Functional testing

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CPC
G11C29/08

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Parent Industries

GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

Current Industry

G11C29/08Functional testing

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Power control device and power test system
- Patent number 12,190,972
- Issue date Jan 7, 2025
- Hefei Core Storage Electronic Limited
- Chih-Ling Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory test system and memory test method
- Patent number 12,190,977
- Issue date Jan 7, 2025
- NANYA TECHNOLOGY CORPORATION
- Cheng-Ting Hsu
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory test system and memory test method
- Patent number 12,190,978
- Issue date Jan 7, 2025
- NANYA TECHNOLOGY CORPORATION
- Cheng-Ting Hsu
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory failure prediction
- Patent number 12,119,070
- Issue date Oct 15, 2024
- Micron Technology, Inc.
- Abhishek Chaurasia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for batch testing device, related computer dev...
- Patent number 12,112,815
- Issue date Oct 8, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Wei Yang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test devices, test systems, and operating methods of test systems
- Patent number 12,111,351
- Issue date Oct 8, 2024
- Samsung Electronics Co., Ltd.
- Ungjin Jang
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and methods of testing memory devices
- Patent number 12,079,152
- Issue date Sep 3, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Meng-Han Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Two-stage voltage calibration upon power-up of memory device
- Patent number 12,073,866
- Issue date Aug 27, 2024
- Micron Technology, Inc.
- Steven Michael Kientz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Error-handling management during copyback operations in memory devices
- Patent number 12,072,762
- Issue date Aug 27, 2024
- Micron Technology, Inc.
- Patrick R. Khayat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Resource allocation in memory systems based on operation modes
- Patent number 12,073,115
- Issue date Aug 27, 2024
- Micron Technology, Inc.
- Alex Frolikov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Error detection for programming single level cells
- Patent number 12,067,255
- Issue date Aug 20, 2024
- Micron Technology, Inc.
- Tomer Tzvi Eliash
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Voltage trimming circuit
- Patent number 12,062,404
- Issue date Aug 13, 2024
- Samsung Electronics Co., Ltd.
- Minho Choi
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory system and data processing system including the same
- Patent number 12,056,027
- Issue date Aug 6, 2024
- SK Hynix Inc.
- Eung-Bo Shim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Software directed firmware acceleration
- Patent number 12,055,581
- Issue date Aug 6, 2024
- Advantest Corporation
- Duane Champoux
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for generating command sequence, method and devic...
- Patent number 12,040,030
- Issue date Jul 16, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yu Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Storage device, host device, and method of operating the same
- Patent number 12,027,222
- Issue date Jul 2, 2024
- SK Hynix Inc.
- Jeong Ho Jeon
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory array detection circuit and detection method, and memory
- Patent number 12,014,788
- Issue date Jun 18, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Weijie Cheng
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory card performance characteristic detection and monitoring
- Patent number 11,985,445
- Issue date May 14, 2024
- GoPro, Inc.
- Naveen Chinya Krishnamurthy
- G11 - INFORMATION STORAGE
Information Patent Grant
Chip test method, apparatus, and device, and storage medium
- Patent number 11,978,522
- Issue date May 7, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Cheng Gu
- G11 - INFORMATION STORAGE
Information Patent Grant
Test program generation method, device, memory medium and electroni...
- Patent number 11,960,751
