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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R13/00
Arrangements for displaying electric variables or waveforms
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G01R13/0272
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Patents Grants
last 30 patents
Information
Patent Grant
Multi-channel spectrum analyzer with multi-channel analog-digital-c...
Patent number
12,366,591
Issue date
Jul 22, 2025
Viavi Solutions Inc.
Chang-Hyun Park
G01 - MEASURING TESTING
Information
Patent Grant
Oscilloscope post processing system, method and measurement device
Patent number
12,270,833
Issue date
Apr 8, 2025
Rhode & Schwarz GmbH & Co. KG
Wolfgang Herbordt
G01 - MEASURING TESTING
Information
Patent Grant
System and method for separation and classification of signals usin...
Patent number
12,265,125
Issue date
Apr 1, 2025
Tektronix, Inc.
John J. Pickerd
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Spur detection in a sampled waveform in a mixed analog/digital syst...
Patent number
12,188,964
Issue date
Jan 7, 2025
International Business Machines Corporation
Timothy Lindquist
G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information
Patent Grant
Systems and methods for condition monitoring
Patent number
12,140,508
Issue date
Nov 12, 2024
Green Running Limited
Raza Rizvi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Cyclic loop image representation for waveform data
Patent number
12,092,692
Issue date
Sep 17, 2024
Tektronix, Inc.
John J. Pickerd
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Oscilloscope and signal analysis method
Patent number
12,055,564
Issue date
Aug 6, 2024
Rohde & Schwarz GmbH & Co. KG
Manuel Stein
G01 - MEASURING TESTING
Information
Patent Grant
Pattern acquisitions in equivalent time sampling systems
Patent number
12,019,098
Issue date
Jun 25, 2024
Tektronix, Inc.
Noah Brummer
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Measurement device and method
Patent number
11,946,951
Issue date
Apr 2, 2024
Rohde & Schwarz GmbH & Co. KG
Philip Diegmann
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for decoding oscilloscope signal and oscilloscope
Patent number
11,928,068
Issue date
Mar 12, 2024
AUTEL INTELLIGENT TECHNOLOGY CORP., LTD.
Liangliang Yang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Voltage monitoring circuit for interface
Patent number
11,899,061
Issue date
Feb 13, 2024
Apple Inc.
Fabien S. Faure
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for reducing error in time domain waveform of a s...
Patent number
11,821,920
Issue date
Nov 21, 2023
Keysight Technologies, Inc.
Marlin E. Viss
G01 - MEASURING TESTING
Information
Patent Grant
Wearable system for capturing and transmitting biomedical signals
Patent number
11,819,343
Issue date
Nov 21, 2023
QUALCOMM Incorporated
Harinath Garudadri
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System for continuous recording and controllable playback of input...
Patent number
11,817,945
Issue date
Nov 14, 2023
Tektronix, Inc.
Shane L. Arnold
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Measurement system and method of operating a measurement system
Patent number
11,789,040
Issue date
Oct 17, 2023
Rohde & Schwarz GmbH & Co. KG
Christian Benisch
G01 - MEASURING TESTING
Information
Patent Grant
Digital data rate enhancement filter, digital data rate reduction f...
Patent number
11,791,928
Issue date
Oct 17, 2023
Rohde & Schwarz GmbH & Co. KG
Manuel Stein
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Systems and methods for improving frequency response of a high-spee...
Patent number
11,758,308
Issue date
Sep 12, 2023
SCHNEIDER ELECTRIC USA, INC.
Erin C. McPhalen
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
System and method for performing lossless compressed serial decoding
Patent number
11,698,391
Issue date
Jul 11, 2023
Keysight Technologies, Inc.
Joseph D. Shaker
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Measurement instrument having time, frequency and logic domain chan...
Patent number
11,686,750
Issue date
Jun 27, 2023
Keysight Technologies, Inc.
Ken A. Nishimura
G01 - MEASURING TESTING
Information
Patent Grant
High resolution spectrum monitoring
Patent number
11,630,138
Issue date
Apr 18, 2023
The Regents of the University of California
Yeswanth Reddy Guddeti
G01 - MEASURING TESTING
Information
Patent Grant
Measurement apparatus and measurement method
Patent number
11,567,106
Issue date
Jan 31, 2023
Rohde & Schwarz GmbH & Co. KG
Gerd Bresser
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Measurement system and method for generating a trigger signal for a...
