for producing permanent records

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CPC
G01R13/04

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R13/00Arrangements for displaying electric variables or waveforms

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G01R13/04for producing permanent records

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Patents Grantslast 30 patents

Information Patent Grant
Measurement apparatus and method for controlling a measurement appa...
- Patent number 11,879,914
- Issue date Jan 23, 2024
- Rohde & Schwarz GmbH & Co. KG
- Wolfgang Herbordt
- G01 - MEASURING TESTING
Information Patent Grant
Method for analyzing a measured signal and oscilloscope
- Patent number 11,378,592
- Issue date Jul 5, 2022
- Rohde & Schwarz GmbH & Co. KG
- Sven Barthel
- G01 - MEASURING TESTING
Information Patent Grant
Optical electrical measurement system, a measurement probe and a me...
- Patent number 10,330,706
- Issue date Jun 25, 2019
- Telefonaktiebolaget LM Ericsson (publ)
- Sverker Sander
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical electrical measurement system, a measurement probe and a me...
- Patent number 10,295,569
- Issue date May 21, 2019
- Telefonaktiebolaget LM Ericsson (publ)
- Sverker Sander
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Power supply controlling apparatus, and non-transitory computer rea...
- Patent number 8,994,364
- Issue date Mar 31, 2015
- Fujitsu Component Limited
- Shinichi Katayama
- G01 - MEASURING TESTING
Information Patent Grant
Waveform measuring apparatus for measuring waveform data and writin...
- Patent number 7,246,017
- Issue date Jul 17, 2007
- Yokogawa Electric Corporation
- Shin'ichi Nakano
- G01 - MEASURING TESTING
Information Patent Grant
Baseband time-domain waveform measurement method
- Patent number 6,211,663
- Issue date Apr 3, 2001
- The Aerospace Corporation
- Andrew Alfred Moulthrop
- G01 - MEASURING TESTING
Information Patent Grant
Waveform library for characterizing an AC power line spectrum
- Patent number 5,471,401
- Issue date Nov 28, 1995
- Basic Measuring Instruments, Inc.
- Jamie Nicholson
- G01 - MEASURING TESTING
Information Patent Grant
Power line waveform measurement system
- Patent number 5,027,285
- Issue date Jun 25, 1991
- Oneac Corporation
- Andrew McCartney
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for calibrating a scan convertor
- Patent number 5,005,145
- Issue date Apr 2, 1991
- Tektronix, Inc.
- Timothy L. Falk
- G01 - MEASURING TESTING
Information Patent Grant
Voltage detecting device
- Patent number 4,973,900
- Issue date Nov 27, 1990
- Hamamatsu Photonics K.K.
- Shinichiro Aoshima
- G01 - MEASURING TESTING
Information Patent Grant
Transient field indicator
- Patent number 4,825,152
- Issue date Apr 25, 1989
- Voyager Technologies, Inc.
- Peter R. Bossard
- G01 - MEASURING TESTING
Information Patent Grant
Signal controlled waveform recorder
- Patent number 4,631,697
- Issue date Dec 23, 1986
- Duffers Scientific, Inc.
- Hugo S. Ferguson
- G01 - MEASURING TESTING
Information Patent Grant
Recording apparatus for a spectrophotometer
- Patent number 4,566,793
- Issue date Jan 28, 1986
- Hitachi, Ltd.
- Shigeo Tohyama
- G01 - MEASURING TESTING
Information Patent Grant
Line disturbance monitor
- Patent number 4,484,290
- Issue date Nov 20, 1984
- Ferranti plc
- Jeffrey L. Bagnall
- G01 - MEASURING TESTING
Information Patent Grant
Meter to printer coupling circuit
- Patent number 4,443,758
- Issue date Apr 17, 1984
- Northern Telecom Inc.
- Charles A. P. Kelly
- G01 - MEASURING TESTING
Information Patent Grant
System for processing data received from a portable data store and...
- Patent number 4,433,387
- Issue date Feb 21, 1984
- Sangamo Weston, Inc.
- Robert E. Dyer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Line recording device
- Patent number 4,389,653
- Issue date Jun 21, 1983
- Kienzle Apparate GmbH
- Manfred Fichter
- G07 - CHECKING-DEVICES
Information Patent Grant
Transverse mode converter for use with a longitudinal mode oscillog...
- Patent number 4,381,514
- Issue date Apr 26, 1983
- Peter M. Calandrino
- G01 - MEASURING TESTING
Information Patent Grant
Chart recording apparatus
- Patent number 4,348,683
- Issue date Sep 7, 1982
- The Foxboro Company
- Everett O. Olsen
- G05 - CONTROLLING REGULATING
Information Patent Grant
Signal handling apparatus
- Patent number 4,310,841
- Issue date Jan 12, 1982
- The Foxboro Company
- Everett O. Olsen
- G05 - CONTROLLING REGULATING
Information Patent Grant
Circuit and method for the recorder display of high frequency perio...
- Patent number 4,213,134
- Issue date Jul 15, 1980
- The University of Akron
- Chun-Fu Chen
- G01 - MEASURING TESTING
Information Patent Grant
Driver for solar cell I-V characteristic plots
- Patent number 4,184,111
- Issue date Jan 15, 1980
- Alan M. Acting Administrator of the National Aeronautics and Space Administra...
- G01 - MEASURING TESTING
Information Patent Grant
Printing apparatus
- Patent number 4,131,900
- Issue date Dec 26, 1978
- Hartman & Braun Aktiengesellschaft
- Hans Joachim Erb
- G01 - MEASURING TESTING
Information Patent Grant
Signal handling apparatus
- Patent number 4,123,696
- Issue date Oct 31, 1978
- The Foxboro Company
- Everett O. Olsen
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for monitoring bcd continuously varying data
- Patent number 4,101,903
- Issue date Jul 18, 1978
- Rockwell International Corporation
- Larry G. Slay
- G01 - MEASURING TESTING
Information Patent Grant
Skew correction
- Patent number 4,091,392
- Issue date May 23, 1978
- Honeywell Inc.
- Donald E. Shafer
- G01 - MEASURING TESTING
Information Patent Grant
Trace locator for a multi-trace recorder
- Patent number 4,083,040
- Issue date Apr 4, 1978
- Honeywell Inc.
- Paul A. Diddens
- G11 - INFORMATION STORAGE
Information Patent Grant
Multipoint recorder
- Patent number 4,074,274
- Issue date Feb 14, 1978
- Yokogawa Electric Works, Ltd.
- Hisaya Fujita
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, instrumentation, and method for comparing samples
- Patent number 4,040,788
- Issue date Aug 9, 1977
- Simons; Sanford L.
- Sanford L. Simons
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AN OPTICAL ELECTRICAL MEASUREMENT SYSTEM, A MEASUREMENT PROBE AND A...
- Publication number 20170102412
- Publication date Apr 13, 2017
- Telefonaktiebolaget LM Ericsson (publ)
- Sverker SANDER
- G01 - MEASURING TESTING
Information Patent Application
Power supply controlling apparatus, and non-transitory computer rea...
- Publication number 20110181270
- Publication date Jul 28, 2011
- FUJITSU COMPONENT LIMITED
- Shinichi Katayama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Waveform measuring apparatus
- Publication number 20050234665
- Publication date Oct 20, 2005
- YOKOGAWA ELECTRIC CORPORATION
- Shin'ichi Nakano
- G01 - MEASURING TESTING

