Grading and classifying of flaws

Industry

CPC
G01N2021/8854

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/8854Grading and classifying of flaws

Industries

Patents Grantslast 30 patents

Information Patent Grant
Cutter analysis and mapping
- Patent number 12,141,960
- Issue date Nov 12, 2024
- Halliburton Energy Services, Inc.
- William Brian Atkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for monitoring resilience of shield tunnel based on multi-so...
- Patent number 12,091,976
- Issue date Sep 17, 2024
- Shenzhen University
- Min Zhu
- E21 - EARTH DRILLING MINING
Information Patent Grant
AI-based product surface inspecting apparatus and method
- Patent number 12,087,421
- Issue date Sep 10, 2024
- INTER X Co., Ltd.
- Jung Ywn Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Portable visual inspection apparatus and method for inspecting article
- Patent number 12,072,296
- Issue date Aug 27, 2024
- Tyco Electronics (Shanghai) Co., Ltd.
- Lei (Alex) Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for synthesizing a diamond using machine learning
- Patent number 12,072,299
- Issue date Aug 27, 2024
- Fraunhofer USA, Inc.
- Rohan Reddy Mekala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Repair diagram generation device, repair diagram generation method,...
- Patent number 12,061,152
- Issue date Aug 13, 2024
- FUJIFILM Corporation
- Shuhei Horita
- G01 - MEASURING TESTING
Information Patent Grant
Data processing method and system for detection of deterioration of...
- Patent number 12,055,498
- Issue date Aug 6, 2024
- Top Technology Platform Co., Ltd.
- Chyuan-Ruey Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of condition monitoring one or more wind turbines and parts...
- Patent number 12,044,208
- Issue date Jul 23, 2024
- Ventus Engineering GmbH
- Lars Lysgaard
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for detection of mobile device fault conditions
- Patent number 12,013,346
- Issue date Jun 18, 2024
- BLANCCO TECHNOLOGY GROUP IP OY
- William Fitzgerald
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection and grading of the effect of blue fluorescence on diamond...
- Patent number 11,988,610
- Issue date May 21, 2024
- Gemological Institute of America, Inc. (GIA)
- Yun Luo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mask inspection of a semiconductor specimen
- Patent number 11,983,867
- Issue date May 14, 2024
- Applied Materials Israel Ltd.
- Ariel Shkalim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Learning device, inspection device, learning method, and inspection...
- Patent number 11,977,033
- Issue date May 7, 2024
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Yuya Sugasawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Selecting a representative subset of potential defects to improve d...
- Patent number 11,940,390
- Issue date Mar 26, 2024
- Applied Materials Israel Ltd.
- Yotam Sofer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus
- Patent number 11,933,739
- Issue date Mar 19, 2024
- NEC Corporation
- Takashi Shibata
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical detection device, optical detection method, method for desi...
- Patent number 11,933,735
- Issue date Mar 19, 2024
- Osaka University
- Tsuyoshi Konishi
- G01 - MEASURING TESTING
Information Patent Grant
Hot spot defect detecting method and hot spot defect detecting system
- Patent number 11,900,586
- Issue date Feb 13, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chien-Huei Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface inspection apparatus, non-transitory computer readable medi...
- Patent number 11,892,416
- Issue date Feb 6, 2024
- FUJIFILM Business Innovation Corp.
- Kiyofumi Aikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image acquisition by an electron beam examination tool for metrolog...
- Patent number 11,828,714
- Issue date Nov 28, 2023
- Applied Materials Israel Ltd.
- Bobin Mathew Skaria
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image restoration apparatus, image restoration method, image restor...
- Patent number 11,815,468
- Issue date Nov 14, 2023
- AISIN CORPORATION
- Yasuyuki Kuno
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect detection device, defect detection method, and defect observ...
- Patent number 11,802,841
- Issue date Oct 31, 2023
- HITACHI HIGH-TECH CORPORATION
- Yuji Takagi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Belt examination system and computer-readable non-transitory record...
- Patent number 11,768,159
- Issue date Sep 26, 2023
- Kyocera Document Solutions Inc.
- Akira Nishizawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Product defect detection method, device and system
- Patent number 11,748,873
- Issue date Sep 5, 2023
- GOERTEK INC.
- Jie Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection system for manufactured components
- Patent number 11,741,758
- Issue date Aug 29, 2023
- General Inspection, LLC
- Nathan Kujacznski
- G07 - CHECKING-DEVICES
Information Patent Grant
Semiconductor wafer fault analysis system and operation method thereof
- Patent number 11,741,596
- Issue date Aug 29, 2023
- Samsung Electronics Co., Ltd.
- Min-Chul Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for synthesizing a diamond using machine learning
- Patent number 11,698,347
- Issue date Jul 11, 2023
- FRAUNHOFER USA, INC.
- Rohan Reddy Mekala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for detecting a defect of a film
- Patent number 11,619,593
- Issue date Apr 4, 2023
- ZHEJIANG GONGSHANG UNIVERSITY
- Huiyan Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of condition monitoring one or more wind turbines and parts...
- Patent number 11,549,492
- Issue date Jan 10, 2023
- Ventus Engineering GmbH
- Lars Lysgaard
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical inspection systems and methods for moving objects
- Patent number 11,480,529
- Issue date Oct 25, 2022
- Borde, Inc.
- Saumitra Buragohain
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for identifying frostbite condition of grain seeds using spe...
- Patent number 11,454,594
- Issue date Sep 27, 2022
- Zhejiang University
- Fang Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Classification method and system for high-throughput transparent ar...
- Patent number 11,415,524
- Issue date Aug 16, 2022
- Schott Schweiz AG
- Igor Sosman
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MONITORING APPARATUS AND OPERATION METHOD THEREOF
- Publication number 20240353348
- Publication date Oct 24, 2024
- LG ENERGY SOLUTION, LTD.
- Min Ji KIM
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
REPAIR DIAGRAM GENERATION DEVICE, REPAIR DIAGRAM GENERATION METHOD,...
- Publication number 20240344998
- Publication date Oct 17, 2024
- FUJIFILM CORPORATION
- Shuhei HORITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR NON-DESTRUCTIVELY TESTING STATOR WELD QUALI...
- Publication number 20240278357
- Publication date Aug 22, 2024
- FORD GLOBAL TECHNOLOGIES, L.L.C.
- Robert Schroeter
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
DETECTION AND GRADING OF THE EFFECT OF BLUE FLUORESCENCE ON DIAMOND...
- Publication number 20240241063
- Publication date Jul 18, 2024
- GEMOLOGICAL INSTITUTE OF AMERICA, INC. (GIA)
- Yun LUO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HOT SPOT DEFECT DETECTING METHOD AND HOT SPOT DEFECT DETECTING SYSTEM
- Publication number 20240144467
- Publication date May 2, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien-Huei Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ARTIFACT-BASED FAULT DETECTION FOR PHYSICAL COMPONENTS
- Publication number 20240102938
- Publication date Mar 28, 2024
- Apple Inc.
- Mikael B. MANNBERG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTION METHOD AND SYSTEM FOR DETERMINING THE LOCATION OF A SURFA...
- Publication number 20240094145
- Publication date Mar 21, 2024
- HUA YANG Precision Machinery Co.,Ltd
- Hsien-Te HSIAO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MANUFACTURING COLORED OPTICAL FIBER
- Publication number 20240053567
- Publication date Feb 15, 2024
- Sumitomo Electric Industries, Ltd.
- Hiroshi KOHDA
- G01 - MEASURING TESTING
Information Patent Application
MONITORING DESIGN SUPPORT APPARATUS, MONITORING DESIGN SUPPORT METH...
- Publication number 20240019379
- Publication date Jan 18, 2024
- FUJIFILM CORPORATION
- Shuhei HORITA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR SYNTHESIZING A DIAMOND USING MACHINE LEARNING
- Publication number 20230349835