Patent number
11,422,160
Issue date
Aug 23, 2022
Rohde & Schwarz GmbH & Co. KG
Wolfgang Herbordt
G01 - MEASURING TESTING
Information
Patent Grant
Method for operating an oscilloscope as well as oscilloscope
Patent number
11,415,602
Issue date
Aug 16, 2022
Rohde & Schwarz GmbH & Co. KG
Andrew Schaefer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for analyzing a measured signal and oscilloscope
Patent number
11,378,592
Issue date
Jul 5, 2022
Rohde & Schwarz GmbH & Co. KG
Sven Barthel
G01 - MEASURING TESTING
Information
Patent Grant
Measuring device and measuring method with selective storage of dat...
Patent number
11,255,879
Issue date
Feb 22, 2022
Rohde & Schwarz GmbH & Co. KG
Thomas Guenther
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Trigger method and measurement device comprising a corresponding tr...
Patent number
11,249,114
Issue date
Feb 15, 2022
Rohde & Schwarz GmbH & Co. KG
Bendix Koopmann
G01 - MEASURING TESTING
Information
Patent Grant
Sampling oscilloscope, trigger generation method, and sampling method
Patent number
11,193,956
Issue date
Dec 7, 2021
Anritsu Corporation
Takashi Murakami
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Oscilloscope and method for operating an oscilloscope
Patent number
11,187,726
Issue date
Nov 30, 2021
Rohde & Schwarz GmbH & Co. KG
Oliver Landolt
G01 - MEASURING TESTING
Information
Patent Grant
Calibration for test and measurement instrument including asynchron...
Patent number
11,041,884
Issue date
Jun 22, 2021
Tektronix, Inc.
Daniel G. Knierim
G01 - MEASURING TESTING
Information
Patent Grant
Multi-channel triggering apparatus and method
Patent number
11,016,123
Issue date
May 25, 2021
Keysight Technologies, Inc.
Andrew Robert Lehane
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
NOISE MARGIN MEASUREMENT OF A REPEATING SIGNAL UNDER TEST (SUT)
Publication number
20250138074
Publication date
May 1, 2025
KEYSIGHT TECHNOLOGIES, INC.
David Leyba
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS, APPARATUSES, AND METHODS FOR ON CHIP DYNAMIC IR DROP OSCIL...
Publication number
20250052788
Publication date
Feb 13, 2025
STMicroelectronics International N.V.
Deepak Kumar ARORA
G11 - INFORMATION STORAGE
Information
Patent Application
MULTIPLE PULSE EXTRACTION FOR TRANSMITTER CALIBRATION
Publication number
20250004014
Publication date
Jan 2, 2025
Tektronix, Inc.
Kan Tan
G01 - MEASURING TESTING
Information
Patent Application
TEST AND MEASUREMENT INSTRUMENT THAT USES MEASUREMENT PRECONDITIONS...
Publication number
20240288474
Publication date
Aug 29, 2024
Tektronix, Inc.
David C. Vollum
G01 - MEASURING TESTING
Information
Patent Application
ELECTRICAL SIGNAL SAMPLING DEVICE
Publication number
20240230719
Publication date
Jul 11, 2024
RIGOL TECHNOLOGIES CO., LTD.
Hui SHI
G01 - MEASURING TESTING
Information
Patent Application
ELECTRICAL SIGNAL SAMPLING DEVICE
Publication number
20240133922
Publication date
Apr 25, 2024
RIGOL TECHNOLOGIES CO., LTD.
Hui SHI
G01 - MEASURING TESTING
Information
Patent Application
ADAPTIVE INSTRUMENT NOISE REMOVAL
Publication number
20240125837
Publication date
Apr 18, 2024
Tektronix, Inc.
Kan Tan
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR CONTINUOUS RECORDING AND CONTROLLABLE PLAYBACK OF INPUT...
Publication number
20240080251
Publication date
Mar 7, 2024
Tektronix, Inc.
Shane L. Arnold
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CONTINUOUS ACQUISITION IN A TEST AND MEASUREMENT INSTRUMENT
Publication number
20240027498
Publication date
Jan 25, 2024
Tektronix, Inc.
Ronald Allan Brown
G01 - MEASURING TESTING
Information
Patent Application
MULTI-CHANNEL SPECTRUM ANALYZER WITH MULTI-CHANNEL ANALOG-DIGITAL-C...
Publication number
20230417799
Publication date
Dec 28, 2023
VIAVI SOLUTIONS INC.
Chang-Hyun PARK
G01 - MEASURING TESTING
Information
Patent Application
OSCILLOSCOPE HAVING A PRINCIPAL COMPONENT ANALYZER
Publication number
20230408551
Publication date
Dec 21, 2023
Tektronix, Inc.
