Imaging particle spectrometry

Industry

CPC
H01J49/0004

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/0004Imaging particle spectrometry

Industries

Patents Grantslast 30 patents

Information Patent Grant
Imaging mass spectrometer
- Patent number 12,154,772
- Issue date Nov 26, 2024
- Shimadzu Corporation
- Kenichi Mishima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Autofocus sample imaging apparatus and method
- Patent number 12,124,020
- Issue date Oct 22, 2024
- STANDARD BIOTOOLS CANADA INC.
- Daaf Sandkuijl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging mass spectrometer
- Patent number 12,112,933
- Issue date Oct 8, 2024
- Shimadzu Corporation
- Kengo Takeshita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen imaging systems and methods
- Patent number 12,094,701
- Issue date Sep 17, 2024
- Georgia Tech Research Corporation
- Andrei G. Fedorov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Correlative multimodal chemical imaging via machine learning
- Patent number 12,057,304
- Issue date Aug 6, 2024
- UT-Battelle, LLC
- Olga S. Ovchinnikova
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging mass spectrometry data processing device
- Patent number 12,046,462
- Issue date Jul 23, 2024
- Shimadzu Corporation
- Tomonori Oshikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stack for an energy storage device
- Patent number 12,040,452
- Issue date Jul 16, 2024
- Dyson Technology Limited
- Michael Edward Rendall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging analyzer
- Patent number 12,026,888
- Issue date Jul 2, 2024
- Shimadzu Corporation
- Shinichi Yamaguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method to conduct correlated chemical mapping
- Patent number 11,990,325
- Issue date May 21, 2024
- DH Technologies Development Pte. Ltd.
- Thomas R. Covey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution imaging apparatus and method
- Patent number 11,967,496
- Issue date Apr 23, 2024
- Standard BioTools Canada Inc.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging analysis device
- Patent number 11,887,827
- Issue date Jan 30, 2024
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-intrusive laser-based technique for monitor and control of prot...
- Patent number 11,887,830
- Issue date Jan 30, 2024
- University of Wyoming
- Erica Belmont
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectral tissue analysis
- Patent number 11,860,172
- Issue date Jan 2, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging mass spectrometer
- Patent number 11,862,445
- Issue date Jan 2, 2024
- Shimadzu Corporation
- Shinichi Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry imaging with substance identification using ion m...
- Patent number 11,854,778
- Issue date Dec 26, 2023
- Michael Easterling
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for processing imaging-analysis data
- Patent number 11,848,182
- Issue date Dec 19, 2023
- Shimadzu Corporation
- Tomonori Oshikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and mass calibration method in mass spectrometer
- Patent number 11,798,795
- Issue date Oct 24, 2023
- Shimadzu Corporation
- Masahiro Ikegami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Intensity normalization in imaging mass spectrometry
- Patent number 11,790,629
- Issue date Oct 17, 2023
- Katholieke Universiteit Leuven
- Bart De Moor
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Laser ablation spectrometry apparatus
- Patent number 11,768,157
- Issue date Sep 26, 2023
- Applied Spectra, Inc.
- Jong Hyun Yoo
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Spectrometric analysis of microbes
- Patent number 11,764,048
- Issue date Sep 19, 2023
- Micromass UK Limited
- Zoltan Takats
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Ion beam focus adjustment
- Patent number 11,764,045
- Issue date Sep 19, 2023
- IONpath, Inc.
- Harris Fienberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Retractable ion guide, grid holder, and technology for removal of c...
- Patent number 11,728,146
- Issue date Aug 15, 2023
- Wisconsin Alumni Research Foundation
- Michael Scott Westphall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cell population analysis
- Patent number 11,710,627
- Issue date Jul 25, 2023
- Micromass UK Limited
- Emrys Jones
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Mass spectrometric determination of tissue states
- Patent number 11,705,316
- Issue date Jul 18, 2023
- Dennis Trede
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample support, sample ionization method, and mass spectrometry method
- Patent number 11,694,883
- Issue date Jul 4, 2023
- Hamamatsu Photonics K.K.
- Miu Takimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging data processing apparatus and imaging data processing progr...
- Patent number 11,636,598
- Issue date Apr 25, 2023
- Shimadzu Corporation
- Masahiro Ikegami
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Joint nanoscale three-dimensional imaging and chemical analysis
- Patent number 11,598,734
- Issue date Mar 7, 2023
- LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST)
- Tom Wirtz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectrometric analysis of microbes
- Patent number 11,574,803
- Issue date Feb 7, 2023
- Micromass UK Limited
- Zoltan Takats
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Mass spectrometry imaging with substance identification using ion m...
- Patent number 11,569,078
- Issue date Jan 31, 2023
- Michael Easterling
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for laser ablation analysis
- Patent number 11,555,786
- Issue date Jan 17, 2023
- Applied Spectra, Inc.
- Jong Hyun Yoo
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
SPECIMEN IMAGING SYSTEMS AND METHODS
- Publication number 20240412961
- Publication date Dec 12, 2024
- Georgia Tech Research Corporation
