in an oscillator circuit

Industry

CPC
G01K7/203

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01KMEASURING TEMPERATURE MEASURING QUANTITY OF HEAT THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR G01K7/00Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat; Power supply

Current Industry

G01K7/203in an oscillator circuit

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Enhanced temperature sensor
- Patent number 12,140,483
- Issue date Nov 12, 2024
- STMicroelectronics (Rousset) SAS
- Vincent Binet
- G01 - MEASURING TESTING
Information Patent Grant
Temperature sensor circuit
- Patent number 12,111,216
- Issue date Oct 8, 2024
- INNOGRIT TECHNOLOGIES CO., LTD.
- Chi Cao
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus
- Patent number 11,982,579
- Issue date May 14, 2024
- Pragmatic Printing Ltd.
- Brian Hardy Cobb
- G01 - MEASURING TESTING
Information Patent Grant
Electronically controlled mechanical timepiece, control method of a...
- Patent number 11,693,367
- Issue date Jul 4, 2023
- Seiko Epson Corporation
- Yutaka Yamazaki
- G01 - MEASURING TESTING
Information Patent Grant
Sensing devices
- Patent number 11,543,297
- Issue date Jan 3, 2023
- Industrial Technology Research Institute
- Ying-Che Lo
- G01 - MEASURING TESTING
Information Patent Grant
Temperature control circuit, oscillation control circuit, and tempe...
- Patent number 11,356,057
- Issue date Jun 7, 2022
- Asahi Kasei Microdevices Corporation
- Takayuki Sato
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Electronically controlled mechanical timepiece, control method of a...
- Patent number 11,249,441
- Issue date Feb 15, 2022
- Seiko Epson Corporation
- Yutaka Yamazaki
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for detecting the temperature of the vibrating el...
- Patent number 11,156,507
- Issue date Oct 26, 2021
- Elmos Semiconductor SE
- Egbert Spiegel
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Grant
Reference circuit for metrology system
- Patent number 11,022,503
- Issue date Jun 1, 2021
- Apple Inc.
- Daniel J. Fritchman
- G01 - MEASURING TESTING
Information Patent Grant
PTAT ring oscillator circuit
- Patent number 11,005,457
- Issue date May 11, 2021
- Apple Inc.
- Ramy A. Ahmed
- G01 - MEASURING TESTING
Information Patent Grant
Reference circuit for metrology system
- Patent number 10,527,503
- Issue date Jan 7, 2020
- Apple Inc.
- Daniel J. Fritchman
- G01 - MEASURING TESTING
Information Patent Grant
Temperature and humidity sensor
- Patent number 10,338,023
- Issue date Jul 2, 2019
- MURATA MANUFACTURING CO., LTD.
- Katsumi Fujimoto
- G01 - MEASURING TESTING
Information Patent Grant
Temperature measurement at high-voltage potential
- Patent number 9,945,733
- Issue date Apr 17, 2018
- Siemens Aktiengesellschaft
- Markus Ritcher
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and measurement method
- Patent number 9,606,007
- Issue date Mar 28, 2017
- Lapis Semiconductor Co., Ltd.
- Yosuke Iwasa
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring a value of a resistor
- Patent number 9,182,430
- Issue date Nov 10, 2015
- Continental Automotive GmbH
- Volker Hertes
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for temperature sensing in integrated circuits
- Patent number 7,455,450
- Issue date Nov 25, 2008
- Advanced Micro Devices, Inc.
- Huining Liu
- G01 - MEASURING TESTING
Information Patent Grant
Electronic circuit with means of evaluating its temperature, method...
- Patent number 7,283,007
- Issue date Oct 16, 2007
- STMicroelectronics S.A.
- Benjamin Duval
- G01 - MEASURING TESTING
Information Patent Grant
On-chip thermal sensing circuit
- Patent number 6,914,764
- Issue date Jul 5, 2005
- International Business Machines Corporation
- Joachim Gerhard Clabes
- G01 - MEASURING TESTING
Information Patent Grant
Temperature measuring method, object detecting method and object de...
- Patent number 6,769,804
- Issue date Aug 3, 2004
- Nohken Inc.
- Hiroshi Kawakatsu
- G01 - MEASURING TESTING
Information Patent Grant
Temperature sensing circuit and method
- Patent number 6,695,475
- Issue date Feb 24, 2004
- STMicroelectronics, Inc.
- Rong Yin
- G01 - MEASURING TESTING
Information Patent Grant
Temperature/voltage detecting unit and battery element unit
- Patent number 6,236,216
- Issue date May 22, 2001
- Yazaki Corporation
- Kenichi Shimoyama
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for temperature sensing
- Patent number 6,029,251
- Issue date Feb 22, 2000
- OPTi Inc.
- Mark Williams
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Time-based temperature sensor system and method therefor