- Issue date Apr 16, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Ruei-Yuan Guo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Chip having debug function and chip debugging method
- Patent number 11,942,172
- Issue date Mar 26, 2024
- Realtek Semiconductor Corporation
- Pan-Ting Jiang
- G11 - INFORMATION STORAGE
Information Patent Grant
Protection circuit and memory
- Patent number 11,935,579
- Issue date Mar 19, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Geyan Liu
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and device for testing sr cycle as well as method and device...
- Patent number 11,929,130
- Issue date Mar 12, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Peng Wang
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device degradation monitoring
- Patent number 11,929,131
- Issue date Mar 12, 2024
- PROTEANTECS LTD.
- Eyal Fayneh
- G11 - INFORMATION STORAGE
Information Patent Grant
Autoscreenshot systems and methods for virtual operating system states
- Patent number 11,899,536
- Issue date Feb 13, 2024
- DATTO, INC.
- Collin Mitchell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, device and system for testing memory devices
- Patent number 11,893,284
- Issue date Feb 6, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Xinwang Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data storage with multi-level read destructive memory
- Patent number 11,868,621
- Issue date Jan 9, 2024
- Seagate Technology LLC
- Jon D. Trantham
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Stressing algorithm for solving cell-to-cell variations in phase ch...
- Patent number 11,862,244
- Issue date Jan 2, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Jau-Yi Wu
- G11 - INFORMATION STORAGE
Information Patent Grant
Seamless recovery of a hardware-based I/O path in a multi-function...
- Patent number 11,789,819
- Issue date Oct 17, 2023
- Micron Technology, Inc.
- Horia C. Simionescu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Voltage trimming circuit
- Patent number 11,776,644
- Issue date Oct 3, 2023
- Samsung Electronics Co., Ltd.
- Minho Choi
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
RESOURCE ALLOCATION IN MEMORY SYSTEMS BASED ON OPERATION MODES
- Publication number 20240411485
- Publication date Dec 12, 2024
- Micron Technology, Inc.
- Alex Frolikov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TWO-STAGE VOLTAGE CALIBRATION UPON POWER-UP OF MEMORY DEVICE
- Publication number 20240386936
- Publication date Nov 21, 2024
- Micron Technology, Inc.
- Steven Michael Kientz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS OF TESTING MEMORY DEVICES
- Publication number 20240378163
- Publication date Nov 14, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Meng-Han Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ERROR-HANDLING MANAGEMENT DURING COPYBACK OPERATIONS IN MEMORY DEVICES
- Publication number 20240370333
- Publication date Nov 7, 2024
- Micron Technology, Inc.
- Patrick R. Khayat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY SYSTEM AND DATA PROCESSING SYSTEM INCLUDING THE SAME
- Publication number 20240354210
- Publication date Oct 24, 2024
- SK HYNIX INC.
- Eung-Bo SHIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20240355404
- Publication date Oct 24, 2024
- WINBOND ELECTRONICS CORP.
- Yutaka ITO
- G11 - INFORMATION STORAGE
Information Patent Application
STORAGE DEVICE, HOST DEVICE, AND METHOD OF OPERATING THE SAME
- Publication number 20240339167
- Publication date Oct 10, 2024
- SK HYNIX INC.
- Jeong Ho JEON
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE WITH DYNAMICALLY VARYING SELF-REFRESH P...
- Publication number 20240290410
- Publication date Aug 29, 2024
- Samsung Electronics Co., Ltd.
- YOUNGJAE PARK
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND APPARATUS FOR TESTING ERROR CORRECTING CODE (ECC) FUNCTI...
- Publication number 20240275406
- Publication date Aug 15, 2024
- GOWIN Semiconductor Corporation
- Jingxiang Wang
- G11 - INFORMATION STORAGE
Information Patent Application
THERMAL CONDUCTION BASED BATCH TESTING SYSTEM
- Publication number 20240194281
- Publication date Jun 13, 2024
- Micron Technology, Inc.
- Daniel P. Cram
- G01 - MEASURING TESTING
Information Patent Application
