Gas purge

Industry

CPC
G01N2201/0233

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2201/00Features of devices classified in G01N21/00

Current Industry

G01N2201/0233Gas purge

Industries

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Patents Grantslast 30 patents

Information Patent Grant
High-temperature optical probe
- Patent number 12,007,330
- Issue date Jun 11, 2024
- Dow Global Technologies LLC
- James D. Tate
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method of hydroxyl detection
- Patent number 10,697,890
- Issue date Jun 30, 2020
- UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA.
- Steven A. Bailey
- G01 - MEASURING TESTING
Information Patent Grant
Probe for gas sensor having purge gas protection
- Patent number 10,416,072
- Issue date Sep 17, 2019
- Danfoss IXA A/S
- Allan Skouboe
- G01 - MEASURING TESTING
Information Patent Grant
Nephelometric turbidimeter and method for controlling the humidity...
- Patent number 10,408,729
- Issue date Sep 10, 2019
- Hach Lange GmbH
- Manfred Battefeld
- G01 - MEASURING TESTING
Information Patent Grant
Sample cup assembly, system and method for purging
- Patent number 9,841,360
- Issue date Dec 12, 2017
- Michael C. Solazzi
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Method and apparatus for measuring appearance and disappearance tem...
- Patent number 9,354,167
- Issue date May 31, 2016
- Phase Technology
- Vivian Hoi Nga Yuen
- G01 - MEASURING TESTING
Information Patent Grant
Light source
- Patent number 8,310,673
- Issue date Nov 13, 2012
- NU Eco Engineering Co., Ltd.
- Masaru Hori
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for monitoring by absorption spectroscopy during the forming...
- Patent number 8,220,291
- Issue date Jul 17, 2012
- L'Air Liquide Societe Anonyme pour l'Etude et l'Exploitation des Procedes Geo...
- Nicolas Docquier
- G01 - MEASURING TESTING
Information Patent Grant
Purge gas flow control for high-precision film measurements using e...
- Patent number 7,755,764
- Issue date Jul 13, 2010
- KLA-Tencor Corporation
- Hidong Kwak
- G01 - MEASURING TESTING
Information Patent Grant
Testing of samples
- Patent number 7,610,815
- Issue date Nov 3, 2009
- Instron Limited
- Paul D. Hayford
- G01 - MEASURING TESTING
Information Patent Grant
Testing of samples
- Patent number 7,047,819
- Issue date May 23, 2006
- Instron Limited
- Paul D. Hayford
- G01 - MEASURING TESTING
Information Patent Grant
Optical scanner with self contained standardization means
- Patent number 5,343,296
- Issue date Aug 30, 1994
- ABB Process Automation Inc.
- Ake A. Hellstrom
- G01 - MEASURING TESTING
Information Patent Grant
Modular surface inspection method and apparatus using optical fibers
- Patent number 5,164,603
- Issue date Nov 17, 1992
- Reynolds Metals Company
- Nile F. Hartman
- G01 - MEASURING TESTING
Information Patent Grant
Removal of gases disturbing the measurements of a gas detector
- Patent number 5,091,649
- Issue date Feb 25, 1992
- Instrumentarium Corporation
- Borje T. Rantala
- G01 - MEASURING TESTING
Information Patent Grant
Multichannel, optical-fiber-based spectrometer
- Patent number 4,755,054
- Issue date Jul 5, 1988
- E-Squared Engineering, Inc.
- Mark B. Ferree
- G02 - OPTICS
Information Patent Grant
Universal spectrometer system having modular sampling chamber
- Patent number 4,657,390
- Issue date Apr 14, 1987
- Laser Precision Corporation
- Walter M. Doyle
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
GAS FLOW CONFIGURATIONS FOR SEMICONDUCTOR INSPECTIONS
- Publication number 20240230555
- Publication date Jul 11, 2024
- KLA Corporation
- Chunhai Wang
- G01 - MEASURING TESTING
Information Patent Application
GAS ANALYSIS DEVICE AND LASER LIGHT TRANSMISSION MECHANISM
- Publication number 20240201078
- Publication date Jun 20, 2024
- Horiba Stec, Co., Ltd.
- Motonobu TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
GAS FLOW CONFIGURATIONS FOR SEMICONDUCTOR INSPECTIONS
- Publication number 20240133825
- Publication date Apr 25, 2024
- KLA Corporation
- Chunhai Wang
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING HELICOBACTER PYLORI
- Publication number 20180011081
- Publication date Jan 11, 2018
- Kibion GmbH
- Grischa Wagner
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR GAS SENSOR HAVING PURGE GAS PROTECTION
- Publication number 20170131199
- Publication date May 11, 2017
- DANFOSS IXA A/S
- Allan SKOUBOE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING APPEARANCE AND DISAPPEARANCE TEM...
- Publication number 20160097717
- Publication date Apr 7, 2016
- Vivain Hoi Nga Yuen
- G01 - MEASURING TESTING
Information Patent Application
LIGHT SOURCE
- Publication number 20100201978
- Publication date Aug 12, 2010
- Masaru Hori
- G01 - MEASURING TESTING
Information Patent Application
Method for Monitoring by Absorption Spectroscopy During the Forming...
- Publication number 20100162766
- Publication date Jul 1, 2010
- L,AIR LIQUIDE SOCIETE ANONYME POUR L'ETUDE ET L'EX
- Nicolas Docquier
- G01 - MEASURING TESTING
Information Patent Application
PURGE GAS FLOW CONTROL FOR HIGH-PRECISION FILM MEASUREMENTS USING E...
- Publication number 20080180698
- Publication date Jul 31, 2008
- KLA-Tencor Corporation
- Hidong Kwak
- G01 - MEASURING TESTING
Information Patent Application
Testing of samples
- Publication number 20060185440
- Publication date Aug 24, 2006
- Paul D. Hayford
- G01 - MEASURING TESTING
Information Patent Application
Device and method for spectroscopically measuring a gas concentrati...
- Publication number 20050128486
- Publication date Jun 16, 2005
- Linde Aktiengesellschaft
- Andreas Dietrich
- G01 - MEASURING TESTING
Information Patent Application
Testing of samples
- Publication number 20040145724
- Publication date Jul 29, 2004
- Paul D. Hayford
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

