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CPC
G01R13/305

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R13/00Arrangements for displaying electric variables or waveforms

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G01R13/305for time marking

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Patents Grantslast 30 patents

Information Patent Grant
System and method for performing lossless compressed serial decoding
- Patent number 11,698,391
- Issue date Jul 11, 2023
- Keysight Technologies, Inc.
- Joseph D. Shaker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement method and measurement apparatus
- Patent number 10,976,350
- Issue date Apr 13, 2021
- Rohde & Schwarz GmbH & Co. KG
- Andrew Schaefer
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for timestamping electrical data in a panel m...
- Patent number 10,211,673
- Issue date Feb 19, 2019
- Siemens Industry, Inc.
- Paul Terricciano
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method of setting grids and/or markers in measuring apparatus
- Patent number 7,026,805
- Issue date Apr 11, 2006
- Yokogawa Electric Corporation
- Hiroki Saito
- G01 - MEASURING TESTING
Information Patent Grant
Method of setting gribs and/or markers in measuring apparatus
- Patent number 6,784,655
- Issue date Aug 31, 2004
- Ando Electric Co., Ltd.
- Hiroki Saito
- G01 - MEASURING TESTING
Information Patent Grant
Method of waveform time stamping for minimizing digitization artifa...
- Patent number 6,571,186
- Issue date May 27, 2003
- Textronix, Inc.
- Benjamin A. Ward
- G01 - MEASURING TESTING
Information Patent Grant
Method of time stamping a waveform edge of an input signal
- Patent number 6,549,859
- Issue date Apr 15, 2003
- Tektronix Inc.
- Benjamin A. Ward
- G01 - MEASURING TESTING
Information Patent Grant
Method for increasing the resolution of measurements taken using a...
- Patent number 4,972,139
- Issue date Nov 20, 1990
- Tektronix, Inc.
- Todd M. Beazley
- G01 - MEASURING TESTING
Information Patent Grant
Method to expand an analog signal and device to implement the method
- Patent number 4,920,279
- Issue date Apr 24, 1990
- SGS-Thomson Microelectronics S.A.
- Pascal Charlet
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Measurement method and measurement apparatus
- Publication number 20200341034
- Publication date Oct 29, 2020
- Rohde& Schwarz GmbH & Co. KG
- Andrew Schaefer
- G01 - MEASURING TESTING
Information Patent Application
Method of setting grids and/or markers in measuring apparatus
- Publication number 20040257062
- Publication date Dec 23, 2004
- Ando Electric Co., Ltd., a Tokyo, Japan corporation
- Hiroki Saito
- G01 - MEASURING TESTING
Information Patent Application
Method of setting gribs and/or markers in measuring apparatus
- Publication number 20020140415
- Publication date Oct 3, 2002
- Hiroki Saito
- G01 - MEASURING TESTING

for time marking

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System and method for performing lossless compressed serial decoding

Measurement method and measurement apparatus

Apparatus and methods for timestamping electrical data in a panel m...

Method of setting grids and/or markers in measuring apparatus

Method of setting gribs and/or markers in measuring apparatus

Method of waveform time stamping for minimizing digitization artifa...

Method of time stamping a waveform edge of an input signal

Method for increasing the resolution of measurements taken using a...

Method to expand an analog signal and device to implement the method

Patents Applicationslast 30 patents

Measurement method and measurement apparatus

Method of setting grids and/or markers in measuring apparatus

Method of setting gribs and/or markers in measuring apparatus