heating, furnaces

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CPC
G01N2223/3106

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

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G01N2223/3106heating, furnaces

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Patents Grantslast 30 patents

Information Patent Grant
X-ray fluorescence analyzer
- Patent number 12,135,299
- Issue date Nov 5, 2024
- Shimadzu Corporation
- Takuro Izumi
- G01 - MEASURING TESTING
Information Patent Grant
Structure for pressurization analysis, X-ray diffraction apparatus...
- Patent number 11,913,891
- Issue date Feb 27, 2024
- Rigaku Corporation
- Koichiro Ito
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
X-ray imaging system containing x-ray apparatus having gratings and...
- Patent number 11,530,994
- Issue date Dec 20, 2022
- Konica Minolta, Inc.
- Mitsuharu Kitamura
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Device, system and method for X-ray diffraction analysis of an elec...
- Patent number 11,181,492
- Issue date Nov 23, 2021
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Julien Vulliet
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Device for clamping and controlling the temperature of planar sampl...
- Patent number 10,948,433
- Issue date Mar 16, 2021
- Helmholtz-Zentrum Geesthacht Zentrum Für Material—und Küstenforschung GmbH
- Armin Kriele
- G01 - MEASURING TESTING
Information Patent Grant
Visible test system and rock mass heating method
- Patent number 10,948,431
- Issue date Mar 16, 2021
- INSTITUTE OF GEOLOGY AND GEOPHYSICS, CHINESE ACADEMY OF SCIENCES
- Bo Zheng
- G01 - MEASURING TESTING
Information Patent Grant
X-ray imaging system containing X-ray apparatus having gratings and...
- Patent number 10,732,133
- Issue date Aug 4, 2020
- Konica Minolta, Inc.
- Mitsuharu Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Furnace for transmission mode X-ray diffractometer and transmission...
- Patent number 10,113,980
- Issue date Oct 30, 2018
- Korea Institute of Science and Technology
- Kyung Yoon Chung
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for evaluating semiconductor substrate
- Patent number 9,748,151
- Issue date Aug 29, 2017
- Shin-Etsu Handotai Co., Ltd.
- Tsuyoshi Ohtsuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-temperature strain cell for tomographic imaging
- Patent number 9,057,681
- Issue date Jun 16, 2015
- The Regents of the University of California
- Alastair A. MacDowell
- G01 - MEASURING TESTING
Information Patent Grant
Sample presentation device for radiation-based analytical equipment
- Patent number 8,597,598
- Issue date Dec 3, 2013
- University of Cape Town
- Michael Christian Maximilian Claeys
- G01 - MEASURING TESTING
Information Patent Grant
Continuous lattice constant measurments and apparatus therefor with...
- Patent number 5,046,077
- Issue date Sep 3, 1991
- U.S. Philips Corporation
- Hiromu Murayama
- G01 - MEASURING TESTING
Information Patent Grant
Analysis of fluids
- Patent number 4,795,903
- Issue date Jan 3, 1989
- United Kingdom Atomic Energy Authority
- Colin G. Clayton
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS FOR REAL-TIME MONITORING OF ORGANIC MATTER POROSITY EVOLU...
- Publication number 20230375457
- Publication date Nov 23, 2023
- Saudi Arabian Oil Company
- Abrar Alabbad
- G01 - MEASURING TESTING
Information Patent Application
IN-SITU X-RAY DIFFRACTION ANALYSIS APPARATUS INCLUDING PELTIER-TYPE...
- Publication number 20220140418
- Publication date May 5, 2022
- Seoul National University R&DB Foundation
- Yung-Eun Sung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE, SYSTEM AND METHOD FOR X-RAY DIFFRACTION ANALYSIS OF AN ELEC...
- Publication number 20210109043
- Publication date Apr 15, 2021
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Julien Vulliet
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
X-RAY IMAGING SYSTEM CONTAINING X-RAY APPARATUS HAVING GRATINGS AND...
- Publication number 20200319120
- Publication date Oct 8, 2020
- Konica Minolta, Inc.
- Mitsuharu KITAMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Device For Clamping And Controlling The Temperature Of Planar Sampl...
- Publication number 20200150061
- Publication date May 14, 2020
- Helmholtz-Zentrum Geesthacht Zentrum fur Material-und Kustenforschung GmbH
- Armin Kriele
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY IMAGING SYSTEM
- Publication number 20190170668
- Publication date Jun 6, 2019
- Konica Minolta, Inc.
- Mitsuharu KITAMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH-TEMPERATURE STRAIN CELL FOR TOMOGRAPHIC IMAGING
- Publication number 20140161223
- Publication date Jun 12, 2014
- The Regents of the University of California
- Alastair A. MacDowell
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PRESENTATION DEVICE FOR RADIATION-BASED ANALYTICAL EQUIPMENT
- Publication number 20130052100
- Publication date Feb 28, 2013
- University of Cape Town
- Michael Christian Maximilian Claeys
- G01 - MEASURING TESTING

heating, furnaces

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

X-ray fluorescence analyzer

Structure for pressurization analysis, X-ray diffraction apparatus...

X-ray imaging system containing x-ray apparatus having gratings and...

Device, system and method for X-ray diffraction analysis of an elec...

Device for clamping and controlling the temperature of planar sampl...

Visible test system and rock mass heating method

X-ray imaging system containing X-ray apparatus having gratings and...

Furnace for transmission mode X-ray diffractometer and transmission...

Method for evaluating semiconductor substrate

High-temperature strain cell for tomographic imaging

Sample presentation device for radiation-based analytical equipment

Continuous lattice constant measurments and apparatus therefor with...

Analysis of fluids

Patents Applicationslast 30 patents

APPARATUS FOR REAL-TIME MONITORING OF ORGANIC MATTER POROSITY EVOLU...

IN-SITU X-RAY DIFFRACTION ANALYSIS APPARATUS INCLUDING PELTIER-TYPE...

DEVICE, SYSTEM AND METHOD FOR X-RAY DIFFRACTION ANALYSIS OF AN ELEC...

X-RAY IMAGING SYSTEM CONTAINING X-RAY APPARATUS HAVING GRATINGS AND...

Device For Clamping And Controlling The Temperature Of Planar Sampl...

X-RAY IMAGING SYSTEM

HIGH-TEMPERATURE STRAIN CELL FOR TOMOGRAPHIC IMAGING

SAMPLE PRESENTATION DEVICE FOR RADIATION-BASED ANALYTICAL EQUIPMENT