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G01N23/20016
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N23/00
Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00
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G01N23/20016
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Patents Grants
last 30 patents
Information
Patent Grant
Method for scanning a sample by means of X-ray optics and an appara...
Patent number
12,106,867
Issue date
Oct 1, 2024
Bruker Nano GmbH
Ulrich Waldschläger
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Single-crystal X-ray structure analysis apparatus and method, and s...
Patent number
12,092,593
Issue date
Sep 17, 2024
Rigaku Corporation
Takashi Sato
G01 - MEASURING TESTING
Information
Patent Grant
Transmissive small-angle scattering device
Patent number
12,019,036
Issue date
Jun 25, 2024
Rigaku Corporation
Naoki Matsushima
G01 - MEASURING TESTING
Information
Patent Grant
Airtight box for measurement, airtight apparatus, measurement syste...
Patent number
11,942,231
Issue date
Mar 26, 2024
Rigaku Corporation
Koichiro Ito
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Device for hosting a probe solution of molecules in a plurality of...
Patent number
11,933,746
Issue date
Mar 19, 2024
Paul Scherrer Institut
Soichiro Tsujino
G01 - MEASURING TESTING
Information
Patent Grant
Anti-frosting and anti-dew device for spectroscopic measurements
Patent number
11,921,062
Issue date
Mar 5, 2024
UNIVERSITE DE ROUEN NORMANDIE
Gérard Coquerel
G01 - MEASURING TESTING
Information
Patent Grant
X-ray device having multiple beam paths
Patent number
11,906,448
Issue date
Feb 20, 2024
Anton Paar GmbH
Josef Gautsch
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Single-crystal X-ray structure analysis apparatus and sample holder
Patent number
11,846,594
Issue date
Dec 19, 2023
Rigaku Corporation
Takashi Sato
G01 - MEASURING TESTING
Information
Patent Grant
Ball-mapping system comprising a sample stage and a sample holder f...
Patent number
11,846,593
Issue date
Dec 19, 2023
PROTO PATENTS LTD.
James Pineault
G01 - MEASURING TESTING
Information
Patent Grant
Single-crystal X-ray structure analysis apparatus and sample holder...
Patent number
11,835,476
Issue date
Dec 5, 2023
Rigaku Corporation
Takashi Sato
G01 - MEASURING TESTING
Information
Patent Grant
X-ray examination device
Patent number
11,821,856
Issue date
Nov 21, 2023
Anton Paar GmbH
Josef Gautsch
G01 - MEASURING TESTING
Information
Patent Grant
X-ray analysis apparatus
Patent number
11,808,721
Issue date
Nov 7, 2023
Rigaku Corporation
Takeshi Osakabe
G01 - MEASURING TESTING
Information
Patent Grant
Single-crystal x-ray structure analysis apparatus and method, and s...
Patent number
11,802,844
Issue date
Oct 31, 2023
Rigaku Corporation
Takashi Sato
G01 - MEASURING TESTING
Information
Patent Grant
Control apparatus, system, method, and program
Patent number
11,788,974
Issue date
Oct 17, 2023
Rigaku Corporation
Shintaro Kobayashi
G01 - MEASURING TESTING
Information
Patent Grant
Transmissive small-angle scattering device
Patent number
11,754,515
Issue date
Sep 12, 2023
Rigaku Corporation
Naoki Matsushima
G01 - MEASURING TESTING
Information
Patent Grant
Determining sucrose concentration in honey based on fluorescence sp...
Patent number
11,499,919
Issue date
Nov 15, 2022
Amirkabir University of Technology
Ali Bavali
G01 - MEASURING TESTING
Information
Patent Grant
Divergent beam two dimensional diffraction
Patent number
11,275,039
Issue date
Mar 15, 2022
Jonathan Giencke
G01 - MEASURING TESTING
Information
Patent Grant
X-ray analysis apparatus
Patent number
11,215,571
Issue date
Jan 4, 2022
Rigaku Corporation
Takeshi Osakabe
G01 - MEASURING TESTING
Information
Patent Grant
Device, system and method for X-ray diffraction analysis of an elec...
Patent number
11,181,492
Issue date
Nov 23, 2021
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Julien Vulliet
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Grant
Detection of crystallographic properties in aerospace components
Patent number
11,181,491
Issue date
Nov 23, 2021
Raytheon Technologies Corporation
Iuliana Cernatescu
G01 - MEASURING TESTING
Information
Patent Grant
System and method for computed laminography x-ray fluorescence imaging
Patent number
11,143,605
Issue date
Oct 12, 2021
Sigray, Inc.
Wenbing Yun
G01 - MEASURING TESTING
Information
Patent Grant
X-ray inspection device
Patent number
11,079,345
Issue date
Aug 3, 2021
Rigaku Corporation
Naoki Matsushima
G01 - MEASURING TESTING
Information
Patent Grant
Method of generating a fingerprint for a gemstone using x-ray imaging
Patent number
11,073,488
Issue date
Jul 27, 2021
Peter Reischig
G01 - MEASURING TESTING
Information
Patent Grant
Hybrid inspection system
Patent number
10,983,073
Issue date
Apr 20, 2021
Rigaku Corporation
Kiyoshi Ogata
G01 - MEASURING TESTING
Information
Patent Grant
Methods for aligning a spectrometer
Patent number
10,962,490
Issue date
Mar 30, 2021
University of Washington
Devon R. Mortensen
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Soller slit, X-ray diffraction apparatus, and method
Patent number
10,964,439
Issue date
Mar 30, 2021
Rigaku Corporation
Ladislav Pina
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
X-ray analysis apparatus
Patent number
10,900,912
Issue date
Jan 26, 2021
Malvern Panalytical B.V.
Detlef Beckers
G01 - MEASURING TESTING
Information
Patent Grant
Processing method, processing apparatus and processing program conf...
Patent number
10,876,979
Issue date
Dec 29, 2020
Rigaku Corporation
Hisashi Konaka
G01 - MEASURING TESTING
Information
Patent Grant
X-ray inspecting device, X-ray thin film inspecting method, and met...
Patent number
10,876,978
Issue date
Dec 29, 2020
Rigaku Corporation
Kiyoshi Ogata
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for X-ray analysis with hybrid control of beam...
Patent number
10,782,252
Issue date
Sep 22, 2020
Malvern Panalytical B.V.
Milen Gateshki
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
X-RAY ANALYSIS APPARATUS AND METHOD
Publication number
20240298400
Publication date
Sep 5, 2024
MALVERN PANALYTICAL B.V.
Detlef Beckers
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SPECIMEN HOLDERS FOR X-RAY DIFFRACTOMETER
Publication number
20240201111
Publication date
Jun 20, 2024
Saudi Arabian Oil Company
Matteo Leoni
G01 - MEASURING TESTING
Information
Patent Application
PROCESSING APPARATUS, SYSTEM, METHOD, AND PROGRAM FOR CALCULATING A...
Publication number
20240120036
Publication date
Apr 11, 2024
Rigaku Corporation
Masatsugu YOSHIMOTO
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR ROTATING A SPECIMEN ABOUT TWO ORTHOGONAL AXES
Publication number
20240027372
Publication date
Jan 25, 2024
HELMHOLTZ-ZENTRUM BERLIN FÜR MATERIALIEN UND ENERGIE GMBH
Andrei VARYKHALOV
G01 - MEASURING TESTING
Information
Patent Application
SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS AND METHOD, AND S...
Publication number
20240027373
Publication date
Jan 25, 2024
Rigaku Corporation
Takashi SATO
G01 - MEASURING TESTING
Information
Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
Publication number
20230384248
Publication date
Nov 30, 2023
Rigaku Corporation
Naoki Matsushima
G01 - MEASURING TESTING
Information
Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
Publication number
20230375485
Publication date
Nov 23, 2023
Rigaku Corporation
Naoki Matsushima
G01 - MEASURING TESTING
Information
Patent Application
CORRECTION APPARATUS, SYSTEM, METHOD, AND PROGRAM
Publication number
20230296539
Publication date
Sep 21, 2023
Rigaku Corporation
Masatsugu YOSHIMOTO
G01 - MEASURING TESTING
Information
Patent Application
X-RAY DETECTOR FOR X-RAY DIFFRACTION ANALYSIS APPARATUS
Publication number
20230296538
Publication date
Sep 21, 2023
MALVERN PANALYTICAL B.V.
Roelof De Vries
G01 - MEASURING TESTING
Information
Patent Application
X-RAY DIFFRACTION APPARATUS AND MEASUREMENT METHOD
Publication number
20230258586
Publication date
Aug 17, 2023
Rigaku Corporation
Hisashi KONAKA
G01 - MEASURING TESTING
Information
Patent Application
CORRECTION AMOUNT SPECIFYING APPARATUS, METHOD, PROGRAM, AND JIG
Publication number
20230152248
Publication date
May 18, 2023
Rigaku Corporation
Takuya KIKUCHI
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE HOLDER FOR PERFORMING X-RAY ANALYSIS ON A CRYSTALLINE SAMPLE...
