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Radiation system
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Patent number 11,984,236
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Issue date May 14, 2024
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ASML Netherlands B.V.
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Han-Kwang Nienhuys
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G02 - OPTICS
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Off-axis capillary x-ray optics
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Patent number 11,875,910
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Issue date Jan 16, 2024
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Arizona Board of Regents on behalf of Arizona State University
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William Graves
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G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
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Testing of curved X-ray gratings
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Patent number 11,421,984
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Issue date Aug 23, 2022
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Koninklijke Philips N.V.
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Andriy Yaroshenko
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G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
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X-ray microscope
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Patent number 11,189,392
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Issue date Nov 30, 2021
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Osaka University
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Satoshi Matsuyama
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G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
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X-ray spectrometer system
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Patent number 10,976,273
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Issue date Apr 13, 2021
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Sigray, Inc.
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Wenbing Yun
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G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
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X-ray optical device
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Patent number 10,629,319
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Issue date Apr 21, 2020
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Rigaku Corporation
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Damian Kucharczyk
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G01 - MEASURING TESTING
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Radiation system
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Patent number 10,580,546
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Issue date Mar 3, 2020
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ASML Netherlands B.V.
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Han-Kwang Nienhuys
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G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
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EUV Collector
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Patent number 10,503,075
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Issue date Dec 10, 2019
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Carl Zeiss SMT GmbH
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Ingrid Schuster
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G02 - OPTICS
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