in an oscillator circuit

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CPC
G01K7/245

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GPHYSICS G01Measuring instruments G01KMEASURING TEMPERATURE MEASURING QUANTITY OF HEAT THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR G01K7/00Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat; Power supply

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G01K7/245in an oscillator circuit

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Patents Grantslast 30 patents

Information Patent Grant
Temperature sensor circuit
- Patent number 12,111,216
- Issue date Oct 8, 2024
- INNOGRIT TECHNOLOGIES CO., LTD.
- Chi Cao
- G01 - MEASURING TESTING
Information Patent Grant
Temperature-reporting oscillator
- Patent number 12,101,062
- Issue date Sep 24, 2024
- SiTime Corporation
- Sassan Tabatabaei
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor drive device, semiconductor device, and power convers...
- Patent number 12,081,115
- Issue date Sep 3, 2024
- Mitsubishi Electric Corporation
- Yohei Mitsui
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Measurement apparatus
- Patent number 11,982,579
- Issue date May 14, 2024
- Pragmatic Printing Ltd.
- Brian Hardy Cobb
- G01 - MEASURING TESTING
Information Patent Grant
Temperature-reporting oscillator
- Patent number 11,646,698
- Issue date May 9, 2023
- SiTime Corporation
- Sassan Tabatabaei
- G01 - MEASURING TESTING
Information Patent Grant
Temperature sensor
- Patent number 11,274,976
- Issue date Mar 15, 2022
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Franck Badets
- G01 - MEASURING TESTING
Information Patent Grant
Temperature-reporting oscillator
- Patent number 11,245,361
- Issue date Feb 8, 2022
- SiTime Corporation
- Sassan Tabatabaei
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Measuring device and measuring method
- Patent number 11,177,797
- Issue date Nov 16, 2021
- BEIJING BOE TECHNOLOGY DEVELOPMENT CO., LTD.
- Xiangye Wei
- G01 - MEASURING TESTING
Information Patent Grant
Temperature-reporting oscillator
- Patent number 10,833,632
- Issue date Nov 10, 2020
- SiTime Corporation
- Sassan Tabatabaei
- G01 - MEASURING TESTING
Information Patent Grant
Piezoelectric device package
- Patent number 10,718,672
- Issue date Jul 21, 2020
- Samsung Electro-Mechanics Co., Ltd.
- Jin Man Han
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Fault detection apparatus
- Patent number 10,514,307
- Issue date Dec 24, 2019
- Hitachi Automotive Systems, Ltd.
- Shinichirou Hida
- G01 - MEASURING TESTING
Information Patent Grant
Temperature measurement at high-voltage potential
- Patent number 9,945,733
- Issue date Apr 17, 2018
- Siemens Aktiengesellschaft
- Markus Ritcher
- G01 - MEASURING TESTING
Information Patent Grant
Thermal protecting device of speaker
- Patent number 9,900,717
- Issue date Feb 20, 2018
- ASUSTeK COMPUTER Inc.
- Wen-Hung Lin
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and device for measuring resistance
- Patent number 7,250,777
- Issue date Jul 31, 2007
- Mini Mitter Co., Inc.
- Rick Allen Kobbe
- G01 - MEASURING TESTING
Information Patent Grant
Digital sensor for miniature medical thermometer, and body temperat...
- Patent number 6,629,776
- Issue date Oct 7, 2003
- Mini-Mitter Company, Inc.
- Florian G. Bell
- G01 - MEASURING TESTING
Information Patent Grant
Space vehicle with temperature sensitive oscillator and associated...
- Patent number 6,390,672
- Issue date May 21, 2002
- Harris Corporation
- David K. Vail
- G01 - MEASURING TESTING
Information Patent Grant
Temperature sensing systems and methods
- Patent number 6,217,213
- Issue date Apr 17, 2001
- Dallas Semiconductor Corporation
- Stephen M. Curry
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit for identifying an item via a serial port
- Patent number 6,122,704
- Issue date Sep 19, 2000
- Dallas Semiconductor Corp.
- Steven N. Hass
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Temperature detector systems and methods
- Patent number 6,115,441
- Issue date Sep 5, 2000
- Dallas Semiconductor Corporation
- James Michael Douglass
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of communicating over a single wire bus between a host devic...
- Patent number 6,112,275
- Issue date Aug 29, 2000
- Dallas Semiconductor Corporation
- Stephen M. Curry
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for measuring localized temperatures on integr...
- Patent number 6,067,508
- Issue date May 23, 2000
- Xilinx, Inc.
- Robert O. Conn
- G01 - MEASURING TESTING
Information Patent Grant
Electronic labeling systems and methods and electronic card systems...
- Patent number 6,036,101
- Issue date Mar 14, 2000
- Dallas Semiconductor Corporation
- Steven N. Hass
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for measuring localized voltages on programmab...
- Patent number 6,002,991
- Issue date Dec 14, 1999
- Xilinx, Inc.
- Robert O. Conn
- G01 - MEASURING TESTING
Information Patent Grant
Portable electronic data carrier
- Patent number 5,994,770
- Issue date Nov 30, 1999
- Dallas Semiconductor Corporation
- Bradley M. Harrington
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor integrated circuit having a digital temperature senso...
- Patent number 5,835,553
- Issue date Nov 10, 1998
- NEC Corporation
- Naoshi Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring localized temperatures and volta...
- Patent number 5,795,068
- Issue date Aug 18, 1998
- Xilinx, Inc.
- Robert O. Conn
- G01 - MEASURING TESTING
Information Patent Grant
Identifiable modules on a serial bus system and corresponding ident...
- Patent number 5,761,697
- Issue date Jun 2, 1998
- Dallas Semiconductor Corporation
- Stephen M. Curry
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for sensing the temperature of a printhead in an ink jet pri...
- Patent number 5,745,130
- Issue date Apr 28, 1998
- Xerox Corporation
- Juan J. Becerra
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Resistance to frequency circuit for measuring ambient temperature o...
- Patent number 5,744,973
- Issue date Apr 28, 1998
- Honeywell Inc.
- Douglas D. Bird
- G01 - MEASURING TESTING
Information Patent Grant
Power regulator
- Patent number 5,652,539
- Issue date Jul 29, 1997
- Dallas Semiconductor Corporation
- Gary V. Zanders
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DRIVE DEVICE, SEMICONDUCTOR DEVICE, AND POWER CONVERS...
- Publication number 20230122671
- Publication date Apr 20, 2023
- Mitsubishi Electric Corporation
- Yohei MITSUI
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
MEASURING DEVICE AND MEASURING METHOD
- Publication number 20210226618
- Publication date Jul 22, 2021
- BEIJING BOE TECHNOLOGY DEVELOPEMENT CO., LTD.
- Xiangye WEI
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS
- Publication number 20210003460
- Publication date Jan 7, 2021
- PRAGMATIC PRINTING LTD.
- Brian Hardy COBB
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE SENSOR
- Publication number 20200182707
- Publication date Jun 11, 2020
- Commissariat a I'Energie Atomique et aux Energies Alternatives
- Franck Badets
- G01 - MEASURING TESTING
Information Patent Application
QUANTUM INTERFERENCE DEVICE, ATOMIC OSCILLATOR, AND ELECTRONIC APPA...
- Publication number 20180241408
- Publication date Aug 23, 2018
- SEIKO EPSON CORPORATION
- Nobuhito HAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fault Detection Apparatus
- Publication number 20170363481
- Publication date Dec 21, 2017
- Hitachi Automotive Systems, Ltd.
- Shinichirou HIDA
- G01 - MEASURING TESTING
Information Patent Application
RING OSCILLATORS FOR TEMPERATURE DETECTION IN WIDEBAND SUPPLY NOISE...
- Publication number 20170038264
- Publication date Feb 9, 2017
- SANDISK TECHNOLOGIES INC.
- Bhavin Odedara
- G01 - MEASURING TESTING
Information Patent Application
Method and device for measuring resistance
- Publication number 20060250145
- Publication date Nov 9, 2006
- Rick Allen Kobbe
- G01 - MEASURING TESTING
Information Patent Application
Digital sensor for miniature medical thermometer, and body temperat...
- Publication number 20020105436
- Publication date Aug 8, 2002
- Florian G. Bell
- G01 - MEASURING TESTING
Information Patent Application
Memory
- Publication number 20020018513
- Publication date Feb 14, 2002
- Dallas Semiconductor Corporation
- Stephen M. Curry
- G01 - MEASURING TESTING

