Holography or phase contrast, phase related imaging in general

Industry

CPC
H01J2237/2614

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/2614Holography or phase contrast, phase related imaging in general

Industries

Patents Grantslast 30 patents

Information Patent Grant
Optically-addressed phase modulator for electron beams
- Patent number 12,033,829
- Issue date Jul 9, 2024
- The Board of Trustees of the Leland Stanford Junior University
- Stewart A. Koppell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Use of optical polarization states to control a ponderomotive phase...
- Patent number 11,990,313
- Issue date May 21, 2024
- The Regents of the University of California
- Jeremy J. Axelrod
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron diffraction holography
- Patent number 11,906,450
- Issue date Feb 20, 2024
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-contact angle measuring apparatus
- Patent number 11,903,755
- Issue date Feb 20, 2024
- Weng-Dah Ken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and sample observation method using the same
- Patent number 11,551,907
- Issue date Jan 10, 2023
- Riken
- Ken Harada
- G01 - MEASURING TESTING
Information Patent Grant
Electron diffraction holography
- Patent number 11,460,419
- Issue date Oct 4, 2022
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 11,251,011
- Issue date Feb 15, 2022
- HITACHI HIGH-TECH CORPORATION
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser-based phase plate image contrast manipulation
- Patent number 11,101,101
- Issue date Aug 24, 2021
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 11,087,947
- Issue date Aug 10, 2021
- HITACHI HIGH-TECH CORPORATION
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spatial phase manipulation of charged particle beam
- Patent number 11,062,872
- Issue date Jul 13, 2021
- Universiteit Antwerpen
- Johan Verbeeck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Holography reconstruction method and program
- Patent number 11,024,482
- Issue date Jun 1, 2021
- Riken
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of image acquisition and electron microscope
- Patent number 10,923,314
- Issue date Feb 16, 2021
- Jeol Ltd.
- Akiho Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of acquiring holograms by off-axis electron holography in pr...
- Patent number 10,884,379
- Issue date Jan 5, 2021
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Victor Boureau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interference optical system unit, charged particle beam interferenc...
- Patent number 10,770,264
- Issue date Sep 8, 2020
- Riken
- Yoh Iwasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 10,741,358
- Issue date Aug 11, 2020
- Jeol Ltd.
- Yuko Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement method and electron microscope
- Patent number 10,714,308
- Issue date Jul 14, 2020
- Jeol Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase contrast transmission electron microscope device
- Patent number 10,658,155
- Issue date May 19, 2020
- Inter-University Research Institute Corporation National Institutes of Natura...
- Yukinori Nagatani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope for magnetic field measurement and magnetic fie...
- Patent number 10,629,410
- Issue date Apr 21, 2020
- Hitachi, Ltd.
- Toshiaki Tanigaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tunable charged particle vortex beam generator and method
- Patent number 10,607,804
- Issue date Mar 31, 2020
- Forschungszentrum Julich GmbH
- Amir Tavabi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of determining the deflection of an electron beam resulting...
- Patent number 10,593,511
- Issue date Mar 17, 2020
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Benedikt Haas
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for imaging single molecules
- Patent number 10,515,791
- Issue date Dec 24, 2019
- Universitaet Zuerich
- Jean-Nicolas Longchamp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and phase plate
- Patent number 10,504,695
- Issue date Dec 10, 2019
- Hitachi High-Technologies Corporation
- Arthur Malcolm Blackburn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for manipulating particle beam
- Patent number 10,497,537
- Issue date Dec 3, 2019
- Ramot At Tel-Aviv University Ltd.
- Roy Shiloh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical-cavity based ponderomotive phase plate for transmission ele...
- Patent number 10,395,888
- Issue date Aug 27, 2019
- The Regents of the University of California
- Jeremy J. Axelrod
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle system and method for measuring deflection fields...
- Patent number 10,332,720
- Issue date Jun 25, 2019
- Jeol Ltd.
- Kazuya Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tunable ampere phase plate for charged particle imaging systems
- Patent number 10,276,345
- Issue date Apr 30, 2019
- Forschunszentrum Juelich GmbH
- Amir Hossein Tavabi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for use in electron microscopy
- Patent number 10,170,272
- Issue date Jan 1, 2019
- Technion Research & Development Foundation Limited
- Ido Kaminer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of imaging a specimen using ptychography
- Patent number 10,008,363
- Issue date Jun 26, 2018
- FEI Company
- Eric Gerardus Theodoor Bosch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam splitter
- Patent number 9,984,849
- Issue date May 29, 2018
- Friedrich-Alexander-Universitat Erlangen-Nurnberg
- Jakob Hammer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for manipulating particle beam
- Patent number 9,953,802
- Issue date Apr 24, 2018
- Ramot At Tel-Aviv University Ltd.
- Roy Shiloh
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
