Image processing arrangements associated with the tube

Industry

CPC
H01J37/222

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge

Current Industry

H01J37/222Image processing arrangements associated with the tube

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam apparatus and focus adjusting method therefor
- Patent number 12,368,017
- Issue date Jul 22, 2025
- HITACHI HIGH-TECH CORPORATION
- Keisuke Igarashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for automatic zone axis alignment
- Patent number 12,362,135
- Issue date Jul 15, 2025
- FEI Company
- John J. Flanagan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and image adjustment method
- Patent number 12,362,134
- Issue date Jul 15, 2025
- Jeol Ltd.
- Tomohiro Mihira
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern inspection apparatus and pattern inspection method
- Patent number 12,354,831
- Issue date Jul 8, 2025
- NuFlare Technology, Inc.
- Masataka Shiratsuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Overlay measurement system and overlay measurement device for overl...
- Patent number 12,354,829
- Issue date Jul 8, 2025
- HITACHI HIGH-TECH CORPORATION
- Masaki Sugie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample image display system and charged particle beam apparatus
- Patent number 12,354,830
- Issue date Jul 8, 2025
- HITACHI HIGH-TECH CORPORATION
- Wei Chean Tan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Computer system, dimension measurement method, and storage medium
- Patent number 12,345,522
- Issue date Jul 1, 2025
- HITACHI HIGH-TECH CORPORATION
- Yutaka Okuyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Area selection in charged particle microscope imaging
- Patent number 12,347,083
- Issue date Jul 1, 2025
- FEI Company
- Yuchen Deng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam device
- Patent number 12,334,299
- Issue date Jun 17, 2025
- HITACHI HIGH-TECH CORPORATION
- U Oh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods of determining aberrations of a charged particle beam, and...
- Patent number 12,308,203
- Issue date May 20, 2025
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Dominik Ehberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for positioning objects in a particle beam microscope with t...
- Patent number 12,300,459
- Issue date May 13, 2025
- Carl Zeiss Microscopy GmbH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple electron beam image acquisition method, multiple electron...
- Patent number 12,288,666
- Issue date Apr 29, 2025
- NuFlare Technology, Inc.
- Koichi Ishii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Live-assisted image acquisition method and system with charged part...
- Patent number 12,288,667
- Issue date Apr 29, 2025
- FEI Company
- Pavel Potocek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
FIB-SEM 3D tomography for measuring shape deviations of HAR structures
- Patent number 12,288,705
- Issue date Apr 29, 2025
- Carl Zeiss SMT GmbH
- Amir Avishai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam device
- Patent number 12,283,458
- Issue date Apr 22, 2025
- HITACHI HIGH-TECH CORPORATION
- Mai Yoshihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Material processing method and material processing system for perfo...
- Patent number 12,280,445
- Issue date Apr 22, 2025
- Carl Zeiss Microscopy GmbH
- Stephan Hiller
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Substrate holder state detection device and substrate holder state...
- Patent number 12,278,083
- Issue date Apr 15, 2025
- SCREEN Holdings Co., Ltd.
- Yuji Okita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hybrid scanning electron microscopy and acousto-optic based metrology
- Patent number 12,278,085
- Issue date Apr 15, 2025
- Applied Materials Israel Ltd.
- Guy Shwartz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern height metrology using an e-beam system
- Patent number 12,278,086
- Issue date Apr 15, 2025
- Imec VZW
- Gian Francesco Lorusso
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and image generation method
- Patent number 12,278,084
- Issue date Apr 15, 2025
- Jeol Ltd.
- Motohiro Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3D metrology from 3D datacube created from stack of registered imag...
- Patent number 12,272,518
- Issue date Apr 8, 2025
- Applied Materials Israel Ltd.
- Ilya Blayvas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3D fiducial for precision 3D NAND channel tilt/shift analysis
- Patent number 12,260,583
- Issue date Mar 25, 2025
- FEI Company
- Mark Najarian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning electron microscope and image generation method using scan...
- Patent number 12,255,043
- Issue date Mar 18, 2025
- Jeol Ltd.
- Takeshi Otsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fiducial guided cross-sectioning and lamella preparation with tomog...
- Patent number 12,255,044
- Issue date Mar 18, 2025
- FIBICS INCORPORATED
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Numerically compensating SEM-induced charging using diffusion-based...
- Patent number 12,255,042
- Issue date Mar 18, 2025
- ASML Netherlands B.V.
- Thomas Jarik Huisman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Shape invariant method for accurate fiducial finding
- Patent number 12,254,645
- Issue date Mar 18, 2025
- FEI Company
- Umesh Adiga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, apparatus, and program for determining condition related to...
- Patent number 12,243,711
- Issue date Mar 4, 2025
- HITACHI HIGH-TECH CORPORATION
- Takahiro Nishihata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method, computer program product, computer-readable medium and syst...
- Patent number 12,235,428
- Issue date Feb 25, 2025
- Carl Zeiss Microscopy GmbH
- Daniel Haase
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam device and inspection device
- Patent number 12,237,145
- Issue date Feb 25, 2025
- HITACHI HIGH-TECH CORPORATION
- Atsuko Shintani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Determining a depth of a hidden structural element background
- Patent number 12,237,146
- Issue date Feb 25, 2025
- Applied Materials Israel Ltd.
- Lior Akerman
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON MICROSCOPE DETECTOR AND RELATED METHODS
- Publication number 20250239431
- Publication date Jul 24, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jian-Ming Zheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADC CALIBRATION FOR MICROSCOPY
- Publication number 20250233597
- Publication date Jul 17, 2025
- ASML NETHERLANDS B.V.
- Hindrik Willem MOOK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS
- Publication number 20250226172
- Publication date Jul 10, 2025
- The University of Liverpool
- Nigel BROWNING
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
3D METROLOGY FROM 3D DATACUBE CREATED FROM STACK OF REGISTERED IMAG...
- Publication number 20250210301
- Publication date Jun 26, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Ilya Blayvas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIVE-ASSISTED IMAGE ACQUISITION METHOD AND SYSTEM WITH CHARGED PART...
- Publication number 20250201512
- Publication date Jun 19, 2025
- FEI Company
- Pavel Potocek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR CORRECTING IMAGE ERRORS WHEN SCANNING A CHARG...
- Publication number 20250174429
- Publication date May 29, 2025
- Carl Zeiss SMT GMBH
- Michael Budach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEM IMAGE ENHANCEMENT METHODS AND SYSTEMS
- Publication number 20250166960
- Publication date May 22, 2025
- ASML NETHERLANDS B.V.
- Wei FANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MICROSCOPY IMAGING METHOD AND SYSTEM
- Publication number 20250166961
- Publication date May 22, 2025
- Fibics Incorporated
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE ADJUSTMENT METHOD AND CHARGED PARTICLE...
- Publication number 20250157785
- Publication date May 15, 2025
- HITACHI HIGH-TECH CORPORATION
- Hidenori MACHIYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20250157786
- Publication date May 15, 2025
- Hitachi, Ltd
- Fumiaki ICHIHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE-BEAM IMAGE ACQUISITION APPARATUS AND MULTIPLE-BEAM IMAGE A...
- Publication number 20250149290
- Publication date May 8, 2025
- NuFlare Technology, Inc.
- Koichi ISHII
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20250140513
- Publication date May 1, 2025
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Satoshi TOMIMATSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20250132123
- Publication date Apr 24, 2025
- Hitachi High-Tech Corporation
- Hiroyuki YAMAMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CORRECTION OF OPTICAL ABERRATIONS IN CHARGED PARTICLE BEAM MICROSCOPY
- Publication number 20250125116
- Publication date Apr 17, 2025
- FEI Company
- Erik Franken
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE ASSESSMENT SYSTEM AND METHOD
- Publication number 20250118528
- Publication date Apr 10, 2025
- ASML NETHERLANDS B.V.
- Marco Jan-Jaco WIELAND
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CRYO-ELECTRON MICROSCOPY IMAGE PROCESSING METHOD AND APPARATUS, TER...
- Publication number 20250112021
- Publication date Apr 3, 2025
- Beijing Youzhuju Network Technology Co., Ltd.
- Jing YUAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SAMPLE CARRIER AND USES THEREOF
- Publication number 20250104962
- Publication date Mar 27, 2025
- FEI Company
- Christopher Thompson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM INSPECTION SYSTEM AND CHARGED PARTICLE BEAM I...
- Publication number 20250095956
- Publication date Mar 20, 2025
- Hitachi High-Tech Corporation
- Hang DU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PROCESSING DATA DERIVED FROM A SAMPLE
- Publication number 20250095133
- Publication date Mar 20, 2025
- ASML NETHERLANDS B.V.
- Vincent Sylvester KUIPER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED REGION SELECTION FOR AUTO SWEEP
- Publication number 20250095159
- Publication date Mar 20, 2025
- FEI Company
- Umesh ADIGA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR CALIBRATION OF DIFFRACTION ANGLES
- Publication number 20250095955
- Publication date Mar 20, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Konstantin Chirko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DATA PROCESSING DEVICE AND METHOD, CHARGED PARTICLE ASSESSMENT SYST...
- Publication number 20250087444
- Publication date Mar 13, 2025
- ASML NETHERLANDS B.V.
- Marco Jan-Jaco WIELAND
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TECHNIQUES FOR WAVEFORM DETECTION OF PERIODIC SIGNALS USING VOLTAGE...
- Publication number 20250069842
- Publication date Feb 27, 2025
- FEI Company
- Neel Leslie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Detection of Probabilistic Process Windows
- Publication number 20250069843
- Publication date Feb 27, 2025
- FRACTILIA, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS FOR HIGH-PERFORMANCE ELECTRON MICROSCOPY
- Publication number 20250069208
- Publication date Feb 27, 2025
- The Board of Regents of the University of Texas System
- Zbyszek Otwinowski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TECHNIQUES FOR IMAGING LOW DUTY CYCLE SIGNALS USING A SCANNING ELEC...
- Publication number 20250069845
- Publication date Feb 27, 2025
- FEI Company
- Neel Leslie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND CONTROL METHOD THEREOF
- Publication number 20250069848
- Publication date Feb 27, 2025
- KIOXIA Corporation
- Kazuya HATANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD TO MORE PRECISELY CALIBRATE THE MECHANICAL TILT AND ROTATION...
- Publication number 20250054726
- Publication date Feb 13, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20250046564
- Publication date Feb 6, 2025
- Korea Research Institute of Standards and Science
- Takashi OGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEEP STRUCTURE SIGNAL DETECTION AND ENHANCEMENT BY SEPARATION TO UP...
- Publication number 20250035438
- Publication date Jan 30, 2025
- ETROLOGY, LLC
- Vladislav Kaplan
- H01 - BASIC ELECTRIC ELEMENTS

Image processing arrangements associated with the tube

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Charged particle beam apparatus and focus adjusting method therefor

Method and system for automatic zone axis alignment

Charged particle beam apparatus and image adjustment method

Pattern inspection apparatus and pattern inspection method

Overlay measurement system and overlay measurement device for overl...

Sample image display system and charged particle beam apparatus

Computer system, dimension measurement method, and storage medium

Area selection in charged particle microscope imaging

Charged particle beam device

Methods of determining aberrations of a charged particle beam, and...

Method for positioning objects in a particle beam microscope with t...

Multiple electron beam image acquisition method, multiple electron...

Live-assisted image acquisition method and system with charged part...

FIB-SEM 3D tomography for measuring shape deviations of HAR structures

Charged particle beam device

Material processing method and material processing system for perfo...

Substrate holder state detection device and substrate holder state...

Hybrid scanning electron microscopy and acousto-optic based metrology

Pattern height metrology using an e-beam system

Electron microscope and image generation method

3D metrology from 3D datacube created from stack of registered imag...

3D fiducial for precision 3D NAND channel tilt/shift analysis

Scanning electron microscope and image generation method using scan...

Fiducial guided cross-sectioning and lamella preparation with tomog...

Numerically compensating SEM-induced charging using diffusion-based...

Shape invariant method for accurate fiducial finding

Method, apparatus, and program for determining condition related to...

Method, computer program product, computer-readable medium and syst...

Charged particle beam device and inspection device

Determining a depth of a hidden structural element background

Patents Applicationslast 30 patents

ELECTRON MICROSCOPE DETECTOR AND RELATED METHODS

ADC CALIBRATION FOR MICROSCOPY

METHOD AND APPARATUS

3D METROLOGY FROM 3D DATACUBE CREATED FROM STACK OF REGISTERED IMAG...

LIVE-ASSISTED IMAGE ACQUISITION METHOD AND SYSTEM WITH CHARGED PART...

METHOD AND DEVICE FOR CORRECTING IMAGE ERRORS WHEN SCANNING A CHARG...

SEM IMAGE ENHANCEMENT METHODS AND SYSTEMS

MICROSCOPY IMAGING METHOD AND SYSTEM

CHARGED PARTICLE BEAM DEVICE ADJUSTMENT METHOD AND CHARGED PARTICLE...

Charged Particle Beam Apparatus

MULTIPLE-BEAM IMAGE ACQUISITION APPARATUS AND MULTIPLE-BEAM IMAGE A...

CHARGED PARTICLE BEAM DEVICE

Charged Particle Beam Device

CORRECTION OF OPTICAL ABERRATIONS IN CHARGED PARTICLE BEAM MICROSCOPY

CHARGED PARTICLE ASSESSMENT SYSTEM AND METHOD

CRYO-ELECTRON MICROSCOPY IMAGE PROCESSING METHOD AND APPARATUS, TER...

SAMPLE CARRIER AND USES THEREOF

CHARGED PARTICLE BEAM INSPECTION SYSTEM AND CHARGED PARTICLE BEAM I...

METHOD OF PROCESSING DATA DERIVED FROM A SAMPLE

AUTOMATED REGION SELECTION FOR AUTO SWEEP

METHOD AND SYSTEM FOR CALIBRATION OF DIFFRACTION ANGLES

DATA PROCESSING DEVICE AND METHOD, CHARGED PARTICLE ASSESSMENT SYST...

TECHNIQUES FOR WAVEFORM DETECTION OF PERIODIC SIGNALS USING VOLTAGE...

Detection of Probabilistic Process Windows

METHODS FOR HIGH-PERFORMANCE ELECTRON MICROSCOPY

TECHNIQUES FOR IMAGING LOW DUTY CYCLE SIGNALS USING A SCANNING ELEC...

CHARGED PARTICLE BEAM APPARATUS AND CONTROL METHOD THEREOF

METHOD TO MORE PRECISELY CALIBRATE THE MECHANICAL TILT AND ROTATION...

CHARGED PARTICLE BEAM APPARATUS

DEEP STRUCTURE SIGNAL DETECTION AND ENHANCEMENT BY SEPARATION TO UP...