This patent application is based on and claims priority pursuant to 35 U.S.C. § 119(a) to Japanese Patent Application No. 2021-162288, filed on Sep. 30, 2021, in the Japan Patent Office, the entire disclosure of which is hereby incorporated by reference herein.
Embodiments of the present disclosure relates to an inspection apparatus and an inspection method.
An inspection apparatus for inspecting a sealing portion of a package including a content such as food is known. The content is packed inside the package by sealing the sealing portion of the package. Specifically, the inspection apparatus checks whether the sealing portion is correctly sealed or not. In other words, the inspection apparatus performs a pass-or-fail determination for the package.
The inspection apparatus emits light to the package all the time during inspection, detects the package when the package reaches the predetermined position of the inspection apparatus, and acquires an image of the package after a predetermined time.
An inspection apparatus includes: a light emitter to emit light to a sealing portion of a package containing a light energy absorbing material, the light having a wavelength absorbable by the light energy absorbing material; a light receiver to receive thermal radiation from the sealing portion as thermal information; and circuitry including multiple image processing algorithms, the circuitry to: acquire the thermal information on the sealing portion from the light receiving unit as a two-dimensional image; determine whether the sealing portion is pass or fail based on the two-dimensional image acquired; and discriminate a type of a sealing defect from other types of sealing defects previously set in the multiple image processing algorithms in response to a determination that the sealing portion is fail.
An inspection method includes: emitting light by a light emitter to a sealing portion of a package including a light energy absorbing material, the light having a wavelength absorbed by the light energy absorbing material; receiving thermal radiation from the sealing portion by a light receiver as thermal information; acquiring the thermal information on the sealing portion as a two-dimensional image from the light receiver; determining whether the sealing portion is pass or fail based on the two-dimensional image acquired; and discriminating a type of a sealing defect from other types of sealing defects previously set in multiple image processing algorithms in response to a determination that the sealing portion is fail.
A more complete appreciation of the disclosure and many of the attendant advantages and features thereof can be readily obtained and understood from the following detailed description with reference to the accompanying drawings, wherein:
The accompanying drawings are intended to depict embodiments of the present invention and should not be interpreted to limit the scope thereof. The accompanying drawings are not to be considered as drawn to scale unless explicitly noted. Also, identical or similar reference numerals designate identical or similar components throughout the several views.
In describing embodiments illustrated in the drawings, specific terminology is employed for the sake of clarity. However, the disclosure of this specification is not intended to be limited to the specific terminology so selected and it is to be understood that each specific element includes all technical equivalents that have a similar function, operate in a similar manner, and achieve a similar result.
Referring now to the drawings, embodiments of the present disclosure are described below. As used herein, the singular forms “a,” “an,” and “the” are intended to include the plural forms as well, unless the context clearly indicates otherwise.
According to embodiments of the present invention, the inspection apparatus and the inspection method determine whether the sealing portion of the package is pass or fail and discriminate between types of defects of the package without additional time to discriminate between the types of the defect.
Hereinafter, embodiments of an inspection apparatus and an inspection method will be described in detail with reference to the accompanying drawings.
An inspection apparatus and an inspection method that determine whether the package is pass or fail and discriminate a certain type of defects of the package from the other types of defects when the package is fail without additional time to determine (identify) a type of defects.
The package 50 will be described. As illustrated in
For the package material 51 of the package 50, a single-layer plastic film, a single-layer plastic film having a surface treatment, or a plastic film laminated with multiple single-layer films is used. Examples of the surface treatment include coating for adding moisture proof or vapor deposition of aluminum, silica, or alumina for adding gas barrier properties.
Further, as the package material 51 of the package 50, a film laminated with an aluminum foil 51b (
The package 50 illustrated in
Herein, a manufacturing process of the package 50 will be briefly described. The package 50 is manufactured by filling contents (e.g., food such as curry or soup) into a package material 51, which is bag-shaped, by a filling means (e.g., filling machine) and sealing the sealing portion 52 of the package material 51.
In such a manufacturing process, the inspection apparatus 1 inspects the package 50 sealed at the sealing portion 52 in order to make sure that the package 50 is tightly sealed and the content does not leak (i.e., seal inspection). In the seal inspection, the inspection apparatus 1 determines whether the sealing portion 52 has a normal state or an anomaly state (i.e., defect). The anomaly state is, for example, trapping, pinhole, through-hole, wrinkle, and tunnel. Specifically, the trapping is a defect in which the contents are trapped in the sealing portion 52, the pinhole or the through-hole is a defect in which a hole is formed in the sealing portion 52, the wrinkle is a defect in which a crease appears when the sealing portion 52 is folded or crushed, and the tunnel is a defect in which a passage through which the contents may leak to the outside is formed in the sealing portion 52.
The inspection apparatus 1 will be described in detail. As illustrated in
The image acquisition device 3 includes a light emitting unit 31 (light emitter) disposed below the conveyor unit 2 and a light receiving unit 32 (light receiver) disposed above the conveyor unit 2.
The conveyor unit 2 includes a first conveyor part 21 and a second conveyor part 22. The first conveyor part 21 and the second conveyor part 22 convey the package 50 on an endless belt by rotationally driving the endless belt. The first conveyor part 21 is disposed on the upstream side in the conveying direction X of the package 50 with respect to the arrangement position of the image acquisition device 3. The second conveyor part 22 is disposed on the downstream side in the conveying direction X of the package 50 with respect to the arrangement position of the image acquisition device 3. The conveyor unit 2 has a gap O between the first conveyor part 21 and the second conveyor part 22. The gap O is also a space between the light emitting unit 31 and the light receiving unit 32. The distance, which is the gap O, between the first conveyor part 21 and the second conveyor part 22 is a distance that does not affect the conveyance of the package 50 from the first conveyor part 21 to the second conveyor part 22. Since the conveyor unit 2 has the configuration described above, the conveyor unit 2 conveys the package 50 through the space between the light emitting unit 31 and the light receiving unit 32.
The image acquisition device 3 acquires two-dimensional thermal information on the sealing portion 52 of the package 50 conveyed by the conveyor unit 2 as an image.
The light emitting unit 31 two-dimensionally emits light to the entire sealing portion 52 of the package 50 conveyed by the conveyor unit 2. The light emitting unit 31 may emit light to the package 50 being conveyed by the conveyor unit 2 at the gap O between the first conveyor part 21 and the second conveyor part 22 or may emit light to the package 50 temporarily being stopped on the conveyor unit 2.
The light receiving unit 32 two-dimensionally receives thermal radiation from the entire sealing portion 52 of the package 50. The thermal radiation is caused by the light emitting unit 31's emitting light to the sealing portion 52.
The controller device 4 will be described. The controller device 4 entirely controls the inspection apparatus 1.
The program executed by the controller device 4 according to the present embodiment may be provided by recorded in a computer-readable recording medium such as a compact disc read-only memory (CD-ROM), a flexible disk (FD), a compact disc recordable (CD-R), and a digital versatile disc (DVD) as a file of an installable format or an executable format.
Further, the program executed by the controller device 4 according to the present embodiment may be stored in a computer connected to a network such as the Internet and provided by downloaded through the network. The program executed by the controller device 4 according to the present embodiment may be provided or distributed through a network such as the Internet.
The controller device 4 determines whether the sealing portion 52 of the package 50 is in a normal state or an anomaly state (i.e., defect) based on the two-dimensional image acquired by the image acquisition device 3.
The function of the controller device 4 will be described.
The controller 401 controls light emission of the light emitting unit 31 and light reception of the light receiving unit 32 of the image acquisition device 3. The controller 401 controls the first conveyor part 21 and the second conveyor part 22 of the conveyor unit 2 to drive.