AUTOSCREENSHOT SYSTEMS AND METHODS FOR VIRTUAL OPERATING SYSTEM STATES
- Publication number 20240184673
- Publication date Jun 6, 2024
- KASEYA US LLC
- Collin Mitchell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GLITCH DETECTION
- Publication number 20240185938
- Publication date Jun 6, 2024
- Micron Technology, Inc.
- Niccolò Izzo
- G11 - INFORMATION STORAGE
Information Patent Application
STRESSING ALGORITHM FOR SOLVING CELL-TO-CELL VARIATIONS IN PHASE CH...
- Publication number 20240087645
- Publication date Mar 14, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jau-Yi WU
- G11 - INFORMATION STORAGE
Information Patent Application
ERROR-HANDLING MANAGEMENT DURING COPYBACK OPERATIONS IN MEMORY DEVICES
- Publication number 20240054046
- Publication date Feb 15, 2024
- Micron Technology, Inc.
- Patrick R. Khayat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY, MEMORY SYSTEM AND OPERATION METHOD OF MEMORY
- Publication number 20240021260
- Publication date Jan 18, 2024
- SK HYNIX INC.
- Kyo Yun LEE
- G11 - INFORMATION STORAGE
Information Patent Application
VOLTAGE TRIMMING CIRCUIT
- Publication number 20230410925
- Publication date Dec 21, 2023
- Samsung Electronics Co., Ltd.
- Minho Choi
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SYSTEM AND OPERATING METHOD THEREOF
- Publication number 20230376370
- Publication date Nov 23, 2023
- SK HYNIX INC.
- Gi Bbeum HAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY ARRAY DETECTION CIRCUIT AND DETECTION METHOD, AND MEMORY
- Publication number 20230352111
- Publication date Nov 2, 2023
- ChangXin Memory Technologies, Inc.
- Weijie CHENG
- G11 - INFORMATION STORAGE
Information Patent Application
SEAMLESS RECOVERY OF A HARDWARE-BASED I/O PATH IN A MULTI-FUNCTION...
- Publication number 20230350754
- Publication date Nov 2, 2023
- Micron Technology, Inc.
- Horia C. Simionescu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
UNUSED REDUNDANT ENABLE DISTURB PROTECTION CIRCUIT
- Publication number 20230315918
- Publication date Oct 5, 2023
- Micron Technology, Inc.
- Seth A. Eichmeyer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHIP TEST METHOD, APPARATUS, AND DEVICE, AND STORAGE MEDIUM
- Publication number 20230282299
- Publication date Sep 7, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Cheng GU
- G11 - INFORMATION STORAGE
Information Patent Application
METAL ISOLATION TESTING IN THE CONTEXT OF MEMORY CELLS
- Publication number 20230255012
- Publication date Aug 10, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Te-Hsin Chiu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STORAGE DEVICE, HOST DEVICE, AND METHOD OF OPERATING THE SAME
- Publication number 20230178162
- Publication date Jun 8, 2023
- SK HYNIX INC.
- Jeong Ho JEON
- G11 - INFORMATION STORAGE
Information Patent Application
STORAGE CONTROLLER AND ELECTRONIC SYSTEM
- Publication number 20230153020
- Publication date May 18, 2023
- Samsung Electronics Co., Ltd.
- Junyong Uhm
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY CARD PERFORMANCE CHARACTERISTIC DETECTION AND MONITORING
- Publication number 20230053532
- Publication date Feb 23, 2023
- GoPro, Inc.
- Naveen Chinya Krishnamurthy
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEMS AND METHODS OF TESTING MEMORY DEVICES
- Publication number 20230031011
- Publication date Feb 2, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Meng-Han Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY SYSTEM AND DATA PROCESSING SYSTEM INCLUDING THE SAME
- Publication number 20230015404
- Publication date Jan 19, 2023
- SK HYNIX INC.
- Eung-Bo SHIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE DEGRADATION MONITORING
- Publication number 20230009637
- Publication date Jan 12, 2023
- PROTEANTECS LTD.
- Eyal FAYNEH
- G11 - INFORMATION STORAGE
Information Patent Application
AUTOSCREENSHOT SYSTEMS AND METHODS FOR VIRTUAL OPERATING SYSTEM STATES
- Publication number 20230004463
- Publication date Jan 5, 2023
- Datto, Inc.
- Collin Mitchell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA STORAGE WITH MULTI-LEVEL READ DESTRUCTIVE MEMORY
- Publication number 20220404982
- Publication date Dec 22, 2022
- SEAGATE TECHNOLOGY LLC
- Jon D. Trantham
- G06 - COMPUTING CALCULATING COUNTING

