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G01J2003/4332
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PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
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G01J2003/4332
frequence-modulated
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Patents Grants
last 30 patents
Information
Patent Grant
Dual-comb ranging with long ambiguity-free range
Patent number
12,130,136
Issue date
Oct 29, 2024
Thorlabs, Inc.
Oliver Heckl
G01 - MEASURING TESTING
Information
Patent Grant
Vector noise subtraction in vapor cell spectroscopy
Patent number
11,913,835
Issue date
Feb 27, 2024
VECTOR ATOMIC, INC.
Micah Perry Ledbetter
G01 - MEASURING TESTING
Information
Patent Grant
Cross-comb spectroscopy
Patent number
11,841,271
Issue date
Dec 12, 2023
California Institute of Technology
Alireza Marandi
G01 - MEASURING TESTING
Information
Patent Grant
Dual-comb spectroscopy
Patent number
11,796,392
Issue date
Oct 24, 2023
IRsweep AG
Stéphane Schilt
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High sensitivity frequency-domain spectroscopy system
Patent number
11,747,204
Issue date
Sep 5, 2023
The Johns Hopkins University
Scott M. Hendrickson
G01 - MEASURING TESTING
Information
Patent Grant
Dual-comb spectroscopy
Patent number
11,650,101
Issue date
May 16, 2023
IRsweep AG
Stéphane Schilt
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Dual-comb spectroscopy
Patent number
11,629,997
Issue date
Apr 18, 2023
IRsweep AG
Stéphane Schilt
G01 - MEASURING TESTING
Information
Patent Grant
Terahertz spectroscopy system and method
Patent number
11,408,768
Issue date
Aug 9, 2022
NovaTrans Group SA
John F. Roulston
G01 - MEASURING TESTING
Information
Patent Grant
Amplifier amplitude digital control for a mass spectrometer
Patent number
11,336,290
Issue date
May 17, 2022
Thermo Finnigan LLC.
Johnathan W. Smith
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Terahertz spectroscopy system and method
Patent number
11,099,069
Issue date
Aug 24, 2021
NovaTrans Group SA
John F. Roulston
G01 - MEASURING TESTING
Information
Patent Grant
Cavity ring-down spectroscopy having interleaved data acquisition f...
Patent number
11,035,728
Issue date
Jun 15, 2021
Picarro, Inc.
Chris W. Rella
G01 - MEASURING TESTING
Information
Patent Grant
Analysis apparatus and analysis method
Patent number
10,935,489
Issue date
Mar 2, 2021
Horiba, Ltd.
Kyoji Shibuya
G01 - MEASURING TESTING
Information
Patent Grant
Optical absorbance measurements with self-calibration and extended...
Patent number
10,746,655
Issue date
Aug 18, 2020
SpectraSensors, Inc.
Xiang Liu
G01 - MEASURING TESTING
Information
Patent Grant
Terahertz spectroscopy system and method
Patent number
10,684,170
Issue date
Jun 16, 2020
Novatrans Group SA
John F. Roulston
G01 - MEASURING TESTING
Information
Patent Grant
Vibrational sum frequency generation using shaped near infrared light
Patent number
10,620,050
Issue date
Apr 14, 2020
UT-Battelle, LLC
Azhad U. Chowdhury
G01 - MEASURING TESTING
Information
Patent Grant
Modulating spectroscopic imaging system using substantially coheren...
Patent number
10,437,033
Issue date
Oct 8, 2019
Daylight Solutions, Inc.
Jeremy Rowlette
G01 - MEASURING TESTING
Information
Patent Grant
Generating laser pulses and spectroscopy using the temporal talbot...
Patent number
10,297,974
Issue date
May 21, 2019
Max-Planck Gesellschaft zur Foerderung der Wissenschaften e.V.
Thomas Udem
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of determining the concentration of a gas component and a sp...
Patent number
10,119,906
Issue date
Nov 6, 2018
Sick AG
Thomas Beyer
G01 - MEASURING TESTING
Information
Patent Grant
Cavity enhanced spectroscopy using off-axis paths
Patent number
10,048,196
Issue date
Aug 14, 2018
Newsouth Innovations Pty Limited
Charles Charbel Harb
G01 - MEASURING TESTING
Information
Patent Grant
Method of determining the concentration of a gas component and spec...
Patent number
9,970,867
Issue date
May 15, 2018
Sick AG
Thomas Beyer
G01 - MEASURING TESTING
Information
Patent Grant
Terahertz spectroscopy system and method
Patent number
9,964,442
Issue date
May 8, 2018
Novatrans Group SA
John F. Roulston
G01 - MEASURING TESTING
Information
Patent Grant
Optical absorbance measurements with self-calibration and extended...
Patent number
9,846,117
Issue date
Dec 19, 2017
SpectraSensors, Inc.
Xin Zhou
G01 - MEASURING TESTING
Information
Patent Grant
Spectral imaging of a sample using a plurality of discrete mid-infr...
Patent number
9,606,002
Issue date
Mar 28, 2017
Daylight Solutions, Inc.
Benjamin Bird
G01 - MEASURING TESTING
Information
Patent Grant
Gas analysis device
Patent number
9,459,209
Issue date
Oct 4, 2016
Shimadzu Corporation
Fumiaki Otera
G01 - MEASURING TESTING
Information
Patent Grant
Frequency comb spectroscopy apparatus and method of frequency comb...
Patent number
9,322,775
Issue date
Apr 26, 2016
C.N.R. Consiglio Nazionale Delle Ricerche
Gianluca Gagliardi
G01 - MEASURING TESTING
Information
Patent Grant
Air turbulence detector
Patent number
5,285,070
Issue date
Feb 8, 1994
AlliedSignal Inc.
