Image reconstruction

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H01J2237/226

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HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/226Image reconstruction

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle microscope device and method for adjusting field-o...
- Patent number 12,170,183
- Issue date Dec 17, 2024
- HITACHI HIGH-TECH CORPORATION
- Mitsutoshi Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Observation method by means of scanning transmission electron micro...
- Patent number 12,154,758
- Issue date Nov 26, 2024
- The University of Tokyo
- Naoya Shibata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and image acquiring method
- Patent number 12,148,594
- Issue date Nov 19, 2024
- Jeol Ltd.
- Takeshi Otsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Rotating sample holder for random angle sampling in tomography
- Patent number 12,074,007
- Issue date Aug 27, 2024
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for cross-sectioning a sample with a preset thick...
- Patent number RE50001
- Issue date Jun 4, 2024
- FIBICS INCORPORATED
- Michael William Phaneuf
Information Patent Grant
Systems and methods for real time stereo imaging using multiple ele...
- Patent number 11,942,303
- Issue date Mar 26, 2024
- ASML Netherlands B.V.
- Yan Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microscopy imaging method for 3D tomography with predictive drift t...
- Patent number 11,923,168
- Issue date Mar 5, 2024
- FIBICS INCORPORATED
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of imaging a specimen using a transmission charged particle...
- Patent number 11,810,751
- Issue date Nov 7, 2023
- FEI Company
- Peter Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Rotating sample holder for random angle sampling in tomography
- Patent number 11,756,762
- Issue date Sep 12, 2023
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defective pixel management in charged particle microscopy
- Patent number 11,742,175
- Issue date Aug 29, 2023
- FEI Company
- Erik Michiel Franken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sparse sampling using a programmatically randomized signal modulati...
- Patent number 11,721,519
- Issue date Aug 8, 2023
- SYNCHROTRON RESEARCH, INC.
- Edward Principe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Beam trajectory via combination of image shift and hardware alpha tilt
- Patent number 11,574,794
- Issue date Feb 7, 2023
- FEI Company
- OndOnd{hacek over (r)}ej L. Shánel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer inspection based on electron beam induced current
- Patent number 11,501,949
- Issue date Nov 15, 2022
- ASML Netherlands B.V.
- Long Ma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Three-dimensional (3D) imaging system and method for nanostructure
- Patent number 11,488,801
- Issue date Nov 1, 2022
- INSTITUTE OF GEOLOGY AND GEOPHYSICS, CHINESE ACADEMY OF SCIENCES
- Zhongming Du
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for imaging a multi-pillar sample
- Patent number 11,476,079
- Issue date Oct 18, 2022
- FEI Company
- Jakub Kuba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for iteratively cross-sectioning a sample to corr...
- Patent number 11,462,383
- Issue date Oct 4, 2022
- Fibics Incorporated
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Microscope system and method for operating a microscope system
- Patent number 11,381,774
- Issue date Jul 5, 2022
- Carl Zeiss Microscopy GmbH
- Andreas Kühm
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Depth reconstruction for 3D images of samples in a charged particle...
- Patent number 11,380,529
- Issue date Jul 5, 2022
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fiducial design for tilted or glancing mill operations with a charg...
- Patent number 11,315,756
- Issue date Apr 26, 2022
- FEI Company
- Stacey Stone
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Slice depth reconstruction of charged particle images using model s...
- Patent number 11,282,670
