for presentation of more than one variable

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CPC
G01R13/0236

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R13/00Arrangements for displaying electric variables or waveforms

Current Industry

G01R13/0236for presentation of more than one variable

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Digital oscilloscope and oscillogram generation system
- Patent number 11,874,302
- Issue date Jan 16, 2024
- BOE Technology Group Co., Ltd.
- Congrui Wu
- G01 - MEASURING TESTING
Information Patent Grant
Measurement instrument having time, frequency and logic domain chan...
- Patent number 11,686,750
- Issue date Jun 27, 2023
- Keysight Technologies, Inc.
- Ken A. Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Test method and test system
- Patent number 11,293,982
- Issue date Apr 5, 2022
- Rohde & Schwarz GmbH & Co. KG
- Philip Diegmann
- G01 - MEASURING TESTING
Information Patent Grant
Acquiring and displaying multiple waveforms in a test and measureme...
- Patent number 11,231,444
- Issue date Jan 25, 2022
- Tektronix, Inc.
- Gary J. Waldo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Switching loss measurement and plot in test and measurement instrument
- Patent number 11,181,581
- Issue date Nov 23, 2021
- Tektronix, Inc.
- Krishna N H Sri
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Measuring device and measuring method with multiple display
- Patent number 11,054,445
- Issue date Jul 6, 2021
- Rohde & Schwarz GmbH & Co. KG
- Matthias Keller
- G01 - MEASURING TESTING
Information Patent Grant
Method for performing a bus autoset function and measurement device
- Patent number 10,991,341
- Issue date Apr 27, 2021
- Rohde & Schwarz GmbH & Co. KG
- Philip Diegmann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Oscilloscope persistence for digital bus signals
- Patent number 10,983,146
- Issue date Apr 20, 2021
- Tektronix, Inc.
- Kevin C. Spisak
- G01 - MEASURING TESTING
Information Patent Grant
Phase identification display method
- Patent number 10,976,349
- Issue date Apr 13, 2021
- Gregory Hubert Piesinger
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Electrical measurement device and method
- Patent number 10,976,978
- Issue date Apr 13, 2021
- Rohde & Schwarz GmbH & Co. KG
- Philip Diegmann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement device and method for visualization of multiple channels
- Patent number 10,845,389
- Issue date Nov 24, 2020
- Rohde & Schwarz GmbH & Co. KG
- Tobias Frede
- G01 - MEASURING TESTING
Information Patent Grant
Multi-level logic analyzer for analyzing multi-level digital signal...
- Patent number 10,809,282
- Issue date Oct 20, 2020
- Rohde & Schwarz GmbH & Co. KG
- Martin Peschke
- G01 - MEASURING TESTING
Information Patent Grant
Waveform display device that allows cycle time comparison to be made
- Patent number 10,802,051
- Issue date Oct 13, 2020
- FANUC CORPORATION
- Kouta Tagami
- G01 - MEASURING TESTING
Information Patent Grant
Waveform display device
- Patent number 10,663,489
- Issue date May 26, 2020
- Yokogawa Electric Corporation
- Takeshi Yamashita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Signal analysis in time and frequency
- Patent number 10,585,120
- Issue date Mar 10, 2020
- Rohde & Schwarz GmbH & Co. KG
- Luke Cirillo
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for time correlated signal acquisition and vie...
- Patent number 10,557,870
- Issue date Feb 11, 2020
- Tektronix, Inc.
- Gary J. Waldo
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for processing measurement tuples
- Patent number 10,514,405
- Issue date Dec 24, 2019
- ROHDE & SCHWARZ GMBH & CO. KG
- Detlev Liebl
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Formatting and navigating graphed information
- Patent number 10,401,390
- Issue date Sep 3, 2019
- KEITHLEY INSTRUMENTS, LLC
- Brian P. Frackelton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analysis device, analysis method, and program
- Patent number 10,281,495
- Issue date May 7, 2019
- Mitsubishi Electric Corporation
- Satoshi Endo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Multiple timebase sampling scope
- Patent number 10,079,639
- Issue date Sep 18, 2018
