Goniometers

Industry

CPC
G01N23/20016

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

Current Industry

G01N23/20016Goniometers

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Spectrometer
- Patent number 12,235,228
- Issue date Feb 25, 2025
- EasyXAFS, LLC
- William Holden
- G01 - MEASURING TESTING
Information Patent Grant
Transmissive small-angle scattering device
- Patent number 12,222,303
- Issue date Feb 11, 2025
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Grant
Method for scanning a sample by means of X-ray optics and an appara...
- Patent number 12,106,867
- Issue date Oct 1, 2024
- Bruker Nano GmbH
- Ulrich Waldschläger
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Single-crystal X-ray structure analysis apparatus and method, and s...
- Patent number 12,092,593
- Issue date Sep 17, 2024
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Transmissive small-angle scattering device
- Patent number 12,019,036
- Issue date Jun 25, 2024
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Grant
Airtight box for measurement, airtight apparatus, measurement syste...
- Patent number 11,942,231
- Issue date Mar 26, 2024
- Rigaku Corporation
- Koichiro Ito
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Device for hosting a probe solution of molecules in a plurality of...
- Patent number 11,933,746
- Issue date Mar 19, 2024
- Paul Scherrer Institut
- Soichiro Tsujino
- G01 - MEASURING TESTING
Information Patent Grant
Anti-frosting and anti-dew device for spectroscopic measurements
- Patent number 11,921,062
- Issue date Mar 5, 2024
- UNIVERSITE DE ROUEN NORMANDIE
- Gérard Coquerel
- G01 - MEASURING TESTING
Information Patent Grant
X-ray device having multiple beam paths
- Patent number 11,906,448
- Issue date Feb 20, 2024
- Anton Paar GmbH
- Josef Gautsch
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Single-crystal X-ray structure analysis apparatus and sample holder
- Patent number 11,846,594
- Issue date Dec 19, 2023
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Ball-mapping system comprising a sample stage and a sample holder f...
- Patent number 11,846,593
- Issue date Dec 19, 2023
- PROTO PATENTS LTD.
- James Pineault
- G01 - MEASURING TESTING
Information Patent Grant
Single-crystal X-ray structure analysis apparatus and sample holder...
- Patent number 11,835,476
- Issue date Dec 5, 2023
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
X-ray examination device
- Patent number 11,821,856
- Issue date Nov 21, 2023
- Anton Paar GmbH
- Josef Gautsch
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis apparatus
- Patent number 11,808,721
- Issue date Nov 7, 2023
- Rigaku Corporation
- Takeshi Osakabe
- G01 - MEASURING TESTING
Information Patent Grant
Single-crystal x-ray structure analysis apparatus and method, and s...
- Patent number 11,802,844
- Issue date Oct 31, 2023
- Rigaku Corporation
- Takashi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Control apparatus, system, method, and program
- Patent number 11,788,974
- Issue date Oct 17, 2023
- Rigaku Corporation
- Shintaro Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Transmissive small-angle scattering device
- Patent number 11,754,515
- Issue date Sep 12, 2023
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Grant
Determining sucrose concentration in honey based on fluorescence sp...
- Patent number 11,499,919
- Issue date Nov 15, 2022
- Amirkabir University of Technology
- Ali Bavali
- G01 - MEASURING TESTING
Information Patent Grant
Divergent beam two dimensional diffraction
- Patent number 11,275,039
- Issue date Mar 15, 2022
- Jonathan Giencke
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis apparatus
- Patent number 11,215,571
- Issue date Jan 4, 2022
- Rigaku Corporation
- Takeshi Osakabe
- G01 - MEASURING TESTING
Information Patent Grant
Device, system and method for X-ray diffraction analysis of an elec...
- Patent number 11,181,492
- Issue date Nov 23, 2021
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Julien Vulliet
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Detection of crystallographic properties in aerospace components
- Patent number 11,181,491
- Issue date Nov 23, 2021
- Raytheon Technologies Corporation
- Iuliana Cernatescu
- G01 - MEASURING TESTING
Information Patent Grant
System and method for computed laminography x-ray fluorescence imaging
- Patent number 11,143,605
- Issue date Oct 12, 2021
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection device
- Patent number 11,079,345
- Issue date Aug 3, 2021
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Grant
Method of generating a fingerprint for a gemstone using x-ray imaging
- Patent number 11,073,488
- Issue date Jul 27, 2021
- Peter Reischig
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid inspection system
- Patent number 10,983,073
- Issue date Apr 20, 2021
- Rigaku Corporation
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Grant
Methods for aligning a spectrometer
- Patent number 10,962,490
- Issue date Mar 30, 2021
- University of Washington
- Devon R. Mortensen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Soller slit, X-ray diffraction apparatus, and method
- Patent number 10,964,439
- Issue date Mar 30, 2021
- Rigaku Corporation
- Ladislav Pina
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray analysis apparatus
- Patent number 10,900,912
- Issue date Jan 26, 2021
- Malvern Panalytical B.V.
- Detlef Beckers
- G01 - MEASURING TESTING
Information Patent Grant
Processing method, processing apparatus and processing program conf...
- Patent number 10,876,979
- Issue date Dec 29, 2020
- Rigaku Corporation
- Hisashi Konaka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY ANALYSIS APPARATUS AND METHOD
- Publication number 20240298400
- Publication date Sep 5, 2024
- MALVERN PANALYTICAL B.V.
