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G01N2223/426

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

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G01N2223/426image comparing, unknown with known substance

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Patents Grantslast 30 patents

Information Patent Grant
Method to use artificial intelligence to enhance visual inspection...
- Patent number 11,988,630
- Issue date May 21, 2024
- Robert Bosch GmbH
- Craig Magera
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for crack detection
- Patent number 11,946,883
- Issue date Apr 2, 2024
- United States as represented by the Administrator of NASA
- Ajay M Koshti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for detecting defects in devices using X-rays
- Patent number 11,688,067
- Issue date Jun 27, 2023
- Bruker Nano, Inc.
- David Lewis Adler
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for printed circuit board design based on autom...
- Patent number 11,662,479
- Issue date May 30, 2023
- Bruker Nano, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for manufacturing printed circuit board based o...
- Patent number 11,651,492
- Issue date May 16, 2023
- Bruker Nano, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection device, inspection method, and method for producing obje...
- Patent number 11,639,904
- Issue date May 2, 2023
- Nikon Corporation
- Takeshi Ohbayashi
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for product failure prediction based on X-ray i...
- Patent number 11,615,533
- Issue date Mar 28, 2023
- Bruker Nano, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection method for electrode structural body
- Patent number 11,598,731
- Issue date Mar 7, 2023
- Honda Motor Co., Ltd.
- Hiroaki Shimizu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for process control based on X-ray inspection
- Patent number 11,430,118
- Issue date Aug 30, 2022
- Bruker Nano, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Particle measuring device and particle measuring method
- Patent number 11,143,606
- Issue date Oct 12, 2021
- HITACHI HIGH-TECH CORPORATION
- Tomihiro Hashizume
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting an anomaly in a single crystal structure
- Patent number 11,099,143
- Issue date Aug 24, 2021
- Rolls-Royce PLC
- Jacqueline Griffiths
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for printed circuit board design based on autom...
- Patent number 11,042,981
- Issue date Jun 22, 2021
- SVXR, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for non-destructive testing of a turbomachine part
- Patent number 10,996,180
- Issue date May 4, 2021
- SAFRAN AIRCRAFT ENGINES
- Clément Remacha
- G01 - MEASURING TESTING
Information Patent Grant
Computed tomography for non-destructive evaluation of manufactured...
- Patent number 10,969,771
- Issue date Apr 6, 2021
- Luke Mohr
- G01 - MEASURING TESTING
Information Patent Grant
Method for characterising a part
- Patent number 10,914,690
- Issue date Feb 9, 2021
- SAFRAN AIRCRAFT ENGINES
- Julien Schneider
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of detecting a defect and apparatus for performing the same
- Patent number 10,782,254
- Issue date Sep 22, 2020
- Samsung Electronics Co., Ltd.
- Hyon-Seok Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron beam inspection apparatus and electron beam inspection method
- Patent number 10,712,295
- Issue date Jul 14, 2020
- NUFLARE TECHNOLOGY, INC.
- Hideo Tsuchiya
- G01 - MEASURING TESTING
Information Patent Grant
Material identification method
- Patent number 10,564,113
- Issue date Feb 18, 2020
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Caroline Paulus
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam inspection apparatus and charged particle bea...
- Patent number 10,041,892
- Issue date Aug 7, 2018
- NuFlare Technology, Inc.
- Masataka Shiratsuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray backscatter system and method for detecting discrepancies in...
- Patent number 9,709,514
- Issue date Jul 18, 2017
- The Boeing Company
- William Talion Edwards
- G01 - MEASURING TESTING
Information Patent Grant
E-beam defect review system
- Patent number 8,094,924
- Issue date Jan 10, 2012
- Hermes-Microvision, Inc.
- Jack Jau
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting trace contaminents
- Patent number 5,023,452
- Issue date Jun 11, 1991
- Hughes Aircraft Company
- Lauren M. Purcell
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...
- Publication number 20240353355
- Publication date Oct 24, 2024
- CiTEX Holding GmbH
- Arno NEUMEISTER
- G01 - MEASURING TESTING
Information Patent Application
X-RAY PHASE IMAGING APPARATUS AND DISPLAY METHOD OF PREVIEW IMAGE I...
- Publication number 20240102945
- Publication date Mar 28, 2024
- Shimadzu Corporation
- Kana KOJIMA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD FOR ELECTRODE STRUCTURAL BODY
- Publication number 20210096089
- Publication date Apr 1, 2021
- Honda Motor Co.,Ltd.
- Hiroaki SHIMIZU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Systems for Defects Detection and Classification Using...
- Publication number 20210010953
- Publication date Jan 14, 2021
- SVXR, Inc.
- David Lewis Adler
- G01 - MEASURING TESTING
Information Patent Application
COMPUTED TOMOGRAPHY FOR NON-DESTRUCTIVE EVALUATION OF MANUFACTURED...
- Publication number 20200393823
- Publication date Dec 17, 2020
- EDISON WELDING INSTITUTE, INC.
- Luke Mohr
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR NON-DESTRUCTIVE TESTING OF A TURBOMACHINE PART
- Publication number 20200386695
- Publication date Dec 10, 2020
- SAFRAN
- Clément Remacha
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE, INSPECTION METHOD, AND METHOD FOR PRODUCING OBJE...
- Publication number 20200300784
- Publication date Sep 24, 2020
- Nikon Corporation
- Takeshi OHBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
Electron Beam Inspection Apparatus and Electron Beam Inspection Method
- Publication number 20190369035
- Publication date Dec 5, 2019
- NUFLARE TECHNOLOGY, INC.
- Hideo Tsuchiya
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETECTING A DEFECT AND APPARATUS FOR PERFORMING THE SAME
- Publication number 20190162681
- Publication date May 30, 2019
- Samsung Electronics Co., Ltd.
- Hyon-Seok SONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR CHARACTERISING A PART
- Publication number 20180195978
- Publication date Jul 12, 2018
- SNECMA
- Julien SCHNEIDER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MATERIAL IDENTIFICATION METHOD
- Publication number 20180195981
- Publication date Jul 12, 2018
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Caroline PAULUS
- G01 - MEASURING TESTING
Information Patent Application
Reference Image Contour Generation
- Publication number 20180053291
- Publication date Feb 22, 2018
- DONGFANG JINGYUAN ELECTRON LIMITED
- Weimin Ma
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM INSPECTION APPARATUS AND CHARGED PARTICLE BEA...
- Publication number 20180031498
- Publication date Feb 1, 2018
- NuFlare Technology, Inc.
- Masataka SHIRATSUCHI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY BACKSCATTER SYSTEM AND METHOD FOR DETECTING DISCREPANCIES IN...
- Publication number 20130255385
- Publication date Oct 3, 2013
- The Boeing Company
- William Talion Edwards
- G01 - MEASURING TESTING
Information Patent Application
E-BEAM DEFECT REVIEW SYSTEM
- Publication number 20100150429
- Publication date Jun 17, 2010
- Hermes-Microvision, Inc.
- Jack JAU
- G06 - COMPUTING CALCULATING COUNTING

