Functionalization

Industry

CPC
G01Q60/42

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Parent Industries

GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof

Current Industry

G01Q60/42Functionalization

Industries

Patents Grantslast 30 patents

Information Patent Grant
Automated optimization of AFM light source positioning
- Patent number 12,055,560
- Issue date Aug 6, 2024
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Grant
Debris removal from high aspect structures
- Patent number 11,964,310
- Issue date Apr 23, 2024
- Bruker Nano, Inc.
- Tod Evan Robinson
- B08 - CLEANING
Information Patent Grant
Atomic-force microscopy for identification of surfaces
- Patent number 11,796,564
- Issue date Oct 24, 2023
- Trustees of Tufts College
- Igor Sokolov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated optimization of AFM light source positioning
- Patent number 11,644,478
- Issue date May 9, 2023
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Grant
Debris removal in high aspect structures
- Patent number 11,577,286
- Issue date Feb 14, 2023
- Bruker Nano, Inc.
- Tod Evan Robinson
- B08 - CLEANING
Information Patent Grant
Atomic-force microscopy for identification of surfaces
- Patent number 11,506,683
- Issue date Nov 22, 2022
- Trustees of Tufts College
- Igor Sokolov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Debris removal from high aspect structures
- Patent number 11,391,664
- Issue date Jul 19, 2022
- Bruker Nano, Inc.
- Tod Evan Robinson
- G01 - MEASURING TESTING
Information Patent Grant
Subsurface atomic force microscopy with guided ultrasound waves
- Patent number 11,327,092
- Issue date May 10, 2022
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Daniele Piras
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Array atomic force microscopy for enabling simultaneous multi-point...
- Patent number 11,287,444
- Issue date Mar 29, 2022
- The Regents of the University of California
- Ratneshwar Lal
- G01 - MEASURING TESTING
Information Patent Grant
Treatment of living organisms based on gravitational resonances and...
- Patent number 11,262,379
- Issue date Mar 1, 2022
- Vadim Kukharev
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for obtaining functionalised sensor tips for atomic force mi...
- Patent number 11,156,635
- Issue date Oct 26, 2021
- Universidad Politecnica de Madrid
- José Pérez Rigueiro
- G01 - MEASURING TESTING
Information Patent Grant
Thermal analysis for source rocks
- Patent number 11,150,206
- Issue date Oct 19, 2021
- Saudi Arabian Oil Company
- Shannon L. Eichmann
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for ultrasensitive quantification of microRNA...
- Patent number 11,111,528
- Issue date Sep 7, 2021
- Posco
- Joon Won Park
- G01 - MEASURING TESTING
Information Patent Grant
Debris removal in high aspect structures
- Patent number 11,040,379
- Issue date Jun 22, 2021
- Bruker Nano, Inc.
- Tod Evan Robinson
- G01 - MEASURING TESTING
Information Patent Grant
Probe manufacturing method and probe
- Patent number 10,900,905
- Issue date Jan 26, 2021
- Horiba, Ltd.
- Masayuki Nishi
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting electrical characteristics of individual soot...
- Patent number 10,788,511
- Issue date Sep 29, 2020
- Tianjin University
- Chonglin Song
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Systems and methods for nano-tribological manufacturing of nanostru...
- Patent number 10,768,202
- Issue date Sep 8, 2020
- The Trustees of the University of Pennsylvania
- Robert W. Carpick
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Methods and apparatus for high throughput SEM and AFM for character...
- Patent number 10,714,310
- Issue date Jul 14, 2020
- Nanowear Inc.
- Vijay Varadan
- B82 - NANO-TECHNOLOGY
Information Patent Grant
VCSEL-based resonant-cavity-enhanced atomic force microscopy active...
- Patent number 10,663,485
- Issue date May 26, 2020
- ACTOPROBE LLC
- Alexander A. Ukhanov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning probe microscope and method for measuring local electrical...
- Patent number 10,585,116
- Issue date Mar 10, 2020
- Forschungszentrum Juelich GmbH
- Frank Stefan Tautz
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for high throughput SEM and AFM for character...
- Patent number 10,438,772
- Issue date Oct 8, 2019
- Nanowear Inc.
- Vijay Varadan
- G01 - MEASURING TESTING
Information Patent Grant
Debris removal in high aspect structures
- Patent number 10,384,238
- Issue date Aug 20, 2019
- Rave LLC
- Tod Evan Robinson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Cantilever set for atomic force microscopes, substrate surface insp...
- Patent number 10,352,964
- Issue date Jul 16, 2019
- Samsung Electronics Co., Ltd.
- Kyeong-mi Lee
- G01 - MEASURING TESTING
Information Patent Grant
Debris removal from high aspect structures
- Patent number 10,330,581
- Issue date Jun 25, 2019
- Rave LLC
- Tod Evan Robinson
- B08 - CLEANING
Information Patent Grant
Cantilevered probes having piezoelectric layer, treated section, an...
- Patent number 10,156,585
- Issue date Dec 18, 2018
- Board of Regents of the Nevada System of Higher Education, on Behalf of the U...
- Jesse D. Adams
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for manufacturing microcantilever having functional probe
- Patent number 10,132,832
- Issue date Nov 20, 2018
- Industry-University Cooperation Foundation Sogang University
- Jung Chul Lee
- G01 - MEASURING TESTING
Information Patent Grant
Micro magnetic trap and process for evaluating forces with pico New...
- Patent number 10,073,057
- Issue date Sep 11, 2018
- Universidad de Santiago de Chile
- Francisco Esteban Melo Hurtado
- G01 - MEASURING TESTING
Information Patent Grant
Targeted sequencing of biomolecules by pulling through a liquid-liq...
- Patent number 10,041,114
- Issue date Aug 7, 2018
- International Business Machines Corporation
- Venkat K. Balagurusamy
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for determining antifouling ability of a material surface an...
- Patent number 10,006,934
- Issue date Jun 26, 2018
- Industrial Technology Research Institute
- Feng-Sheng Kao
- G01 - MEASURING TESTING
Information Patent Grant
Chemical reagents for attaching affinity molecules on surfaces
- Patent number 9,981,997
- Issue date May 29, 2018
- Arizona Board of Regents on behalf of Arizona State University
- Peiming Zhang
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...

