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G11C29/4401

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GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

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G11C29/4401for self repair

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Storing memory array operational information in non-volatile subarrays
- Patent number 12,158,826
- Issue date Dec 3, 2024
- Micron Technology, Inc.
- Christopher John Kawamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Built-in memory tests for aircraft processing systems
- Patent number 12,154,642
- Issue date Nov 26, 2024
- Hamilton Sundstrand Corporation
- Christopher Brian Noll
- G11 - INFORMATION STORAGE
Information Patent Grant
Detect whether die or channel is defective to confirm temperature data
- Patent number 12,148,495
- Issue date Nov 19, 2024
- Micron Technology, Inc.
- Venkata Naga Lakshman Pasala
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory devices and methods of operating semiconductor...
- Patent number 12,136,463
- Issue date Nov 5, 2024
- Samsung Electronics Co., Ltd.
- Kiheung Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor system including semiconductor device for performing...
- Patent number 12,131,791
- Issue date Oct 29, 2024
- SK Hynix Inc.
- Byung Goo Cho
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus for determining memory cell data states
- Patent number 12,112,819
- Issue date Oct 8, 2024
- Micron Technology, Inc.
- Sheyang Ning
- G11 - INFORMATION STORAGE
Information Patent Grant
Test method, computer apparatus, and computer-readable storage medium
- Patent number 12,112,817
- Issue date Oct 8, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Biao Song
- G11 - INFORMATION STORAGE
Information Patent Grant
Single event effect mitigation with smart-redundancy
- Patent number 12,112,820
- Issue date Oct 8, 2024
- University of Utah Research Foundation
- Aurelien Alacchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Read destructive memory wear leveling system
- Patent number 12,112,821
- Issue date Oct 8, 2024
- Seagate Technology LLC
- Jon D. Trantham
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory repair method and apparatus based on error code tracking
- Patent number 12,111,723
- Issue date Oct 8, 2024
- RAMBUS INC.
- Frederick A. Ware
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Repairable latch array
- Patent number 12,100,464
- Issue date Sep 24, 2024
- Advanced Micro Devices, Inc.
- Joel Thornton Irby
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and methods for testing redundant fuse latches in a memory...
- Patent number 12,100,467
- Issue date Sep 24, 2024
- Micron Technology, Inc.
- Yoshinori Fujiwara
- G11 - INFORMATION STORAGE
Information Patent Grant
Virtualized scan chain testing in a random access memory (RAM) array
- Patent number 12,087,383
- Issue date Sep 10, 2024
- Ampere Computing LLC
- David Hoff
- G11 - INFORMATION STORAGE
Information Patent Grant
Performing data integrity checks to identify defective wordlines
- Patent number 12,062,394
- Issue date Aug 13, 2024
- Micron Technology, Inc.
- Jian Huang
- G11 - INFORMATION STORAGE
Information Patent Grant
Multi-level cell data encoding
- Patent number 12,057,182
- Issue date Aug 6, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Win-San Khwa
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory systems having memory devices therein with enhanced error co...
- Patent number 12,057,184
- Issue date Aug 6, 2024
- Samsung Electronics Co., Ltd.
- Sunghye Cho
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory system and data processing system including the same
- Patent number 12,056,027
- Issue date Aug 6, 2024
- SK Hynix Inc.
- Eung-Bo Shim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Non-volatile memory with autonomous cycling
- Patent number 12,040,031
- Issue date Jul 16, 2024
- Western Digital Technologies, Inc.
- Liang Li
- G11 - INFORMATION STORAGE
Information Patent Grant
Buffer circuit with adaptive repair capability
- Patent number 12,040,035
- Issue date Jul 16, 2024
- RAMBUS INC.
- Scott C. Best
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic memory device
- Patent number 12,040,036
- Issue date Jul 16, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chia-Hsiang Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Interrupting a memory built-in self-test
- Patent number 12,040,037
- Issue date Jul 16, 2024
- Micron Technology, Inc.
- Scott E. Schaefer
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and device for generating command sequence, method and devic...
- Patent number 12,040,030
- Issue date Jul 16, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yu Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Control logic assemblies
- Patent number 12,040,041
- Issue date Jul 16, 2024
- Micron Technology, Inc.
- Kurt D. Beigel
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in memory repair with repair code compression
- Patent number 12,033,711
- Issue date Jul 9, 2024
- Texas Instruments Incorporated
- Devanathan Varadarajan
- G11 - INFORMATION STORAGE
Information Patent Grant
Method, device, apparatus and storage medium for repairing failed bits
- Patent number 12,027,223
- Issue date Jul 2, 2024
- Changxin Memory Technologies, Inc.
- Yui-Lang Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Authenticity and yield by reading defective cells
- Patent number 12,027,224
- Issue date Jul 2, 2024
- International Business Machines Corporation
- Julien Frougier
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory fault handling method and apparatus, device, and storage medium
- Patent number 12,014,791
- Issue date Jun 18, 2024
- Huawei Technologies Co., Ltd.
- Guangyi Qiao
- G11 - INFORMATION STORAGE
Information Patent Grant
Monitoring and adjusting access operations at a memory device
- Patent number 12,014,792
- Issue date Jun 18, 2024
- Micron Technology, Inc.
- Mark D. Ingram
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Management of multiple memory in-field self-repair options
- Patent number 12,009,045
- Issue date Jun 11, 2024
- Texas Instruments Incorporated
- Devanathan Varadarajan
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for detecting errors in a memory device
- Patent number 12,009,041
- Issue date Jun 11, 2024
- ARM Limited
- Siddharth Gupta
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
HYBRID MEMORY SYSTEM WITH CONFIGURABLE ERROR THRESHOLDS AND FAILURE...
- Publication number 20240419557
- Publication date Dec 19, 2024
- Netlist, Inc.
- Scott H. Milton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BUFFER CIRCUIT WITH ADAPTIVE REPAIR CAPABILITY
- Publication number 20240420793
- Publication date Dec 19, 2024
- Rambus Inc.
- Scott C. Best
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR TESTING AND REPAIRING MEMORY DEVICE
- Publication number 20240379183
- Publication date Nov 14, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Po-Hao Lee
- G11 - INFORMATION STORAGE
Information Patent Application
MULTI-LEVEL CELL DATA ENCODING
- Publication number 20240363184
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Win-San KHWA
- G11 - INFORMATION STORAGE
Information Patent Application
TECHNIQUES FOR RETIRING BLOCKS OF A MEMORY SYSTEM
- Publication number 20240363185
- Publication date Oct 31, 2024
- Micron Technology, Inc.
- Deping He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY SYSTEM AND DATA PROCESSING SYSTEM INCLUDING THE SAME
- Publication number 20240354210
- Publication date Oct 24, 2024
- SK HYNIX INC.
- Eung-Bo SHIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTENT ADDRESSABLE MEMORY AND CONTENT ADDRESSABLE MEMORY CELL
- Publication number 20240355408
- Publication date Oct 24, 2024
- Faraday Technology Corp.
- Yi-Hsin Tseng
- G11 - INFORMATION STORAGE
Information Patent Application
PERFORMING DATA INTEGRITY CHECKS TO IDENTIFY DEFECTIVE WORDLINES
- Publication number 20240347110
- Publication date Oct 17, 2024
- Micron Technology, Inc.
- Jian Huang
- G11 - INFORMATION STORAGE
Information Patent Application
CENTRALIZED ERROR CORRECTION CIRCUIT
- Publication number 20240347123
- Publication date Oct 17, 2024
- Micron Technology, Inc.
- Taeksang Song
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SYSTEMS HAVING MEMORY DEVICES THEREIN WITH ENHANCED ERROR CO...
- Publication number 20240339168
- Publication date Oct 10, 2024
- Samsung Electronics Co., Ltd.
- Sunghye Cho
- G11 - INFORMATION STORAGE
Information Patent Application
INTERRUPTING A MEMORY BUILT-IN SELF-TEST
- Publication number 20240339170
- Publication date Oct 10, 2024
- Micron Technology, Inc.
- Scott E. Schaefer
- G11 - INFORMATION STORAGE
Information Patent Application
Magnetic Memory Device
- Publication number 20240331796
- Publication date Oct 3, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Hsiang CHEN
- G11 - INFORMATION STORAGE
Information Patent Application
BUILT-IN MEMORY REPAIR WITH REPAIR CODE COMPRESSION
- Publication number 20240321378
- Publication date Sep 26, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Devanathan VARADARAJAN
- G11 - INFORMATION STORAGE
Information Patent Application
TOPOLOGY-BASED RETIREMENT IN A MEMORY SYSTEM
- Publication number 20240290411
- Publication date Aug 29, 2024
- Micron Technology, Inc.
- Chun S. Yeung
- G11 - INFORMATION STORAGE
Information Patent Application
ENABLING OR DISABLING ON-DIE ERROR-CORRECTING CODE FOR A MEMORY BUI...
- Publication number 20240274216
- Publication date Aug 15, 2024
- Micron Technology, Inc.
- Scott E. Schaefer
- G11 - INFORMATION STORAGE
Information Patent Application
BIT RETIRING TO MITIGATE BIT ERRORS
- Publication number 20240265991
- Publication date Aug 8, 2024
- Micron Technology, Inc.
- Scott E. Schaefer
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SYSTEM AND OPERATION METHOD OF MEMORY SYSTEM
- Publication number 20240257894
- Publication date Aug 1, 2024
- SK HYNIX INC.
- Chul Moon JUNG
- G11 - INFORMATION STORAGE
Information Patent Application
INTEGRATED CIRCUIT CHIP AND DIE TEST WITHOUT CELL ARRAY
- Publication number 20240257897
- Publication date Aug 1, 2024
- SK HYNIX INC.
- Ji-Hwan KIM
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SYSTEM AND OPERATION METHOD OF MEMORY SYSTEM
- Publication number 20240257895
- Publication date Aug 1, 2024
- SK HYNIX INC.
- Chul Moon JUNG
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEM AND METHOD FOR EXTENDING LIFETIME OF MEMORY DEVICE
- Publication number 20240249792
- Publication date Jul 25, 2024
- Taiwan Semiconductor Manufacturing Company Limited
- Yung-Huei Lee
- G11 - INFORMATION STORAGE
Information Patent Application
Memory Repair Device
- Publication number 20240233853
- Publication date Jul 11, 2024
- Magnachip Semiconductor, Ltd.
- Jun Soo KWACK
- G11 - INFORMATION STORAGE
Information Patent Application
Logical Memory Repair with a Shared Physical Memory
- Publication number 20240203517
- Publication date Jun 20, 2024
- Google LLC
- Wilson Pradeep
- G11 - INFORMATION STORAGE
Information Patent Application
READ COMMAND FAULT DETECTION IN A MEMORY SYSTEM
- Publication number 20240161854
- Publication date May 16, 2024
- Micron Technology, Inc.
- Melissa I. Uribe
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY WITH ERROR CHECKING AND CORRECTING UNIT
- Publication number 20240145022
- Publication date May 2, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Weibing SHANG
- G11 - INFORMATION STORAGE
Information Patent Application
Memory Repair Device
- Publication number 20240136007
- Publication date Apr 25, 2024
- Magnachip Semiconductor, Ltd.
- Jun Soo KWACK
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR MEMORY STORAGE AND ACCESS
- Publication number 20240126640
- Publication date Apr 18, 2024
- INFINEON TECHNOLOGIES AG
- Thomas Kern
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INDICATING A STATUS OF A MEMORY BUILT-IN SELF-TEST
- Publication number 20240127902
- Publication date Apr 18, 2024
- Micron Technology, Inc.
- Scott E. Schaefer
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY REPAIR METHOD AND APPARATUS BASED ON ERROR CODE TRACKING
- Publication number 20240111625
- Publication date Apr 4, 2024
- Rambus Inc.
- Frederick A. Ware
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WEIGHTED WEAR LEVELING FOR IMPROVING UNIFORMITY
- Publication number 20240096433
- Publication date Mar 21, 2024
- Micron Technology, Inc.
- Zhongyuan Lu
- G11 - INFORMATION STORAGE
Information Patent Application
READ-ONLY MEMORY DIAGNOSIS AND REPAIR
- Publication number 20240087665
- Publication date Mar 14, 2024
- Siemens Industry Software Inc.
- Benoit Nadeau-Dostie
- G11 - INFORMATION STORAGE