Justin E. Patterson
G01 - MEASURING TESTING
Information
Patent Application
OSCILLOSCOPE POST PROCESSING SYSTEM, METHOD AND MEASUREMENT DEVICE
Publication number
20230358788
Publication date
Nov 9, 2023
Rohde& Schwarz GmbH & Co. KG
Wolfgang Herbordt
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR WAVEFORM SEARCHING BY EXAMPLE
Publication number
20230333148
Publication date
Oct 19, 2023
Tektronix, Inc.
Lance H. Forsberg
G01 - MEASURING TESTING
Information
Patent Application
WAVEFORM DISPLAY DEVICE
Publication number
20230324877
Publication date
Oct 12, 2023
FANUC CORPORATION
Junichi TEZUKA
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT INSTRUMENT HAVING TIME, FREQUENCY AND LOGIC DOMAIN CHAN...
Publication number
20230280382
Publication date
Sep 7, 2023
KEYSIGHT TECHNOLOGIES, INC.
Ken A. Nishimura
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT DEVICE AND METHOD
Publication number
20230266367
Publication date
Aug 24, 2023
Rohde& Schwarz GmbH & Co. KG
Philip Diegmann
G01 - MEASURING TESTING
Information
Patent Application
SEAMLESS SPECTROGRAMS IN A MULTI-CHANNEL TEST AND MEASUREMENT INSTR...
Publication number
20230258692
Publication date
Aug 17, 2023
Tektronix, Inc.
Gary J. WALDO
G01 - MEASURING TESTING
Information
Patent Application
OSCILLOSCOPE AND SIGNAL ANALYSIS METHOD
Publication number
20220397589
Publication date
Dec 15, 2022
ROHDE & SCHWARZ GMBH & CO. KG
Manuel Stein
G01 - MEASURING TESTING
Information
Patent Application
Voltage Monitoring Circuit for Interface
Publication number
20220397604
Publication date
Dec 15, 2022
Apple Inc.
Fabien S. Faure
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEASUREMENT INSTRUMENT AND METHOD FOR ACQUIRING AN INPUT SIGNAL
Publication number
20220357363
Publication date
Nov 10, 2022
ROHDE & SCHWARZ GMBH & CO. KG
Andrew Schaefer
G01 - MEASURING TESTING
Information
Patent Application
CYCLIC LOOP IMAGE REPRESENTATION FOR WAVEFORM DATA
Publication number
20210389349
Publication date
Dec 16, 2021
Tektronix, Inc.
John J. Pickerd
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT SYSTEM AND METHOD OF OPERATING A MEASUREMENT SYSTEM
Publication number
20210382089
Publication date
Dec 9, 2021
ROHDE & SCHWARZ GMBH & CO. KG
Christian Benisch
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR CONDITION MONITORING
Publication number
20210293666
Publication date
Sep 23, 2021
Green Running Limited
Raza Rizvi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IDENTIFYING ONE OR MORE ACQUISITIONS OF INTEREST USING VISUAL QUALI...
Publication number
20210278441
Publication date
Sep 9, 2021
Tektronix, Inc.
Gary J. Waldo
G01 - MEASURING TESTING
Information
Patent Application
WEARABLE SYSTEM FOR CAPTURING AND TRANSMITTING BIOMEDICAL SIGNALS
Publication number
20210169426
Publication date
Jun 10, 2021
QUALCOMM Incorporated
Harinath GARUDADRI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND APPARATUS FOR CONTROLLING A MEASUREMENT DEVICE
Publication number
20210109130
Publication date
Apr 15, 2021
Rohde& Schwarz GmbH & Co. KG
Sven Barthel
G01 - MEASURING TESTING
Information
Patent Application
SPUR DETECTION IN A SAMPLED WAVEFORM IN A MIXED ANALOG/DIGITAL SYST...
Publication number
20210102977
Publication date
Apr 8, 2021
International Business Machines Corporation
TIMOTHY LINDQUIST
G01 - MEASURING TESTING
Information
Patent Application
SPUR DETECTION IN A SAMPLED WAVEFORM IN A MIXED ANALOG/DIGITAL SYST...
Publication number
20210102976
Publication date
Apr 8, 2021
International Business Machines Corporation
TIMOTHY LINDQUIST
G01 - MEASURING TESTING
Information
Patent Application
TRIGGER METHOD AND MEASUREMENT DEVICE COMPRISING A CORRESPONDING TR...
Publication number
20210018535
Publication date
Jan 21, 2021
ROHDE & SCHWARZ GMBH & CO. KG
Bendix KOOPMANN
G01 - MEASURING TESTING
Information
Patent Application
PATTERN ACQUISITIONS IN EQUIVALENT TIME SAMPLING SYSTEMS
Publication number
20200386791
Publication date
Dec 10, 2020
Tektronix, Inc.
Noah Brummer
G01 - MEASURING TESTING