- Patent number 5,899,570
- Issue date May 4, 1999
- Microchip Technology Incorporated
- Hartono Darmawaskita
- G01 - MEASURING TESTING
Information Patent Grant
Temperature to frequency converter
- Patent number 5,277,495
- Issue date Jan 11, 1994
- Halliburton Company
- Gilbert H. Forehand
- E21 - EARTH DRILLING MINING
Information Patent Grant
Oscillator having all-pass filter with resistance bridge for detect...
- Patent number 4,739,285
- Issue date Apr 19, 1988
- U.S. Philips Corporation
- Bernd Heck
- G01 - MEASURING TESTING
Information Patent Grant
Oscillator for measuring temperature
- Patent number 4,719,432
- Issue date Jan 12, 1988
- U.S. Philips Corporation
- Bernd Heck
- G01 - MEASURING TESTING
Information Patent Grant
Electronic clinical thermometer with power shut-off at maximum temp...
- Patent number 4,658,407
- Issue date Apr 14, 1987
- Kabushiki Kaisha Toshiba
- Nobuyuki Iwama
- G01 - MEASURING TESTING
Information Patent Grant
Multivibrator
- Patent number 4,129,833
- Issue date Dec 12, 1978
- Meisei Electric Co. Ltd.
- Toshiji Shibata
- G01 - MEASURING TESTING
Information Patent Grant
Temperature sensing device for producing alternating electric signa...
- Patent number 4,090,151
- Issue date May 16, 1978
- Crouzet
- Rene Presset
- G01 - MEASURING TESTING
Information Patent Grant
Fast response thermometer
- Patent number 4,085,617
- Issue date Apr 25, 1978
- Edwin Langberg
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC CIRCUIT DEVICE AND METHOD FOR MEASURING TEMPERATURE OF E...
- Publication number 20240035899
- Publication date Feb 1, 2024
- FURUNO ELECTRIC CO., LTD.
- Takuji YASUMOTO
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE MEASUREMENT CIRCUIT AND METHOD
- Publication number 20220357215
- Publication date Nov 10, 2022
- Lemon Inc.
- Chuang ZHANG
- G01 - MEASURING TESTING
Information Patent Application
Enhanced Temperature Sensor
- Publication number 20220163408
- Publication date May 26, 2022
- STMicroelectronics (Rousset) SAS
- Vincent Binet
- G01 - MEASURING TESTING
Information Patent Application
Electronically Controlled Mechanical Timepiece, Control Method Of A...
- Publication number 20220128949
- Publication date Apr 28, 2022
- SEIKO EPSON CORPORATION
- Yutaka YAMAZAKI
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE CONTROL CIRCUIT, OSCILLATION CONTROL CIRCUIT, AND TEMPE...
- Publication number 20210119577
- Publication date Apr 22, 2021
- ASAHI KASEI MICRODEVICES CORPORATION
- Takayuki SATO
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SENSING DEVICES
- Publication number 20210018376
- Publication date Jan 21, 2021
- Industrial Technology Research Institute
- Ying-Che LO
- G01 - MEASURING TESTING
Information Patent Application
Reference Circuit for Metrology System
- Publication number 20200217729
- Publication date Jul 9, 2020
- Apple Inc.
- Daniel J. Fritchman
- G01 - MEASURING TESTING
Information Patent Application
Electronically Controlled Mechanical Timepiece, Control Method Of A...
- Publication number 20190369560
- Publication date Dec 5, 2019
- SEIKO EPSON CORPORATION
- Yutaka YAMAZAKI
- G04 - HOROLOGY
Information Patent Application
SEMICONDUCTOR DEVICE AND MEASUREMENT METHOD
- Publication number 20140286472
- Publication date Sep 25, 2014
- LAPIS SEMICONDUCTOR CO., LTD.
- Yosuke IWASA
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING A VALUE OF A RESISTOR
- Publication number 20130249575
- Publication date Sep 26, 2013
- CONTINENTAL AUTOMOTIVE GMBH
- VOLKER HERTES
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for temperature sensing in integrated circuits
- Publication number 20070081575
- Publication date Apr 12, 2007
- Advanced Micro Devices, Inc.
- Huining Liu
- G01 - MEASURING TESTING
Information Patent Application
Electronic circuit with means of evaluating its temperature, method...
- Publication number 20060038626
- Publication date Feb 23, 2006
- STMicroelectronics S.A.
- Benjamin Duval
- G01 - MEASURING TESTING
Information Patent Application
On-chip thermal sensing circuit
- Publication number 20040008754
- Publication date Jan 15, 2004
- International Business Machines Corporation
- Joachim Gerhard Clabes
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Temperature measuring method, object detecting method and object de...
- Publication number 20030235233
- Publication date Dec 25, 2003
- NOHKEN INC.
- Hiroshi Kawakatsu
- G01 - MEASURING TESTING
Information Patent Application
Temperature sensing circuit and method
- Publication number 20020181543
- Publication date Dec 5, 2002
- RONG YIN
- G01 - MEASURING TESTING