- Detlef Beckers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECIMEN HOLDERS FOR X-RAY DIFFRACTOMETER
- Publication number 20240201111
- Publication date Jun 20, 2024
- Saudi Arabian Oil Company
- Matteo Leoni
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING APPARATUS, SYSTEM, METHOD, AND PROGRAM FOR CALCULATING A...
- Publication number 20240120036
- Publication date Apr 11, 2024
- Rigaku Corporation
- Masatsugu YOSHIMOTO
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR ROTATING A SPECIMEN ABOUT TWO ORTHOGONAL AXES
- Publication number 20240027372
- Publication date Jan 25, 2024
- HELMHOLTZ-ZENTRUM BERLIN FÜR MATERIALIEN UND ENERGIE GMBH
- Andrei VARYKHALOV
- G01 - MEASURING TESTING
Information Patent Application
SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS AND METHOD, AND S...
- Publication number 20240027373
- Publication date Jan 25, 2024
- Rigaku Corporation
- Takashi SATO
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
- Publication number 20230384248
- Publication date Nov 30, 2023
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
- Publication number 20230375485
- Publication date Nov 23, 2023
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Application
CORRECTION APPARATUS, SYSTEM, METHOD, AND PROGRAM
- Publication number 20230296539
- Publication date Sep 21, 2023
- Rigaku Corporation
- Masatsugu YOSHIMOTO
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTOR FOR X-RAY DIFFRACTION ANALYSIS APPARATUS
- Publication number 20230296538
- Publication date Sep 21, 2023
- MALVERN PANALYTICAL B.V.
- Roelof De Vries
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION APPARATUS AND MEASUREMENT METHOD
- Publication number 20230258586
- Publication date Aug 17, 2023
- Rigaku Corporation
- Hisashi KONAKA
- G01 - MEASURING TESTING
Information Patent Application
CORRECTION AMOUNT SPECIFYING APPARATUS, METHOD, PROGRAM, AND JIG
- Publication number 20230152248
- Publication date May 18, 2023
- Rigaku Corporation
- Takuya KIKUCHI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE HOLDER FOR PERFORMING X-RAY ANALYSIS ON A CRYSTALLINE SAMPLE...
- Publication number 20230031147
- Publication date Feb 2, 2023
- Merck Patent GmbH
- Carolina VON ESSEN
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR HOSTING A PROBE SOLUTION OF MOLECULES IN A PLURALITY OF...
- Publication number 20220404296
- Publication date Dec 22, 2022
- PAUL SCHERRER INSTITUT
- Soichiro Tsujino
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DEVICE HAVING MULTIPLE BEAM PATHS
- Publication number 20220381709
- Publication date Dec 1, 2022
- ANTON PAAR GMBH
- Josef GAUTSCH
- G01 - MEASURING TESTING
Information Patent Application
X-RAY EXAMINATION DEVICE
- Publication number 20220381712
- Publication date Dec 1, 2022
- ANTON PAAR GMBH
- Josef Gautsch
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS APPARATUS
- Publication number 20220244199
- Publication date Aug 4, 2022
- Rigaku Corporation
- Takeshi OSAKABE
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
- Publication number 20220170869
- Publication date Jun 2, 2022
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Application
SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS AND SAMPLE HOLDER...
- Publication number 20220128491
- Publication date Apr 28, 2022
- Rigaku Corporation
- Takashi SATO
- G01 - MEASURING TESTING
Information Patent Application
SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS AND SAMPLE HOLDER
- Publication number 20220128492
- Publication date Apr 28, 2022
- Rigaku Corporation
- Takashi SATO
- G01 - MEASURING TESTING
Information Patent Application
SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS AND METHOD, AND S...
- Publication number 20220128490
- Publication date Apr 28, 2022
- Rigaku Corporation
- Takashi SATO
- G01 - MEASURING TESTING
Information Patent Application
SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS AND METHOD, AND S...
- Publication number 20220018791
- Publication date Jan 20, 2022
- Rigaku Corporation
- Takashi SATO
- G01 - MEASURING TESTING
Information Patent Application
Anti-Frosting and Anti-Dew Device for Spectroscopic Measurements
- Publication number 20210223191
- Publication date Jul 22, 2021
- UNIVERSITÉ DE ROUEN NORMANDIE
- Gérard Coquerel
- G01 - MEASURING TESTING
Information Patent Application
CONTROL APPARATUS, SYSTEM, METHOD, AND PROGRAM
- Publication number 20210181126
- Publication date Jun 17, 2021
- Rigaku Corporation
- Shintaro KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
DEVICE, SYSTEM AND METHOD FOR X-RAY DIFFRACTION ANALYSIS OF AN ELEC...
- Publication number 20210109043
- Publication date Apr 15, 2021
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Julien Vulliet
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
SYSTEM AND METHOD FOR COMPUTED LAMINOGRAPHY X-RAY FLUORESCENCE IMAGING
- Publication number 20210080408
- Publication date Mar 18, 2021
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION DEVICE
- Publication number 20210063326
- Publication date Mar 4, 2021
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS APPARATUS
- Publication number 20200300789
- Publication date Sep 24, 2020
- Rigaku Corporation
- Takeshi OSAKABE
- G01 - MEASURING TESTING
Information Patent Application
DIVERGENT BEAM TWO DIMENSIONAL DIFFRACTION
- Publication number 20200033275
- Publication date Jan 30, 2020
- Bruker AXS, Inc.
- Jonathan Giencke
- G01 - MEASURING TESTING
Information Patent Application
X-ray Analysis Apparatus
- Publication number 20190317029
- Publication date Oct 17, 2019
- MALVERN PANALYTICAL B.V.
- Detlef BECKERS
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION APPARATUS
- Publication number 20190293575
- Publication date Sep 26, 2019
- Rigaku Corporation
- TAKESHI OSAKABE
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Goniometers

