Grating and filter

Industry

CPC
G01J2003/1204

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Parent Industries

GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

Current Industry

G01J2003/1204Grating and filter

Industries

Patents Grantslast 30 patents

Information Patent Grant
Field spectral radiometers including calibration assemblies
- Patent number 11,885,671
- Issue date Jan 30, 2024
- Labsphere, Inc.
- Jeffrey William Holt
- G01 - MEASURING TESTING
Information Patent Grant
High resolution multi-pass optical spectrum analyzer
- Patent number 11,639,873
- Issue date May 2, 2023
- Viavi Solutions Inc.
- Driss Touahri
- G01 - MEASURING TESTING
Information Patent Grant
Diode-pumped multipass cavity raman gas sensor and method of use
- Patent number 11,579,017
- Issue date Feb 14, 2023
- University of South Florida
- Andreas Muller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hyper-spectral imaging of airborne biological particles
- Patent number 11,474,016
- Issue date Oct 18, 2022
- Scanit Technologies, Inc.
- Joel Kent
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Temperature insensitive filter
- Patent number 11,360,262
- Issue date Jun 14, 2022
- Universiteit Gent
- Roeland Baets
- G02 - OPTICS
Information Patent Grant
Multichannel broadband high-resolution spectrograph
- Patent number 11,268,853
- Issue date Mar 8, 2022
- Liangyao Chen
- G01 - MEASURING TESTING
Information Patent Grant
Monolithic assembly of reflective spatial heterodyne spectrometer
- Patent number 11,237,056
- Issue date Feb 1, 2022
- California Institute of Technology
- Seyedeh Sona Hosseini
- G01 - MEASURING TESTING
Information Patent Grant
Thermal imaging with an integrated photonics chip
- Patent number 11,150,137
- Issue date Oct 19, 2021
- Honeywell International Inc.
- Matthew Wade Puckett
- G01 - MEASURING TESTING
Information Patent Grant
Multi-stage parallel spectroscopy systems and methods
- Patent number 11,060,912
- Issue date Jul 13, 2021
- University of Maryland, College Park
- Giuliano Scarcelli
- G01 - MEASURING TESTING
Information Patent Grant
Subject identification device and subject identification method
- Patent number 10,989,596
- Issue date Apr 27, 2021
- Olympus Corporation
- Takuji Horie
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for calibrating measuring instruments
- Patent number 10,677,652
- Issue date Jun 9, 2020
- University of Ottawa
- Samuel Lemieux
- G01 - MEASURING TESTING
Information Patent Grant
Technique and apparatus for spectrophotometry using broadband filters
- Patent number 10,514,298
- Issue date Dec 24, 2019
- Seung Min Jin
- G02 - OPTICS
Information Patent Grant
High resolution broadband monolithic spectrometer and method
- Patent number 10,508,951
- Issue date Dec 17, 2019
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Borgert Kruizinga
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for actuating an acousto-optical component
- Patent number 10,302,490
- Issue date May 28, 2019
- Carl Zeiss Microscopy GmbH
- Burkhard Roscher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Simultaneous overlapping order spectral imager and method
- Patent number 10,151,632
- Issue date Dec 11, 2018
- Raytheon Company
- John F. Silny
- G01 - MEASURING TESTING
Information Patent Grant
Lamellar grating interferometer having stress-dispersible support s...
- Patent number 10,119,861
- Issue date Nov 6, 2018
- Agency for Defense Development
- Jaehwan Lee
- G01 - MEASURING TESTING
Information Patent Grant
Image sensor
- Patent number 9,876,995
- Issue date Jan 23, 2018
- VisEra Technologies Company Limited
- Kuo-Feng Lin
- G02 - OPTICS
Information Patent Grant
Spectrometer with monochromator and order sorting filter
- Patent number 9,778,106
- Issue date Oct 3, 2017
- Tecan Trading AG
- Lutz Niggl
- G01 - MEASURING TESTING