The two-dimensional image acquisition unit 402 acquires two-dimensional thermal information on the sealing portion 52 of the package 50 from thermal radiation information two-dimensionally received by the light receiving unit 32 as an image. The two-dimensional image acquisition unit 402 converts the light information into the thermal information and acquires a thermal image. The two-dimensional image acquisition unit 402 is also referred to as thermography (thermal image). The two-dimensional image acquisition unit 402 may be provided in an infrared camera in which the light receiving unit 32 is an uncooled microbolometer.
The light emitting unit 31 and the light receiving unit 32 will be described in detail. As described above, the aluminum vapor deposition film or a film laminated with an aluminum foil is used in the package material 51 of the package 50, and at least aluminum is included in the package material 51 of the package 50. Thus, the light emitting unit 31 of the inspection apparatus 1 according to the present embodiment emits light to one side of the sealing portion 52 of the package 50, in which the light has a wavelength that at least aluminum absorbs. The aluminum foil 51b (
The light emitting unit 31 is not limited to a halogen lamp, and a xenon lamp capable of emitting ultraviolet light, visible light, or near infrared light may be applied. In general, the xenon lamp has a broad emission spectrum over ultraviolet light, visible light, and near infrared light, and has multiple sharp emission spectra in the near infrared light. The xenon lamp includes little light having a wavelength longer than near infrared (e.g., 5% or smaller). Such light having a wavelength longer than the wavelength of the near infrared light is also referred to as a heat ray and heats surrounding members, which affects downsizing of the apparatus and selection of components. Preferably, the light emitting unit 31 excludes light having a wavelength longer than near infrared wavelengths.
A near infrared light emitting diode (LED) or a near infrared laser having a peak wavelength in a near infrared wavelengths may be applied to the light emitting unit 31. Since the peak wavelength of the emission spectrum of the near infrared light emitting diode or the near infrared laser is substantially the same as the peak wavelength of the absorption spectrum of aluminum, light energy can be converted into thermal energy with high efficiency. The near infrared LED or the near infrared laser generally has a longer life than a life of a halogen lamp or a xenon lamp and has an advantage in a longer replacement cycle when used in the inspection apparatus 1 that continuously operates.
The light emitting unit 31 may be continuously turned on (i.e., direct current (DC) light emission) or intermittently turned on (i.e., pulse light emission). However, in terms of life, preferably, the light emitting unit 31 can be intermittently turned on at about 1 Hz to 2 Hz. Specifically, the light emitting unit 31 is a laser, an LED, or a xenon lamp.
When continuously turned on (i.e., DC light emission), the light emitting unit 31 may be provided with an intermittent emission means (e.g., shutter) between the light emitting unit 31 and the package 50 so as to intermittently emit light to the package 50.
In the present embodiment, an increase in the surface temperature of the sealing portion 52 may be about several degrees of Celsius to 10° C. Depending on the cost of light source and size, a high-power light source may be used to further raise temperature. When the ambient temperature around the inspection apparatus 1 is about 20° C. to 30° C., the surface temperature of the seal portion is about 295K to 315K in absolute temperature. (0° C. is 273K. When the ambient temperature is about 20° C. to 30° C., it is about 293K to 303K. In consideration of the surface temperature of the sealing portion, it is about 295K to 315K) According to the Planck's law, the thermal radiation corresponding to 300K has wavelengths of about 3 μm or longer. Thus, the light emitted from the sealing portion 52 of the package 50 caused by thermal radiation has a wavelength of about 3 μm or longer according to the Planck's law. Thus, the light receiving unit 32 receives the light having a wavelength of 3 μm or longer.
As described above, since the wavelength of the light emitted from the light emitting unit 31 and the wavelength of the thermal radiation received by the light receiving unit 32 are different from each other (i.e., wavelength difference), the light receiving unit 32 does not receive the light emitted from the light emitting unit 31. Thus, the wavelength difference does not generate noise to the light receiving unit 32, and the light receiving unit 32 receives a signal having a higher quality.