Joseph J. Barrett
G01 - MEASURING TESTING
Information
Patent Grant
Light radiation absorption gas detector
Patent number
5,268,745
Issue date
Dec 7, 1993
Siemens Plessey Controls Limited
Brian A. Goody
G01 - MEASURING TESTING
Information
Patent Grant
Resonant piezoelectric chopper for infrared radiation
Patent number
4,850,697
Issue date
Jul 25, 1989
Dynatech Electro-Optics Corporation
Larry J. Schoennauer
G01 - MEASURING TESTING
Information
Patent Grant
Spectrally selective shutter mechanism
Patent number
4,770,478
Issue date
Sep 13, 1988
The Aerospace Corporation
Edward F. Cross
G02 - OPTICS
Information
Patent Grant
Infra-red light absorption gas detector
Patent number
4,590,374
Issue date
May 20, 1986
International Standard Electric Corporation
Arthur E. Brewster
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
APPARATUS AND METHOD FOR DUAL COMB SPECTROSCOPY
Publication number
20230349761
Publication date
Nov 2, 2023
Government of the United States of America, as Represented by the Secretary o...
Ian Robert Coddington
G01 - MEASURING TESTING
Information
Patent Application
Dual-Comb Spectroscopy
Publication number
20230107251
Publication date
Apr 6, 2023
IRSWEEP AG
Stéphane SCHILT
G01 - MEASURING TESTING
Information
Patent Application
CROSS-COMB SPECTROSCOPY
Publication number
20220163389
Publication date
May 26, 2022
California Institute of Technology
Alireza Marandi
G01 - MEASURING TESTING
Information
Patent Application
HIGH SENSITIVITY FREQUENCY-DOMAIN SPECTROSCOPY SYSTEM
Publication number
20220042849
Publication date
Feb 10, 2022
The Johns Hopkins University
Scott M. Hendrickson
G01 - MEASURING TESTING
Information
Patent Application
TERAHERTZ SPECTROSCOPY SYSTEM AND METHOD
Publication number
20210364353
Publication date
Nov 25, 2021
Novatrans Group SA
John F. ROULSTON
G01 - MEASURING TESTING
Information
Patent Application
AMPLIFIER AMPLITUDE DIGITAL CONTROL FOR A MASS SPECTROMETER
Publication number
20210305991
Publication date
Sep 30, 2021
Thermo Finnigan LLC
Johnathan W. Smith
G01 - MEASURING TESTING
Information
Patent Application
TERAHERTZ SPECTROSCOPY SYSTEM AND METHOD
Publication number
20200400496
Publication date
Dec 24, 2020
Novatrans Group SA
John F. ROULSTON
G01 - MEASURING TESTING
Information
Patent Application
TERAHERTZ SPECTROSCOPY SYSTEM AND METHOD
Publication number
20200271515
Publication date
Aug 27, 2020
Novatrans Group SA
John F. ROULSTON
G01 - MEASURING TESTING
Information
Patent Application
Cavity Ring-Down Spectroscopy having Interleaved Data Acquisition f...
Publication number
20200049556
Publication date
Feb 13, 2020
Chris W. Rella
G01 - MEASURING TESTING
Information
Patent Application
VIBRATIONAL SUM FREQUENCY GENERATION USING SHAPED NEAR INFRARED LIGHT
Publication number
20190271595
Publication date
Sep 5, 2019
UT-Battelle, LLC
Azhad U. Chowdhury
G01 - MEASURING TESTING
Information
Patent Application
TERAHERTZ SPECTROSCOPY SYSTEM AND METHOD
Publication number
20180252581
Publication date
Sep 6, 2018
Novatrans Group SA
John F. ROULSTON
G01 - MEASURING TESTING
Information
Patent Application
GENERATING LASER PULSES AND SPECTROSCOPY USING THE TEMPORAL TALBOT...
Publication number
20180233877
Publication date
Aug 16, 2018
Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.V.
Thomas UDEM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
OPTICAL ABSORBANCE MEASUREMENTS WITH SELF-CALIBRATION AND EXTENDED...
Publication number
20180156726
Publication date
Jun 7, 2018
SPECTRASENSORS, INC.
Xiang Liu
G01 - MEASURING TESTING
Information
Patent Application
CAVITY ENHANCED SPECTROSCOPY USING OFF-AXIS PATHS
Publication number
20170067822
Publication date
Mar 9, 2017
NEWSOUTH INNOVATIONS PTY LIMITED
Charles Charbel HARB
G01 - MEASURING TESTING
Information
Patent Application
Method of determining the concentration of a gas component and spec...
Publication number
20170045446
Publication date
Feb 16, 2017
SICK AG
Thomas BEYER
G01 - MEASURING TESTING
Information
Patent Application
TERAHERTZ SPECTROSCOPY SYSTEM AND METHOD
Publication number
20160252393
Publication date
Sep 1, 2016
Novatrans Group SA
John F. ROULSTON
G01 - MEASURING TESTING
Information
Patent Application
SPECTRAL IMAGING OF A SAMPLE USING A PLURALITY OF DISCRETE MID-INFR...
Publication number
20150323384
Publication date
Nov 12, 2015
DAYLIGHT SOLUTIONS INC.
Benjamin Bird
G01 - MEASURING TESTING
Information
Patent Application
Gas Analysis Device
Publication number
20130321815
Publication date
Dec 5, 2013
Shimadzu Corporation
Fumiaki OTERA
G01 - MEASURING TESTING
Information
Patent Application
TERAHERTZ SPECTROSCOPY SYSTEM AND METHOD
Publication number
20120044479
Publication date
Feb 23, 2012
Novatrans Group SA
John F. Roulston
G01 - MEASURING TESTING