Illumination Optics

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CPC
G01N2201/06

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2201/00Features of devices classified in G01N21/00

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G01N2201/06Illumination Optics

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Estimating soil properties within a field using hyperspectral remot...
- Patent number 12,366,678
- Issue date Jul 22, 2025
- CLIMATE LLC
- Nick Cisek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface-enhanced Raman scattering substrate for fuel oil analysis
- Patent number 12,366,534
- Issue date Jul 22, 2025
- King Fahd University of Petroleum & Minerals
- Abdulaziz Abdulrahman Al-Saadi
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Systems and methods for live projection imaging for fluorescence mi...
- Patent number 12,366,740
- Issue date Jul 22, 2025
- The Board of Regents of the University of Texas System
- Reto Fiolka
- G01 - MEASURING TESTING
Information Patent Grant
Phase retrieval
- Patent number 12,366,525
- Issue date Jul 22, 2025
- Applied Materials Israel Ltd.
- Benny Kirshner
- G01 - MEASURING TESTING
Information Patent Grant
System including a fiber laser module
- Patent number 12,366,532
- Issue date Jul 22, 2025
- Atonarp Inc.
- Mateusz Plewicki
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining optical density of a solution
- Patent number 12,366,528
- Issue date Jul 22, 2025
- Cytiva Sweden AB
- Hanno Ehring
- G01 - MEASURING TESTING
Information Patent Grant
Use of vibrational spectroscopy for microfluidic liquid measurement
- Patent number 12,364,984
- Issue date Jul 22, 2025
- 1087 Systems, Inc.
- Matthias Wagner
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Measuring apparatus and method for roughness and/or defect measurem...
- Patent number 12,366,445
- Issue date Jul 22, 2025
- ASML Netherlands B.V.
- Alexander Von Finck
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and inspection method using the same
- Patent number 12,360,055
- Issue date Jul 15, 2025
- Samsung Display Co., Ltd.
- Sungwoo Jung
- G01 - MEASURING TESTING
Information Patent Grant
Characteristic information extraction method and portable detection...
- Patent number 12,360,047
- Issue date Jul 15, 2025
- Jiangsu University
- Quansheng Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and methods for the estimation of soil unconfined compres...
- Patent number 12,360,048
- Issue date Jul 15, 2025
- King Fahd University of Petroleum & Minerals
- Yakubu Sani Wudil
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring the light absorbance of a substa...
- Patent number 12,352,685
- Issue date Jul 8, 2025
- Cytiva Sweden AB
- Hanno Ehring
- G01 - MEASURING TESTING
Information Patent Grant
In-line gas sensor and sensing methods
- Patent number 12,352,690
- Issue date Jul 8, 2025
- INTEGRITY COMMUNICATIONS SOLUTIONS, INC.
- Michael Lenn Tipton
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for shortwave infrared photothermal (SWIP) mic...
- Patent number 12,352,944
- Issue date Jul 8, 2025
- Trustees of Boston University
- Ji-Xin Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced evanescent prism coupling systems and methods for characte...
- Patent number 12,345,629
- Issue date Jul 1, 2025
- Corning Incorporated
- Rostislav Vatchev Roussev
- G01 - MEASURING TESTING
Information Patent Grant
Ultrafast chemical imaging by widefield photothermal sensing of inf...
- Patent number 12,345,635
- Issue date Jul 1, 2025
- Purdue Research Foundation
- Ji-Xin Cheng
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz characterization of a multi-layered tire tread
- Patent number 12,345,636
- Issue date Jul 1, 2025
- The Goodyear Tire & Rubber Company
- Claude Schweitzer
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspection of a subject article
- Patent number 12,345,652
- Issue date Jul 1, 2025
- SENS-TECH LTD.
- Stephen Jaye
- G01 - MEASURING TESTING
Information Patent Grant
Ellipsometer and apparatus for inspecting semiconductor device incl...
- Patent number 12,345,626
- Issue date Jul 1, 2025
- Samsung Electronics Co., Ltd.
- Yasuhiro Hidaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas detection device and gas detection method