- Andrei G. Fedorov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPROVEMENTS IN AND RELATING TO ION ANALYSIS USING IMAGE-CHARGE/CUR...
- Publication number 20240404812
- Publication date Dec 5, 2024
- Shimadzu Corporation
- Aleksandr RUSINOV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPROVEMENTS IN AND RELATING TO ION ANALYSIS
- Publication number 20240387157
- Publication date Nov 21, 2024
- Shimadzu Corporation
- Li DING
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometry Data Analysis Method and Imaging Mass Spectrometer
- Publication number 20240387158
- Publication date Nov 21, 2024
- Shimadzu Corporation
- Shinichi YAMAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS OF RAPID AND AUTONOMOUS DETECTION OF AEROSOL PA...
- Publication number 20240379337
- Publication date Nov 14, 2024
- Zeteo Tech, Inc.
- Michael MCLOUGHLIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESOLUTION IMAGING APPARATUS AND METHOD
- Publication number 20240371622
- Publication date Nov 7, 2024
- Standard BioTools Canada Inc.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR THE SPECTROMETRIC ANALYSIS OF SAMPLE MATERIAL
- Publication number 20240355610
- Publication date Oct 24, 2024
- Bruker Daltonics GmbH & Co. KG
- Sebastian BÖHM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE SPECTROMETER
- Publication number 20240331993
- Publication date Oct 3, 2024
- SCIENTA OMICRON AB
- Patrik KARLSSON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES WITH INTEGRATED TEST AREAS
- Publication number 20240321647
- Publication date Sep 26, 2024
- Woflspeed, Inc.
- In-Hwan Ji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR SPECTROMETRIC ANALYSIS
- Publication number 20240288439
- Publication date Aug 29, 2024
- Bruker Daltonics GmbH & Co. KG
- Tanja BIEN
- G01 - MEASURING TESTING
Information Patent Application
IMPROVEMENTS IN AND RELATING TO ION ANALYSIS
- Publication number 20240290597
- Publication date Aug 29, 2024
- Shimadzu Corporation
- Sergey SMIRNOV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometry Data Analysis Method and Imaging Mass Spectrometer
- Publication number 20240282561
- Publication date Aug 22, 2024
- Shimadzu Corporation
- Shinichi YAMAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY IMAGE PROCESSING METHOD, IMAGE PROCESSING METHOD...
- Publication number 20240249928
- Publication date Jul 25, 2024
- Shimadzu Corporation
- Makoto SATO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MASS SPECTROMETRY DEVICE AND MASS SPECTROMETRY METHOD
- Publication number 20240234119
- Publication date Jul 11, 2024
- Hamamatsu Photonics K.K.
- Tsuyoshi HIRAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTRAL TISSUE ANALYSIS
- Publication number 20240219410
- Publication date Jul 4, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETRY DEVICE AND MASS SPECTROMETRY METHOD
- Publication number 20240136170
- Publication date Apr 25, 2024
- Hamamatsu Photonics K.K.
- Tsuyoshi HIRAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INLET INSTRUMENTATION FOR ION ANALYSER COUPLED TO RAPID EVAPORATIVE...
- Publication number 20240128071
- Publication date Apr 18, 2024
- Micromass UK Limited
- Zoltán TAKÁTS
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
FEATURES FOR DETERMINING DUCTAL CARCINOMA IN SITU RECURRENCE AND PR...
- Publication number 20240044900
- Publication date Feb 8, 2024
- The Board of Trustees of the Leland Stanford Junior University
- Tyler Risom
- G01 - MEASURING TESTING
Information Patent Application
Systems and Method for Image and/or Video Processing of Mass Spectr...
- Publication number 20230420234
- Publication date Dec 28, 2023
- MOBILion Systems, Inc.
- James Russel Arndt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA-ANALYZING METHOD, DATA-ANALYZING DEVICE, AND SAMPLE ANALYZER
- Publication number 20230335221
- Publication date Oct 19, 2023
- Shimadzu Corporation
- Ikuko YAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20230238228
- Publication date Jul 27, 2023
- ASCEND DIAGNOSTICS LIMITED
- Simone PANTALEI
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED MICROFLUIDIC PROBE (iMFP) AND METHODS OF USE THEREOF
- Publication number 20230238231
- Publication date Jul 27, 2023
- Purdue Research Foundation
- Julia Laskin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMA AND SAMPLING GEOMETRIES FOR IMAGING MASS CYTOMETRY
- Publication number 20230215714
- Publication date Jul 6, 2023
- Standard BioTools Canada Inc.
- Adam Carew
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
JOINT NANOSCALE THREE-DIMENSIONAL IMAGING AND CHEMICAL ANALYSIS
- Publication number 20230175993
- Publication date Jun 8, 2023
- LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST)
- Tom WIRTZ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY METHOD AND MASS SPECTROMETER
- Publication number 20230162957
- Publication date May 25, 2023
- SHIMADZU CORPORATION
- Kengo TAKESHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY METHOD AND MASS SPECTROMETER
- Publication number 20230162959
- Publication date May 25, 2023
- SHIMADZU CORPORATION
- Satoshi KASAMATSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY IMAGING
- Publication number 20230154740
- Publication date May 18, 2023
- Micromass UK Limited
- Emrys Jones
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LASER ABLATION SPECTROMETRY APPARATUS
- Publication number 20230152236
- Publication date May 18, 2023
- Applied Spectra, Inc.
- Jong Hyun Yoo
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SPECTROMETRIC ANALYSIS OF MICROBES
- Publication number 20230143849
- Publication date May 11, 2023
- Micromass UK Limited
- Zoltán TAKÁTS
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETRY IMAGING WITH SUBSTANCE IDENTIFICATION USING ION M...
- Publication number 20230135091
- Publication date May 4, 2023
- Bruker Scientific LLC
- Michael EASTERLING
- H01 - BASIC ELECTRIC ELEMENTS