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Spectrometer

Transmissive small-angle scattering device

Method for scanning a sample by means of X-ray optics and an appara...

Single-crystal X-ray structure analysis apparatus and method, and s...

Transmissive small-angle scattering device

Airtight box for measurement, airtight apparatus, measurement syste...

Device for hosting a probe solution of molecules in a plurality of...

Anti-frosting and anti-dew device for spectroscopic measurements

X-ray device having multiple beam paths

Single-crystal X-ray structure analysis apparatus and sample holder

Ball-mapping system comprising a sample stage and a sample holder f...

Single-crystal X-ray structure analysis apparatus and sample holder...

X-ray examination device

X-ray analysis apparatus

Single-crystal x-ray structure analysis apparatus and method, and s...

Control apparatus, system, method, and program

Transmissive small-angle scattering device

Determining sucrose concentration in honey based on fluorescence sp...

Divergent beam two dimensional diffraction

X-ray analysis apparatus

Device, system and method for X-ray diffraction analysis of an elec...

Detection of crystallographic properties in aerospace components

System and method for computed laminography x-ray fluorescence imaging

X-ray inspection device

Method of generating a fingerprint for a gemstone using x-ray imaging

Hybrid inspection system

Methods for aligning a spectrometer

Soller slit, X-ray diffraction apparatus, and method

X-ray analysis apparatus

Processing method, processing apparatus and processing program conf...

Patents Applicationslast 30 patents

X-RAY ANALYSIS APPARATUS AND METHOD

SPECIMEN HOLDERS FOR X-RAY DIFFRACTOMETER

PROCESSING APPARATUS, SYSTEM, METHOD, AND PROGRAM FOR CALCULATING A...

DEVICE FOR ROTATING A SPECIMEN ABOUT TWO ORTHOGONAL AXES

SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS AND METHOD, AND S...

TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE

TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE

CORRECTION APPARATUS, SYSTEM, METHOD, AND PROGRAM

X-RAY DETECTOR FOR X-RAY DIFFRACTION ANALYSIS APPARATUS

X-RAY DIFFRACTION APPARATUS AND MEASUREMENT METHOD

CORRECTION AMOUNT SPECIFYING APPARATUS, METHOD, PROGRAM, AND JIG

SAMPLE HOLDER FOR PERFORMING X-RAY ANALYSIS ON A CRYSTALLINE SAMPLE...

DEVICE FOR HOSTING A PROBE SOLUTION OF MOLECULES IN A PLURALITY OF...

X-RAY DEVICE HAVING MULTIPLE BEAM PATHS

X-RAY EXAMINATION DEVICE

X-RAY ANALYSIS APPARATUS

TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE

SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS AND SAMPLE HOLDER...

SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS AND SAMPLE HOLDER

SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS AND METHOD, AND S...

SINGLE-CRYSTAL X-RAY STRUCTURE ANALYSIS APPARATUS AND METHOD, AND S...

Anti-Frosting and Anti-Dew Device for Spectroscopic Measurements

CONTROL APPARATUS, SYSTEM, METHOD, AND PROGRAM

DEVICE, SYSTEM AND METHOD FOR X-RAY DIFFRACTION ANALYSIS OF AN ELEC...

SYSTEM AND METHOD FOR COMPUTED LAMINOGRAPHY X-RAY FLUORESCENCE IMAGING

X-RAY INSPECTION DEVICE

X-RAY ANALYSIS APPARATUS

DIVERGENT BEAM TWO DIMENSIONAL DIFFRACTION

X-ray Analysis Apparatus

X-RAY DIFFRACTION APPARATUS