Information Patent Grant
Visible-infrared plane grating imaging spectrometer
- Patent number 9,689,744
- Issue date Jun 27, 2017
- Massachusetts Institute of Technology
- Michael P. Chrisp
- G01 - MEASURING TESTING
Information Patent Grant
Two-dimensional spectral imaging system
- Patent number 9,488,571
- Issue date Nov 8, 2016
- Dar Bahatt
- G01 - MEASURING TESTING
Information Patent Grant
Two-dimensional spectral imaging system
- Patent number 8,139,213
- Issue date Mar 20, 2012
- Life Technologies Corporation
- Dar Bahatt
- G01 - MEASURING TESTING
Information Patent Grant
Two-dimensional spectral imaging system
- Patent number 7,663,750
- Issue date Feb 16, 2010
- Applied Biosystems, LLC.
- Dar Bahatt
- G01 - MEASURING TESTING
Information Patent Grant
Miniature optical spectrometer
- Patent number 7,019,833
- Issue date Mar 28, 2006
- Agence Spatiale Europeenne
- Bernd Harnisch
- G01 - MEASURING TESTING
Information Patent Grant
Infrared spectrophotometer employing sweep diffraction grating
- Patent number 6,528,791
- Issue date Mar 4, 2003
- Andros Incorporated
- Kevin G. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for carrying out spectral analysis of an optical light so...
- Patent number 5,859,702
- Issue date Jan 12, 1999
- Peter Lindblom
- G01 - MEASURING TESTING
Information Patent Grant
Filter having adjustable spectral transmittance function
- Patent number 5,121,239
- Issue date Jun 9, 1992
- The United States of America as represented by the Secretary of the Air Force
- David L. Post
- G01 - MEASURING TESTING
Information Patent Grant
Optical system for a multidetector array spectrograph
- Patent number 4,966,458
- Issue date Oct 30, 1990
- Milton Roy Company
- Richard Burns
- G01 - MEASURING TESTING
Information Patent Grant
Optical system for a multidetector array spectrograph
- Patent number 4,875,773
- Issue date Oct 24, 1989
- Milton Roy Company
- Richard Burns
- G01 - MEASURING TESTING
Information Patent Grant
Automatic monochromator-testing system
- Patent number 4,669,878
- Issue date Jun 2, 1987
- American Monitor Corporation
- Daniel J. Meier
- G01 - MEASURING TESTING
Information Patent Grant
Scanning monochromator system with direct coupled dispersing elemen...
- Patent number 4,469,441
- Issue date Sep 4, 1984
- Allied Corporation
- John A. Bernier
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR MINIATURE SPATIAL HETERODYNE SPECTROMETRY
- Publication number 20240385035
- Publication date Nov 21, 2024
- California Institute of Technology
- Seyedeh Sona Hosseini
- G01 - MEASURING TESTING
Information Patent Application
CASCADED, SELF-CALIBRATED, SINGLE-PIXEL INFRARED HADAMARD TRANSFORM...
- Publication number 20240377252
- Publication date Nov 14, 2024
- National University of Singapore
- Zi Heng LIM
- G01 - MEASURING TESTING
Information Patent Application
VERY HIGH RESOLUTION SPECTROMETER FOR MONITORING OF SEMICONDUCTOR P...
- Publication number 20240019302
- Publication date Jan 18, 2024
- Verity Instruments, Inc.
- Andrew Weeks Kueny
- G01 - MEASURING TESTING
Information Patent Application
AN IMAGING SYSTEM AND A LIGHT ENCODING DEVICE THEREFOR
- Publication number 20220307903
- Publication date Sep 29, 2022
- National University of Singapore
- Guangya ZHOU
- G02 - OPTICS
Information Patent Application
RECONSTRUCTING LIGHT WAVELENGTH SPECTRUM WITH THIN-FILM DEVICE
- Publication number 20220299367
- Publication date Sep 22, 2022
- ams International AG
- Ruitao ZHENG
- G01 - MEASURING TESTING
Information Patent Application
HIGH RESOLUTION MULTI-PASS OPTICAL SPECTRUM ANALYZER
- Publication number 20210325245
- Publication date Oct 21, 2021
- VIAVI Solutions Inc.
- Driss TOUAHRI
- G01 - MEASURING TESTING
Information Patent Application
THERMAL IMAGING WITH AN INTEGRATED PHOTONICS CHIP
- Publication number 20210172803
- Publication date Jun 10, 2021
- HONEYWELL INTERNATIONAL INC.