In the transmission spectrum of the atmosphere, there are wavelength bands referred to as an atmospheric window in which the transmittance of the atmosphere is higher. When the inspection is performed in the atmosphere, it is preferable to use such wavelength bands. The wavelength bands are, for example, middle wavelength infrared radiation (MWIR) having a wavelength band of 3 to 6 μm and long wavelength infrared radiation (LWIR) having a wavelength band of 8 to 14 μm.
In addition, since the thermal radiation spectrum of about 300K has a peak at about 10 μm in wavelength, it is preferable to use the atmospheric window of LWIR in order to achieve a higher sensitive measurement.
Thus, in the present embodiment, an infrared light receiving element that receives the LWIR is used as the light receiving unit 32. The infrared light receiving element includes a cooling infrared light receiving element cooled to extremely low temperature to achieve higher sensitivity and an uncooled infrared light receiving element operable at room temperature. In the present embodiment, the uncooled infrared light receiving element is used as the light receiving unit 32 because it is practically low cost.
The light emitting unit 31 may be a point light source, a line light source, or an area light source as long as these light sources two-dimensionally emits light to the entire sealing portion 52.
The light emitting unit 31 and the light receiving unit 32 will be described in detail. As described above, the light receiving unit 32 is an area light receiving element that receives thermal radiation from the entire sealing portion 52 due to the light emission to the sealing portion 52.
In the timing chart illustrated in
As illustrated in
As described above, the light receiving unit 32 has a rectangular shape. Each line outputs a signal, and the readout direction is along the shorter side including less pixels of the rectangular shape. In the present embodiment, the signals to be output from the limited region along the readout direction is used. Thus, in order to increase the spatial resolution of the two-dimensional image, preferably, the directions of the shorter side of light receiving unit 32 and the shorter side of the sealing portion 52 are matched.
The limited region is not limited to the line 1 to n and may be, for example, the line n to N. In such a case, the light emitting unit starts emitting light at the end of the exposure time of the line of the limited region in the Pth frame and ends emitting light at the start of the exposure time of the line of the limited region in the (P+1)th frame.
The light exposure time in the light emitting unit 31 will be described in detail.
When a two-dimensional image of the package 50 being conveyed by the conveyor unit 2 is acquired using the light receiving unit 32 having the sequential readout for each line having a time delay in the exposure time, the image is distorted. Preferably, the package 50 is being temporarily stopped for a certain period of time on the conveyor unit 2, the light emitting unit 31 emits light to the package 50, and the light receiving unit 32 receives thermal radiation (i.e., light reception) from the package between the Pth frame and the (P+1) frame.
The package 50 is stopped on the conveyor unit 2 of the inspection apparatus 1 is stopped (i.e., stopping configuration). The stopping configuration will be described. Specifically, the conveyor unit 2 stops the package 50 by applying the stopping configuration described below.
The controller 401 of the controller device 4 (
As illustrated in
The package 50 is conveyed on the first conveyor part 21 at a constant speed V, and the position and the angle of the package are aligned in the direction orthogonal to the conveyor direction by the position-and-angle aligner 23. The position-and-angle aligner 23 aligns the package 50 to be substantially parallel to the conveying direction and the direction orthogonal to the conveying direction. The friction coefficient μ1 of the belt of the first conveyor part 21 is set such that the package 50 slides in the direction orthogonal to the conveying direction according to the position-and-angle aligner 23 while being conveyed on the belt of the first conveyor part 21 in the conveying direction.
The package 50 in which the position and the angle are aligned by the position-and-angle aligner 23 is conveyed from the first conveyor part 21 to the second conveyor part 22. The first conveyor part 21 and the second conveyor part 22 are arranged having a predetermined gap O therebetween. When the package 50 conveys to the second conveyor part 22, the second conveyor part 22 decreases the conveying speed of the package 50 from V to 0 and stops. The package 50 being conveyed at the speed V2 stops with little slide on the belt of the second conveyor part 22. The friction coefficient μ2 of the belt of the second conveyor part 22 is set such that slide of the package 50 due to decreasing the speed is unlikely to occur.