- Issue date Mar 22, 2022
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lamella alignment based on a reconstructed volume
- Patent number 11,264,200
- Issue date Mar 1, 2022
- FEI Company
- TomáTomá{hacek over (s)} Onderlicka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Rotating sample holder for random angle sampling in tomography
- Patent number 11,257,656
- Issue date Feb 22, 2022
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for capturing volume information of three-dime...
- Patent number 11,215,536
- Issue date Jan 4, 2022
- Carl Zeiss Microscopy GmbH
- Marlene Thaler
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam system and method of measuring sample using s...
- Patent number 11,217,422
- Issue date Jan 4, 2022
- Jeol Ltd.
- Yoshikazu Nemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for electron diffraction analysis
- Patent number 11,195,692
- Issue date Dec 7, 2021
- Oxford Instruments Nanotechnology Tools Limited
- Peter Statham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Holography reconstruction method and program
- Patent number 11,024,482
- Issue date Jun 1, 2021
- Riken
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diffraction pattern detection in a transmission charged particle mi...
- Patent number 11,004,655
- Issue date May 11, 2021
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Rock sample preparation method by using focused ion beam for minimi...
- Patent number 10,948,429
- Issue date Mar 16, 2021
- Saudi Arabian Oil Company
- Dong kyu Cha
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for energy resolved chroma imaging
- Patent number 10,923,308
- Issue date Feb 16, 2021
- FEI Company
- Yuchen Deng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Atom probe inspection device, field ion microscope, and distortion...
- Patent number 10,916,405
- Issue date Feb 9, 2021
- TOSHIBA MEMORY CORPORATION
- Takahiro Ikeda
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MICROSCOPY IMAGING METHOD AND SYSTEM
- Publication number 20240177966
- Publication date May 30, 2024
- Fibics Incorporated
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LIVE-ASSISTED IMAGE ACQUISITION METHOD AND SYSTEM WITH CHARGED PART...
- Publication number 20230395351
- Publication date Dec 7, 2023
- FEI Company
- Pavel Potocek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ROTATING SAMPLE HOLDER FOR RANDOM ANGLE SAMPLING IN TOMOGRAPHY
- Publication number 20230377835
- Publication date Nov 23, 2023
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HYBRID SCANNING ELECTRON MICROSCOPY AND ACOUSTO-OPTIC BASED METROLOGY
- Publication number 20230326713
- Publication date Oct 12, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Guy Shwartz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING METHOD AND APPARATUS FOR DIRECT ELECTRON DETECTION CAMERAS...
- Publication number 20230260743
- Publication date Aug 17, 2023
- INSTITUTE OF BIOPHYSICS,CHINESE ACADEMY OF SCIENCES
- Xinzheng ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE IMAGE-BASED PITCH WALK INSPECTION METH...
- Publication number 20230253179
- Publication date Aug 10, 2023
- Samsung Electronics Co., Ltd.
- SUNG MIN NAM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE IMAGE OBSERVATION DEVICE AND METHOD FOR SAME
- Publication number 20230230799
- Publication date Jul 20, 2023
- HITACHI HIGH-TECH CORPORATION
- Yuta IMAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR REAL TIME STEREO IMAGING USING MULTIPLE ELE...
- Publication number 20230154723
- Publication date May 18, 2023
- ASML NETHERLANDS B.V.
- Yan REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROSCOPY IMAGING METHOD AND SYSTEM
- Publication number 20230044598
- Publication date Feb 9, 2023
- Fibics Incorporated
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OBSERVATION METHOD BY MEANS OF SCANNING TRANSMISSION ELECTRON MICRO...
- Publication number 20230040811
- Publication date Feb 9, 2023
- THE UNIVERSITY OF TOKYO
- Naoya Shibata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPARSE SAMPLING USING A PROGRAMMATICALLY RANDOMIZED SIGNAL MODULATI...
