for measuring temperature based on the time delay of a signal through a series of logical ports

Industry

CPC
G01K7/346

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Parent Industries

GPHYSICS G01Measuring instruments G01KMEASURING TEMPERATURE MEASURING QUANTITY OF HEAT THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR G01K7/00Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat; Power supply

Current Industry

G01K7/346for measuring temperature based on the time delay of a signal through a series of logical ports

Industries

Patents Grantslast 30 patents

Information Patent Grant
Fan control circuit with temperature compensation and method of con...
- Patent number 11,736,052
- Issue date Aug 22, 2023
- Enermax Technology Corporation
- Chin-Yun Chang
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Method and system for detecting high turbine temperature operations
- Patent number 11,280,683
- Issue date Mar 22, 2022
- Pratt & Whitney Canada Corp.
- Sylvain Lamarre
- F05 - INDEXING SCHEMES RELATING TO ENGINES OR PUMPS IN VARIOUS SUBCLASSES OF...
Information Patent Grant
Active heat-dissipation system and controlling method thereof
- Patent number 10,729,033
- Issue date Jul 28, 2020
- NATIONAL CHUNG SHAN INSTITUTE OF SCIENCE AND TECHNOLOGY
- Yen-Bin Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Temperature sensor circuit and semiconductor device including the same
- Patent number 10,594,303
- Issue date Mar 17, 2020
- SK Hynix Inc.
- Joongho Choi
- G01 - MEASURING TESTING
Information Patent Grant
Time measuring circuit and temperature sensor circuit
- Patent number 10,037,011
- Issue date Jul 31, 2018
- Kabushiki Kaisha Toyota Chuo Kenkyusho
- Hideto Shimada
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for temperature measurement of FinFET devices
- Patent number 9,970,981
- Issue date May 15, 2018
- Semiconductor Manufacturing International (Shanghai) Corporation
- Junhong Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power device temperature monitor
- Patent number 9,719,860
- Issue date Aug 1, 2017
- Atieva, Inc.
- Yifan Tang
- G01 - MEASURING TESTING
Information Patent Grant
Temperature sensor and temperature sensing method
- Patent number 9,574,948
- Issue date Feb 21, 2017
- Industry-Academic Cooperation Foundation, Yonsei University
- Seong-Ook Jung
- G01 - MEASURING TESTING
Information Patent Grant
Time-domain temperature sensing system with a digital output and me...
- Patent number 9,488,530
- Issue date Nov 8, 2016
- National Kaohsiung First University of Science and Technology
- Chun-Chi Chen
- G01 - MEASURING TESTING
Information Patent Grant
Power device temperature monitor
- Patent number 9,182,293
- Issue date Nov 10, 2015
- Atieva, Inc.
- Yifan Tang
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring circuit and method
- Patent number 8,868,962
- Issue date Oct 21, 2014
- ARM Limited
- James Edward Myers
- G01 - MEASURING TESTING
Information Patent Grant
Temperature sensing circuit
- Patent number 8,864,376
- Issue date Oct 21, 2014
- Hynix Semiconductor Inc.
- Kwang-Seok Kim
- G01 - MEASURING TESTING
Information Patent Grant
Wireless temperature sensor
- Patent number 8,573,840
- Issue date Nov 5, 2013
- Incide, S.A.
- Aritz Ubarretxena Belandia
- G01 - MEASURING TESTING
Information Patent Grant
Temperature sensing circuit and method
- Patent number 8,482,330
- Issue date Jul 9, 2013
- Accusilicon Inc.
- Yi Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for evaluating a temperature
- Patent number 8,430,562
- Issue date Apr 30, 2013
- FREESCALE SEMICONDUCTOR, INC.
- Yoav Weizman
- G01 - MEASURING TESTING
Information Patent Grant
Time domain digital temperature sensing system and method thereof
- Patent number 8,317,393
- Issue date Nov 27, 2012
- National Taiwan University of Science and Technology
- Poki Chen
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for non-contact sensing using temporal measures
- Patent number 8,229,057
- Issue date Jul 24, 2012
- Intel-Ge Care Innovations LLC
- Terry Dishongh
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit
- Patent number 8,083,404
- Issue date Dec 27, 2011
- Kabushiki Kaisha Toshiba
- Tomoaki Shoda
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for evaluating a temperature
- Patent number 8,070,357
- Issue date Dec 6, 2011
- FREESCALE SEMICONDUCTOR, INC.
- Yoav Weizman
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for determining a temperature of a temperature...
- Patent number 8,032,323
- Issue date Oct 4, 2011
- Kyocera Corporation
- John Philip Taylor
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit temperature measurement methods and apparatuses
- Patent number 7,693,678