- Matthew Wade Puckett
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE INSENSITIVE FILTER
- Publication number 20210063638
- Publication date Mar 4, 2021
- Universiteit Gent
- Roeland BAETS
- G01 - MEASURING TESTING
Information Patent Application
MULTICHANNEL BROADBAND HIGH-RESOLUTION SPECTROGRAPH
- Publication number 20200348172
- Publication date Nov 5, 2020
- Fudan University
- Liangyao Chen
- G01 - MEASURING TESTING
Information Patent Application
MULTI-STAGE PARALLEL SPECTROSCOPY SYSTEMS AND METHODS
- Publication number 20200182694
- Publication date Jun 11, 2020
- University of Maryland, College Park
- Giuliano Scarcelli
- G01 - MEASURING TESTING
Information Patent Application
SUBJECT IDENTIFICATION DEVICE AND SUBJECT IDENTIFICATION METHOD
- Publication number 20200158572
- Publication date May 21, 2020
- OLYMPUS CORPORATION
- Takuji HORIE
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR CALIBRATING MEASURING INSTRUMENTS
- Publication number 20190339126
- Publication date Nov 7, 2019
- Samuel LEMIEUX
- G01 - MEASURING TESTING
Information Patent Application
METHOD, APPARATUS AND COMPUTER PROGRAM FOR MEASURING AND PROCESSING...
- Publication number 20190271586
- Publication date Sep 5, 2019
- Universiteit Twente
- Muharrem Bayraktar
- G01 - MEASURING TESTING
Information Patent Application
TECHNIQUE AND APPARATUS FOR SPECTROPHOTOMETRY USING BROADBAND FILTERS
- Publication number 20190056268
- Publication date Feb 21, 2019
- iiSM Inc.
- Seung Min Jin
- G01 - MEASURING TESTING
Information Patent Application
HIGH RESOLUTION BROADBAND MONOLITHIC SPECTROMETER AND METHOD
- Publication number 20190017869
- Publication date Jan 17, 2019
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Borgert KRUIZINGA
- G01 - MEASURING TESTING
Information Patent Application
LAMELLAR GRATING INTERFEROMETER HAVING STRESS-DISPERSIBLE SUPPORT S...
- Publication number 20180149518
- Publication date May 31, 2018
- AGENCY FOR DEFENSE DEVELOPMENT
- Jaehwan LEE
- G01 - MEASURING TESTING
Information Patent Application
Monolithic Assembly of Reflective Spatial Heterodyne Spectrometer
- Publication number 20180128683
- Publication date May 10, 2018
- California Institute of Technology
- Seyedeh Sona Hosseini
- G01 - MEASURING TESTING
Information Patent Application
SIMULTANEOUS OVERLAPPING ORDER SPECTRAL IMAGER AND METHOD
- Publication number 20180080826
- Publication date Mar 22, 2018
- Raytheon Company
- John F. Silny
- G01 - MEASURING TESTING
Information Patent Application
IMAGE SENSOR
- Publication number 20170160133
- Publication date Jun 8, 2017
- VisEra Technologies Company Limited
- Kuo-Feng LIN
- G02 - OPTICS
Information Patent Application
Spectrometer with Monochromator and Order Sorting Filter
- Publication number 20160011048
- Publication date Jan 14, 2016
- Tecan Trading AG
- Lutz NIGGL
- G01 - MEASURING TESTING
Information Patent Application
VISIBLE-INFRARED PLANE GRATING IMAGING SPECTROMETER
- Publication number 20150021480
- Publication date Jan 22, 2015
- Michael P. Chrisp
- G01 - MEASURING TESTING
Information Patent Application
Two-Dimensional Spectral Imaging System
- Publication number 20120212738
- Publication date Aug 23, 2012
- Life Technologies Corporation
- Dar Bahatt
- G01 - MEASURING TESTING
Information Patent Application
Two-Dimensional Spectral Imaging System
- Publication number 20100039642
- Publication date Feb 18, 2010
- Life Technologies Corporation
- Dar Bahatt
- G01 - MEASURING TESTING
Information Patent Application
Two-dimensional spectral imaging system
- Publication number 20070035819
- Publication date Feb 15, 2007
- Dar Bahatt
- G01 - MEASURING TESTING
Information Patent Application
Miniature optical spectrometer
- Publication number 20050046839
- Publication date Mar 3, 2005
- Agence Spatiale Europeenne
- Bernd Harnisch
- G01 - MEASURING TESTING