Publication number
20230031147
Publication date
Feb 2, 2023
Merck Patent GmbH
Carolina VON ESSEN
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR HOSTING A PROBE SOLUTION OF MOLECULES IN A PLURALITY OF...
Publication number
20220404296
Publication date
Dec 22, 2022
PAUL SCHERRER INSTITUT
Soichiro Tsujino
G01 - MEASURING TESTING
Information
Patent Application
X-RAY DEVICE HAVING MULTIPLE BEAM PATHS
Publication number
20220381709
Publication date
Dec 1, 2022
ANTON PAAR GMBH
Josef GAUTSCH
G01 - MEASURING TESTING
Information
Patent Application
X-RAY EXAMINATION DEVICE
Publication number
20220381712
Publication date
Dec 1, 2022
ANTON PAAR GMBH
Josef Gautsch
G01 - MEASURING TESTING
Information
Patent Application
X-RAY ANALYSIS APPARATUS
Publication number
20220244199
Publication date
Aug 4, 2022
Rigaku Corporation
Takeshi OSAKABE
G01 - MEASURING TESTING
Information
Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
Publication number
20220170869
Publication date
Jun 2, 2022
Rigaku Corporation
Naoki Matsushima
G01 - MEASURING TESTING
Information
Patent Application
SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS AND SAMPLE HOLDER...
Publication number
20220128491
Publication date
Apr 28, 2022
Rigaku Corporation
Takashi SATO
G01 - MEASURING TESTING
Information
Patent Application
SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS AND SAMPLE HOLDER
Publication number
20220128492
Publication date
Apr 28, 2022
Rigaku Corporation
Takashi SATO
G01 - MEASURING TESTING
Information
Patent Application
SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS AND METHOD, AND S...
Publication number
20220128490
Publication date
Apr 28, 2022
Rigaku Corporation
Takashi SATO
G01 - MEASURING TESTING
Information
Patent Application
SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS AND METHOD, AND S...
Publication number
20220018791
Publication date
Jan 20, 2022
Rigaku Corporation
Takashi SATO
G01 - MEASURING TESTING
Information
Patent Application
Anti-Frosting and Anti-Dew Device for Spectroscopic Measurements
Publication number
20210223191
Publication date
Jul 22, 2021
UNIVERSITÉ DE ROUEN NORMANDIE
Gérard Coquerel
G01 - MEASURING TESTING
Information
Patent Application
CONTROL APPARATUS, SYSTEM, METHOD, AND PROGRAM
Publication number
20210181126
Publication date
Jun 17, 2021
Rigaku Corporation
Shintaro KOBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
DEVICE, SYSTEM AND METHOD FOR X-RAY DIFFRACTION ANALYSIS OF AN ELEC...
Publication number
20210109043
Publication date
Apr 15, 2021
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Julien Vulliet
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Application
SYSTEM AND METHOD FOR COMPUTED LAMINOGRAPHY X-RAY FLUORESCENCE IMAGING
Publication number
20210080408
Publication date
Mar 18, 2021
Sigray, Inc.
Wenbing Yun
G01 - MEASURING TESTING
Information
Patent Application
X-RAY INSPECTION DEVICE
Publication number
20210063326
Publication date
Mar 4, 2021
Rigaku Corporation
Naoki Matsushima
G01 - MEASURING TESTING
Information
Patent Application
X-RAY ANALYSIS APPARATUS
Publication number
20200300789
Publication date
Sep 24, 2020
Rigaku Corporation
Takeshi OSAKABE
G01 - MEASURING TESTING
Information
Patent Application
DIVERGENT BEAM TWO DIMENSIONAL DIFFRACTION
Publication number
20200033275
Publication date
Jan 30, 2020
Bruker AXS, Inc.
Jonathan Giencke
G01 - MEASURING TESTING
Information
Patent Application
X-ray Analysis Apparatus
Publication number
20190317029
Publication date
Oct 17, 2019
MALVERN PANALYTICAL B.V.
Detlef BECKERS
G01 - MEASURING TESTING
Information
Patent Application
X-RAY DIFFRACTION APPARATUS
Publication number
20190293575
Publication date
Sep 26, 2019
Rigaku Corporation
TAKESHI OSAKABE
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING