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Automatic analysis apparatus
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Patent number 12,163,971
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Issue date Dec 10, 2024
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HITACHI HIGH-TECH CORPORATION
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Taichiro Yamashita
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G01 - MEASURING TESTING
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Systems and methods for multi-analysis
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Patent number 12,085,583
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Issue date Sep 10, 2024
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Labrador Diagnostics LLC
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Elizabeth A. Holmes
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B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Genetic testing device
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Patent number 12,023,678
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Issue date Jul 2, 2024
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HC BIO-ENGINEERING (CHENGDU) CO., LTD.
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Jian Chen
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C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
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Automatic analysis device
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Patent number 11,927,032
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Issue date Mar 12, 2024
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HITACHI HIGH-TECH CORPORATION
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Taichiro Yamashita
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G01 - MEASURING TESTING
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Automatic analyzer
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Patent number 11,885,824
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Issue date Jan 30, 2024
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HITACHI HIGH-TECH CORPORATION
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Takahiro Kumagai
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G01 - MEASURING TESTING
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Sensor and sensor module
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Patent number 11,879,753
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Issue date Jan 23, 2024
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Kabushiki Kaisha Toshiba
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Yosuke Akimoto
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G01 - MEASURING TESTING
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Rheometer docking station
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Patent number 11,493,418
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Issue date Nov 8, 2022
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Alpha Technologies Services LLC
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Patrick Kosuth
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G01 - MEASURING TESTING
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Diagnostic test reader system
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Patent number 11,193,949
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Issue date Dec 7, 2021
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Zoetis Services LLC
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Niels Kristian Bau-Madsen
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G06 - COMPUTING CALCULATING COUNTING
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Automatic analyzer
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Patent number 11,125,762
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Issue date Sep 21, 2021
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HITACHI HIGH-TECH CORPORATION
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Tsuyoshi Yamamoto
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G01 - MEASURING TESTING
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Systems and methods for multi-analysis
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Patent number 11,112,418
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Issue date Sep 7, 2021
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Labrador Diagnostics LLC
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Elizabeth A. Holmes
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B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Automated analyzer
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Patent number 11,067,589
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Issue date Jul 20, 2021
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HITACHI HIGH-TECH CORPORATION
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Yoshiteru Hirama
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B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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Loading station
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Patent number 11,061,043
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Issue date Jul 13, 2021
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Cellular Research, Inc.
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Janice H. Lai
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G01 - MEASURING TESTING
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