Imaging particle spectrometry

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Imaging mass spectrometer

Autofocus sample imaging apparatus and method

Imaging mass spectrometer

Specimen imaging systems and methods

Correlative multimodal chemical imaging via machine learning

Imaging mass spectrometry data processing device

Stack for an energy storage device

Imaging analyzer

System and method to conduct correlated chemical mapping

High resolution imaging apparatus and method

Imaging analysis device

Non-intrusive laser-based technique for monitor and control of prot...

Mass spectral tissue analysis

Imaging mass spectrometer

Mass spectrometry imaging with substance identification using ion m...

Method and device for processing imaging-analysis data

Mass spectrometer and mass calibration method in mass spectrometer

Intensity normalization in imaging mass spectrometry

Laser ablation spectrometry apparatus

Spectrometric analysis of microbes

Ion beam focus adjustment

Retractable ion guide, grid holder, and technology for removal of c...

Cell population analysis

Mass spectrometric determination of tissue states

Sample support, sample ionization method, and mass spectrometry method

Imaging data processing apparatus and imaging data processing progr...

Joint nanoscale three-dimensional imaging and chemical analysis

Spectrometric analysis of microbes

Mass spectrometry imaging with substance identification using ion m...

Apparatus for laser ablation analysis

Patents Applicationslast 30 patents

SPECIMEN IMAGING SYSTEMS AND METHODS

IMPROVEMENTS IN AND RELATING TO ION ANALYSIS USING IMAGE-CHARGE/CUR...

IMPROVEMENTS IN AND RELATING TO ION ANALYSIS

Mass Spectrometry Data Analysis Method and Imaging Mass Spectrometer

SYSTEMS AND METHODS OF RAPID AND AUTONOMOUS DETECTION OF AEROSOL PA...

HIGH RESOLUTION IMAGING APPARATUS AND METHOD

DEVICE AND METHOD FOR THE SPECTROMETRIC ANALYSIS OF SAMPLE MATERIAL

CHARGED PARTICLE SPECTROMETER

SEMICONDUCTOR DEVICES WITH INTEGRATED TEST AREAS

METHOD AND DEVICE FOR SPECTROMETRIC ANALYSIS

IMPROVEMENTS IN AND RELATING TO ION ANALYSIS

Mass Spectrometry Data Analysis Method and Imaging Mass Spectrometer

MASS SPECTROMETRY IMAGE PROCESSING METHOD, IMAGE PROCESSING METHOD...

MASS SPECTROMETRY DEVICE AND MASS SPECTROMETRY METHOD

MASS SPECTRAL TISSUE ANALYSIS

MASS SPECTROMETRY DEVICE AND MASS SPECTROMETRY METHOD

INLET INSTRUMENTATION FOR ION ANALYSER COUPLED TO RAPID EVAPORATIVE...

FEATURES FOR DETERMINING DUCTAL CARCINOMA IN SITU RECURRENCE AND PR...

Systems and Method for Image and/or Video Processing of Mass Spectr...

DATA-ANALYZING METHOD, DATA-ANALYZING DEVICE, AND SAMPLE ANALYZER

MASS SPECTROMETER

INTEGRATED MICROFLUIDIC PROBE (iMFP) AND METHODS OF USE THEREOF

PLASMA AND SAMPLING GEOMETRIES FOR IMAGING MASS CYTOMETRY

JOINT NANOSCALE THREE-DIMENSIONAL IMAGING AND CHEMICAL ANALYSIS

MASS SPECTROMETRY METHOD AND MASS SPECTROMETER

MASS SPECTROMETRY METHOD AND MASS SPECTROMETER

MASS SPECTROMETRY IMAGING

LASER ABLATION SPECTROMETRY APPARATUS

SPECTROMETRIC ANALYSIS OF MICROBES

MASS SPECTROMETRY IMAGING WITH SUBSTANCE IDENTIFICATION USING ION M...