for producing permanent records

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Measurement apparatus and method for controlling a measurement appa...

Method for analyzing a measured signal and oscilloscope

Optical electrical measurement system, a measurement probe and a me...

Optical electrical measurement system, a measurement probe and a me...

Power supply controlling apparatus, and non-transitory computer rea...

Waveform measuring apparatus for measuring waveform data and writin...

Baseband time-domain waveform measurement method

Waveform library for characterizing an AC power line spectrum

Power line waveform measurement system

Method and apparatus for calibrating a scan convertor

Voltage detecting device

Transient field indicator

Signal controlled waveform recorder

Recording apparatus for a spectrophotometer

Line disturbance monitor

Meter to printer coupling circuit

System for processing data received from a portable data store and...

Line recording device

Transverse mode converter for use with a longitudinal mode oscillog...

Chart recording apparatus

Signal handling apparatus

Circuit and method for the recorder display of high frequency perio...

Driver for solar cell I-V characteristic plots

Printing apparatus

Signal handling apparatus

Method and apparatus for monitoring bcd continuously varying data

Skew correction

Trace locator for a multi-trace recorder

Multipoint recorder

Apparatus, instrumentation, and method for comparing samples

Patents Applicationslast 30 patents

AN OPTICAL ELECTRICAL MEASUREMENT SYSTEM, A MEASUREMENT PROBE AND A...

Power supply controlling apparatus, and non-transitory computer rea...

Waveform measuring apparatus