High-temperature optical probe

Apparatus and method of hydroxyl detection

Probe for gas sensor having purge gas protection

Nephelometric turbidimeter and method for controlling the humidity...

Sample cup assembly, system and method for purging

Method and apparatus for measuring appearance and disappearance tem...

Light source

Method for monitoring by absorption spectroscopy during the forming...

Purge gas flow control for high-precision film measurements using e...

Testing of samples

Testing of samples

Optical scanner with self contained standardization means

Modular surface inspection method and apparatus using optical fibers

Removal of gases disturbing the measurements of a gas detector

Multichannel, optical-fiber-based spectrometer

Universal spectrometer system having modular sampling chamber

Patents Applicationslast 30 patents

GAS FLOW CONFIGURATIONS FOR SEMICONDUCTOR INSPECTIONS

GAS ANALYSIS DEVICE AND LASER LIGHT TRANSMISSION MECHANISM

GAS FLOW CONFIGURATIONS FOR SEMICONDUCTOR INSPECTIONS

METHOD FOR DETECTING HELICOBACTER PYLORI

PROBE FOR GAS SENSOR HAVING PURGE GAS PROTECTION

METHOD AND APPARATUS FOR MEASURING APPEARANCE AND DISAPPEARANCE TEM...

LIGHT SOURCE

Method for Monitoring by Absorption Spectroscopy During the Forming...

PURGE GAS FLOW CONTROL FOR HIGH-PRECISION FILM MEASUREMENTS USING E...

Testing of samples

Device and method for spectroscopically measuring a gas concentrati...

Testing of samples