for testing lamps or other light sources

Industry

CPC
G01J2001/4247

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

Current Industry

G01J2001/4247for testing lamps or other light sources

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Laser illumination techniques for capillary electrophoresis
- Patent number 12,019,046
- Issue date Jun 25, 2024
- PROMEGA CORPORATION
- Sergey Lazarev
- G02 - OPTICS
Information Patent Grant
Optical module
- Patent number 11,988,553
- Issue date May 21, 2024
- Advanced Semiconductor Engineering, Inc.
- Kuo Sin Huang
- G01 - MEASURING TESTING
Information Patent Grant
See-through metrology systems, apparatus, and methods for optical d...
- Patent number 11,978,196
- Issue date May 7, 2024
- Yangyang Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Display device and optical inspection method for the same
- Patent number 11,963,394
- Issue date Apr 16, 2024
- Samsung Display Co., Ltd.
- Hee Young Lee
- G01 - MEASURING TESTING
Information Patent Grant
Method for photometric characterization of the optical radiation ch...
- Patent number 11,927,477
- Issue date Mar 12, 2024
- TechnoTeam Holding GmbH
- Klaus Trampert
- G01 - MEASURING TESTING
Information Patent Grant
Display device and optical inspection method for the same
- Patent number 11,812,637
- Issue date Nov 7, 2023
- Samsung Display Co., Ltd.
- Hee Young Lee
- G01 - MEASURING TESTING
Information Patent Grant
Light diagnostics and monitoring using wearables
- Patent number 11,761,618
- Issue date Sep 19, 2023
- EATON INTELLIGENT POWER LIMITED
- Stewart Parfitt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
See-through metrology systems, apparatus, and methods for optical d...
- Patent number 11,748,875
- Issue date Sep 5, 2023
- Applied Materials, Inc.
- Yangyang Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical instrument and method for determining a wavelength of light...
- Patent number 11,686,959
- Issue date Jun 27, 2023
- Rockley Photonics Limited
- Trevor Fowler
- G02 - OPTICS
Information Patent Grant
Adaptive and optimal imaging of quantum optical systems for quantum...
- Patent number 11,681,322
- Issue date Jun 20, 2023
- University of Maryland, College Park
- Christopher Monroe
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Electronic device and method for controlling a sensor, based on a s...
- Patent number 11,614,358
- Issue date Mar 28, 2023
- Samsung Electronics Co., Ltd.
- Hee Woong Yoon
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Predicting spherical irradiance for volume disinfection
- Patent number 11,590,252
- Issue date Feb 28, 2023
- Ian Edward Ashdown
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for detecting variation value
- Patent number 11,486,765
- Issue date Nov 1, 2022
- HKC CORPORATION LIMITED
- Beizhou Huang
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for detecting the sparkle effect of a transparent...
- Patent number 11,467,435
- Issue date Oct 11, 2022
- C. R. F. Societa Consortile per Azioni
- Fabio Scaffidi Muta
- G01 - MEASURING TESTING
Information Patent Grant
Light-source characterizer and associated methods
- Patent number 11,463,675
- Issue date Oct 4, 2022
- JENOPTIK OPTICAL SYSTEMS, LLC
- Marc D. Himel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Enzyme-dependent fluorescence recovery of NADH after photobleaching...
- Patent number 11,445,950
- Issue date Sep 20, 2022
- The George Washington University
- Matthew Kay
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Photoelectric conversion device
- Patent number 11,402,262
- Issue date Aug 2, 2022
- Kaneka Corporation
- Kunta Yoshikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for predicting performance of a measurement m...
- Patent number 11,391,677
- Issue date Jul 19, 2022
- ASML Netherlands B.V.
- Stefan Michiel Witte
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for characterizing power in a high-power laser
- Patent number 11,385,098
- Issue date Jul 12, 2022
- Board of Trustees of Michigan State University
- Marcos Dantus
- G01 - MEASURING TESTING
Information Patent Grant
Time of flight sensor with light baffle system and method
- Patent number 11,378,657
- Issue date Jul 5, 2022
- DATALOGIC IP TECH, S.R.L.
- Marco Gnan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Automotive lamp
