Membership
Tour
Register
Log in
for modifying the output characteristic
Follow
Industry
CPC
G01K7/21
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01K
MEASURING TEMPERATURE MEASURING QUANTITY OF HEAT THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
G01K7/00
Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat; Power supply
Current Industry
G01K7/21
for modifying the output characteristic
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Resistive hotspot temperature sensor
Patent number
12,098,964
Issue date
Sep 24, 2024
Apple Inc.
Craig P. Finlinson
G01 - MEASURING TESTING
Information
Patent Grant
3D thermal detection circuits and methods
Patent number
11,692,880
Issue date
Jul 4, 2023
Taiwan Semiconductor Manufacturing Co., Ltd.
Szu-Lin Liu
G01 - MEASURING TESTING
Information
Patent Grant
Temperature detector
Patent number
11,536,614
Issue date
Dec 27, 2022
Richwave Technology Corp.
Po-Wei Wu
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Offset corrected bandgap reference and temperature sensor
Patent number
11,221,638
Issue date
Jan 11, 2022
Qorvo US, Inc.
Bruce John Tesch
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Optimized thermocouple system and method
Patent number
10,921,196
Issue date
Feb 16, 2021
HarcoSemco, LLC
Igor Giterman
G01 - MEASURING TESTING
Information
Patent Grant
3D thermal detection circuits and methods
Patent number
10,883,884
Issue date
Jan 5, 2021
Taiwan Semiconductor Manufacturing Co., Ltd.
Szu-Lin Liu
G01 - MEASURING TESTING
Information
Patent Grant
Temperature sensors
Patent number
10,481,015
Issue date
Nov 19, 2019
SK hynix Inc.
Sang Ah Hyun
G01 - MEASURING TESTING
Information
Patent Grant
3D thermal detection circuits and methods
Patent number
10,274,380
Issue date
Apr 30, 2019
Taiwan Semiconductor Manufacturing Co., Ltd.
Szu-Lin Liu
G01 - MEASURING TESTING
Information
Patent Grant
Corrected temperature sensor measurement
Patent number
10,088,855
Issue date
Oct 2, 2018
Infineon Technologies AG
Fan Yung Ma
G01 - MEASURING TESTING
Information
Patent Grant
Temperature sensor peripheral having independent temperature coeffi...
Patent number
9,739,669
Issue date
Aug 22, 2017
Microchip Technology Incorporated
David Michael Susak
G01 - MEASURING TESTING
Information
Patent Grant
Temperature sensor
Patent number
9,645,016
Issue date
May 9, 2017
SK hynix Inc.
Hyun Sik Jeong
G01 - MEASURING TESTING
Information
Patent Grant
3D thermal detection circuits and methods
Patent number
9,599,517
Issue date
Mar 21, 2017
Taiwan Semiconductor Manufacturing Co., Ltd.
Szu-Lin Liu
G01 - MEASURING TESTING
Information
Patent Grant
Measuring transducer having two transmission channels
Patent number
9,506,810
Issue date
Nov 29, 2016
Phoenix Contact GmbH & Co. KG
Heinz W. Meier
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for temperature compensated temperature measure...
Patent number
9,134,184
Issue date
Sep 15, 2015
Schlumberger Technology Corporation
Masahiro Kamata
G01 - MEASURING TESTING
Information
Patent Grant
Temperature measurement circuit and temperature measurement method
Patent number
9,109,956
Issue date
Aug 18, 2015
Global Unichip Corp.
Ting-Hao Wang
G01 - MEASURING TESTING
Information
Patent Grant
Zero heat flux sensor and method of use
Patent number
8,945,020
Issue date
Feb 3, 2015
Koninklijke Philips N.V.
Amy Oi Mee Cheung
G01 - MEASURING TESTING
Information
Patent Grant
Temperature sensor
Patent number
8,876,374
Issue date
Nov 4, 2014
SK Hynix Inc.
Hyun Sik Jeong
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for temperature compensated temperature measure...
Patent number
8,267,578
Issue date
Sep 18, 2012
Schlumberger Technology Corporation
Masahiro Kamata
G01 - MEASURING TESTING
Information
Patent Grant
Method for estimating the temperature in an internal combustion engine
Patent number
8,265,894
Issue date
Sep 11, 2012
GM Global Technology Operations LLC
Paolo Casasso
G01 - MEASURING TESTING
Information
Patent Grant
Temperature measurement device and measurement method
Patent number
7,775,711
Issue date
Aug 17, 2010
Mettler-Toledo AG
Changlin Wang
G01 - MEASURING TESTING
Information
Patent Grant
Temperature sensing circuit
Patent number
7,592,854
Issue date
Sep 22, 2009
Ricoh Company, Ltd.