- Publication date Nov 2, 2023
- Fraunhofer USA, Inc.
- Rohan Reddy MEKALA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR ASSESSING A COATED SURFACE WITH RESPECT TO SU...
- Publication number 20230304941
- Publication date Sep 28, 2023
- BYK-Chemie GmbH
- Nikolay Kladt
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR AUTOMATIC DIAGNOSTICS AND MONITORING OF SEMICONDUCTOR DE...
- Publication number 20230236132
- Publication date Jul 27, 2023
- KLA Corporation
- David W. Price
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CONDITION MONITORING ONE OR MORE WIND TURBINES AND PARTS...
- Publication number 20230213021
- Publication date Jul 6, 2023
- Ventus Engineering GmbH
- Lars Lysgaard
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION SUPPORT DEVICE, INSPECTION SUPPORT METHOD, AND PROGRAM
- Publication number 20230112828
- Publication date Apr 13, 2023
- FUJIFILM CORPORATION
- Shuhei HORITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20230098041
- Publication date Mar 30, 2023
- Koji MASUDA
- G01 - MEASURING TESTING
Information Patent Application
DETERIORATION DIAGNOSIS DEVICE, DETERIORATION DIAGNOSIS METHOD, AND...
- Publication number 20230081098
- Publication date Mar 16, 2023
- NEC Corporation
- Chisato SUGAWARA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTION DEVICE, SURFACE INSPECTION METHOD, METHOD OF MAN...
- Publication number 20230055315
- Publication date Feb 23, 2023
- JFE STEEL CORPORATION
- Hiroaki Ono
- G01 - MEASURING TESTING
Information Patent Application
DEVICE CONDITION DETERMINATION
- Publication number 20230011330
- Publication date Jan 12, 2023
- AT&T INTELLECTUAL PROPERTY I, L.P.
- Kanini Brooks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION SUPPORT DEVICE, INSPECTION SUPPORT METHOD, AND INSPECTIO...
- Publication number 20230003663
- Publication date Jan 5, 2023
- FUJIFILM CORPORATION
- Shuhei HORITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR IMAGE ANALYSIS FOR PHYSICAL DEFECT DETECTION...
- Publication number 20220405914
- Publication date Dec 22, 2022
- Bank of America Corporation
- Siten Sanghvi
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTION APPARATUS, NON-TRANSITORY COMPUTER READABLE MEDI...
- Publication number 20220390385
- Publication date Dec 8, 2022
- FUJIFILM Business Innovation Corp.
- Kiyofumi AIKAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SYSTEMS FOR DETECTING A DEFECT OF A FILM
- Publication number 20220381699
- Publication date Dec 1, 2022
- ZHEJIANG GONGSHANG UNIVERSITY
- Huiyan WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPEARANCE INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20220360720
- Publication date Nov 10, 2022
- Omron Corporation
- Shingo HAYASHI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEM AND METHOD FOR PROBABILISTIC DETERMINATION OF LIKELY GRADE O...
- Publication number 20220343483
- Publication date Oct 27, 2022
- Veery, LLC
- Chintan Desai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Portable Visual Inspection Apparatus And Method for Inspecting Article
- Publication number 20220341852
- Publication date Oct 27, 2022
- Tyco Electronics (Shanghai) Co., Ltd.
- Lei (Alex) Zhou
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF EXAMINING SPECIMENS AND SYSTEM THEREOF
- Publication number 20220291138
- Publication date Sep 15, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Yotam SOFER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MASK INSPECTION OF A SEMICONDUCTOR SPECIMEN
- Publication number 20220254000
- Publication date Aug 11, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Ariel SHKALIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GEMSTONE BLUE FLUORESCENCE DETECTION AND GRADING
- Publication number 20220196565
- Publication date Jun 23, 2022
- GEMOLOGICAL INSTITUTE OF AMERICA, INC. (GIA)
- Yun LUO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION APPARATUS
- Publication number 20220155238
- Publication date May 19, 2022
- NEC Corporation
- Takashi SHIBATA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
OPTICAL DETECTION DEVICE, OPTICAL DETECTION METHOD, METHOD FOR DESI...
- Publication number 20220155237
- Publication date May 19, 2022
- OSAKA UNIVERSITY
- Tsuyoshi KONISHI
- G01 - MEASURING TESTING

Grading and classifying of flaws

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Cutter analysis and mapping

Method for monitoring resilience of shield tunnel based on multi-so...

AI-based product surface inspecting apparatus and method

Portable visual inspection apparatus and method for inspecting article

Systems and methods for synthesizing a diamond using machine learning

Repair diagram generation device, repair diagram generation method,...

Data processing method and system for detection of deterioration of...

Method of condition monitoring one or more wind turbines and parts...

System and method for detection of mobile device fault conditions

Detection and grading of the effect of blue fluorescence on diamond...

Mask inspection of a semiconductor specimen

Learning device, inspection device, learning method, and inspection...

Selecting a representative subset of potential defects to improve d...

Inspection apparatus

Optical detection device, optical detection method, method for desi...

Hot spot defect detecting method and hot spot defect detecting system

Surface inspection apparatus, non-transitory computer readable medi...

Image acquisition by an electron beam examination tool for metrolog...

Image restoration apparatus, image restoration method, image restor...

Defect detection device, defect detection method, and defect observ...

Belt examination system and computer-readable non-transitory record...

Product defect detection method, device and system

Inspection system for manufactured components

Semiconductor wafer fault analysis system and operation method thereof

Systems and methods for synthesizing a diamond using machine learning

Methods and systems for detecting a defect of a film

Method of condition monitoring one or more wind turbines and parts...

Optical inspection systems and methods for moving objects

Method for identifying frostbite condition of grain seeds using spe...

Classification method and system for high-throughput transparent ar...

Patents Applicationslast 30 patents

MONITORING APPARATUS AND OPERATION METHOD THEREOF

REPAIR DIAGRAM GENERATION DEVICE, REPAIR DIAGRAM GENERATION METHOD,...

SYSTEMS AND METHODS FOR NON-DESTRUCTIVELY TESTING STATOR WELD QUALI...

DETECTION AND GRADING OF THE EFFECT OF BLUE FLUORESCENCE ON DIAMOND...

HOT SPOT DEFECT DETECTING METHOD AND HOT SPOT DEFECT DETECTING SYSTEM

ARTIFACT-BASED FAULT DETECTION FOR PHYSICAL COMPONENTS

DETECTION METHOD AND SYSTEM FOR DETERMINING THE LOCATION OF A SURFA...

METHOD AND APPARATUS FOR MANUFACTURING COLORED OPTICAL FIBER

MONITORING DESIGN SUPPORT APPARATUS, MONITORING DESIGN SUPPORT METH...

SYSTEMS AND METHODS FOR SYNTHESIZING A DIAMOND USING MACHINE LEARNING

SYSTEM AND METHOD FOR ASSESSING A COATED SURFACE WITH RESPECT TO SU...

SYSTEM FOR AUTOMATIC DIAGNOSTICS AND MONITORING OF SEMICONDUCTOR DE...

METHOD OF CONDITION MONITORING ONE OR MORE WIND TURBINES AND PARTS...

INSPECTION SUPPORT DEVICE, INSPECTION SUPPORT METHOD, AND PROGRAM

INSPECTION APPARATUS AND INSPECTION METHOD

DETERIORATION DIAGNOSIS DEVICE, DETERIORATION DIAGNOSIS METHOD, AND...

SURFACE INSPECTION DEVICE, SURFACE INSPECTION METHOD, METHOD OF MAN...

DEVICE CONDITION DETERMINATION

INSPECTION SUPPORT DEVICE, INSPECTION SUPPORT METHOD, AND INSPECTIO...

SYSTEM AND METHOD FOR IMAGE ANALYSIS FOR PHYSICAL DEFECT DETECTION...

SURFACE INSPECTION APPARATUS, NON-TRANSITORY COMPUTER READABLE MEDI...

METHODS AND SYSTEMS FOR DETECTING A DEFECT OF A FILM

APPEARANCE INSPECTION DEVICE AND DEFECT INSPECTION METHOD

SYSTEM AND METHOD FOR PROBABILISTIC DETERMINATION OF LIKELY GRADE O...

Portable Visual Inspection Apparatus And Method for Inspecting Article

METHOD OF EXAMINING SPECIMENS AND SYSTEM THEREOF

MASK INSPECTION OF A SEMICONDUCTOR SPECIMEN

GEMSTONE BLUE FLUORESCENCE DETECTION AND GRADING

INSPECTION APPARATUS

OPTICAL DETECTION DEVICE, OPTICAL DETECTION METHOD, METHOD FOR DESI...