Functional testing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Power control device and power test system

Memory test system and memory test method

Memory test system and memory test method

Memory failure prediction

Method and apparatus for batch testing device, related computer dev...

Test devices, test systems, and operating methods of test systems

Systems and methods of testing memory devices

Two-stage voltage calibration upon power-up of memory device

Error-handling management during copyback operations in memory devices

Resource allocation in memory systems based on operation modes

Error detection for programming single level cells

Voltage trimming circuit

Memory system and data processing system including the same

Software directed firmware acceleration

Method and device for generating command sequence, method and devic...

Storage device, host device, and method of operating the same

Memory array detection circuit and detection method, and memory

Memory card performance characteristic detection and monitoring

Chip test method, apparatus, and device, and storage medium

Test program generation method, device, memory medium and electroni...

Chip having debug function and chip debugging method

Protection circuit and memory

Method and device for testing sr cycle as well as method and device...

Memory device degradation monitoring

Autoscreenshot systems and methods for virtual operating system states

Method, device and system for testing memory devices

Data storage with multi-level read destructive memory

Stressing algorithm for solving cell-to-cell variations in phase ch...

Seamless recovery of a hardware-based I/O path in a multi-function...

Voltage trimming circuit

Patents Applicationslast 30 patents

RESOURCE ALLOCATION IN MEMORY SYSTEMS BASED ON OPERATION MODES

TWO-STAGE VOLTAGE CALIBRATION UPON POWER-UP OF MEMORY DEVICE

SYSTEMS AND METHODS OF TESTING MEMORY DEVICES

ERROR-HANDLING MANAGEMENT DURING COPYBACK OPERATIONS IN MEMORY DEVICES

MEMORY SYSTEM AND DATA PROCESSING SYSTEM INCLUDING THE SAME

SEMICONDUCTOR MEMORY DEVICE

STORAGE DEVICE, HOST DEVICE, AND METHOD OF OPERATING THE SAME

SEMICONDUCTOR MEMORY DEVICE WITH DYNAMICALLY VARYING SELF-REFRESH P...

METHOD AND APPARATUS FOR TESTING ERROR CORRECTING CODE (ECC) FUNCTI...

THERMAL CONDUCTION BASED BATCH TESTING SYSTEM

AUTOSCREENSHOT SYSTEMS AND METHODS FOR VIRTUAL OPERATING SYSTEM STATES

GLITCH DETECTION

STRESSING ALGORITHM FOR SOLVING CELL-TO-CELL VARIATIONS IN PHASE CH...

ERROR-HANDLING MANAGEMENT DURING COPYBACK OPERATIONS IN MEMORY DEVICES

MEMORY, MEMORY SYSTEM AND OPERATION METHOD OF MEMORY

VOLTAGE TRIMMING CIRCUIT

MEMORY SYSTEM AND OPERATING METHOD THEREOF

MEMORY ARRAY DETECTION CIRCUIT AND DETECTION METHOD, AND MEMORY

SEAMLESS RECOVERY OF A HARDWARE-BASED I/O PATH IN A MULTI-FUNCTION...

UNUSED REDUNDANT ENABLE DISTURB PROTECTION CIRCUIT

CHIP TEST METHOD, APPARATUS, AND DEVICE, AND STORAGE MEDIUM

METAL ISOLATION TESTING IN THE CONTEXT OF MEMORY CELLS

STORAGE DEVICE, HOST DEVICE, AND METHOD OF OPERATING THE SAME

STORAGE CONTROLLER AND ELECTRONIC SYSTEM

MEMORY CARD PERFORMANCE CHARACTERISTIC DETECTION AND MONITORING

SYSTEMS AND METHODS OF TESTING MEMORY DEVICES

MEMORY SYSTEM AND DATA PROCESSING SYSTEM INCLUDING THE SAME

MEMORY DEVICE DEGRADATION MONITORING

AUTOSCREENSHOT SYSTEMS AND METHODS FOR VIRTUAL OPERATING SYSTEM STATES

DATA STORAGE WITH MULTI-LEVEL READ DESTRUCTIVE MEMORY