- Patent number 12,345,631
- Issue date Jul 1, 2025
- Kabushiki Kaisha Toshiba
- Yasutomo Shiomi
- G01 - MEASURING TESTING
Information Patent Grant
Two-photon microscope
- Patent number 12,345,643
- Issue date Jul 1, 2025
- Electronics and Telecommunications Research Institute
- Hong-Seok Seo
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus
- Patent number 12,345,653
- Issue date Jul 1, 2025
- Shimadzu Corporation
- Hiroshi Horikawa
- G01 - MEASURING TESTING
Information Patent Grant
Optical system, and method of illuminating a sample plane
- Patent number 12,345,642
- Issue date Jul 1, 2025
- Advanced Instrument Pte. Ltd.
- Ronian Siew
- G01 - MEASURING TESTING
Information Patent Grant
Red-shifted fluorophores
- Patent number 12,344,594
- Issue date Jul 1, 2025
- Howard Hughes Medical Institute
- Luke D. Lavis
- G01 - MEASURING TESTING
Information Patent Grant
Microscopic object detection device, detection system, and detectio...
- Patent number 12,345,625
- Issue date Jul 1, 2025
- University Public Corporation Osaka
- Takuya Iida
- G01 - MEASURING TESTING
Information Patent Grant
Fully compensated optical gas sensing system and apparatus
- Patent number 12,345,632
- Issue date Jul 1, 2025
- Analog Devices, Inc.
- Shrenik Deliwala
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibrating blood glucose measurement apparatus based on...
- Patent number 12,336,813
- Issue date Jun 24, 2025
- Apollon Inc.
- Miyeon Jue
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Measuring apparatus and testing apparatus having the same
- Patent number 12,339,223
- Issue date Jun 24, 2025
- Samsung Electronics Co., Ltd.
- Yasuhiro Hidaka
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determination of textile fiber composition
- Patent number 12,339,224
- Issue date Jun 24, 2025
- VALVAN NV
- Frank Vandeputte
- G01 - MEASURING TESTING
Information Patent Grant
Method for training machine learning model for blood glucose measur...
- Patent number 12,336,814
- Issue date Jun 24, 2025
- Apollon Inc.
- Miyeon Jue
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
POLARIZER ASSEMBLY AND SPECTROSCOPIC ELLIPSOMETER INCLUDING THE SAME
- Publication number 20250237861
- Publication date Jul 24, 2025
- Samsung Electronics Co., Ltd.
- Jiyong Shin
- G02 - OPTICS
Information Patent Application
DEVICES FOR BIOLOGICAL ANALYSIS
- Publication number 20250237602
- Publication date Jul 24, 2025
- CELLSBIN, INC.
- Ali KABIRI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AN APPARATUS FOR MEASURING LIQUID SAMPLE TRANSMITTANCE
- Publication number 20250237607
- Publication date Jul 24, 2025
- Cerillo, Inc.
- Kevin Seitter
- G01 - MEASURING TESTING
Information Patent Application
TEST OBJECT ANALYSIS METHOD
- Publication number 20250237608
- Publication date Jul 24, 2025
- HAMAMTSU PHOTONICS K.K.
- Kazuhiko FUJIWARA
- G01 - MEASURING TESTING
Information Patent Application
ION BEAM TIME OF ARRIVAL (TOA) GAUGE
- Publication number 20250237546
- Publication date Jul 24, 2025
- Analex Corporation
- Todd Evan Vande Brake
- G01 - MEASURING TESTING
Information Patent Application
FLUORESCENCE DETECTION DEVICE
- Publication number 20250231111
- Publication date Jul 17, 2025
- Japan Display Inc.
- Yasuhiro TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR RAPID CHARACTERIZATION OF METALLIC POWDERS
- Publication number 20250231113
- Publication date Jul 17, 2025
- RTX Corporation
- David U. Furrer
- G01 - MEASURING TESTING
Information Patent Application
System for Measuring Microplastics in an Aquatic Environment
- Publication number 20250231115
- Publication date Jul 17, 2025
- Ely Oser
- G01 - MEASURING TESTING
Information Patent Application
DETECTION DEVICE
- Publication number 20250231099
- Publication date Jul 17, 2025
- Japan Display Inc.
- Kaoru ITO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL APPARATUS
- Publication number 20250234096
- Publication date Jul 17, 2025
- Panasonic Intellectual Property Management Co., Ltd.
- Yusuke KITAGAWA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
OPTICAL GAS SENSOR DEVICE, GAS DETECTION METHOD, AND STORAGE MEDIUM...
- Publication number 20250231104
- Publication date Jul 17, 2025
- MITSUMI ELECTRIC CO., LTD.
- Akira NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
A METHOD FOR ANALYZING MILK, A METHOD FOR ANALYZING THE CONTENT OF...
- Publication number 20250224334
- Publication date Jul 10, 2025
- CARAG AG
- Alexander Kalyanov
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL-TYPE FOREIGN MATTER INSPECTION DEVICE
- Publication number 20250224342
- Publication date Jul 10, 2025
- Hitachi High-Tech Corporation
- Tomoharu NAGASHIMA
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION APPARATUS AND WAFER INSPECTION SYSTEM INCLUDING TH...
- Publication number 20250224345
- Publication date Jul 10, 2025
- Samsung Electronics Co., Ltd.
- Jun Taek OH
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPIC ELLIPSOMETER AND SUBSTRATE ANALYSIS METHOD USING THE...
- Publication number 20250224326
- Publication date Jul 10, 2025
- Samsung Electronics Co., Ltd.
- Jaeho KIM
- G01 - MEASURING TESTING
Information Patent Application
LUMINESCENCE IMAGING FOR GEMSTONE SCREENING
- Publication number 20250224338
- Publication date Jul 10, 2025
- Gemological Institute of America, Inc.
- Tsung-Han TSAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NONLINEAR OPTICAL STOKES ELLIPSOMETERS
- Publication number 20250224327
- Publication date Jul 10, 2025
- FemtoMetrix, Inc.
- Ken James
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WHITE LIGHT SCATTERING IN OPTICAL BIOMOLECULE INTERACTION ANALYSIS
- Publication number 20250216328
- Publication date Jul 3, 2025
- Miltenyi Biotec B.V. & Co. KG
- Heinrich SPIECKER
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION SYSTEM
- Publication number 20250216339
- Publication date Jul 3, 2025
- BRIGHTEST TECHNOLOGY TAIWAN CO., LTD.
- ZHONG-HUA DONG
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
NANOSENSOR METHODS AND APPARATUSES FOR DETERMINATION OF ANALYTES
- Publication number 20250214082
- Publication date Jul 3, 2025
- President and Fellows of Harvard College
- Qimin Quan
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
COMPACT INJECTION MOLDED OPTICAL MODULE FOR GAS SENSING
- Publication number 20250216327
- Publication date Jul 3, 2025
- Renesas Electronics America Inc.
- Mohammad Taghi FATHI
- G01 - MEASURING TESTING
Information Patent Application
FIELD QUANTITATIVE ANALYSIS METHOD AND SYSTEM OF LITHIUM
- Publication number 20250216334
- Publication date Jul 3, 2025
- Institute of Geology and Geophysics, CAS
- Zhiyuan LI
- G01 - MEASURING TESTING
Information Patent Application
Spectroscopic Mapping System
- Publication number 20250207974
- Publication date Jun 26, 2025
- Board of Trustees of Michigan State University
- Elad HAREL
- G01 - MEASURING TESTING
Information Patent Application
OBJECT IMAGING APPARATUS AND OBJECT RECOGNITION APPARATUS
- Publication number 20250205745
- Publication date Jun 26, 2025
- PFU Limited
- Masanobu HONGO
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
MODE-MATCHING A PLURALITY OF OPTICAL BEAMS TO A CORRESPONDING PLURA...
- Publication number 20250210931
- Publication date Jun 26, 2025
- Rosemount Aerospace Inc.
- Gary E. Halama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD TO QUALIFY ADDITIONAL DIES AFTER MASTER DIE
- Publication number 20250209607
- Publication date Jun 26, 2025
- Pratt & Whitney Canada Corp.
- Michael Morash
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING ELECTRON DENSITY OF PLASMA
- Publication number 20250208034
- Publication date Jun 26, 2025
- Research & Business Foundation Sungkyunkwan University
- Moon Soo BAK
- G01 - MEASURING TESTING
Information Patent Application
PHOTOMETRIC PROCESS MEASUREMENT APPARATUS
- Publication number 20250208052
- Publication date Jun 26, 2025
- Hach Lange GmbH
- Andre Naggies
- G01 - MEASURING TESTING
Information Patent Application
MIRROR-BASED RELAY FOR AN OPTICAL INSPECTION SYSTEM
- Publication number 20250208059
- Publication date Jun 26, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Boris GOLBERG
- G01 - MEASURING TESTING
Information Patent Application
MEASURING HEAD AND MEASUREMENT APPARATUS FOR PERFORMING SURFACE-ENH...
- Publication number 20250208047
- Publication date Jun 26, 2025
- Justin Moretto
- G01 - MEASURING TESTING

Illumination Optics

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Estimating soil properties within a field using hyperspectral remot...

Surface-enhanced Raman scattering substrate for fuel oil analysis

Systems and methods for live projection imaging for fluorescence mi...

Phase retrieval

System including a fiber laser module

Method and apparatus for determining optical density of a solution

Use of vibrational spectroscopy for microfluidic liquid measurement

Measuring apparatus and method for roughness and/or defect measurem...

Inspection system and inspection method using the same

Characteristic information extraction method and portable detection...

Apparatus and methods for the estimation of soil unconfined compres...

Apparatus and method for measuring the light absorbance of a substa...

In-line gas sensor and sensing methods

Apparatus and method for shortwave infrared photothermal (SWIP) mic...

Enhanced evanescent prism coupling systems and methods for characte...

Ultrafast chemical imaging by widefield photothermal sensing of inf...

Terahertz characterization of a multi-layered tire tread

Method and apparatus for inspection of a subject article

Ellipsometer and apparatus for inspecting semiconductor device incl...

Gas detection device and gas detection method

Two-photon microscope

Defect inspection apparatus

Optical system, and method of illuminating a sample plane

Red-shifted fluorophores

Microscopic object detection device, detection system, and detectio...

Fully compensated optical gas sensing system and apparatus

Method for calibrating blood glucose measurement apparatus based on...

Measuring apparatus and testing apparatus having the same

Method and apparatus for determination of textile fiber composition

Method for training machine learning model for blood glucose measur...

Patents Applicationslast 30 patents

POLARIZER ASSEMBLY AND SPECTROSCOPIC ELLIPSOMETER INCLUDING THE SAME

DEVICES FOR BIOLOGICAL ANALYSIS

AN APPARATUS FOR MEASURING LIQUID SAMPLE TRANSMITTANCE

TEST OBJECT ANALYSIS METHOD

ION BEAM TIME OF ARRIVAL (TOA) GAUGE

FLUORESCENCE DETECTION DEVICE

METHOD FOR RAPID CHARACTERIZATION OF METALLIC POWDERS

System for Measuring Microplastics in an Aquatic Environment

DETECTION DEVICE

OPTICAL APPARATUS

OPTICAL GAS SENSOR DEVICE, GAS DETECTION METHOD, AND STORAGE MEDIUM...

A METHOD FOR ANALYZING MILK, A METHOD FOR ANALYZING THE CONTENT OF...

OPTICAL-TYPE FOREIGN MATTER INSPECTION DEVICE

WAFER INSPECTION APPARATUS AND WAFER INSPECTION SYSTEM INCLUDING TH...

SPECTROSCOPIC ELLIPSOMETER AND SUBSTRATE ANALYSIS METHOD USING THE...

LUMINESCENCE IMAGING FOR GEMSTONE SCREENING

NONLINEAR OPTICAL STOKES ELLIPSOMETERS

WHITE LIGHT SCATTERING IN OPTICAL BIOMOLECULE INTERACTION ANALYSIS

WAFER INSPECTION SYSTEM

NANOSENSOR METHODS AND APPARATUSES FOR DETERMINATION OF ANALYTES

COMPACT INJECTION MOLDED OPTICAL MODULE FOR GAS SENSING

FIELD QUANTITATIVE ANALYSIS METHOD AND SYSTEM OF LITHIUM

Spectroscopic Mapping System

OBJECT IMAGING APPARATUS AND OBJECT RECOGNITION APPARATUS

MODE-MATCHING A PLURALITY OF OPTICAL BEAMS TO A CORRESPONDING PLURA...

METHOD TO QUALIFY ADDITIONAL DIES AFTER MASTER DIE

APPARATUS AND METHOD FOR MEASURING ELECTRON DENSITY OF PLASMA

PHOTOMETRIC PROCESS MEASUREMENT APPARATUS

MIRROR-BASED RELAY FOR AN OPTICAL INSPECTION SYSTEM

MEASURING HEAD AND MEASUREMENT APPARATUS FOR PERFORMING SURFACE-ENH...