- Publication number 20230037773
- Publication date Feb 9, 2023
- Synchrotron Research, Inc.
- Edward Principe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECTIVE PIXEL MANAGEMENT IN CHARGED PARTICLE MICROSCOPY
- Publication number 20230005702
- Publication date Jan 5, 2023
- FEI Company
- Erik Michiel FRANKEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF CROSS-SECTION IMAGING OF AN INSPECTION VOLUME IN A WAFER
- Publication number 20220392793
- Publication date Dec 8, 2022
- Carl Zeiss SMT GMBH
- Alex Buxbaum
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged Particle Beam Apparatus and Image Acquiring Method
- Publication number 20220392738
- Publication date Dec 8, 2022
- JEOL Ltd.
- Takeshi Otsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE MICROSCOPE DEVICE AND METHOD FOR ADJUSTING FIELD-O...
- Publication number 20220351935
- Publication date Nov 3, 2022
- HITACHI HIGH-TECH CORPORATION
- Mitsutoshi KOBAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-BEAM DIGITAL SCAN AND IMAGE ACQUISITION
- Publication number 20220351936
- Publication date Nov 3, 2022
- Carl Zeiss MultiSEM GmbH
- Nicolas Kaufmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Overlay Measurement System and Overlay Measurement Device
- Publication number 20220319804
- Publication date Oct 6, 2022
- Hitachi High-Tech Corporation
- Masaki SUGIE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR IMAGING A MULTI-PILLAR SAMPLE
- Publication number 20220319799
- Publication date Oct 6, 2022
- FEI Company
- Jakub Kuba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BEAM TRAJECTORY VIA COMBINATION OF IMAGE SHIFT AND HARDWARE ALPHA TILT
- Publication number 20220310354
- Publication date Sep 29, 2022
- FEI Company
- Ondrej L. Shánel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ROTATING SAMPLE HOLDER FOR RANDOM ANGLE SAMPLING IN TOMOGRAPHY
- Publication number 20220157557
- Publication date May 19, 2022
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEPTH RECONSTRUCTION FOR 3D IMAGES OF SAMPLES IN A CHARGED PARTICLE...
- Publication number 20220102121
- Publication date Mar 31, 2022
- FEI Company
- Pavel POTOCEK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LAMELLA ALIGNMENT BASED ON A RECONSTRUCTED VOLUME
- Publication number 20220093359
- Publication date Mar 24, 2022
- FEI Company
- Tomás ONDERLICKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF IMAGING A SPECIMEN USING A TRANSMISSION CHARGED PARTICLE...
- Publication number 20210407762
- Publication date Dec 30, 2021
- FEI Company
- Peter TIEMEIJER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ROTATING SAMPLE HOLDER FOR RANDOM ANGLE SAMPLING IN TOMOGRAPHY
- Publication number 20210319975
- Publication date Oct 14, 2021
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROSCOPY IMAGING METHOD AND SYSTEM
- Publication number 20210159046
- Publication date May 27, 2021
- Fibics Incorporated
- Michael William Phaneuf
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER INSPECTION BASED ON ELECTRON BEAM INDUCED CURRENT
- Publication number 20210134556
- Publication date May 6, 2021
- ASML NETHERLANDS B.V.
- Long MA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR CAPTURING VOLUME INFORMATION OF THREE-DIME...
- Publication number 20210018403
- Publication date Jan 21, 2021
- CARL ZEISS MICROSCOPY GMBH
- Marlene Thaler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR LARGE-SCALE HIGH THROUGHPUT QUANTITATIVE C...
- Publication number 20200294760
- Publication date Sep 17, 2020
- THE NCS TESTING TECHNOLOGY CO., LTD.
- Haizhou WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ATOM PROBE INSPECTION DEVICE, FIELD ION MICROSCOPE, AND DISTORTION...
- Publication number 20200286711
- Publication date Sep 10, 2020
- Toshiba Memory Corporation
- Takahiro IKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPROVED SYSTEM FOR ELECTRON DIFFRACTION ANALYSIS
- Publication number 20200273663
- Publication date Aug 27, 2020
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- Peter Statham
- H01 - BASIC ELECTRIC ELEMENTS

