Friction force microscopy

Industry

CPC
G01Q60/26

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Parent Industries

GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof

Current Industry

G01Q60/26Friction force microscopy

Industries

Patents Grantslast 30 patents

Information Patent Grant
In situ mechanical characterization of a single cell-cell adhesion...
- Patent number 11,846,611
- Issue date Dec 19, 2023
- Nutech Ventures
- Ruiguo Yang
- G01 - MEASURING TESTING
Information Patent Grant
In situ tribometer and methods of use
- Patent number 10,908,069
- Issue date Feb 2, 2021
- The Trustees of the University of Pennsylvania
- Robert W. Carpick
- G01 - MEASURING TESTING
Information Patent Grant
Method of controlling a probe using constant command signals
- Patent number 10,895,584
- Issue date Jan 19, 2021
- CONCEPT SCIENTIFIQUE INSTRUMENTS
- Louis Pacheco
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for nano-tribological manufacturing of nanostru...
- Patent number 10,768,202
- Issue date Sep 8, 2020
- The Trustees of the University of Pennsylvania
- Robert W. Carpick
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for inspecting process solution, and sample pr...
- Patent number 10,746,635
- Issue date Aug 18, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Tzu-Sou Chuang
- G01 - MEASURING TESTING
Information Patent Grant
Methods for designing and processing a microcantilever-based probe...
- Patent number 10,739,379
- Issue date Aug 11, 2020
- Southwest Jiaotong University
- Linmao Qian
- G01 - MEASURING TESTING
Information Patent Grant
Friction coefficient measuring method of surface of specimen
- Patent number 10,088,408
- Issue date Oct 2, 2018
- Hyundai Motor Company
- Jung Yeon Park
- G01 - MEASURING TESTING
Information Patent Grant
Microscope having a multimode local probe, tip-enhanced raman micro...
- Patent number 9,366,694
- Issue date Jun 14, 2016
- Ecole Polytechnique
- Marc Chaigneau
- G01 - MEASURING TESTING
Information Patent Grant
Processes for surface measurement and modification by scanning prob...
- Patent number 8,997,261
- Issue date Mar 31, 2015
- Centre National de la Recherche Scientifique CNRS
- Olivier Noel
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus and method for investigating surface properties of differ...
- Patent number 8,689,359
- Issue date Apr 1, 2014
- Nano Analytik GmbH
- Ivo W. Rangelow
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for determining material properties
- Patent number 7,810,382
- Issue date Oct 12, 2010
- Karlsruher Institut für Technologie
- Thomas Schimmel
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for measuring electrical properties in torsion...
- Patent number 7,757,544
- Issue date Jul 20, 2010
- Veeco Instruments Inc.
- Lin Huang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of driving torsional resonance mode of a probe...
- Patent number 7,574,903
- Issue date Aug 18, 2009
- Veeco Instruments Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Grant
Measuring probe, sample surface measuring apparatus and sample surf...
- Patent number 7,557,933
- Issue date Jul 7, 2009
- Japan Science and Technology Agency
- Kenji Fukuzawa
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscope and method of energy dissipation imaging us...
- Patent number 7,387,016
- Issue date Jun 17, 2008
- Jeol Ltd.
- Keiichi Nakamoto
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining tribological properties of a sample surface...
- Patent number 7,360,404
- Issue date Apr 22, 2008
- Fraunhofer-Gesellschaft zur Förderung der Angelwandten Forschung E.V.
- Michael Reinstadtler
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of driving torsional resonance mode of a probe...
- Patent number 7,168,301
- Issue date Jan 30, 2007
- Veeco Instruments Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring electrical properties in torsion...
- Patent number 7,155,964
- Issue date Jan 2, 2007
- Veeco Instruments Inc.
- Lin Huang
- G01 - MEASURING TESTING
Information Patent Grant
Multi-dimensional force sensing for scanning probe microscopy using...
- Patent number 7,137,291
- Issue date Nov 21, 2006
- Xidex Corporation
- Vladimir Mancevski
- G01 - MEASURING TESTING
Information Patent Grant
Torsional resonance mode probe-based instrument and method
- Patent number 6,945,099
- Issue date Sep 20, 2005
- Veeco Instruments Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for simultaneously determining the adhesion, fric...
- Patent number 6,880,386
- Issue date Apr 19, 2005
- Witec Wissenschaftliche Instrumente und Technologie GmbH
- Hans-Ulrich Krotil
- G01 - MEASURING TESTING
Information Patent Grant
System and method of multi-dimensional force sensing for scanning p...
- Patent number 6,666,075
- Issue date Dec 23, 2003
- Xidex Corporation
- Vladimir Mancevski
- G01 - MEASURING TESTING
Information Patent Grant
Resistive cantilever spring for probe microscopy
- Patent number 6,578,410
- Issue date Jun 17, 2003
- Jacob Israelachvili
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope having graphical information
- Patent number 6,294,774
- Issue date Sep 25, 2001
- Jeol Ltd.
- Takashi Ito