for self repair

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Storing memory array operational information in non-volatile subarrays

Built-in memory tests for aircraft processing systems

Detect whether die or channel is defective to confirm temperature data

Semiconductor memory devices and methods of operating semiconductor...

Semiconductor system including semiconductor device for performing...

Apparatus for determining memory cell data states

Test method, computer apparatus, and computer-readable storage medium

Single event effect mitigation with smart-redundancy

Read destructive memory wear leveling system

Memory repair method and apparatus based on error code tracking

Repairable latch array

Systems and methods for testing redundant fuse latches in a memory...

Virtualized scan chain testing in a random access memory (RAM) array

Performing data integrity checks to identify defective wordlines

Multi-level cell data encoding

Memory systems having memory devices therein with enhanced error co...

Memory system and data processing system including the same

Non-volatile memory with autonomous cycling

Buffer circuit with adaptive repair capability

Magnetic memory device

Interrupting a memory built-in self-test

Method and device for generating command sequence, method and devic...

Control logic assemblies

Built-in memory repair with repair code compression

Method, device, apparatus and storage medium for repairing failed bits

Authenticity and yield by reading defective cells

Memory fault handling method and apparatus, device, and storage medium

Monitoring and adjusting access operations at a memory device

Management of multiple memory in-field self-repair options

Apparatus and method for detecting errors in a memory device

Patents Applicationslast 30 patents

HYBRID MEMORY SYSTEM WITH CONFIGURABLE ERROR THRESHOLDS AND FAILURE...

BUFFER CIRCUIT WITH ADAPTIVE REPAIR CAPABILITY

METHOD FOR TESTING AND REPAIRING MEMORY DEVICE

MULTI-LEVEL CELL DATA ENCODING

TECHNIQUES FOR RETIRING BLOCKS OF A MEMORY SYSTEM

MEMORY SYSTEM AND DATA PROCESSING SYSTEM INCLUDING THE SAME

CONTENT ADDRESSABLE MEMORY AND CONTENT ADDRESSABLE MEMORY CELL

PERFORMING DATA INTEGRITY CHECKS TO IDENTIFY DEFECTIVE WORDLINES

CENTRALIZED ERROR CORRECTION CIRCUIT

MEMORY SYSTEMS HAVING MEMORY DEVICES THEREIN WITH ENHANCED ERROR CO...

INTERRUPTING A MEMORY BUILT-IN SELF-TEST

Magnetic Memory Device

BUILT-IN MEMORY REPAIR WITH REPAIR CODE COMPRESSION

TOPOLOGY-BASED RETIREMENT IN A MEMORY SYSTEM

ENABLING OR DISABLING ON-DIE ERROR-CORRECTING CODE FOR A MEMORY BUI...

BIT RETIRING TO MITIGATE BIT ERRORS

MEMORY SYSTEM AND OPERATION METHOD OF MEMORY SYSTEM

INTEGRATED CIRCUIT CHIP AND DIE TEST WITHOUT CELL ARRAY

MEMORY SYSTEM AND OPERATION METHOD OF MEMORY SYSTEM

SYSTEM AND METHOD FOR EXTENDING LIFETIME OF MEMORY DEVICE

Memory Repair Device

Logical Memory Repair with a Shared Physical Memory

READ COMMAND FAULT DETECTION IN A MEMORY SYSTEM

MEMORY WITH ERROR CHECKING AND CORRECTING UNIT

Memory Repair Device

METHOD FOR MEMORY STORAGE AND ACCESS

INDICATING A STATUS OF A MEMORY BUILT-IN SELF-TEST

MEMORY REPAIR METHOD AND APPARATUS BASED ON ERROR CODE TRACKING

WEIGHTED WEAR LEVELING FOR IMPROVING UNIFORMITY

READ-ONLY MEMORY DIAGNOSIS AND REPAIR