Patents Applicationslast 30 patents

Information Patent Application
DEBRIS REMOVAL FROM HIGH ASPECT STRUCTURES
- Publication number 20240269717
- Publication date Aug 15, 2024
- Bruker Nano, Inc.
- Tod Evan Robinson
- B08 - CLEANING
Information Patent Application
SYSTEM AND METHOD FOR SCANNING NEAR-FIELD OPTICAL MICROSCOPY
- Publication number 20240219420
- Publication date Jul 4, 2024
- Brown University
- Daniel MITTLEMAN
- B82 - NANO-TECHNOLOGY
Information Patent Application
SYSTEM, METHOD, COMPUTER-ACCESSIBLE MEDIUM AND APPARATUS FOR DNA MA...
- Publication number 20240077516
- Publication date Mar 7, 2024
- Virginia Commonwealth University
- Jason REED
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING
- Publication number 20230251284
- Publication date Aug 10, 2023
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Application
Atomic-Force Microscopy for Identification of Surfaces
- Publication number 20230058610
- Publication date Feb 23, 2023
- Trustees of Tufts College
- Igor Sokolov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING
- Publication number 20220244289
- Publication date Aug 4, 2022
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Application
PROBE PRODUCTION METHOD AND SURFACE OBSERVATION METHOD
- Publication number 20220050125
- Publication date Feb 17, 2022
- SHOWA DENKO K.K.
- Tsuyoshi KATO
- G01 - MEASURING TESTING
Information Patent Application
TREATMENT OF LIVING ORGANISMS BASED ON GRAVITATIONAL RESONANCES AND...
- Publication number 20220026463
- Publication date Jan 27, 2022
- Vadim KUKHAREV
- B82 - NANO-TECHNOLOGY
Information Patent Application
Atomic-Force Microscopy for Identification of Surfaces
- Publication number 20220003798
- Publication date Jan 6, 2022
- Trustees of Tufts College
- Igor Sokolov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ARRAY ATOMIC FORCE MICROSCOPY FOR ENABLING SIMULTANEOUS MULTI-POINT...
- Publication number 20210396783
- Publication date Dec 23, 2021
- The Regents of the University of California
- Ratneshwar Lal
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR OBTAINING FUNCTIONALISED SENSOR TIPS FOR ATOMIC FORCE MI...
- Publication number 20210293851
- Publication date Sep 23, 2021
- UNIVERSIDAD POLITECNICA DE MADRID
- José PÉREZ RIGUEIRO
- G01 - MEASURING TESTING
Information Patent Application
SUBSURFACE ATOMIC FORCE MICROSCOPY WITH GUIDED ULTRASOUND WAVES
- Publication number 20210109128
- Publication date Apr 15, 2021
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Daniele Piras
- B82 - NANO-TECHNOLOGY
Information Patent Application
Thermal Analysis for Source Rocks
- Publication number 20210080413
- Publication date Mar 18, 2021
- Saudi Arabian Oil Company
- Shannon L. Eichmann
- G01 - MEASURING TESTING
Information Patent Application
PREDICTING TUMOR SPECIFICITY OF TARGETED THERAPEUTICS USING ATOMIC...
- Publication number 20200308620
- Publication date Oct 1, 2020
- Children's Medical Center Corporation
- Marsha A. Moses
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING ELECTRICAL CHARACTERISTICS OF INDIVIDUAL SOOT...
- Publication number 20200241039
- Publication date Jul 30, 2020
- TIANJIN UNIVERSITY
- Chonglin SONG
- B82 - NANO-TECHNOLOGY
Information Patent Application
SYSTEM, METHOD, COMPUTER-ACCESSIBLE MEDIUM AND APPARATUS FOR DNA MA...
- Publication number 20190352710
- Publication date Nov 21, 2019
- Virginia Commonwealth University
- Jason REED
- G01 - MEASURING TESTING
Information Patent Application
Large Radius Probe
- Publication number 20190293682
- Publication date Sep 26, 2019
- Bruker Nano, Inc.
- Jeffrey Wong
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
PROBE MANUFACTURING METHOD AND PROBE
- Publication number 20190170651
- Publication date Jun 6, 2019
- KYOTO UNIVERSITY
- Masayuki NISHI
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR HIGH THROUGHPUT SEM AND AFM FOR CHARACTER...
- Publication number 20180330918
- Publication date Nov 15, 2018
- Nanowear Inc.
- Vijay Varadan
- B82 - NANO-TECHNOLOGY
Information Patent Application
SYSTEMS AND METHODS FOR NANO-TRIBOLOGICAL MANUFACTURING OF NANOSTRU...
- Publication number 20180210007
- Publication date Jul 26, 2018
- The Trustees of the University of Pennsylvania
- Robert W. Carpick
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD FOR MANUFACTURING MICROCANTILEVER HAVING FUNCTIONAL PROBE
- Publication number 20180143222
- Publication date May 24, 2018
- Industry-University Cooperation Foundation Sogang University
- Jung Chul LEE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR ULTRASENSITIVE QUANTITATIVE ANALYSIS OF DN...
- Publication number 20180135111
- Publication date May 17, 2018
- POSTECH ACADEMY-INDUSTRY FOUNDATION
- Joon Won Park
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
ATOMIC FORCE MICROSCOPE INTEGRATED WITH A MULTIPLE DEGREES-OF-FREED...
- Publication number 20160266107
- Publication date Sep 15, 2016
- BOGAZICI UNIVERSITESI
- Hamdi TORUN
- G01 - MEASURING TESTING
Information Patent Application
TARGETED SEQUENCING OF BIOMOLECULES BY PULLING THROUGH A LIQUID-LIQ...
- Publication number 20140352006
- Publication date Nov 27, 2014
- International Business Machines Corporation
- Venkat K. Balagurusamy
- B82 - NANO-TECHNOLOGY
Information Patent Application
TARGETED SEQUENCING OF BIOMOLECULES BY PULLING THROUGH A LIQUID-LIQ...
- Publication number 20140352005
- Publication date Nov 27, 2014
- Venkat K. Balagurusamy
- B82 - NANO-TECHNOLOGY
Information Patent Application
BIOMOLECULE INTERACTION USING ATOMIC FORCE MICROSCOPE
- Publication number 20140315319
- Publication date Oct 23, 2014
- Posco
- Joon Won PARK
- B82 - NANO-TECHNOLOGY
Information Patent Application
CANTILEVERED PROBES HAVING PIEZOELECTRIC LAYER, TREATED SECTION, AN...
- Publication number 20140287958
- Publication date Sep 25, 2014
- Jesse D. Adams
- B82 - NANO-TECHNOLOGY
Information Patent Application
HIGH THROUGHOUT REPRODUCIBLE CANTILEVER FUNCTIONALIZATION
- Publication number 20140123348
- Publication date May 1, 2014
- UT-Battelle, LLC
- Barbara R. Evans
- B82 - NANO-TECHNOLOGY
Information Patent Application
MICROFLUIDIC SURFACE PROCESSING DEVICE AND METHOD
- Publication number 20140004264
- Publication date Jan 2, 2014
- Urs T. Duerig
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
Atomic Force Microscope Manipulation of Living Cells
- Publication number 20130283486
- Publication date Oct 24, 2013
- The Board of Trustees of the Leland Stanford Junior University
- Manish J. Butte
- B82 - NANO-TECHNOLOGY

Functionalization

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Automated optimization of AFM light source positioning

Debris removal from high aspect structures

Atomic-force microscopy for identification of surfaces

Automated optimization of AFM light source positioning

Debris removal in high aspect structures

Atomic-force microscopy for identification of surfaces

Debris removal from high aspect structures

Subsurface atomic force microscopy with guided ultrasound waves

Array atomic force microscopy for enabling simultaneous multi-point...