Thus, the position and the angle of the package 50 in the direction orthogonal to the conveyor direction is aligned by the position-and-angle aligner 23, and the speed of the belt of the second conveyor part 22 having the friction coefficient μ2 larger than μ1 is decreased from V to 0. The package 50 stops. As described above, the package 50 being conveyed is temporarily stopped, and a two-dimensional image is acquired by the light receiving unit 32 while the package 50 is being stopped. Thus, blurring or image distortion that occurs at the time of acquiring the image does not occur. In addition, the influence of a temperature change due to convection during conveying is reduced.
As described above, the position of the package 50 in the direction orthogonal to the conveying direction is aligned by the position-and-angle aligner 23. The stop position of the package 50 in the conveying direction is determined by controlling the second conveyor part 22 to decrease the speed of conveying and stop. When the package 50 slides on the belt of the second conveyor part 22 due to inertia, the controller 401 (
When the package 50 has a substantially rectangular parallelepiped shape, a two-dimensional image in which the sides of the package 50 and the sides of the light receiving unit 32 are substantially parallel to each other is acquired. In such a case, trimming image processing of the two-dimensional image of the package 50 is easy to perform.
The second conveyor part 22 increases the conveyor speed of the package 50 from 0 to V and keeps the conveying speed of the package 50 at the constant speed V.
As illustrated in
As a simple example, the positioning part 24 is a stopper made of aluminum. The position and the angle of the package 50 are aligned in the direction orthogonal to the conveying direction of the package 50 by the position-and-angle aligner 23. The package 50 having a substantially rectangular parallelepiped shape is stopped by touching the top side of the packaged 50 substantially parallel to a part of the positioning part 24 orthogonal to the conveying direction.
Specifically, the controller 401 of the controller device 4 (
When the package 50 has a circular shape, the positioning part 24 may have an arc-shaped stopper corresponding to the shape of the package 50. The positioning part 24 is not limited thereto, and existing technique may be used.
Light emission of the light emitting unit 31 will be described.
The light receiving unit 32 will be described. On the other hand, the light receiving unit 32 may be any one of the point light receiving element, the line light receiving element, and the area light receiving element as long as these light receiving elements two-dimensionally receive thermal radiation from the entire sealing portion 52 upon the light emission to the sealing portion 52. A microbolometer may be applied to the area light receiving element.
As described above, there are various modifications for the light emitting unit 31 that emits light to the entire sealing portion 52 and the light receiving unit 32 that receives thermal radiation from the entire sealing portion 52. In the present embodiment, the light emitting unit 31 is an area light source, and the light receiving unit 32 is an area light receiving element. As described above, by combining the area light source and the area light receiving element, the light can be emitted to the entire sealing portion 52 as one shot and the thermal radiation from the entire sealing portion 52 can be received as one shot, even when the package 50 is being conveyed or stopped. Further, in the case of using an area light source in which the point light sources (e.g., LEDs) are arranged vertically and horizontally and an area light receiving element, an optical system for one- or two-dimensional scanning (i.e., a movable component) may be excluded, and a higher-quality image can be acquired without being affected by vibration of the movable component.
The positional relation between the light emitting unit 31 and the light receiving unit 32 (i.e., arrangement or layout) will be described in detail.
As described above, the light receiving unit 32 does not directly receive the light emitted from the light emitting unit 31 and the light transmitted through the sealing portion 52 of the package material 51 or the light reflected from the sealing portion 52. The light receiving unit 32 receives light emitted from the surface of the package material 51 as the thermal radiation generated by the light emitted from the light emitting unit 31. The light emitting unit 31 and the light receiving unit 32 are not limited to an arrangement based on transmission of the light or regular reflection of the light. Thus, the latitude in the layout of the light emitting unit 31 and the light receiving unit 32 is increased.
