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Wafer defect detection device
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Patent number 12,265,038
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Issue date Apr 1, 2025
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PlayNitride Display Co., Ltd.
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Yi-Chia Hwang
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G01 - MEASURING TESTING
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Compact imaging-based sensors
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Patent number 12,265,019
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Issue date Apr 1, 2025
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ESSENLIX CORPORATION
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Stephen Y. Chou
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H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Microfluidic detection device
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Patent number 12,253,456
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Issue date Mar 18, 2025
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AUO Corporation
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Shu-Jiang Liu
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B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Optical device
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Patent number 12,247,915
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Issue date Mar 11, 2025
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Asahi Kasei Microdevices Corporation
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Kengo Sasayama
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G02 - OPTICS
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