Grating and filter

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Field spectral radiometers including calibration assemblies

High resolution multi-pass optical spectrum analyzer

Diode-pumped multipass cavity raman gas sensor and method of use

Hyper-spectral imaging of airborne biological particles

Temperature insensitive filter

Multichannel broadband high-resolution spectrograph

Monolithic assembly of reflective spatial heterodyne spectrometer

Thermal imaging with an integrated photonics chip

Multi-stage parallel spectroscopy systems and methods

Subject identification device and subject identification method

Apparatus and method for calibrating measuring instruments

Technique and apparatus for spectrophotometry using broadband filters

High resolution broadband monolithic spectrometer and method

Method and apparatus for actuating an acousto-optical component

Simultaneous overlapping order spectral imager and method

Lamellar grating interferometer having stress-dispersible support s...

Image sensor

Spectrometer with monochromator and order sorting filter

Visible-infrared plane grating imaging spectrometer

Two-dimensional spectral imaging system

Two-dimensional spectral imaging system

Two-dimensional spectral imaging system

Miniature optical spectrometer

Infrared spectrophotometer employing sweep diffraction grating

Apparatus for carrying out spectral analysis of an optical light so...

Filter having adjustable spectral transmittance function

Optical system for a multidetector array spectrograph

Optical system for a multidetector array spectrograph

Automatic monochromator-testing system

Scanning monochromator system with direct coupled dispersing elemen...

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR MINIATURE SPATIAL HETERODYNE SPECTROMETRY

CASCADED, SELF-CALIBRATED, SINGLE-PIXEL INFRARED HADAMARD TRANSFORM...

VERY HIGH RESOLUTION SPECTROMETER FOR MONITORING OF SEMICONDUCTOR P...

AN IMAGING SYSTEM AND A LIGHT ENCODING DEVICE THEREFOR

RECONSTRUCTING LIGHT WAVELENGTH SPECTRUM WITH THIN-FILM DEVICE

HIGH RESOLUTION MULTI-PASS OPTICAL SPECTRUM ANALYZER

THERMAL IMAGING WITH AN INTEGRATED PHOTONICS CHIP

TEMPERATURE INSENSITIVE FILTER

MULTICHANNEL BROADBAND HIGH-RESOLUTION SPECTROGRAPH

MULTI-STAGE PARALLEL SPECTROSCOPY SYSTEMS AND METHODS

SUBJECT IDENTIFICATION DEVICE AND SUBJECT IDENTIFICATION METHOD

APPARATUS AND METHOD FOR CALIBRATING MEASURING INSTRUMENTS

METHOD, APPARATUS AND COMPUTER PROGRAM FOR MEASURING AND PROCESSING...

TECHNIQUE AND APPARATUS FOR SPECTROPHOTOMETRY USING BROADBAND FILTERS

HIGH RESOLUTION BROADBAND MONOLITHIC SPECTROMETER AND METHOD

LAMELLAR GRATING INTERFEROMETER HAVING STRESS-DISPERSIBLE SUPPORT S...

Monolithic Assembly of Reflective Spatial Heterodyne Spectrometer

SIMULTANEOUS OVERLAPPING ORDER SPECTRAL IMAGER AND METHOD

IMAGE SENSOR

Spectrometer with Monochromator and Order Sorting Filter

VISIBLE-INFRARED PLANE GRATING IMAGING SPECTROMETER

Two-Dimensional Spectral Imaging System

Two-Dimensional Spectral Imaging System

Two-dimensional spectral imaging system

Miniature optical spectrometer