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope and method of analyzing frictions in atomic...
- Patent number 5,804,708
- Issue date Sep 8, 1998
- Agency Industrial Science and Seiko Instruments Inc.
- Kazushi Yamanaka
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Methods of operating atomic force microscopes to measure friction
- Patent number 5,553,487
- Issue date Sep 10, 1996
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Directional atomic force microscope and method of observing a sampl...
- Patent number 5,503,010
- Issue date Apr 2, 1996
- Agency of Industrial Science and Technology
- Kazushi Yamanaka
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Surface observing apparatus and method
- Patent number 5,436,448
- Issue date Jul 25, 1995
- Hitachi, Ltd.
- Sumio Hosaka
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Methods of operating atomic force microscopes to measure friction
- Patent number 5,400,647
- Issue date Mar 28, 1995
- Digital Instruments, Inc.
- Virgil B. Elings
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning microscope comprising force-sensing means and position-sen...
- Patent number 5,254,854
- Issue date Oct 19, 1993
- AT&T Bell Laboratories
- Robert E. Betzig
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
FRICTION REGULATION METHOD, APPARATUS AND SYSTEM FOR MOLYBDENUM DIS...
- Publication number 20240410916
- Publication date Dec 12, 2024
- Tsinghua University
- Dameng Liu
- C10 - PETROLEUM, GAS OR COKE INDUSTRIES TECHNICAL GASES CONTAINING CARBON MON...
Information Patent Application
IN SITU MECHANICAL CHARACTERIZATION OF A SINGLE CELL-CELL ADHESION...
- Publication number 20220082483
- Publication date Mar 17, 2022
- Board of Regents of the University of Nebraska
- Ruiguo Yang
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CONTROLLING A PROBE
- Publication number 20190094267
- Publication date Mar 28, 2019
- CONCEPT SCIENTIFIQUE INSTRUMENTS
- Louis Pacheco
- G01 - MEASURING TESTING
Information Patent Application
SITU TRIBOMETER AND METHODS OF USE
- Publication number 20170254740
- Publication date Sep 7, 2017
- The Trustees of the University of Pennsylvania
- Robert W. Carpick
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING PROCESS SOLUTION, AND SAMPLE PR...
- Publication number 20160061695
- Publication date Mar 3, 2016
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tzu-Sou CHUANG
- G01 - MEASURING TESTING
Information Patent Application
PROCESSES FOR SURFACE MEASUREMENT AND MODIFICATION BY SCANNING PROB...
- Publication number 20130047302
- Publication date Feb 21, 2013
- UNIVERSITE DU MAINE (LE MANS)
- Olivier Noel
- B82 - NANO-TECHNOLOGY
Information Patent Application
FRICTION FORCE MICROSCOPE
- Publication number 20120227139
- Publication date Sep 6, 2012
- Masatoshi YASUTAKE
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INVESTIGATING SURFACE PROPERTIES OF DIFFER...
- Publication number 20110047662
- Publication date Feb 24, 2011
- Ivo W. Rangelow
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method using a disk drive slider and/or a peltier pla...
- Publication number 20090151434
- Publication date Jun 18, 2009
- SAMSUNG ELECTRONICS CO., LTD.
- Dongman Kim
- G01 - MEASURING TESTING
Information Patent Application
MEASURING PROBE, SAMPLE SURFACE MEASURING APPARATUS AND SAMPLE SURF...
- Publication number 20090027690
- Publication date Jan 29, 2009
- Kenji Fukuzawa
- G01 - MEASURING TESTING
Information Patent Application
Method and Device for Determining Material Properties
- Publication number 20080134771
- Publication date Jun 12, 2008
- Universität Karlsruhe (TH) Forrchungsuniversität Gegründet 1825
- Thomas Schimmel
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING ELECTRICAL PROPERTIES IN TORSION...
- Publication number 20070163335
- Publication date Jul 19, 2007
- Lin Huang
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS OF DRIVING TORSIONAL RESONANCE MODE OF A PROBE...
- Publication number 20070119241
- Publication date May 31, 2007
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
Atomic force microscope and method of energy dissipation imaging us...
- Publication number 20060213260
- Publication date Sep 28, 2006
- JEOL Ltd.
- Keiichi Nakamoto
- G01 - MEASURING TESTING
Information Patent Application
Method for determining tribological properties of a sample surface...
- Publication number 20060150719
- Publication date Jul 13, 2006
- Michael Reinstadtler
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measuring electrical properties in torsion...
- Publication number 20050212529
- Publication date Sep 29, 2005
- Lin Huang
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus of driving torsional resonance mode of a probe...
- Publication number 20050028583
- Publication date Feb 10, 2005
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
Multi-dimensional force sensing for scanning probe microscopy using...
- Publication number 20040134265
- Publication date Jul 15, 2004
- Vladimir Mancevski
- G01 - MEASURING TESTING
Information Patent Application
System and method of multi-dimensional force sensing for scanning p...
- Publication number 20020121131
- Publication date Sep 5, 2002
- Vladimir Mancevski
- B82 - NANO-TECHNOLOGY

Friction force microscopy

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

In situ mechanical characterization of a single cell-cell adhesion...

In situ tribometer and methods of use

Method of controlling a probe using constant command signals

Systems and methods for nano-tribological manufacturing of nanostru...

Method and apparatus for inspecting process solution, and sample pr...

Methods for designing and processing a microcantilever-based probe...

Friction coefficient measuring method of surface of specimen

Microscope having a multimode local probe, tip-enhanced raman micro...

Processes for surface measurement and modification by scanning prob...

Apparatus and method for investigating surface properties of differ...

Method and device for determining material properties

Method and apparatus for measuring electrical properties in torsion...

Method and apparatus of driving torsional resonance mode of a probe...

Measuring probe, sample surface measuring apparatus and sample surf...

Atomic force microscope and method of energy dissipation imaging us...

Method for determining tribological properties of a sample surface...

Method and apparatus of driving torsional resonance mode of a probe...

Method and apparatus for measuring electrical properties in torsion...

Multi-dimensional force sensing for scanning probe microscopy using...

Torsional resonance mode probe-based instrument and method

Method and device for simultaneously determining the adhesion, fric...

System and method of multi-dimensional force sensing for scanning p...

Resistive cantilever spring for probe microscopy

Scanning probe microscope having graphical information

Atomic force microscope and method of analyzing frictions in atomic...

Methods of operating atomic force microscopes to measure friction

Directional atomic force microscope and method of observing a sampl...

Surface observing apparatus and method

Methods of operating atomic force microscopes to measure friction

Scanning microscope comprising force-sensing means and position-sen...

Patents Applicationslast 30 patents

FRICTION REGULATION METHOD, APPARATUS AND SYSTEM FOR MOLYBDENUM DIS...

IN SITU MECHANICAL CHARACTERIZATION OF A SINGLE CELL-CELL ADHESION...

METHOD OF CONTROLLING A PROBE

SITU TRIBOMETER AND METHODS OF USE

METHOD AND APPARATUS FOR INSPECTING PROCESS SOLUTION, AND SAMPLE PR...

PROCESSES FOR SURFACE MEASUREMENT AND MODIFICATION BY SCANNING PROB...

FRICTION FORCE MICROSCOPE

APPARATUS AND METHOD FOR INVESTIGATING SURFACE PROPERTIES OF DIFFER...

Apparatus and method using a disk drive slider and/or a peltier pla...

MEASURING PROBE, SAMPLE SURFACE MEASURING APPARATUS AND SAMPLE SURF...

Method and Device for Determining Material Properties

METHOD AND APPARATUS FOR MEASURING ELECTRICAL PROPERTIES IN TORSION...

METHOD AND APPARATUS OF DRIVING TORSIONAL RESONANCE MODE OF A PROBE...

Atomic force microscope and method of energy dissipation imaging us...

Method for determining tribological properties of a sample surface...

Method and apparatus for measuring electrical properties in torsion...

Method and apparatus of driving torsional resonance mode of a probe...

Multi-dimensional force sensing for scanning probe microscopy using...

System and method of multi-dimensional force sensing for scanning p...