- Patent number 11,338,723
- Issue date May 24, 2022
- Koito Manufacturing Co., Ltd.
- Yoshinori Shibata
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Power-measuring protection method and laser protection system
- Patent number 11,283,232
- Issue date Mar 22, 2022
- Industrial Technology Research Institute
- Chih-Chun Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for light-to-frequency conversion and light-to-frequency con...
- Patent number 11,268,852
- Issue date Mar 8, 2022
- ams International AG
- Rohit Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatuses for identifying and controlling quantum emi...
- Patent number 11,262,785
- Issue date Mar 1, 2022
- University of Maryland, College Park
- Christopher Monroe
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and device for calibrating a light source of a medical device
- Patent number 11,221,251
- Issue date Jan 11, 2022
- OMICRON-LASERAGE LASERPRODUKTE GMBH
- Dieter Dinges
- G01 - MEASURING TESTING
Information Patent Grant
Laser detection system
- Patent number 11,169,030
- Issue date Nov 9, 2021
- Aston University
- David Benton
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device and method for controlling an ambient light senso...
- Patent number 11,125,610
- Issue date Sep 21, 2021
- Samsung Electronics Co., Ltd.
- Hee Woong Yoon
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and method for measuring a response time of a li...
- Patent number 11,100,828
- Issue date Aug 24, 2021
- Realtek Semiconductor Corp.
- Yung-Chih Chen
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Display device
- Patent number 11,069,754
- Issue date Jul 20, 2021
- TIANMA MICROELECTRONICS CO., LTD.
- Hitoshi Yoshida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for testing optical outputs
- Patent number 11,067,437
- Issue date Jul 20, 2021
- FEASA ENTERPRISES UMSTED
- Eamonn O'Toole
- B60 - VEHICLES IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
LASER PROCESSING APPARATUS INCLUDING BEAM ANALYSIS SYSTEM AND METHO...
- Publication number 20240286217
- Publication date Aug 29, 2024
- ELECTRO SCIENTIFIC INDUSTRIES, INC.
- Joe HASTY
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHODS, SYSTEMS, AND APPARATUS FOR MONITORING RADIATION OUTPUT OF...
- Publication number 20240234073
- Publication date Jul 11, 2024
- Applied Materials, Inc.
- Zhepeng CONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LUMINOUS FLUX TEST CIRCUITRY, TEST METHOD AND DISPLAY PANEL
- Publication number 20240230403
- Publication date Jul 11, 2024
- BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Yifan SONG
- G01 - MEASURING TESTING
Information Patent Application
TESTING METHOD AND CONTROLLER FOR CONTROLLING TESTING METHOD
- Publication number 20240237179
- Publication date Jul 11, 2024
- SCHREDER S.A.
- Laurent Secretin
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
ADAPTIVE AND OPTIMAL IMAGING OF QUANTUM OPTICAL SYSTEMS FOR QUANTUM...
- Publication number 20240219951
- Publication date Jul 4, 2024
- University of Maryland, College Park
- Christopher MONROE
- B82 - NANO-TECHNOLOGY
Information Patent Application
TESTING METHOD AND CONTROLLER FOR CONTROLLING TESTING METHOD
- Publication number 20240138044
- Publication date Apr 25, 2024
- SCHREDER S.A.
- Laurent Secretin
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHODS, SYSTEMS, AND APPARATUS FOR MONITORING RADIATION OUTPUT OF...
- Publication number 20240136140
- Publication date Apr 25, 2024
- Applied Materials, Inc.
- Zhepeng CONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETERMINING THE OPERATING STATE OF A LIGHT-EMITTING IMPLANT
- Publication number 20240110828
- Publication date Apr 4, 2024
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Pierre BLEUET
- G01 - MEASURING TESTING
Information Patent Application
CONNECTING A MACHINE
- Publication number 20240106898
- Publication date Mar 28, 2024
- Talenco B.V.
- GERRY BRUYNS
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
OPTICAL MODULE
- Publication number 20240094052
- Publication date Mar 21, 2024
- Advanced Semiconductor Engineering, Inc.
- Kuo Sin HUANG
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR CHARACTERIZING FLICKER
- Publication number 20240027263
- Publication date Jan 25, 2024
- ams International AG
- Ravi Kumar ADUSUMALLI
- G01 - MEASURING TESTING
Information Patent Application
MATCHING METHOD OF LIGHT SOURCE PARAMETERS
- Publication number 20230358605
- Publication date Nov 9, 2023
- United Microelectronics Corp.
- Sheng Lung Teng
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR OPERATING AN ILLUMINATING DEVICE, AND MOTOR VEHICLE
- Publication number 20230278485
- Publication date Sep 7, 2023
- Audi AG
- Valentin SCHMIDT
- B60 - VEHICLES IN GENERAL
Information Patent Application
INSPECTION METHOD AND INSPECTION PLATFORM FOR LITHOGRAPHY
- Publication number 20230131662
- Publication date Apr 27, 2023
- Industrial Technology Research Institute
- Cheng-Hsien CHEN
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE ALLOWING THE ANGULAR EMISSION PATTERN OF A LIGHT SOU...
- Publication number 20230117589
- Publication date Apr 20, 2023
- ELDIM
- Thierry Leroux
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR REAL-TIME LIGHT MAPPING
- Publication number 20230122342
- Publication date Apr 20, 2023
- Bowery Farming Inc.
- Henry SZTUL
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING SCREEN LIGHT INTENSITY VALUE,...
- Publication number 20220301475
- Publication date Sep 22, 2022
- Beijing Xiaomi Mobile Software Co., Ltd.
- Chaoxi CHEN
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
PREDICTING SPHERICAL IRRADIANCE FOR VOLUME DISINFECTION
- Publication number 20220288261
- Publication date Sep 15, 2022
- SUNTRACKER TECHNOLOGIES LTD.
- Ian Edward Ashdown
- C02 - TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
Information Patent Application
ADAPTIVE AND OPTIMAL IMAGING OF QUANTUM OPTICAL SYSTEMS FOR QUANTUM...
- Publication number 20220236761
- Publication date Jul 28, 2022
- University of Maryland, College Park
- Christopher MONROE
- B82 - NANO-TECHNOLOGY
Information Patent Application
IN-LINE METROLOGY SYSTEMS, APPARATUS, AND METHODS FOR OPTICAL DEVICES
- Publication number 20220122240
- Publication date Apr 21, 2022
- Applied Materials, Inc.
- Yangyang SUN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION DEVICE FOR EMERGENCY LIGHTING EQUIPMENT
- Publication number 20220042845
- Publication date Feb 10, 2022
- Wentai Technology Corporation
- Yun-Yuan YEH
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE AND METHOD FOR CONTROLLING AMBIENT LIGHT SENSOR
- Publication number 20220003597
- Publication date Jan 6, 2022
- Samsung Electronics Co., Ltd.
- Hee Woong YOON
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND DEVICES FOR MEASURING LIGHT SOURCES AND METHODS OF USE T...
- Publication number 20210389175
- Publication date Dec 16, 2021
- BlueLight Analytics, Inc.
- Derek LEBLANC
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LIGHT-SOURCE CHARACTERIZER AND ASSOCIATED METHODS
- Publication number 20210258559
- Publication date Aug 19, 2021
- JENOPTIK Optical Systems LLC
- Marc D. Himel
- G01 - MEASURING TESTING
Information Patent Application
Method And System For Characterizing Power In A High-Power Laser
- Publication number 20210239523
- Publication date Aug 5, 2021
- Board of Trustees of Michigan State University
- Marcos DANTUS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A METHOD OF MEASURING ILLUMINATION, CORRESPONDING SYSTEM, COMPUTER...
- Publication number 20210199498
- Publication date Jul 1, 2021
- OSRAM GMBH
- Theodore TSESMELIS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Measurement system and method for measuring a response time of a li...
- Publication number 20210183284
- Publication date Jun 17, 2021
- Realtek Semiconductor Corp.
- Yung-Chih Chen
- G01 - MEASURING TESTING
Information Patent Application
POWER-MEASURING PROTECTION METHOD AND LASER PROTECTION SYSTEM
- Publication number 20210167571
- Publication date Jun 3, 2021
- Industrial Technology Research Institute
- CHIH-CHUN CHEN
- G02 - OPTICS
Information Patent Application
DIAGNOSTIC WAVEGUIDE FOR OPTICAL CHIP TESTING
- Publication number 20210116295
- Publication date Apr 22, 2021
- Skorpios Technologies, Inc.
- Robert J. Stone
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Device and System for Measuring Flicker
- Publication number 20200378827
- Publication date Dec 3, 2020
- OSRAM SYLVANIA INC.
- Alireza Safaee
- G06 - COMPUTING CALCULATING COUNTING