Specifically, as illustrated in
The defect discrimination unit 403 will be described. The defect discrimination unit 403 determines whether the package 50 is pass or fail.
As described above, when the sealing portion 52 of the package 50 has the anomaly state, the heat capacity of the anomaly state of the sealing portion 52 changes with respect to normal state. For example, when a content or a portion of the content of the package 50 is trapped in the sealing portion 52 (i.e., trapping), the trapping is a defect in which the content is trapped between the packaging materials (i.e., one package material 51 and the opposite packaging material 51). Thus, a new layer is generated by the content trapped in the sealing portion 52, and heat transfer slows. A tunnel is a defect in which a passage through which the content leaks to the outside of the package is formed in the sealing portion 52. Since there is an air layer between one packaging material 51 and the opposite package material 51, heat transmission slows due to high thermal resistance of air. When the sealing portion 52 of the package 50 is in an anomaly state as described above, it takes time for heat to reach the surface of the sealing portion 52 and the time delays, so that a temperature distribution occurs on the surface. Thus, the defect discrimination unit 403 can determine that the two-dimensional image is in an anomaly state, that is, not acceptable, based on the temperature distribution generated in the two-dimensional image having the thermal information.
The defect discrimination unit 403 determines whether the sealing portion 52 of the package 50 is in a normal state or in an anomaly state (i.e., determination of pass or fail) based on the two-dimensional image having the thermal information. The defect discrimination unit 403 applies various conventional image processing on the two-dimensional image in order to reveal an anomaly state. The image processing will be described below.
The pass-or-fail determination of the sealing portion 52 in the defect discrimination unit 403 will be described.
In the example illustrated in
The two-dimensional image in
In the example of
As described above, when the air layer is present in the seal portion 52 as illustrated in
Depending on the anomaly state, the thermal resistance may become smaller, and the temperature of the anomaly state may become higher than the surrounding temperature. In such a case, the anormal state of the sealing portion 52 can be detected by inspecting the difference between the normal state and the anomaly state.
For example, the image processing algorithm (1) to discriminate the sealing defect (1) from other types of sealing defects (2) to (7) will be described (
In
As described above, the defect discrimination unit 403 includes multiple image processing algorithms to discriminate between sealing defects that cannot be overlooked and any one of image processing algorithms detects the sealing defect, overlook of the sealing defect is less likely to occur.
As described above, the light emitting unit 31 and the light receiving unit 32 work under a certain condition, and a two-dimensional image is acquired from the thermal information. As an example of a practical condition, the light emitting unit 31 starts to emit light having a desired power at a desired time and ends to emit the light after a desired duration time. The light receiving unit 32 receives thermal radiation from the sealing portion 52 of the package 50 at a desired period of time (i.e., frame rate) and the desired number of two-dimensional images in accordance with the light emission timing of the light emitting unit 31. The light receiving unit 32 may select a desired region (i.e., size of light receiving area) for the light reception. The defect discrimination unit 403 acquires a two-dimensional image having two-dimensional thermal information of the sealing portion 52 of the package 50 from the thermal information received in this manner. At this time, the defect discrimination unit 403 may perform image processing such as adjustment of image size or image contrast.
The defect discrimination unit 403 generates multiple two-dimensional image data sets from the two-dimensional image acquired under a certain condition on operations of the light emitting unit and the light receiving unit (i.e., light emission-and-reception condition) described above.
The generation of multiple two-dimensional image data sets will be described. The defect discrimination unit 403 generates multiple two-dimensional image data sets from two-dimensional images acquired under different light emission-and-reception conditions. Herein, the different light emission-and-reception conditions are not mechanical conditions such as positional changes of the light emitting unit 31, the light receiving unit 32, or at least one part that constitutes the light emitting unit 31 or the light receiving unit 32. Thus, the different light emission-and-reception conditions are, for example, changes of set vales in a software or in circuitry (i.e., software and circuitry conditions). Specifically, the changes of set values are, a change in light emission power, a stat timing of light emission, and duration period of light emission in the light emitting unit 31, or a change in a period of time (i.e., frame rate), the number of two-dimensional images to be acquired, or light receiving size in the light receiving unit 32.