- Tektronix, Inc.
- Jan P. Peeters Weem
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Acquisition memory allocation for digital storage oscilloscope
- Patent number 9,891,248
- Issue date Feb 13, 2018
- Tektronix, Inc.
- Haiwen Yu
- G01 - MEASURING TESTING
Information Patent Grant
Internal chirp generator with time aligned acquisition in a mixed-d...
- Patent number 9,869,699
- Issue date Jan 16, 2018
- Tektronix, Inc.
- Donald J. Dalebroux
- G01 - MEASURING TESTING
Information Patent Grant
Test and measurement instrument including asynchronous time-interle...
- Patent number 9,859,908
- Issue date Jan 2, 2018
- Tektronix, Inc.
- Daniel G. Knierim
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Signal analysis in time and frequency
- Patent number 9,810,716
- Issue date Nov 7, 2017
- Rohde & Schwarz GmbH & Co. KG
- Luke Cirillo
- G01 - MEASURING TESTING
Information Patent Grant
Digital oscilloscope comprising multiple data acquisition pathways
- Patent number 9,804,200
- Issue date Oct 31, 2017
- Keysight Technologies, Inc.
- Daniel P. Timm
- G01 - MEASURING TESTING
Information Patent Grant
Device and method to prevent inter-system interference
- Patent number 9,599,639
- Issue date Mar 21, 2017
- Tektronix, Inc.
- John J. Pickerd
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
Apparatus and method for time correlated signal acquisition and vie...
- Patent number 9,500,676
- Issue date Nov 22, 2016
- Tektronix, Inc.
- Gary J. Waldo
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for providing frequency domain display with vi...
- Patent number 9,500,677
- Issue date Nov 22, 2016
- TEKTRONIK, INC.
- Gary J. Waldo
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device and a method for measuring a signal with several c...
- Patent number 9,491,646
- Issue date Nov 8, 2016
- Rohde & Schwarz GmbH & Co. KG
- Jens Franke
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Oscilloscope system and method for simultaneously displaying zoomed...
- Patent number 9,459,290
- Issue date Oct 4, 2016
- Keysight Technologies, Inc.
- Kenneth W. Johnson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT RESULT DISPLAY METHOD
- Publication number 20240353448
- Publication date Oct 24, 2024
- Hioki E. E. Corporation
- Naoya KITAMURA
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT INSTRUMENT HAVING TIME, FREQUENCY AND LOGIC DOMAIN CHAN...
- Publication number 20230280382
- Publication date Sep 7, 2023
- KEYSIGHT TECHNOLOGIES, INC.
- Ken A. Nishimura
- G01 - MEASURING TESTING
Information Patent Application
SEAMLESS SPECTROGRAMS IN A MULTI-CHANNEL TEST AND MEASUREMENT INSTR...
- Publication number 20230258692
- Publication date Aug 17, 2023
- Tektronix, Inc.
- Gary J. WALDO
- G01 - MEASURING TESTING
Information Patent Application
DIGITAL OSCILLOSOPE AND OSCILLOGRAM GENERATION SYSTEM
- Publication number 20220308089
- Publication date Sep 29, 2022
- BOE TECHNOLOGY GROUP CO., LTD.
- Congrui WU
- G01 - MEASURING TESTING
Information Patent Application
Phase Identification Display Method
- Publication number 20210096159
- Publication date Apr 1, 2021
- Gregory Hubert Piesinger
- G01 - MEASURING TESTING
Information Patent Application
TEST METHOD AND TEST SYSTEM
- Publication number 20200284839
- Publication date Sep 10, 2020
- Rohde& Schwarz GmbH & Co. KG
- Philip Diegmann
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT INSTRUMENT HAVING TIME, FREQUENCY AND LOGIC DOMAIN CHAN...
- Publication number 20200132741
- Publication date Apr 30, 2020
- KEYSIGHT TECHNOLOGIES, INC.
- Ken A. Nishimura
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT DEVICE AND METHOD FOR VISUALIZATION OF MULTIPLE CHANNELS
- Publication number 20190271723
- Publication date Sep 5, 2019
- ROHDE & SCHWARZ GMBH & CO. KG
- Tobias FREDE
- G01 - MEASURING TESTING
Information Patent Application
MULTI-LEVEL LOGIC ANALYZER FOR ANALYZING MULTI-LEVEL DIGITAL SIGNAL...
- Publication number 20180275170
- Publication date Sep 27, 2018
- Rohde& Schwarz GmbH & Co. KG
- Martin Peschke
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT INCLUDING ASYNCHRONOUS TIME-INTERLE...
- Publication number 20180131381
- Publication date May 10, 2018