Hirofumi Watanabe
G01 - MEASURING TESTING
Information
Patent Grant
Temperature sensor bow compensation
Patent number
7,556,423
Issue date
Jul 7, 2009
Microchip Technology Incorporated
Amado Abella Caliboso
G01 - MEASURING TESTING
Information
Patent Grant
Feedback parameter estimation for electric machines
Patent number
7,199,549
Issue date
Apr 3, 2007
Delphi Technologies, Inc.
Julie A. Kleinau
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Temperature sensing circuit
Patent number
7,078,954
Issue date
Jul 18, 2006
Ricoh Company, Ltd.
Hirofumi Watanabe
G01 - MEASURING TESTING
Information
Patent Grant
Active temperature estimation for electric machines
Patent number
7,071,649
Issue date
Jul 4, 2006
Delphi Technologies, Inc.
Daniel W. Shafer
B62 - LAND VEHICLES FOR TRAVELLING OTHERWISE THAN ON RAILS
Information
Patent Grant
Combined feedforward and feedback parameter estimation for electric...
Patent number
6,900,607
Issue date
May 31, 2005
Delphi Technologies, Inc.
Julie A. Kleinau
B62 - LAND VEHICLES FOR TRAVELLING OTHERWISE THAN ON RAILS
Information
Patent Grant
System for difference calculation using a quad slope converter
Patent number
6,717,393
Issue date
Apr 6, 2004
Texas Instruments Incorporated
Barry Jon Male
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device having a sensor with the temperature compensat...
Patent number
6,433,615
Issue date
Aug 13, 2002
Asahi Kasei Kabushiki Kaisha
Shuichi Nagano
G01 - MEASURING TESTING
Information
Patent Grant
Linearized temperature sensor
Patent number
6,183,131
Issue date
Feb 6, 2001
National Semiconductor Corporation
Peter R. Holloway
G01 - MEASURING TESTING
Information
Patent Grant
Circuit arrangement to compensate non-linearities in a resistor, an...
Patent number
6,166,578
Issue date
Dec 26, 2000
Motorola Inc.
Joseph Shor
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Resistive Hotspot Temperature Sensor
Publication number
20230101044
Publication date
Mar 30, 2023
Apple Inc.
Craig P. Finlinson
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT CIRCUIT OF THIN-FILM TEMPERATURE SENSOR
Publication number
20230026496
Publication date
Jan 26, 2023
NINGBO CRRC TIMES TRANSDUCER TECHNOLOGY CO., LTD.
Xiaowei HOU
G01 - MEASURING TESTING
Information
Patent Application
DETERMINING A TEMPERATURE IN AN ELECTRIC MACHINE
Publication number
20230003587
Publication date
Jan 5, 2023
SCHAEFFLER TECHNOLOGIES AG & CO. KG
Sebastian Supper
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
Temperature Detector
Publication number
20220307916
Publication date
Sep 29, 2022
RICHWAVE TECHNOLOGY CORP.
Po-Wei Wu
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
3D THERMAL DETECTION CIRCUITS AND METHODS
Publication number
20210123816
Publication date
Apr 29, 2021
Taiwan Semiconductor Manufacturing Co., LTD
Szu-Lin LIU
G01 - MEASURING TESTING
Information
Patent Application
OFFSET CORRECTED BANDGAP REFERENCE AND TEMPERATURE SENSOR
Publication number
20200278708
Publication date
Sep 3, 2020
Qorvo US, Inc.
Bruce John Tesch
G05 - CONTROLLING REGULATING
Information
Patent Application
3D THERMAL DETECTION CIRCUITS AND METHODS
Publication number
20190234807
Publication date
Aug 1, 2019
Taiwan Semiconductor Manufacturing Co., LTD
Szu-Lin LIU
G01 - MEASURING TESTING
Information
Patent Application
Temperature Sensor Peripheral Having Independent Temperature Coeffi...