in an oscillator circuit

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Enhanced temperature sensor

Temperature sensor circuit

Measurement apparatus

Electronically controlled mechanical timepiece, control method of a...

Sensing devices

Temperature control circuit, oscillation control circuit, and tempe...

Electronically controlled mechanical timepiece, control method of a...

Method and device for detecting the temperature of the vibrating el...

Reference circuit for metrology system

PTAT ring oscillator circuit

Reference circuit for metrology system

Temperature and humidity sensor

Temperature measurement at high-voltage potential

Semiconductor device and measurement method

Device and method for measuring a value of a resistor

Method and apparatus for temperature sensing in integrated circuits

Electronic circuit with means of evaluating its temperature, method...

On-chip thermal sensing circuit

Temperature measuring method, object detecting method and object de...

Temperature sensing circuit and method

Temperature/voltage detecting unit and battery element unit

Method and apparatus for temperature sensing

Time-based temperature sensor system and method therefor

Temperature to frequency converter

Oscillator having all-pass filter with resistance bridge for detect...

Oscillator for measuring temperature

Electronic clinical thermometer with power shut-off at maximum temp...

Multivibrator

Temperature sensing device for producing alternating electric signa...

Fast response thermometer

Patents Applicationslast 30 patents

ELECTRONIC CIRCUIT DEVICE AND METHOD FOR MEASURING TEMPERATURE OF E...

TEMPERATURE MEASUREMENT CIRCUIT AND METHOD

Enhanced Temperature Sensor

Electronically Controlled Mechanical Timepiece, Control Method Of A...

TEMPERATURE CONTROL CIRCUIT, OSCILLATION CONTROL CIRCUIT, AND TEMPE...

SENSING DEVICES

Reference Circuit for Metrology System

Electronically Controlled Mechanical Timepiece, Control Method Of A...

SEMICONDUCTOR DEVICE AND MEASUREMENT METHOD

DEVICE AND METHOD FOR MEASURING A VALUE OF A RESISTOR

Method and apparatus for temperature sensing in integrated circuits

Electronic circuit with means of evaluating its temperature, method...

On-chip thermal sensing circuit

Temperature measuring method, object detecting method and object de...

Temperature sensing circuit and method