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL ANALYSIS IN TIME AND FREQUENCY
- Publication number 20180059142
- Publication date Mar 1, 2018
- ROHDE & SCHWARZ GMBH & CO. KG
- Luke Cirillo
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR TIME CORRELATED SIGNAL ACQUISITION AND VIE...
- Publication number 20170030945
- Publication date Feb 2, 2017
- Tektronix, Inc.
- Gary J. WALDO
- G01 - MEASURING TESTING
Information Patent Application
TRIGGERED OPERATION AND/OR RECORDING OF TEST AND MEASUREMENT OR IMA...
- Publication number 20160080667
- Publication date Mar 17, 2016
- FLUKE CORPORATION
- Michael D. Stuart
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE, ANALYSIS METHOD, AND PROGRAM
- Publication number 20150142357
- Publication date May 21, 2015
- Mitsubishi Electric Corporation
- Satoshi Endo
- G01 - MEASURING TESTING
Information Patent Application
OSCILLOSCOPE SYSTEM AND METHOD FOR SIMULTANEOUSLY DISPLAYING ZOOMED...
- Publication number 20140320145
- Publication date Oct 30, 2014
- AGILENT TECHNOLOGIES, INC.
- Kenneth W. Johnson
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD TO PREVENT INTER-SYSTEM INTERFERENCE
- Publication number 20140300371
- Publication date Oct 9, 2014
- Tektronix, Inc.
- John J. Pickerd
- G01 - MEASURING TESTING
Information Patent Application
INTERNAL CHIRP GENERATOR WITH TIME ALIGNED ACQUISITION IN A MIXED-D...
- Publication number 20140111184
- Publication date Apr 24, 2014
- Tektronix, Inc.
- Donald J. Dalebroux
- G01 - MEASURING TESTING
Information Patent Application
MULTI-DOMAIN TEST AND MEASUREMENT INSTRUMENT
- Publication number 20140064346
- Publication date Mar 6, 2014
- Tektronix, Inc.
- Kenneth P. Dobyns
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL ANALYSIS IN TIME AND FREQUENCY
- Publication number 20130346005
- Publication date Dec 26, 2013
- ROHDE & SCHWARZ GMBH & CO. KG
- Luke Cirillo
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR THREE-DIMENSIONAL RENDERING OF ELECTRICAL TEST AND MEASU...
- Publication number 20130314419
- Publication date Nov 28, 2013
- C SPEED, LLC
- Justin Ralph Louise
- G01 - MEASURING TESTING
Information Patent Application
ARBITRARY MULTIBAND OVERLAY MIXER APPARATUS AND METHOD FOR BANDWIDT...
- Publication number 20130237170
- Publication date Sep 12, 2013
- Tektronix, Inc.
- John J. PICKERD
- G01 - MEASURING TESTING
Information Patent Application
Acquisition Memory Allocation for Digital Storage Oscilloscope
- Publication number 20130231882
- Publication date Sep 5, 2013
- TEKTRONIX (CHINA) CO., LTD.
- Haiwen Yu
- G01 - MEASURING TESTING
Information Patent Application
DIGITAL OSCILLOSCOPE COMPRISING MULTIPLE DATA ACQUISITION PATHWAYS
- Publication number 20130207641
- Publication date Aug 15, 2013
- AGILENT TECHNOLOGIES, INC.
- Daniel P. TIMM
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR THREE-DIMENSIONAL RENDERING OF ELECTRICAL TEST AND MEASU...
- Publication number 20130207969
- Publication date Aug 15, 2013
- JUSTIN RALPH LOUISE
- G01 - MEASURING TESTING
Information Patent Application
ARBITRARY MULTIBAND OVERLAY MIXER APPARATUS ANDMETHOD FOR BANDWIDTH...
- Publication number 20130093493
- Publication date Apr 18, 2013
- Tektronix, Inc.
- John J. PICKERD
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR PROVIDING FREQUENCY DOMAIN DISPLAY WITH VI...
- Publication number 20130044112
- Publication date Feb 21, 2013
- Tektronix, Inc.
- Gary J. WALDO
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR TIME CORRELATED SIGNAL ACQUISITION AND VIE...
- Publication number 20130044134
- Publication date Feb 21, 2013
- Tektronix, Inc.
- Gary J. WALDO
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL DISPLAY DEVICE, METHOD, AND RECORDING MEDIUM
- Publication number 20120319855
- Publication date Dec 20, 2012
- Advantest Corporation
- Yuichiro HARADA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF GROUPING WAVEFORMS FOR A SINGLE CHANNEL ON A SINGLE DISPLAY
- Publication number 20120278763
- Publication date Nov 1, 2012
- Tektronix, Inc.
- Ian S. Dees
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT WITH COMMON PRESENTATION OF TIME DO...
- Publication number 20120197598
- Publication date Aug 2, 2012
- Tektronix, Inc.
- Kenneth P. DOBYNS
- G01 - MEASURING TESTING

for presentation of more than one variable

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Digital oscilloscope and oscillogram generation system

Measurement instrument having time, frequency and logic domain chan...

Test method and test system

Acquiring and displaying multiple waveforms in a test and measureme...

Switching loss measurement and plot in test and measurement instrument

Measuring device and measuring method with multiple display

Method for performing a bus autoset function and measurement device

Oscilloscope persistence for digital bus signals

Phase identification display method

Electrical measurement device and method

Measurement device and method for visualization of multiple channels

Multi-level logic analyzer for analyzing multi-level digital signal...

Waveform display device that allows cycle time comparison to be made

Waveform display device

Signal analysis in time and frequency

Apparatus and method for time correlated signal acquisition and vie...

Method and apparatus for processing measurement tuples

Formatting and navigating graphed information

Analysis device, analysis method, and program

Multiple timebase sampling scope

Acquisition memory allocation for digital storage oscilloscope

Internal chirp generator with time aligned acquisition in a mixed-d...

Test and measurement instrument including asynchronous time-interle...

Signal analysis in time and frequency

Digital oscilloscope comprising multiple data acquisition pathways

Device and method to prevent inter-system interference

Apparatus and method for time correlated signal acquisition and vie...

Apparatus and method for providing frequency domain display with vi...

Measuring device and a method for measuring a signal with several c...

Oscilloscope system and method for simultaneously displaying zoomed...

Patents Applicationslast 30 patents

MEASUREMENT APPARATUS AND MEASUREMENT RESULT DISPLAY METHOD

MEASUREMENT INSTRUMENT HAVING TIME, FREQUENCY AND LOGIC DOMAIN CHAN...

SEAMLESS SPECTROGRAMS IN A MULTI-CHANNEL TEST AND MEASUREMENT INSTR...

DIGITAL OSCILLOSOPE AND OSCILLOGRAM GENERATION SYSTEM

Phase Identification Display Method

TEST METHOD AND TEST SYSTEM

MEASUREMENT INSTRUMENT HAVING TIME, FREQUENCY AND LOGIC DOMAIN CHAN...

MEASUREMENT DEVICE AND METHOD FOR VISUALIZATION OF MULTIPLE CHANNELS

MULTI-LEVEL LOGIC ANALYZER FOR ANALYZING MULTI-LEVEL DIGITAL SIGNAL...

TEST AND MEASUREMENT INSTRUMENT INCLUDING ASYNCHRONOUS TIME-INTERLE...

SIGNAL ANALYSIS IN TIME AND FREQUENCY

APPARATUS AND METHOD FOR TIME CORRELATED SIGNAL ACQUISITION AND VIE...

TRIGGERED OPERATION AND/OR RECORDING OF TEST AND MEASUREMENT OR IMA...

ANALYSIS DEVICE, ANALYSIS METHOD, AND PROGRAM

OSCILLOSCOPE SYSTEM AND METHOD FOR SIMULTANEOUSLY DISPLAYING ZOOMED...

DEVICE AND METHOD TO PREVENT INTER-SYSTEM INTERFERENCE

INTERNAL CHIRP GENERATOR WITH TIME ALIGNED ACQUISITION IN A MIXED-D...

MULTI-DOMAIN TEST AND MEASUREMENT INSTRUMENT

SIGNAL ANALYSIS IN TIME AND FREQUENCY

SYSTEM FOR THREE-DIMENSIONAL RENDERING OF ELECTRICAL TEST AND MEASU...

ARBITRARY MULTIBAND OVERLAY MIXER APPARATUS AND METHOD FOR BANDWIDT...

Acquisition Memory Allocation for Digital Storage Oscilloscope

DIGITAL OSCILLOSCOPE COMPRISING MULTIPLE DATA ACQUISITION PATHWAYS

SYSTEM FOR THREE-DIMENSIONAL RENDERING OF ELECTRICAL TEST AND MEASU...

ARBITRARY MULTIBAND OVERLAY MIXER APPARATUS ANDMETHOD FOR BANDWIDTH...

APPARATUS AND METHOD FOR PROVIDING FREQUENCY DOMAIN DISPLAY WITH VI...

APPARATUS AND METHOD FOR TIME CORRELATED SIGNAL ACQUISITION AND VIE...

SIGNAL DISPLAY DEVICE, METHOD, AND RECORDING MEDIUM

METHOD OF GROUPING WAVEFORMS FOR A SINGLE CHANNEL ON A SINGLE DISPLAY

TEST AND MEASUREMENT INSTRUMENT WITH COMMON PRESENTATION OF TIME DO...