- Issue date Apr 6, 2010
- International Business Machines Corporation
- Zhibin Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Digital temperature detecting system and method
- Patent number 7,563,023
- Issue date Jul 21, 2009
- VIA Technologies, Inc.
- Hung-Yi Kuo
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for determining a temperature sensing element
- Patent number 7,413,343
- Issue date Aug 19, 2008
- Kyoćera Wireless Corp.
- John Philip Taylor
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEMPERATURE SENSOR CIRCUIT AND SEMICONDUCTOR DEVICE INCLUDING THE SAME
- Publication number 20190207591
- Publication date Jul 4, 2019
- SK HYNIX INC.
- Joongho CHOI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DETECTING HIGH TURBINE TEMPERATURE OPERATIONS
- Publication number 20180348065
- Publication date Dec 6, 2018
- Pratt & Whitney Canada Corp.
- Sylvain LAMARRE
- F01 - MACHINES OR ENGINES IN GENERAL ENGINE PLANTS IN GENERAL STEAM ENGINES
Information Patent Application
METHOD AND DEVICE FOR TEMPERATURE MEASUREMENT OF FINFET DEVICES
- Publication number 20180038742
- Publication date Feb 8, 2018
- Semiconductor Manufacturing International (Shanghai) Corporation
- JUNHONG FENG
- G01 - MEASURING TESTING
Information Patent Application
POWER DEVICE TEMPERATURE MONITOR
- Publication number 20140269831
- Publication date Sep 18, 2014
- ATIEVA, INC.
- Yifan TANG
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE SENSOR AND TEMPERATURE SENSING METHOD
- Publication number 20140204974
- Publication date Jul 24, 2014
- Industry-Academic Cooperation Foundation, Yonsei University
- Seong-Ook JUNG
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE SENSOR
- Publication number 20140036959
- Publication date Feb 6, 2014
- Shi-Wen Chen
- G01 - MEASURING TESTING
Information Patent Application
MONITORING CIRCUIT AND METHOD
- Publication number 20130202008
- Publication date Aug 8, 2013
- ARM Limited
- James Edward MYERS
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE SENSING CIRCUIT
- Publication number 20120189033
- Publication date Jul 26, 2012
- Kwang-Seok KIM
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR EVALUATING A TEMPERATURE
- Publication number 20120051398
- Publication date Mar 1, 2012
- FREESCALE SEMICONDUCTOR, INC.
- Yoav Weizman
- G01 - MEASURING TESTING
Information Patent Application
Temperature sensing circuit and method
- Publication number 20110080200
- Publication date Apr 7, 2011
- Yi Zhou
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD FOR MEASURING TEMPERATURE OF SEMICONDUCTOR DEVICE AND APPARA...
- Publication number 20100150202
- Publication date Jun 17, 2010
- Katsunori Asano
- G01 - MEASURING TESTING
Information Patent Application
WIRELESS TEMPERATURE SENSOR
- Publication number 20100040191
- Publication date Feb 18, 2010
- Aritz Ubarretxena Belandia
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR EVALUATING A TEMPERATURE
- Publication number 20100020847
- Publication date Jan 28, 2010
- Yaov Weizman
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR DETERMINING A TEMPERATURE OF A TEMPERATURE...
- Publication number 20090281760
- Publication date Nov 12, 2009
- John Philip TAYLOR
- G01 - MEASURING TESTING
Information Patent Application
TIME DOMAIN DIGITAL TEMPERATURE SENSING SYSTEM AND METHOD THEREOF
- Publication number 20090141770
- Publication date Jun 4, 2009
- National Taiwan University of Science and Technology
- Poki Chen
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR NON-CONTACT SENSING USING TEMPORAL MEASURES
- Publication number 20090097602
- Publication date Apr 16, 2009
- Intel Corporation
- Terry Dishongh
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT
- Publication number 20090059999
- Publication date Mar 5, 2009
- Kabushiki Kaisha Toshiba
- Tomoaki Shoda
- G01 - MEASURING TESTING
Information Patent Application
DIGITAL TEMPERATURE DETECTING SYSTEM AND METHOD
- Publication number 20080136453
- Publication date Jun 12, 2008
- VIA Technologies, Inc.
- Hung-Yi Kuo
- G01 - MEASURING TESTING
Information Patent Application
Integrated Circuit Temperature Measurement Methods and Apparatuses
- Publication number 20080027670
- Publication date Jan 31, 2008
- International Business Machines Corporation
- Zhibin Cheng
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit and system guaranteeing proper ope...
- Publication number 20070216376
- Publication date Sep 20, 2007
- FUJITSU LIMITED
- Toshio Ogawa
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for determining a temperature of a temperature...
- Publication number 20070064768
- Publication date Mar 22, 2007
- John Philip Taylor
- G01 - MEASURING TESTING

for measuring temperature based on the time delay of a signal through a series of logical ports

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Fan control circuit with temperature compensation and method of con...

Method and system for detecting high turbine temperature operations

Active heat-dissipation system and controlling method thereof

Temperature sensor circuit and semiconductor device including the same

Time measuring circuit and temperature sensor circuit

Method and device for temperature measurement of FinFET devices

Power device temperature monitor

Temperature sensor and temperature sensing method

Time-domain temperature sensing system with a digital output and me...

Power device temperature monitor

Monitoring circuit and method

Temperature sensing circuit

Wireless temperature sensor

Temperature sensing circuit and method

Device and method for evaluating a temperature

Time domain digital temperature sensing system and method thereof

Apparatus and method for non-contact sensing using temporal measures

Semiconductor integrated circuit

Device and method for evaluating a temperature

Apparatus and method for determining a temperature of a temperature...

Integrated circuit temperature measurement methods and apparatuses

Digital temperature detecting system and method

Apparatus for determining a temperature sensing element

Patents Applicationslast 30 patents

TEMPERATURE SENSOR CIRCUIT AND SEMICONDUCTOR DEVICE INCLUDING THE SAME

METHOD AND SYSTEM FOR DETECTING HIGH TURBINE TEMPERATURE OPERATIONS

METHOD AND DEVICE FOR TEMPERATURE MEASUREMENT OF FINFET DEVICES

POWER DEVICE TEMPERATURE MONITOR

TEMPERATURE SENSOR AND TEMPERATURE SENSING METHOD

TEMPERATURE SENSOR

MONITORING CIRCUIT AND METHOD

TEMPERATURE SENSING CIRCUIT

DEVICE AND METHOD FOR EVALUATING A TEMPERATURE

Temperature sensing circuit and method

METHOD FOR MEASURING TEMPERATURE OF SEMICONDUCTOR DEVICE AND APPARA...

WIRELESS TEMPERATURE SENSOR

DEVICE AND METHOD FOR EVALUATING A TEMPERATURE

APPARATUS AND METHOD FOR DETERMINING A TEMPERATURE OF A TEMPERATURE...

TIME DOMAIN DIGITAL TEMPERATURE SENSING SYSTEM AND METHOD THEREOF

APPARATUS AND METHOD FOR NON-CONTACT SENSING USING TEMPORAL MEASURES

SEMICONDUCTOR INTEGRATED CIRCUIT

DIGITAL TEMPERATURE DETECTING SYSTEM AND METHOD

Integrated Circuit Temperature Measurement Methods and Apparatuses

Semiconductor integrated circuit and system guaranteeing proper ope...

Apparatus and method for determining a temperature of a temperature...