Treatment of living organisms based on gravitational resonances and...

Method for obtaining functionalised sensor tips for atomic force mi...

Thermal analysis for source rocks

Method and apparatus for ultrasensitive quantification of microRNA...

Debris removal in high aspect structures

Probe manufacturing method and probe

Method for detecting electrical characteristics of individual soot...

Systems and methods for nano-tribological manufacturing of nanostru...

Methods and apparatus for high throughput SEM and AFM for character...

VCSEL-based resonant-cavity-enhanced atomic force microscopy active...

Scanning probe microscope and method for measuring local electrical...

Methods and apparatus for high throughput SEM and AFM for character...

Debris removal in high aspect structures

Cantilever set for atomic force microscopes, substrate surface insp...

Debris removal from high aspect structures

Cantilevered probes having piezoelectric layer, treated section, an...

Method for manufacturing microcantilever having functional probe

Micro magnetic trap and process for evaluating forces with pico New...

Targeted sequencing of biomolecules by pulling through a liquid-liq...

Method for determining antifouling ability of a material surface an...

Chemical reagents for attaching affinity molecules on surfaces

Patents Applicationslast 30 patents

DEBRIS REMOVAL FROM HIGH ASPECT STRUCTURES

SYSTEM AND METHOD FOR SCANNING NEAR-FIELD OPTICAL MICROSCOPY

SYSTEM, METHOD, COMPUTER-ACCESSIBLE MEDIUM AND APPARATUS FOR DNA MA...

AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING

Atomic-Force Microscopy for Identification of Surfaces

AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING

PROBE PRODUCTION METHOD AND SURFACE OBSERVATION METHOD

TREATMENT OF LIVING ORGANISMS BASED ON GRAVITATIONAL RESONANCES AND...

Atomic-Force Microscopy for Identification of Surfaces

ARRAY ATOMIC FORCE MICROSCOPY FOR ENABLING SIMULTANEOUS MULTI-POINT...

METHOD FOR OBTAINING FUNCTIONALISED SENSOR TIPS FOR ATOMIC FORCE MI...

SUBSURFACE ATOMIC FORCE MICROSCOPY WITH GUIDED ULTRASOUND WAVES

Thermal Analysis for Source Rocks

PREDICTING TUMOR SPECIFICITY OF TARGETED THERAPEUTICS USING ATOMIC...

METHOD FOR DETECTING ELECTRICAL CHARACTERISTICS OF INDIVIDUAL SOOT...

SYSTEM, METHOD, COMPUTER-ACCESSIBLE MEDIUM AND APPARATUS FOR DNA MA...

Large Radius Probe

PROBE MANUFACTURING METHOD AND PROBE

METHODS AND APPARATUS FOR HIGH THROUGHPUT SEM AND AFM FOR CHARACTER...

SYSTEMS AND METHODS FOR NANO-TRIBOLOGICAL MANUFACTURING OF NANOSTRU...

METHOD FOR MANUFACTURING MICROCANTILEVER HAVING FUNCTIONAL PROBE

METHOD AND APPARATUS FOR ULTRASENSITIVE QUANTITATIVE ANALYSIS OF DN...

ATOMIC FORCE MICROSCOPE INTEGRATED WITH A MULTIPLE DEGREES-OF-FREED...

TARGETED SEQUENCING OF BIOMOLECULES BY PULLING THROUGH A LIQUID-LIQ...

TARGETED SEQUENCING OF BIOMOLECULES BY PULLING THROUGH A LIQUID-LIQ...

BIOMOLECULE INTERACTION USING ATOMIC FORCE MICROSCOPE

CANTILEVERED PROBES HAVING PIEZOELECTRIC LAYER, TREATED SECTION, AN...

HIGH THROUGHOUT REPRODUCIBLE CANTILEVER FUNCTIONALIZATION

MICROFLUIDIC SURFACE PROCESSING DEVICE AND METHOD

Atomic Force Microscope Manipulation of Living Cells