image comparing, unknown with known substance

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method to use artificial intelligence to enhance visual inspection...

System and method for crack detection

Methods and systems for detecting defects in devices using X-rays

Methods and systems for printed circuit board design based on autom...

Methods and systems for manufacturing printed circuit board based o...

Inspection device, inspection method, and method for producing obje...

Methods and systems for product failure prediction based on X-ray i...

Inspection method for electrode structural body

Methods and systems for process control based on X-ray inspection

Particle measuring device and particle measuring method

Method of detecting an anomaly in a single crystal structure

Methods and systems for printed circuit board design based on autom...

Method for non-destructive testing of a turbomachine part

Computed tomography for non-destructive evaluation of manufactured...

Method for characterising a part

Method of detecting a defect and apparatus for performing the same

Electron beam inspection apparatus and electron beam inspection method

Material identification method

Charged particle beam inspection apparatus and charged particle bea...

X-ray backscatter system and method for detecting discrepancies in...

E-beam defect review system

Method and apparatus for detecting trace contaminents

Patents Applicationslast 30 patents

X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...

X-RAY PHASE IMAGING APPARATUS AND DISPLAY METHOD OF PREVIEW IMAGE I...

INSPECTION METHOD FOR ELECTRODE STRUCTURAL BODY

Methods and Systems for Defects Detection and Classification Using...

COMPUTED TOMOGRAPHY FOR NON-DESTRUCTIVE EVALUATION OF MANUFACTURED...

METHOD FOR NON-DESTRUCTIVE TESTING OF A TURBOMACHINE PART

INSPECTION DEVICE, INSPECTION METHOD, AND METHOD FOR PRODUCING OBJE...

Electron Beam Inspection Apparatus and Electron Beam Inspection Method

METHOD OF DETECTING A DEFECT AND APPARATUS FOR PERFORMING THE SAME

METHOD FOR CHARACTERISING A PART

MATERIAL IDENTIFICATION METHOD

Reference Image Contour Generation

CHARGED PARTICLE BEAM INSPECTION APPARATUS AND CHARGED PARTICLE BEA...

X-RAY BACKSCATTER SYSTEM AND METHOD FOR DETECTING DISCREPANCIES IN...

E-BEAM DEFECT REVIEW SYSTEM