Since the defect discrimination unit 403 does not use the mechanical conditions and use the software and circuitry conditions, the defect discrimination unit 403 changes the conditions in a short time. As a result, the package inspection is done at a constant speed. As a result, a latitude of generating the two-dimensional image data set increases.
For example, when the defect discrimination unit 403 acquires three two-dimensional images (sequentially, 1st image, 2nd image, and 3rd image) under a condition in which three two-dimensional images are acquired, the defect discrimination unit 403 may create a two-dimensional image data set α consisting of the 2nd image and a two-dimensional image data set β consisting of the first image, the second image, and the third image (i.e., all three images). The defect discrimination unit 403 may perform image processing such as differential processing or processing on rate of change in the image using, for example, the three images in the two-dimensional image data set β. The two-dimensional image data set β has a different feature as compared with the two-dimensional image data set α consisting of one two-dimensional image as an input image.
In some embodiments, the controller device 4 (circuitry) of the inspection apparatus 1 controls a light emitter to emit light and controls a light receiver to receive thermal radiation as thermal information at the same condition, and generates the multiple two-dimensional image data sets based on the thermal information acquired.
In some embodiments, the controller device 4 (circuitry) of the inspection apparatus 1 controls the light emitter to emit the light and controls the light receiver to receive the thermal radiation at different number of two-dimensional images, and generates the multiple two-dimensional image data sets based on the thermal information acquired.
In some embodiments, the controller device 4 (circuitry) of the inspection apparatus 1 controls the light emitter to emit the light at different light emitting conditions and controls the light receiver to receive the thermal radiation at different light receiving conditions to acquire the thermal information, and generates the multiple two-dimensional image data sets based on the thermal information acquired.
As another example, the defect discrimination unit 403 may generate a two-dimensional image data set having different light receiving timings.
The defect discrimination unit 403 may generate the two-dimensional image data set α including the first two-dimensional image and the second two-dimensional image, and a two-dimensional image data set β including the third two-dimensional image and the fourth two-dimensional image. In the two-dimensional data set α, the first two-dimensional image is acquired before the light emission and the second two-dimensional image is acquired after the light emission. In the two-dimensional data set β, the third two-dimensional image and the fourth two-dimensional image are acquired after certain intervals from the light emission. Thus, these four two-dimensional images include information on different states of the package 50 as input images.
In an example illustrated in
Both the number of the two-dimensional image to be acquired and the light receiving timings may vary for the defect discrimination unit 403.
As illustrated in
In some embodiments, the defect discrimination unit 403 may input the two-dimensional data set α into the image processing algorithm (1) and the two-dimensional data set β into the image processing algorithm (2).
The defect discrimination unit 403 displays a determination result (i.e., pass or fail) on the display device. In addition to the determination result, the defect discrimination unit 403 displays the type of sealing defect (i.e., type of defect) and a symbol or name indicating the image processing algorithm that discriminates the sealing defect when the determination result is fail.
As illustrated in
As illustrated in
The inspection apparatus includes a display. The controller device 4 (circuitry) controls the display to display (i.e., the circuitry displays) a result of a determination of the sealing defect, the type of the sealing defect; and a name or a symbol indicating the multiple image processing algorithms that discriminates the type of sealing defect.
Since the type of defect and the image processing algorithm that discriminated the defect is displayed on the result screen in accordance with the two-dimensional image, an inspector or a supervisor of the production line easily grasps the inspection state.