USE OF OPTICAL POLARIZATION STATES TO CONTROL A PONDEROMOTIVE PHASE...
- Publication number 20240282549
- Publication date Aug 22, 2024
- The Regents of the University of California
- Jeremy J. Axelrod
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BIFOCAL ELECTRON MICROSCOPE
- Publication number 20240272100
- Publication date Aug 15, 2024
- FEI Company
- Alexander Henstra
- G01 - MEASURING TESTING
Information Patent Application
ULTRA-PRECISION TIMING CLOCK METHOD AND APPARATUS
- Publication number 20240115222
- Publication date Apr 11, 2024
- Weng-Dah Ken
- G04 - HOROLOGY
Information Patent Application
PHASE IMAGE PROCESSING APPARATUS AND PHASE IMAGE PROCESSING METHOD
- Publication number 20240021406
- Publication date Jan 18, 2024
- Hitachi, Ltd
- Yoshio TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON DIFFRACTION HOLOGRAPHY
- Publication number 20230003672
- Publication date Jan 5, 2023
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
USE OF OPTICAL POLARIZATION STATES TO CONTROL A PONDEROMOTIVE PHASE...
- Publication number 20220319803
- Publication date Oct 6, 2022
- The Regents of the University of California
- Jeremy J. Axelrod
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Optically-addressed phase modulator for electron beams
- Publication number 20220238298
- Publication date Jul 28, 2022
- Stewart A. Koppell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE AND SAMPLE OBSERVATION METHOD USING THE SAME
- Publication number 20210233741
- Publication date Jul 29, 2021
- Riken
- Ken Harada
- G01 - MEASURING TESTING
Information Patent Application
NON-CONTACT ANGLE MEASURING APPARATUS
- Publication number 20200397391
- Publication date Dec 24, 2020
- Weng-Dah Ken
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20200303152
- Publication date Sep 24, 2020
- Hitachi High-Technologies Corporation
- Takashi OHSHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPATIAL PHASE MANIPULATION OF CHARGED PARTICLE BEAM
- Publication number 20200258712
- Publication date Aug 13, 2020
- Johan VERBEECK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HOLOGRAPHY RECONSTRUCTION METHOD AND PROGRAM
- Publication number 20200105498
- Publication date Apr 2, 2020
- Riken
- Ken HARADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope
- Publication number 20200013582
- Publication date Jan 9, 2020
- JEOL Ltd.
- Yuko Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERFERENCE OPTICAL SYSTEM UNIT, CHARGED PARTICLE BEAM INTERFERENC...
- Publication number 20190295816
- Publication date Sep 26, 2019
- Riken
- Yoh IWASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE FOR MAGNETIC FIELD MEASUREMENT AND MAGNETIC FIE...
- Publication number 20190295817
- Publication date Sep 26, 2019
- Hitachi, Ltd
- Toshiaki TANIGAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF ACQUIRING HOLOGRAMS BY OFF-AXIS ELECTRON HOLOGRAPHY IN PR...
- Publication number 20190155218
- Publication date May 23, 2019
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Victor BOUREAU
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND PHASE PLATE
- Publication number 20180330916
- Publication date Nov 15, 2018
- Hitachi High-Technologies Corporation
- Arthur Malcolm BLACKBURN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL-CAVITY BASED PONDEROMOTIVE PHASE PLATE FOR TRANSMISSION ELE...
- Publication number 20180286631
- Publication date Oct 4, 2018
- The Regents of the University of California
- Jeremy J. Axelrod
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR MANIPULATING PARTICLE BEAM
- Publication number 20180211814
- Publication date Jul 26, 2018
- Ramot at Tel-Aviv University Ltd.
- Roy SHILOH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Beam Splitter
- Publication number 20170025242
- Publication date Jan 26, 2017
- Friedrich-Alexander-Universitat Erlangen-Nurnberg
- Jakob Hammer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR MANIPULATING PARTICLE BEAM
- Publication number 20160343536
- Publication date Nov 24, 2016
- Ramot at Tel-Aviv University Ltd.
- Roy SHILOH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Phase Plate, Method of Fabricating Same, and Electron Microscope
- Publication number 20160276125
- Publication date Sep 22, 2016
- JEOL Ltd.
- Hirofumi Iijima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED-PARTICLE-BEAM DEVICE AND METHOD FOR CORRECTING ABERRATION
- Publication number 20150235801
- Publication date Aug 20, 2015
- Hitachi High-Technologies Corporation
- Hisanao Akima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHASE PLATE FOR A TRANSMISSION ELECTRON MICROSCOPE
- Publication number 20150136172
- Publication date May 21, 2015
- FEI Company
- Patrick Kurth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM MICROSCOPE, SAMPLE HOLDER FOR CHARGED PARTICL...
- Publication number 20140353500
- Publication date Dec 4, 2014
- Ruriko Tsuneta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GENERATION OF CHARGED PARTICLE VORTEX WAVES
- Publication number 20140346354
- Publication date Nov 27, 2014
- Johan Verbeeck
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE VORTEX WAVE GENERATION
- Publication number 20140346353
- Publication date Nov 27, 2014
- Johan Verbeeck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF USING A PHASE PLATE IN A TRANSMISSION ELECTRON MICROSCOPE
- Publication number 20140326876
- Publication date Nov 6, 2014
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHASE SHIFT METHOD FOR A TEM
- Publication number 20140326878
- Publication date Nov 6, 2014
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INCOHERENT TRANSMISSION ELECTRON MICROSCOPY
- Publication number 20140284475
- Publication date Sep 25, 2014
- MOCHII, INC. (D/B/A VOXA)
- Christopher Su-Yan Own
- H01 - BASIC ELECTRIC ELEMENTS

