for solder coating, coverage

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G01N2021/95669

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

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G01N2021/95669for solder coating, coverage

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Patents Grantslast 30 patents

Information Patent Grant
Measurement machine and method for detecting a defect in solder joints
- Patent number 11,927,436
- Issue date Mar 12, 2024
- Hewlett Packard Enterprise Development LP
- Jaime E. Llinas
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting fused plastic pipes
- Patent number 11,448,604
- Issue date Sep 20, 2022
- WorldWide Nondestructive Testing, Inc.
- Kevin P. Bohne
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method of generating control parameter of screen printer
- Patent number 11,379,639
- Issue date Jul 5, 2022
- Koh Young Technology Inc.
- Duk Young Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing device, method for controlling same, program, and...
- Patent number 9,752,994
- Issue date Sep 5, 2017
- Omron Corporation
- Takeshi Kojima
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting potentially interfering features in a machine vision system
- Patent number 8,269,830
- Issue date Sep 18, 2012
- Mitutoyo Corporation
- Mark Lawrence Delaney
- G01 - MEASURING TESTING
Information Patent Grant
Method of setting reference data for inspection of fillets and insp...
- Patent number 7,961,933
- Issue date Jun 14, 2011
- Omron Corporation
- Yoshiki Fujii
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Visual inspection method and visual inspection apparatus
- Patent number 7,664,306
- Issue date Feb 16, 2010
- NEC Electronics Corporation
- Yoshihiro Sasaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Visual inspection method and visual inspection apparatus
- Patent number 7,545,970
- Issue date Jun 9, 2009
- NEC Electronics Corporation
- Yoshihiro Sasaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for detecting defects in printed solder paste
- Patent number 7,149,344
- Issue date Dec 12, 2006
- Speedline Technologies, Inc.
- David P. Prince
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Optical inspection system
- Patent number 7,075,565
- Issue date Jul 11, 2006
- Landrex Technologies Co., Ltd.
- Douglas W. Raymond
- G01 - MEASURING TESTING
Information Patent Grant
Visual inspection method and visual inspection apparatus
- Patent number 6,950,549
- Issue date Sep 27, 2005
- NEC Electronics Corporation
- Yoshihiro Sasaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for detecting defects in printed solder paste
- Patent number 6,891,967
- Issue date May 10, 2005
- Speedline Technologies, Inc.
- David P. Prince
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Lighting arrangement for automated optical inspection system
- Patent number 6,850,637
- Issue date Feb 1, 2005
- Teradyne, Inc.
- John B. Burnett
- G01 - MEASURING TESTING
Information Patent Grant
Optical system
- Patent number 6,552,783
- Issue date Apr 22, 2003
- Teradyne, Inc.
- Peter E. Schmidt
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining solder quality
- Patent number 5,157,463
- Issue date Oct 20, 1992
- Texas Instruments Incorporated
- Mark D. Brown
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IMAGE PROCESSING DEVICE, METHOD FOR CONTROLLING SAME, PROGRAM, AND...
- Publication number 20140372075
- Publication date Dec 18, 2014
- Takeshi KOJIMA
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL SHAPE MEASUREMENT APPARATUS AND THREE-DIMENSIONAL...
- Publication number 20120218562
- Publication date Aug 30, 2012
- Omron Corporation
- Hirotaka OGINO
- G01 - MEASURING TESTING
Information Patent Application
INSPECTING APPARATUS
- Publication number 20100021050
- Publication date Jan 28, 2010
- I-PULSE KABUSHIKI KAISHA
- Yoshihisa Kakuda
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
VISUAL INSPECTION METHOD AND VISUAL INSPECTION APPARATUS
- Publication number 20090202141
- Publication date Aug 13, 2009
- NEC ELECTRONICS CORPORATION
- Yoshihiro SASAKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Light Source Device for Components Inspection
- Publication number 20080212318
- Publication date Sep 4, 2008
- Jin Feng Wang
- G01 - MEASURING TESTING
Information Patent Application
Method of setting reference data for inspection of fillets and insp...
- Publication number 20080040058
- Publication date Feb 14, 2008
- OMRON CORPORATION
- Yoshiki Fujii
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Production of test patterns for test inspection
- Publication number 20070053577
- Publication date Mar 8, 2007
- Karl Schanz
- G01 - MEASURING TESTING
Information Patent Application
Visual inspection method and visual inspection apparatus
- Publication number 20050276463
- Publication date Dec 15, 2005
- NEC ELECTRONICS CORPORATION
- Yoshihiro Sasaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems and methods for detecting defects in printed solder paste
- Publication number 20050169514
- Publication date Aug 4, 2005
- Speedline Technologies, Inc.
- David P. Prince
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Automatic optical inspection of components using a shadow projectio...
- Publication number 20050162651
- Publication date Jul 28, 2005
- Seagate Technology LLC
- Ching Tong Sim
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for detecting defects in printed solder paste
- Publication number 20040175030
- Publication date Sep 9, 2004
- David P. Prince
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Golden unit
- Publication number 20030183948
- Publication date Oct 2, 2003
- Yew Fei Tham
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Visual inspection method and visual inspection apparatus
- Publication number 20020110271
- Publication date Aug 15, 2002
- NEC Corporation
- Yoshihiro Sasaki
- G01 - MEASURING TESTING
Information Patent Application
Multi-modal soldering inspection system
- Publication number 20020040922
- Publication date Apr 11, 2002
- Shigeki Kobayashi
- G01 - MEASURING TESTING

for solder coating, coverage

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Measurement machine and method for detecting a defect in solder joints

System and method for inspecting fused plastic pipes

Apparatus and method of generating control parameter of screen printer

Image processing device, method for controlling same, program, and...

Inspecting potentially interfering features in a machine vision system

Method of setting reference data for inspection of fillets and insp...

Visual inspection method and visual inspection apparatus

Visual inspection method and visual inspection apparatus

Systems and methods for detecting defects in printed solder paste

Optical inspection system

Visual inspection method and visual inspection apparatus

Systems and methods for detecting defects in printed solder paste

Lighting arrangement for automated optical inspection system

Optical system

Method for determining solder quality

Patents Applicationslast 30 patents

IMAGE PROCESSING DEVICE, METHOD FOR CONTROLLING SAME, PROGRAM, AND...

THREE-DIMENSIONAL SHAPE MEASUREMENT APPARATUS AND THREE-DIMENSIONAL...

INSPECTING APPARATUS

VISUAL INSPECTION METHOD AND VISUAL INSPECTION APPARATUS

Light Source Device for Components Inspection

Method of setting reference data for inspection of fillets and insp...

Production of test patterns for test inspection

Visual inspection method and visual inspection apparatus

Systems and methods for detecting defects in printed solder paste

Automatic optical inspection of components using a shadow projectio...

Systems and methods for detecting defects in printed solder paste

Golden unit

Visual inspection method and visual inspection apparatus

Multi-modal soldering inspection system