Grating pulse time encoder

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G01N2201/112

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2201/00Features of devices classified in G01N21/00

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G01N2201/112Grating pulse time encoder

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Patents Grantslast 30 patents

Information Patent Grant
Method of condensed cell slide preparation and detection of rarely...
- Patent number 7,595,874
- Issue date Sep 29, 2009
- Sciperio, Inc.
- Vladimir M. Pelekhaty
- G01 - MEASURING TESTING
Information Patent Grant
Particle detection on patterned wafers and the like
- Patent number 4,898,471
- Issue date Feb 6, 1990
- Tencor Instruments
- John L. Vaught
- G01 - MEASURING TESTING
Information Patent Grant
Dual beam laser inspection apparatus
- Patent number 4,643,569
- Issue date Feb 17, 1987
- Lincoln Laser Company
- Sean Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Light collector for optical contaminant and flaw detector
- Patent number 4,601,576
- Issue date Jul 22, 1986
- Tencor Instruments
- Lee K. Galbraith
- G01 - MEASURING TESTING
Information Patent Grant
Scanning sample, signal generation, data digitizing and retiming sy...
- Patent number 4,600,951
- Issue date Jul 15, 1986
- AT&T Technologies, Inc.
- Frank H. Blitchington
- G01 - MEASURING TESTING
Information Patent Grant
Dual collector optical flaw detector
- Patent number 4,597,665
- Issue date Jul 1, 1986
- Tencor Instruments
- Lee K. Galbraith
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents