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ELECTRICITY
H01
Electric elements
H01J
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J2237/00
Discharge tubes exposing object to beam
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H01J2237/221
Image processing
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Patents Grants
last 30 patents
Information
Patent Grant
Detection and correction of system responses in real-time
Patent number
11,894,214
Issue date
Feb 6, 2024
KLA Corporation
Henning Stoschus
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Biological tissue image processing system, and machine learning method
Patent number
11,854,201
Issue date
Dec 26, 2023
Nikon Corporation
Kohki Konishi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method, device and system for reducing off-axial aberration in elec...
Patent number
11,817,290
Issue date
Nov 14, 2023
FEI Company
Maarten Bischoff
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of imaging a specimen using a transmission charged particle...
Patent number
11,810,751
Issue date
Nov 7, 2023
FEI Company
Peter Tiemeijer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of recording an image using a particle microscope
Patent number
11,728,130
Issue date
Aug 15, 2023
Carl Zeiss SMT GmbH
Dirk Zeidler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam device
Patent number
11,728,127
Issue date
Aug 15, 2023
HITACHI HIGH-TECH CORPORATION
Takuma Yamamoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam device and analysis method
Patent number
11,710,615
Issue date
Jul 25, 2023
Jeol Ltd.
Kenichi Tsutsumi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
TEM-based metrology method and system
Patent number
11,710,616
Issue date
Jul 25, 2023
Vladimir Machavariani
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Charged particle beam device
Patent number
11,670,481
Issue date
Jun 6, 2023
HITACHI HIGH-TECH CORPORATION
Motonobu Hommi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam apparatus
Patent number
11,646,172
Issue date
May 9, 2023
HITACHI HIGH-TECH CORPORATION
Takafumi Miwa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam apparatus and control method
Patent number
11,610,756
Issue date
Mar 21, 2023
HITACHI HIGH-TECH CORPORATION
Kaori Bizen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method, device and system for reducing off-axial aberration in elec...
Patent number
11,587,759
Issue date
Feb 21, 2023
FEI Company
Maarten Bischoff
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Pattern inspection apparatus and pattern outline position acquisiti...
Patent number
11,569,057
Issue date
Jan 31, 2023
NuFlare Technology, Inc.
Shinji Sugihara
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Detection and correction of system responses in real-time
Patent number
11,508,551
Issue date
Nov 22, 2022
KLA Corporation
Henning Stoschus
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Operating a particle beam device
Patent number
11,501,948
Issue date
Nov 15, 2022
Carl Zeiss Microscopy GmbH
Luyang Han
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
BBP assisted defect detection flow for SEM images
Patent number
11,450,012
Issue date
Sep 20, 2022
KLA Corporation
Santosh Bhattacharyya
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Detection of buried features by backscattered particles
Patent number
11,443,915
Issue date
Sep 13, 2022
ASML Netherlands B.V.
Joe Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
SEM FOV fingerprint in stochastic EPE and placement measurements in...
Patent number
11,435,671
Issue date
Sep 6, 2022
ASML Netherlands B.V.
Marleen Kooiman
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Charged particle beam apparatus
Patent number
11,398,367
Issue date
Jul 26, 2022
HITACHI HIGH-TECH CORPORATION
Takafumi Miwa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electronic microscope device
Patent number
11,355,304
Issue date
Jun 7, 2022
HITACHI HIGH-TECH CORPORATION
Takahiro Nishihata
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Low keV ion beam image restoration by machine learning for object l...
Patent number
11,355,305
Issue date
Jun 7, 2022
FEI Company
Remco Johannes Petrus Geurts
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Charged particle beam device and analysis method
Patent number
11,315,753
Issue date
Apr 26, 2022
Jeol Ltd.
Kenichi Tsutsumi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Fiducial design for tilted or glancing mill operations with a charg...
Patent number
11,315,756
Issue date
Apr 26, 2022
FEI Company
Stacey Stone
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
TEM-based metrology method and system
Patent number
11,309,162
Issue date
Apr 19, 2022
Nova Ltd.
Vladimir Machavariani
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Slice depth reconstruction of charged particle images using model s...
Patent number
11,282,670
Issue date
Mar 22, 2022
FEI Company
Pavel Potocek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Holes tilt angle measurement using FIB diagonal cut
Patent number
11,280,749
Issue date
Mar 22, 2022
Applied Materials Israel Ltd.
Yehuda Zur
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Generating three dimensional information regarding structural eleme...
Patent number
11,264,202
Issue date
Mar 1, 2022
Applied Materials Israel Ltd.
Konstantin Chirko
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Lamella alignment based on a reconstructed volume
Patent number
11,264,200
Issue date
Mar 1, 2022
FEI Company
TomáTomá{hacek over (s)} Onderlicka
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Detecting method and detecting equipment therefor
Patent number
11,237,414
Issue date
Feb 1, 2022
HKC CORPORATION LIMITED
Chung-Kuang Chien
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Charged particle beam apparatus and machine learning method
Patent number
11,222,241
Issue date
Jan 11, 2022
Jeol Ltd.
Fuminori Uematsu
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR PREPARING A MICROSCOPIC SAMPLE FOR FIB/SEM TOMOGRAPHY
Publication number
20240120175
Publication date
Apr 11, 2024
CARL ZEISS MICROSCOPY GMBH
Lorenz Lechner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DATA PROCESSING DEVICE AND METHOD, CHARGED PARTICLE ASSESSMENT SYST...
Publication number
20240087842
Publication date
Mar 14, 2024
ASML NETHERLANDS B.V.
Marco Jan-Jaco WIELAND
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR PROCESSING SUBSTRATE
Publication number
20240078663
Publication date
Mar 7, 2024
PSK INC.
KWANG SUNG YOO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SEMICONDUCTOR PROCESS DEVICE
Publication number
20240047247
Publication date
Feb 8, 2024
Samsung Electronics Co., Ltd.
Chansoo KANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD, DEVICE AND SYSTEM FOR REDUCING OFF-AXIAL ABERRATION IN ELEC...
Publication number
20240029993
Publication date
Jan 25, 2024
FEI Company
Maarten BISCHOFF
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEFECT INSPECTION APPARATUS
Publication number
20230402249
Publication date
Dec 14, 2023
HITACHI HIGH-TECH CORPORATION
Yasuhiro YOSHIDA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method for Beam Interference Compensation Based on Computer Vision
Publication number
20230335371
Publication date
Oct 19, 2023
FEI Company
Lukáลก Malý
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
STROBOSCOPIC ELECTRON-BEAM SIGNAL IMAGE MAPPING
Publication number
20230317408
Publication date
Oct 5, 2023
Intel Corporation
Xianghong Tong
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MATERIAL ANALYSIS WITH MULTIPLE DETECTORS
Publication number
20230258587
Publication date
Aug 17, 2023
OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
Simon BURGESS
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR COMPRESSED SENSING AND PROCESSING OF IMAGE DATA
Publication number
20230230209
Publication date
Jul 20, 2023
CARL ZEISS MICROSCOPY GMBH
Manuel AMTHOR
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD, DEVICE AND SYSTEM FOR REDUCING OFF-AXIAL ABERRATION IN ELEC...
Publication number
20230223231
Publication date
Jul 13, 2023
FEI Company
Maarten BISCHOFF
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF GENERATING A CRYSTALLINE ORIENTATION MAP OF A SURFACE POR...
Publication number
20230178332
Publication date
Jun 8, 2023
CARL ZEISS MICROSCOPY GMBH
Luyang Han
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor Analysis System
Publication number
20230063192
Publication date
Mar 2, 2023
Hitachi High-Tech Corporation
Yudai KUBO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Detection and Correction of System Responses in Real-Time
Publication number
20230045072
Publication date
Feb 9, 2023
KLA Corporation
Henning Stoschus
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Electron Microscope and Image Generation Method
Publication number
20230015400
Publication date
Jan 19, 2023
JEOL Ltd.
Motohiro Nakamura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged Particle Beam Device
Publication number
20220344124
Publication date
Oct 27, 2022
Hitachi High-Tech Corporation
Hiroyuki CHIBA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Systems and methods of determining aberrations in images obtained b...
Publication number
20220328282
Publication date
Oct 13, 2022
ASML NETHERLANDS B.V.
Yifeng SHAO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TEM-BASED METROLOGY METHOD AND SYSTEM
Publication number
20220310356
Publication date
Sep 29, 2022
NOVA LTD
VLADIMIR MACHAVARIANI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGE GENERATION FOR EXAMINATION OF A SEMICONDUCTOR SPECIMEN
Publication number
20220301196
Publication date
Sep 22, 2022
APPLIED MATERIALS ISRAEL LTD.
David ULIEL
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PATTERN MEASUREMENT SYSTEM AND PATTERN MEASUREMENT METHOD
Publication number
20220230842
Publication date
Jul 21, 2022
HITACHI HIGH-TECH CORPORATION
Wei SUN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged Particle Beam Device
Publication number
20220165537
Publication date
May 26, 2022
HITACHI HIGH-TECH CORPORATION
Motonobu HOMMI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged Particle Beam Device and Analysis Method
Publication number
20220157558
Publication date
May 19, 2022
JEOL Ltd.
Kenichi Tsutsumi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE BEAM APPARATUS AND CONTROL METHOD
Publication number
20220115203
Publication date
Apr 14, 2022
HITACHI HIGH-TECH CORPORATION
Kaori BIZEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LAMELLA ALIGNMENT BASED ON A RECONSTRUCTED VOLUME
Publication number
20220093359
Publication date
Mar 24, 2022
FEI Company
Tomás ONDERLICKA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN OUTLINE POSITION ACQUISITI...
Publication number
20220013327
Publication date
Jan 13, 2022
NuFlare Technology, Inc.
Shinji SUGIHARA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD OF IMAGING A SPECIMEN USING A TRANSMISSION CHARGED PARTICLE...
Publication number
20210407762
Publication date
Dec 30, 2021
FEI Company
Peter TIEMEIJER
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
GENERATING THREE DIMENSIONAL INFORMATION REGARDING STRUCTURAL ELEME...
Publication number
20210358712
Publication date
Nov 18, 2021
APPLIED MATERIALS ISRAEL LTD.
Konstantin Chirko
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF RECORDING AN IMAGE USING A PARTICLE MICROSCOPE
Publication number
20210296089
Publication date
Sep 23, 2021
Carl Zeiss SMT GMBH
Dirk Zeidler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD, DEVICE AND SYSTEM FOR REDUCING OFF-AXIAL ABERRATION IN ELEC...
Publication number
20210272767
Publication date
Sep 2, 2021
FEI Company
Maarten BISCHOFF
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TEM-BASED METROLOGY METHOD AND SYSTEM
Publication number
20210217581
Publication date
Jul 15, 2021
NOVA MEASURING INSTRUMENTS LTD.
VLADIMIR MACHAVARIANI
G06 - COMPUTING CALCULATING COUNTING