Holography or phase contrast, phase related imaging in general

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Optically-addressed phase modulator for electron beams

Use of optical polarization states to control a ponderomotive phase...

Electron diffraction holography

Non-contact angle measuring apparatus

Electron microscope and sample observation method using the same

Electron diffraction holography

Electron microscope

Laser-based phase plate image contrast manipulation

Electron microscope

Spatial phase manipulation of charged particle beam

Holography reconstruction method and program

Method of image acquisition and electron microscope

Method of acquiring holograms by off-axis electron holography in pr...

Interference optical system unit, charged particle beam interferenc...

Electron microscope

Measurement method and electron microscope

Phase contrast transmission electron microscope device

Electron microscope for magnetic field measurement and magnetic fie...

Tunable charged particle vortex beam generator and method

Method of determining the deflection of an electron beam resulting...

Method and apparatus for imaging single molecules

Charged particle beam device and phase plate

Method and device for manipulating particle beam

Optical-cavity based ponderomotive phase plate for transmission ele...

Charged particle system and method for measuring deflection fields...

Tunable ampere phase plate for charged particle imaging systems

System and method for use in electron microscopy

Method of imaging a specimen using ptychography

Electron beam splitter

Method and device for manipulating particle beam

Patents Applicationslast 30 patents

USE OF OPTICAL POLARIZATION STATES TO CONTROL A PONDEROMOTIVE PHASE...

BIFOCAL ELECTRON MICROSCOPE

ULTRA-PRECISION TIMING CLOCK METHOD AND APPARATUS

PHASE IMAGE PROCESSING APPARATUS AND PHASE IMAGE PROCESSING METHOD

ELECTRON DIFFRACTION HOLOGRAPHY

USE OF OPTICAL POLARIZATION STATES TO CONTROL A PONDEROMOTIVE PHASE...

Optically-addressed phase modulator for electron beams

ELECTRON MICROSCOPE AND SAMPLE OBSERVATION METHOD USING THE SAME

NON-CONTACT ANGLE MEASURING APPARATUS

ELECTRON MICROSCOPE

SPATIAL PHASE MANIPULATION OF CHARGED PARTICLE BEAM

HOLOGRAPHY RECONSTRUCTION METHOD AND PROGRAM

Electron Microscope

INTERFERENCE OPTICAL SYSTEM UNIT, CHARGED PARTICLE BEAM INTERFERENC...

ELECTRON MICROSCOPE FOR MAGNETIC FIELD MEASUREMENT AND MAGNETIC FIE...

METHOD OF ACQUIRING HOLOGRAMS BY OFF-AXIS ELECTRON HOLOGRAPHY IN PR...

CHARGED PARTICLE BEAM DEVICE AND PHASE PLATE

OPTICAL-CAVITY BASED PONDEROMOTIVE PHASE PLATE FOR TRANSMISSION ELE...

METHOD AND DEVICE FOR MANIPULATING PARTICLE BEAM

Electron Beam Splitter

METHOD AND DEVICE FOR MANIPULATING PARTICLE BEAM

Phase Plate, Method of Fabricating Same, and Electron Microscope

CHARGED-PARTICLE-BEAM DEVICE AND METHOD FOR CORRECTING ABERRATION

PHASE PLATE FOR A TRANSMISSION ELECTRON MICROSCOPE

CHARGED PARTICLE BEAM MICROSCOPE, SAMPLE HOLDER FOR CHARGED PARTICL...

GENERATION OF CHARGED PARTICLE VORTEX WAVES

CHARGED PARTICLE VORTEX WAVE GENERATION

METHOD OF USING A PHASE PLATE IN A TRANSMISSION ELECTRON MICROSCOPE

PHASE SHIFT METHOD FOR A TEM

INCOHERENT TRANSMISSION ELECTRON MICROSCOPY