As described above, the inspection apparatus 1 determines whether the sealing portion 52 of the package 50 is pass or fail. Further, in the inspection apparatus 1, after the package 50 is conveyed by the second conveyor part 22 of the conveyor unit 2, the package 50 determined to be anomaly is removed from the second conveyor part 22 by a sorting means (e.g., rejector). By contrast, the package 50 determined to be a normal state is conveyed by the second conveyor part 22 and packed into a box by a packing means (e.g., caser) or manually.
As described above, according to the present embodiments, an inspection apparatus determines whether the sealing portion 52 of the package 50 is pass or fail and discriminates between the types of the sealing defect without an additional time for determining the type of the defect (i.e., the inspection speed is not decreased).
An inspection apparatus includes: a light emitter to emit light to a sealing portion of a package containing a light energy absorbing material, the light having a wavelength absorbable by the light absorbing material; a light receiver to receive thermal radiation from the sealing portion as thermal information by a two-dimensional image acquisition unit; and circuitry to: acquire the thermal information on the sealing portion from the light receiver as a two-dimensional image; and determine whether the sealing portion is pass or fail based on the two-dimensional image acquired by the two-dimensional image acquisition unit; and discriminate a type of a sealing defect from other types of sealing defects previously set in multiple image processing algorithms in response to a determination that the sealing portion is fail.
An inspection method includes: emitting light by a light emitter to a sealing portion of a package including a light energy absorbing material, the light having a wavelength absorbed by the light energy absorbing material; receiving thermal radiation from the sealing portion by a light receiver as thermal information; acquiring the thermal information on the sealing portion as a two-dimensional image from the light receiver; determining whether the sealing portion is pass or fail based on the two-dimensional image acquired; and discriminating a type of a sealing defect from other types of sealing defects previously set in the multiple image processing algorithms in response to a determination that the sealing portion is fail.
In the present embodiment, aluminum is used as a material that absorbs energy of light, but the material is not limited thereto, and other metals or resins may be used as long as the material absorbs energy of light (light energy) and converts into thermal energy.
In the present embodiment, a retort pouch is applied as the packaging material 51 of the package 50, but the package material 51 is not limited thereto, and can be applied to various packaging materials 51 that packs contents and seal openings. Examples of the package material 51 of the package 50 include, for example, a lid of a yogurt container, a container for sealing a medicine tablet therein.
The inspection apparatus 1 according to the present embodiment may be used for in-line inspection. In mass production, multiple products are sequentially conveyed on a belt conveyor and produced through multiple processes. An inspection process is one of the multiple processes, and the inspection apparatus is installed in the vicinity of the belt conveyor to sequentially inspect the produced products. Such an inspection is referred to as in-line inspection. A typical inspection apparatus acquires an image of an area of an object (e.g., package)while conveying the object. By contrast, the inspection apparatus 1 according to the present embodiment acquires a higher-quality image because the inspection apparatus 1 temporarily stops the package when acquiring the image of an area of the object. As a result, the accuracy of the inspection is increased. Thus, the inspection apparatus 1 is suitable for in-line inspection.
Although the embodiments of the present invention have been described in detail with reference to the drawings, the above embodiments are merely examples of the present invention, and the embodiment of the present invention is not limited to the configurations of the above embodiments. Design changes and the like that do not depart from the gist of the present invention are also included in the present invention.
The above-described embodiments are illustrative and do not limit the present invention. Thus, numerous additional modifications and variations are possible in light of the above teachings. For example, elements and/or features of different illustrative embodiments may be combined with each other and/or substituted for each other within the scope of the present invention.
Any one of the above-described operations may be performed in various other ways, for example, in an order different from the one described above.
Each of the functions of the described embodiments may be implemented by one or more processing circuits or circuitry. Processing circuitry includes a programmed processor, as a processor includes circuitry. A processing circuit also includes devices such as an application specific integrated circuit (ASIC), a digital signal processor (DSP), a field programmable gate array (FPGA), and conventional circuit components arranged to perform the recited functions.
Number | Date | Country | Kind |
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2021-162288 | Sep 2021 | JP | national |