Publication number
20170350770
Publication date
Dec 7, 2017
MICROCHIP TECHNOLOGY INCORPORATED
David Michael Susak
G01 - MEASURING TESTING
Information
Patent Application
3D THERMAL DETECTION CIRCUITS AND METHODS
Publication number
20170184459
Publication date
Jun 29, 2017
Taiwan Semiconductor Manufacturing Co., LTD
Szu-Lin LIU
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE SENSOR
Publication number
20140294047
Publication date
Oct 2, 2014
Hyun Sik JEONG
G01 - MEASURING TESTING
Information
Patent Application
MEASURING TRANSDUCER HAVING TWO TRANSMISSION CHANNELS
Publication number
20140222365
Publication date
Aug 7, 2014
Phoenix Contact GmbH & Co. KG
Heinz W. Meier
G01 - MEASURING TESTING
Information
Patent Application
Temperature Sensor Peripheral Having Independent Temperature Coeffi...
Publication number
20140161149
Publication date
Jun 12, 2014
David Michael Susak
G01 - MEASURING TESTING
Information
Patent Application
QUADRATURE HYBRID COUPLER, AMPLIFIER, AND WIRELESS COMMUNICATION DE...
Publication number
20140155003
Publication date
Jun 5, 2014
Toshifumi Nakatani
G01 - MEASURING TESTING
Information
Patent Application
Methods And Systems For Temperature Compensated Temperature Measure...
Publication number
20120294327
Publication date
Nov 22, 2012
Masahiro Kamata
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
TEMPERATURE MEASUREMENT CIRCUIT AND TEMPERATURE MEASUREMENT METHOD
Publication number
20120250721
Publication date
Oct 4, 2012
Ting-Hao Wang
G01 - MEASURING TESTING
Information
Patent Application
ZERO HEAT FLUX SENSOR AND METHOD OF USE
Publication number
20110264001
Publication date
Oct 27, 2011
Koninklijke Philips Electronics N.V.
Amy Oi Mee Cheung
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE SENSOR
Publication number
20110204873
Publication date
Aug 25, 2011
Hynix Semiconductor Inc.
Hyun Sik JEONG
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND SYSTEMS FOR TEMPERATURE COMPENSATED TEMPERATURE MEASURE...
Publication number
20100198546
Publication date
Aug 5, 2010
SCHLUMBERGER TECHNOLOGY CORPORATION
MASAHIRO KAMATA
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
METHOD FOR ESTIMATING THE TEMPERATURE IN AN INTERNAL COMBUSTION ENGINE
Publication number
20100082285
Publication date
Apr 1, 2010
GM Global Technology Operations, Inc.
Paolo CASASSO
G01 - MEASURING TESTING
Information
Patent Application
Temperature Sensor
Publication number
20090304043
Publication date
Dec 10, 2009
CONTINENTAL AUTOMOTIVE GMBH
Manfred Glehr
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE MEASUREMENT DEVICE AND MEASUREMENT METHOD
Publication number
20090122834
Publication date
May 14, 2009
METTLER-TOLEDO AG
Changlin WANG
G01 - MEASURING TESTING
Information
Patent Application
Temperature Sensor Bow Compensation
Publication number
20080165823
Publication date
Jul 10, 2008
MICROCHIP TECHNOLOGY INCORPORATED
Amado Abella Caliboso
G01 - MEASURING TESTING
Information
Patent Application
Temperature sensing circuit
Publication number
20060226888
Publication date
Oct 12, 2006
Hirofumi Watanabe
G01 - MEASURING TESTING
Information
Patent Application
Temperature sensing circuit
Publication number
20030214336
Publication date
Nov 20, 2003
Hirofumi Watanabe
G01 - MEASURING TESTING
Information
Patent Application
System for difference calculation using a quad slope converter
Publication number
20030193324
Publication date
Oct 16, 2003
TEXAS INSTRUMENTS INCORPORATED
Barry Jon Male
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Feedforward parameter estimation for electric machines
Publication number
20030076064
Publication date
Apr 24, 2003
Julie A. Kleinau
G05 - CONTROLLING REGULATING
Information
Patent Application
Active temperature estimation for electric machines
Publication number
20030076065
Publication date
Apr 24, 2003
Daniel W. Shafer
G05 - CONTROLLING REGULATING
Information
Patent Application
Combined feedforward and feedback parameter estimation for electric...
Publication number
20030076061
Publication date
Apr 24, 2003
Julie A. Kleinau
G05 - CONTROLLING REGULATING
Information
Patent Application
Feedback parameter estimation for electric machines
Publication number
20030071594
Publication date
Apr 17, 2003
Julie A. Kleinau
B60 - VEHICLES IN GENERAL
Information
Patent Application
Semiconductor device
Publication number
20010040241
Publication date
Nov 15, 2001
Shuichi Nagano
G01 - MEASURING TESTING