Image reconstruction

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Charged particle microscope device and method for adjusting field-o...

Observation method by means of scanning transmission electron micro...

Charged particle beam apparatus and image acquiring method

Rotating sample holder for random angle sampling in tomography

Method and system for cross-sectioning a sample with a preset thick...

Systems and methods for real time stereo imaging using multiple ele...

Microscopy imaging method for 3D tomography with predictive drift t...

Method of imaging a specimen using a transmission charged particle...

Rotating sample holder for random angle sampling in tomography

Defective pixel management in charged particle microscopy

Sparse sampling using a programmatically randomized signal modulati...

Beam trajectory via combination of image shift and hardware alpha tilt

Wafer inspection based on electron beam induced current

Three-dimensional (3D) imaging system and method for nanostructure

Method and system for imaging a multi-pillar sample

Method and system for iteratively cross-sectioning a sample to corr...

Microscope system and method for operating a microscope system

Depth reconstruction for 3D images of samples in a charged particle...

Fiducial design for tilted or glancing mill operations with a charg...

Slice depth reconstruction of charged particle images using model s...

Lamella alignment based on a reconstructed volume

Rotating sample holder for random angle sampling in tomography

Method and apparatus for capturing volume information of three-dime...

Charged particle beam system and method of measuring sample using s...

System for electron diffraction analysis

Holography reconstruction method and program

Diffraction pattern detection in a transmission charged particle mi...

Rock sample preparation method by using focused ion beam for minimi...

Method and system for energy resolved chroma imaging

Atom probe inspection device, field ion microscope, and distortion...

Patents Applicationslast 30 patents

MICROSCOPY IMAGING METHOD AND SYSTEM

LIVE-ASSISTED IMAGE ACQUISITION METHOD AND SYSTEM WITH CHARGED PART...

ROTATING SAMPLE HOLDER FOR RANDOM ANGLE SAMPLING IN TOMOGRAPHY

HYBRID SCANNING ELECTRON MICROSCOPY AND ACOUSTO-OPTIC BASED METROLOGY

IMAGING METHOD AND APPARATUS FOR DIRECT ELECTRON DETECTION CAMERAS...

SCANNING ELECTRON MICROSCOPE IMAGE-BASED PITCH WALK INSPECTION METH...

SAMPLE IMAGE OBSERVATION DEVICE AND METHOD FOR SAME

SYSTEMS AND METHODS FOR REAL TIME STEREO IMAGING USING MULTIPLE ELE...

MICROSCOPY IMAGING METHOD AND SYSTEM

OBSERVATION METHOD BY MEANS OF SCANNING TRANSMISSION ELECTRON MICRO...

SPARSE SAMPLING USING A PROGRAMMATICALLY RANDOMIZED SIGNAL MODULATI...

DEFECTIVE PIXEL MANAGEMENT IN CHARGED PARTICLE MICROSCOPY

METHODS OF CROSS-SECTION IMAGING OF AN INSPECTION VOLUME IN A WAFER

Charged Particle Beam Apparatus and Image Acquiring Method

CHARGED PARTICLE MICROSCOPE DEVICE AND METHOD FOR ADJUSTING FIELD-O...

MULTI-BEAM DIGITAL SCAN AND IMAGE ACQUISITION

Overlay Measurement System and Overlay Measurement Device

METHOD AND SYSTEM FOR IMAGING A MULTI-PILLAR SAMPLE

BEAM TRAJECTORY VIA COMBINATION OF IMAGE SHIFT AND HARDWARE ALPHA TILT

ROTATING SAMPLE HOLDER FOR RANDOM ANGLE SAMPLING IN TOMOGRAPHY

DEPTH RECONSTRUCTION FOR 3D IMAGES OF SAMPLES IN A CHARGED PARTICLE...

LAMELLA ALIGNMENT BASED ON A RECONSTRUCTED VOLUME

METHOD OF IMAGING A SPECIMEN USING A TRANSMISSION CHARGED PARTICLE...

ROTATING SAMPLE HOLDER FOR RANDOM ANGLE SAMPLING IN TOMOGRAPHY

MICROSCOPY IMAGING METHOD AND SYSTEM

WAFER INSPECTION BASED ON ELECTRON BEAM INDUCED CURRENT

METHOD AND APPARATUS FOR CAPTURING VOLUME INFORMATION OF THREE-DIME...

APPARATUS AND METHOD FOR LARGE-SCALE HIGH THROUGHPUT QUANTITATIVE C...

ATOM PROBE INSPECTION DEVICE, FIELD ION MICROSCOPE, AND DISTORTION...

IMPROVED SYSTEM FOR ELECTRON DIFFRACTION ANALYSIS