for testing lamps or other light sources

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Laser illumination techniques for capillary electrophoresis

Optical module

See-through metrology systems, apparatus, and methods for optical d...

Display device and optical inspection method for the same

Method for photometric characterization of the optical radiation ch...

Display device and optical inspection method for the same

Light diagnostics and monitoring using wearables

See-through metrology systems, apparatus, and methods for optical d...

Optical instrument and method for determining a wavelength of light...

Adaptive and optimal imaging of quantum optical systems for quantum...

Electronic device and method for controlling a sensor, based on a s...

Predicting spherical irradiance for volume disinfection

Method for detecting variation value

Device and method for detecting the sparkle effect of a transparent...

Light-source characterizer and associated methods

Enzyme-dependent fluorescence recovery of NADH after photobleaching...

Photoelectric conversion device

Methods and apparatus for predicting performance of a measurement m...

Method and system for characterizing power in a high-power laser

Time of flight sensor with light baffle system and method

Automotive lamp

Power-measuring protection method and laser protection system

Method for light-to-frequency conversion and light-to-frequency con...

Methods and apparatuses for identifying and controlling quantum emi...

Method and device for calibrating a light source of a medical device

Laser detection system

Electronic device and method for controlling an ambient light senso...

Measurement system and method for measuring a response time of a li...

Display device

Method and apparatus for testing optical outputs

Patents Applicationslast 30 patents

LASER PROCESSING APPARATUS INCLUDING BEAM ANALYSIS SYSTEM AND METHO...

METHODS, SYSTEMS, AND APPARATUS FOR MONITORING RADIATION OUTPUT OF...

LUMINOUS FLUX TEST CIRCUITRY, TEST METHOD AND DISPLAY PANEL

TESTING METHOD AND CONTROLLER FOR CONTROLLING TESTING METHOD

ADAPTIVE AND OPTIMAL IMAGING OF QUANTUM OPTICAL SYSTEMS FOR QUANTUM...

TESTING METHOD AND CONTROLLER FOR CONTROLLING TESTING METHOD

METHODS, SYSTEMS, AND APPARATUS FOR MONITORING RADIATION OUTPUT OF...

METHOD FOR DETERMINING THE OPERATING STATE OF A LIGHT-EMITTING IMPLANT

CONNECTING A MACHINE

OPTICAL MODULE

DEVICE FOR CHARACTERIZING FLICKER

MATCHING METHOD OF LIGHT SOURCE PARAMETERS

METHOD FOR OPERATING AN ILLUMINATING DEVICE, AND MOTOR VEHICLE

INSPECTION METHOD AND INSPECTION PLATFORM FOR LITHOGRAPHY

OPTICAL DEVICE ALLOWING THE ANGULAR EMISSION PATTERN OF A LIGHT SOU...

SYSTEM AND METHOD FOR REAL-TIME LIGHT MAPPING

METHOD AND APPARATUS FOR DETERMINING SCREEN LIGHT INTENSITY VALUE,...

PREDICTING SPHERICAL IRRADIANCE FOR VOLUME DISINFECTION

ADAPTIVE AND OPTIMAL IMAGING OF QUANTUM OPTICAL SYSTEMS FOR QUANTUM...

IN-LINE METROLOGY SYSTEMS, APPARATUS, AND METHODS FOR OPTICAL DEVICES

INSPECTION DEVICE FOR EMERGENCY LIGHTING EQUIPMENT

ELECTRONIC DEVICE AND METHOD FOR CONTROLLING AMBIENT LIGHT SENSOR

SYSTEM AND DEVICES FOR MEASURING LIGHT SOURCES AND METHODS OF USE T...

LIGHT-SOURCE CHARACTERIZER AND ASSOCIATED METHODS

Method And System For Characterizing Power In A High-Power Laser

A METHOD OF MEASURING ILLUMINATION, CORRESPONDING SYSTEM, COMPUTER...

Measurement system and method for measuring a response time of a li...

POWER-MEASURING PROTECTION METHOD AND LASER PROTECTION SYSTEM

DIAGNOSTIC WAVEGUIDE FOR OPTICAL CHIP TESTING

Device and System for Measuring Flicker