in an oscillator circuit

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Temperature sensor circuit

Temperature-reporting oscillator

Semiconductor drive device, semiconductor device, and power convers...

Measurement apparatus

Temperature-reporting oscillator

Temperature sensor

Temperature-reporting oscillator

Measuring device and measuring method

Temperature-reporting oscillator

Piezoelectric device package

Fault detection apparatus

Temperature measurement at high-voltage potential

Thermal protecting device of speaker

Method and device for measuring resistance

Digital sensor for miniature medical thermometer, and body temperat...

Space vehicle with temperature sensitive oscillator and associated...

Temperature sensing systems and methods

Integrated circuit for identifying an item via a serial port

Temperature detector systems and methods

Method of communicating over a single wire bus between a host devic...

Method and apparatus for measuring localized temperatures on integr...

Electronic labeling systems and methods and electronic card systems...

Method and apparatus for measuring localized voltages on programmab...

Portable electronic data carrier

Semiconductor integrated circuit having a digital temperature senso...

Method and apparatus for measuring localized temperatures and volta...

Identifiable modules on a serial bus system and corresponding ident...

System for sensing the temperature of a printhead in an ink jet pri...

Resistance to frequency circuit for measuring ambient temperature o...

Power regulator

Patents Applicationslast 30 patents

SEMICONDUCTOR DRIVE DEVICE, SEMICONDUCTOR DEVICE, AND POWER CONVERS...

MEASURING DEVICE AND MEASURING METHOD

MEASUREMENT APPARATUS

TEMPERATURE SENSOR

QUANTUM INTERFERENCE DEVICE, ATOMIC OSCILLATOR, AND ELECTRONIC APPA...

Fault Detection Apparatus

RING OSCILLATORS FOR TEMPERATURE DETECTION IN WIDEBAND SUPPLY NOISE...

Method and device for measuring resistance

Digital sensor for miniature medical thermometer, and body temperat...

Memory