Image pick-up tubes having an input of visible light and electric output

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H01J31/26

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J31/00Cathode ray tubes Electron beam tubes

Current Industry

H01J31/26Image pick-up tubes having an input of visible light and electric output

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Patents Grantslast 30 patents

Information Patent Grant
Compact proximity focused image sensor
- Patent number 12,002,834
- Issue date Jun 4, 2024
- EOTech, LLC
- Kenneth Costello
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer scale enhanced gain electron bombarded CMOS imager
- Patent number 11,810,747
- Issue date Nov 7, 2023
- Elbit Systems of America, LLC
- Dan W. Chilcott
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photocathode with improved quantum yield
- Patent number 11,676,790
- Issue date Jun 13, 2023
- Photonis France
- Pascal Lavoute
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compact proximity focused image sensor
- Patent number 11,621,289
- Issue date Apr 4, 2023
- EOTech, LLC
- Kenneth Costello
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photocathode including silicon substrate with boron layer
- Patent number 11,081,310
- Issue date Aug 3, 2021
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image intensifier sensor as well as an imaging device comprising su...
- Patent number 10,790,109
- Issue date Sep 29, 2020
- Photonis Netherlands B.V.
- Bjorn Pluis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photocathode including silicon substrate with boron layer
- Patent number 10,199,197
- Issue date Feb 5, 2019
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- G02 - OPTICS
Information Patent Grant
Electron-bombarded charge-coupled device and inspection systems usi...
- Patent number 10,197,501
- Issue date Feb 5, 2019
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- G01 - MEASURING TESTING
Information Patent Grant
Image intensifier with indexed compliant anode assembly
- Patent number 9,734,977
- Issue date Aug 15, 2017
- Intevac, Inc.
- Kenneth Costello
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High performance scanning miniature star camera system
- Patent number 9,648,252
- Issue date May 9, 2017
- The Charles Stark Draper Laboratory, Inc.
- Juha-Pekka J. Laine
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Photocathode including silicon substrate with boron layer
- Patent number 9,601,299
- Issue date Mar 21, 2017
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- G02 - OPTICS
Information Patent Grant
High resolution high quantum efficiency electron bombarded CCD or C...
- Patent number 9,460,886
- Issue date Oct 4, 2016
- KLA-Tencor Corporation
- Ximan Jiang
- G01 - MEASURING TESTING
Information Patent Grant
Sensor system comprising stacked micro-channel plate detector
- Patent number 9,142,380
- Issue date Sep 22, 2015
- PFG IP LLC
- Medhet Azzazy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging a sample in a TEM equipped with a phase plate
- Patent number 8,835,846
- Issue date Sep 16, 2014
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron bombarded image sensor array device and its manufacturing...
- Patent number 8,269,187
- Issue date Sep 18, 2012
- Photonis-Dep B.V.
- Daniela Georgeta Tomuta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging apparatus having electron source array
- Patent number 8,203,611
- Issue date Jun 19, 2012
- Nippon Hoso Kyokai
- Yuki Honda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus and method for sealing an image intensifier device
- Patent number 8,071,932
- Issue date Dec 6, 2011
- ITT Manufacturing Enterprises, Inc.
- William Eric Garris
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron tube
- Patent number 8,040,060
- Issue date Oct 18, 2011
- Hamamatsu Photonics K.K.
- Atsuhito Fukasawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for aligning an image sensor including a heade...
- Patent number 7,880,127
- Issue date Feb 1, 2011
- ITT Manufacturing Enterprises, Inc.
- William Eric Garris
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor die attachment for high vacuum tubes
- Patent number 7,608,533
- Issue date Oct 27, 2009
- Intevac, Inc.
- Kenneth A Costello
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor die attachment for high vacuum tubes
- Patent number 7,607,560
- Issue date Oct 27, 2009
- Intevac, Inc.
- Kenneth A Costello
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Piezoelectrically enhanced photocathode
- Patent number 7,592,747
- Issue date Sep 22, 2009
- The United States of America as represented by the National Aeronautics and S...
- Robert A. Beach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image intensification for low light inspection
- Patent number 7,570,354
- Issue date Aug 4, 2009
- KLA-Tencor Corporation
- Wei Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Low profile wire bond for an electron sensing device in an image in...
- Patent number 7,429,724
- Issue date Sep 30, 2008
- ITT Manufacturing Enterprises, Inc.
- Thomas M. Meisel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photoelectric conversion device and image pickup device using elect...
- Patent number 7,348,531
- Issue date Mar 25, 2008
- Pioneer Corporation
- Yoshiyuki Okuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low profile wire bond for an electron sensing device in an image in...
- Patent number 7,199,345
- Issue date Apr 3, 2007
- ITT Manufacturing Enterprises Inc.
- Thomas M. Meisel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Intensified hybrid solid-state sensor
- Patent number 7,015,452
- Issue date Mar 21, 2006
- ITT Manufacturing Enterprises, Inc.
- Rudolph G. Benz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor die attachment for high vacuum tubes
- Patent number 7,012,328
- Issue date Mar 14, 2006
- Intevac, Inc.
- Kenneth A Costello
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Intensified hybrid solid-state sensor with an insulating layer
- Patent number 6,747,258
- Issue date Jun 8, 2004
- ITT Manufacturing Enterprises, Inc.
- Rudolph G. Benz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging apparatus
- Patent number 6,720,996
- Issue date Apr 13, 2004
- Hamamatsu Photonics K.K.
- Motohiro Suyama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PHOTOELECTRIC CONVERSION DEVICE, ELECTROMAGNETIC WAVE DETECTION DEV...
- Publication number 20240363302
- Publication date Oct 31, 2024
- Hamamatsu Photonics K.K.
- Naoya KAWAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPACT PROXIMITY FOCUSED IMAGE SENSOR
- Publication number 20230282670
- Publication date Sep 7, 2023
- EOTech, LLC
- Kenneth Costello
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHOTOCATHODE WITH IMPROVED QUANTUM YIELD
- Publication number 20220223364
- Publication date Jul 14, 2022
- PHOTONIS FRANCE
- Pascal Lavoute
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER SCALE ENHANCED GAIN ELECTRON BOMBARDED CMOS IMAGER
- Publication number 20220037106
- Publication date Feb 3, 2022
- Elbit Systems of America, LLC
- Dan W. Chilcott
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPACT PROXIMITY FOCUSED IMAGE SENSOR
- Publication number 20210366972
- Publication date Nov 25, 2021
- INTEVAC, INC.
- Kenneth Costello
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROFLUIDIC CHIP AND DETECTION METHOD USING MICROFLUIDIC CHIP
- Publication number 20210229092
- Publication date Jul 29, 2021
- BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Haochen CUI
- G01 - MEASURING TESTING
Information Patent Application
PHOTOCATHODE INCLUDING SILICON SUBSTRATE WITH BORON LAYER
- Publication number 20190066962
- Publication date Feb 28, 2019
- Yung-Ho Alex Chuang
- G02 - OPTICS
Information Patent Application
IMAGE INTENSIFIER SENSOR AS WELL AS AN IMAGING DEVICE COMPRISING SU...
- Publication number 20170250049
- Publication date Aug 31, 2017
- PHOTONIS NETHERLANDS B.V.
- Bjorn Pluis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Photocathode Including Silicon Substrate With Boron Layer
- Publication number 20170069455
- Publication date Mar 9, 2017
- YUNG-HO ALEX CHUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High Resolution High Quantum Efficiency Electron Bombarded CCD Or C...
- Publication number 20160027605
- Publication date Jan 28, 2016
- KLA-Tencor Corporation
- Ximan Jiang
- G01 - MEASURING TESTING
Information Patent Application
HIGH PERFORMANCE SCANNING MINIATURE STAR CAMERA SYSTEM
- Publication number 20140267755
- Publication date Sep 18, 2014
- The Charles Stark Draper Laboratory, Inc.
- Juha-Pekka J. Laine
- G01 - MEASURING TESTING
Information Patent Application
BRIGHT SOURCE PROTECTION FOR LOW LIGHT IMAGING SENSORS
- Publication number 20140239157
- Publication date Aug 28, 2014
- Christopher David Burgess
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Photocathode Including Silicon Substrate With Boron Layer
- Publication number 20140034816
- Publication date Feb 6, 2014
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- G02 - OPTICS
Information Patent Application
Electron-Bombarded Charge-Coupled Device And Inspection Systems Usi...
- Publication number 20130148112
- Publication date Jun 13, 2013
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- G01 - MEASURING TESTING
Information Patent Application
ELECTRO OPTICAL IMAGE-MAGNIFYING DEVICE
- Publication number 20120320182
- Publication date Dec 20, 2012
- RICHARD HUBBARD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sensor System Comprising Stacked Micro-Channel Plate Detector
- Publication number 20120181433
- Publication date Jul 19, 2012
- Irvine Sensors Corporation
- Medhet Azzazy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIDAR System Comprising Large Area Micro-Channel Plate Focal Plane...
- Publication number 20120170029
- Publication date Jul 5, 2012
- ISC8 Inc.
- Medhat Azzazy
- G01 - MEASURING TESTING
Information Patent Application
SCANNING INCREMENTAL FOCUS MICROSCOPY
- Publication number 20120097848
- Publication date Apr 26, 2012
- THE RESEARCH FOUNDATION OF STATE UNIVERSITY OF NEW YORK
- Eric LIFSHIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRONIC IMAGE DETECTION DEVICE
- Publication number 20120086010
- Publication date Apr 12, 2012
- COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES
- Benoît Giffard
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHOTOCATHODE
- Publication number 20110089825
- Publication date Apr 21, 2011
- HAMAMATSU PHOTONICS K. K.
- Toshikazu Matsui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-layer photon counting electronic module
- Publication number 20110084212
- Publication date Apr 14, 2011
- Irvine Sensors Corporation
- Stewart Clark
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON TUBE
- Publication number 20100102721
- Publication date Apr 29, 2010
- HAMAMATSU PHOTONICS K. K.
- Atsuhito FUKASAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR ALIGNING AN IMAGE SENSOR
- Publication number 20100102213
- Publication date Apr 29, 2010
- ITT Manufacturing Enterprises, Inc.
- William Eric Garris
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR SEALING AN IMAGE INTENSIFIER DEVICE
- Publication number 20100102209
- Publication date Apr 29, 2010
- ITT Manufacturing Enterprises, Inc.
- William Eric Garris
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Bombarded Image Sensor Array Device and Its Manufacturing...
- Publication number 20090206265
- Publication date Aug 20, 2009
- PHOTONIS-DEP B.V.
- Daniela Georgeta Tomuta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHYSIOLOGICAL PARAMETER DETECTOR
- Publication number 20090095926
- Publication date Apr 16, 2009
- William Jack MacNeish, III
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Electron bombarded image sensor array device as well as such an ima...
- Publication number 20090045325
- Publication date Feb 19, 2009
- Photnis-Dep B.V.
- Daniela Georgeta Tomuta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING APPARATUS HAVING ELECTRON SOURCE ARRAY
- Publication number 20080291307
- Publication date Nov 27, 2008
- Nippon Hoso Kyokai
- Yuki Honda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Electron emitting element
- Publication number 20080007152
- Publication date Jan 10, 2008
- MT Picture Display Co., Ltd.
- Masahide Yamauchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor die attachment for high vacuum tubes
- Publication number 20060113655
- Publication date Jun 1, 2006
- Kenneth A. Costello
- H01 - BASIC ELECTRIC ELEMENTS

Image pick-up tubes having an input of visible light and electric output

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Compact proximity focused image sensor

Wafer scale enhanced gain electron bombarded CMOS imager

Photocathode with improved quantum yield

Compact proximity focused image sensor

Photocathode including silicon substrate with boron layer

Image intensifier sensor as well as an imaging device comprising su...

Photocathode including silicon substrate with boron layer

Electron-bombarded charge-coupled device and inspection systems usi...

Image intensifier with indexed compliant anode assembly

High performance scanning miniature star camera system

Photocathode including silicon substrate with boron layer

High resolution high quantum efficiency electron bombarded CCD or C...

Sensor system comprising stacked micro-channel plate detector

Imaging a sample in a TEM equipped with a phase plate

Electron bombarded image sensor array device and its manufacturing...

Imaging apparatus having electron source array

Apparatus and method for sealing an image intensifier device

Electron tube

Apparatus and method for aligning an image sensor including a heade...

Semiconductor die attachment for high vacuum tubes

Semiconductor die attachment for high vacuum tubes

Piezoelectrically enhanced photocathode

Image intensification for low light inspection

Low profile wire bond for an electron sensing device in an image in...

Photoelectric conversion device and image pickup device using elect...

Low profile wire bond for an electron sensing device in an image in...

Intensified hybrid solid-state sensor

Semiconductor die attachment for high vacuum tubes

Intensified hybrid solid-state sensor with an insulating layer

Imaging apparatus

Patents Applicationslast 30 patents

PHOTOELECTRIC CONVERSION DEVICE, ELECTROMAGNETIC WAVE DETECTION DEV...

COMPACT PROXIMITY FOCUSED IMAGE SENSOR

PHOTOCATHODE WITH IMPROVED QUANTUM YIELD

WAFER SCALE ENHANCED GAIN ELECTRON BOMBARDED CMOS IMAGER

COMPACT PROXIMITY FOCUSED IMAGE SENSOR

MICROFLUIDIC CHIP AND DETECTION METHOD USING MICROFLUIDIC CHIP

PHOTOCATHODE INCLUDING SILICON SUBSTRATE WITH BORON LAYER

IMAGE INTENSIFIER SENSOR AS WELL AS AN IMAGING DEVICE COMPRISING SU...

Photocathode Including Silicon Substrate With Boron Layer

High Resolution High Quantum Efficiency Electron Bombarded CCD Or C...

HIGH PERFORMANCE SCANNING MINIATURE STAR CAMERA SYSTEM

BRIGHT SOURCE PROTECTION FOR LOW LIGHT IMAGING SENSORS

Photocathode Including Silicon Substrate With Boron Layer

Electron-Bombarded Charge-Coupled Device And Inspection Systems Usi...

ELECTRO OPTICAL IMAGE-MAGNIFYING DEVICE

Sensor System Comprising Stacked Micro-Channel Plate Detector

LIDAR System Comprising Large Area Micro-Channel Plate Focal Plane...

SCANNING INCREMENTAL FOCUS MICROSCOPY

ELECTRONIC IMAGE DETECTION DEVICE

PHOTOCATHODE

Multi-layer photon counting electronic module

ELECTRON TUBE

APPARATUS AND METHOD FOR ALIGNING AN IMAGE SENSOR

APPARATUS AND METHOD FOR SEALING AN IMAGE INTENSIFIER DEVICE

Electron Bombarded Image Sensor Array Device and Its Manufacturing...

PHYSIOLOGICAL PARAMETER DETECTOR

Electron bombarded image sensor array device as well as such an ima...

IMAGING APPARATUS HAVING ELECTRON SOURCE ARRAY

Electron emitting element

Semiconductor die attachment for high vacuum tubes