in combination with diodes, or resistors, or capacitors

Industry

CPC
H01L27/0629

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Parent Industries

HELECTRICITY H01Electric elements H01LSEMICONDUCTOR DEVICES ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR H01L27/00Devices consisting of a plurality of semiconductor or other solid state components formed in or on a common substrate

Current Industry

H01L27/0629in combination with diodes, or resistors, or capacitors

Industries

Patents Grantslast 30 patents

Information Patent Grant
Current detection circuit and garbage can
- Patent number 11,973,450
- Issue date Apr 30, 2024
- Jiangmen Jinlong High Technology Industrial Co., Ltd.
- Jinsheng Liao
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Electrostatic discharge protection circuit and semiconductor circuit
- Patent number 11,973,076
- Issue date Apr 30, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Ming-Fang Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High electron mobility transistor and method for fabricating the same
- Patent number 11,973,133
- Issue date Apr 30, 2024
- United Microelectronics Corp.
- Kuo-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 11,967,649
- Issue date Apr 23, 2024
- Semiconductor Energy Laboratory Co., Ltd.
- Toshihiko Takeuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicide-sandwiched source/drain region and method of fabricating same
- Patent number 11,967,621
- Issue date Apr 23, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chung-Hui Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Super CMOS devices on a microelectronics system
- Patent number 11,955,476
- Issue date Apr 9, 2024
- SCHOTTKY LSI, INC.
- Augustine Wei-Chun Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturable thin film gallium and nitrogen containing devices
- Patent number 11,955,521
- Issue date Apr 9, 2024
- KYOCERA SLD Laser, Inc.
- James W. Raring
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Resistor with doped regions and semiconductor devices having the same
- Patent number 11,955,475
- Issue date Apr 9, 2024
- Samsung Electronics Co., Ltd.
- Woocheol Shin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 11,955,508
- Issue date Apr 9, 2024
- SOCIONEXT INC.
- Isaya Sobue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power semiconductor device with an auxiliary gate structure
- Patent number 11,955,478
- Issue date Apr 9, 2024
- CAMBRIDGE GAN DEVICES LIMITED
- Martin Arnold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit comprising a three-dimensional capacitor
- Patent number 11,955,480
- Issue date Apr 9, 2024
- STMicroelectronics (Tours) SAS
- Mohamed Boufnichel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fin field effect transistor (FinFet) device structure and method fo...
- Patent number 11,949,014
- Issue date Apr 2, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Wei-Barn Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 11,948,888
- Issue date Apr 2, 2024
- Samsung Electronics Co., Ltd.
- Hongsik Shin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturable thin film gallium and nitrogen containing devices
- Patent number 11,948,980
- Issue date Apr 2, 2024
- KYOCERA SLD Laser, Inc.
- James W. Raring
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor die and method of manufacturing the same
- Patent number 11,949,009
- Issue date Apr 2, 2024
- Infineon Technologies Austria AG
- Stanislav Vitanov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 11,948,883
- Issue date Apr 2, 2024
- Samsung Electronics Co., Ltd.
- Seonghun Lim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device structures and methods of manufacturing the same
- Patent number 11,942,560
- Issue date Mar 26, 2024
- INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., LTD.
- Anbang Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field-effect transistor (FET) based synchronous rectifier for emula...
- Patent number 11,942,930
- Issue date Mar 26, 2024
- Steifpower Technology Company Limited
- Domenico Lo Verde
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capacitor networks for harmonic control in power devices
- Patent number 11,929,317
- Issue date Mar 12, 2024
- MACOM Technology Solutions Holdings, Inc.
- Prity Kirit Patel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MOSFET device of silicon carbide having an integrated diode and man...
- Patent number 11,916,066
- Issue date Feb 27, 2024
- STMicroelectronics S.r.l.
- Mario Giuseppe Saggio
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High reliability polysilicon components
- Patent number 11,916,067
- Issue date Feb 27, 2024
- Texas Instruments Incorporated
- Robert M. Higgins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Type III-V semiconductor substrate with monolithically integrated c...
- Patent number 11,916,068
- Issue date Feb 27, 2024
- Infineon Technologies Austria AG
- Hyeongnam Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for operating semiconductor device
- Patent number 11,916,065
- Issue date Feb 27, 2024
- Semiconductor Energy Laboratory Co., Ltd.
- Kei Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and semiconductor module
- Patent number 11,916,069
- Issue date Feb 27, 2024
- Rohm Co., Ltd.
- Yuki Nakano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor super-junction power device
- Patent number 11,908,889
- Issue date Feb 20, 2024
- SUZHOU ORIENTAL SEMICONDUCTOR CO., LTD.
- Yi Gong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MOS transistor isolated from the substrate of an integrated circuit...
- Patent number 11,906,332
- Issue date Feb 20, 2024
- STMicroelectronics (Rousset) SAS
- Pascal Fornara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 11,901,444
- Issue date Feb 13, 2024
- Mitsubishi Electric Corporation
- Ryu Kamibaba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device structure with resistive element
- Patent number 11,901,289
- Issue date Feb 13, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Wan-Te Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having a main transistor, a sense transistor,...
- Patent number 11,901,355
- Issue date Feb 13, 2024
- Infineon Technologies Austria AG
- Gerhard Noebauer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capacitor integrated in FinFET device and method for fabricating th...
- Patent number 11,887,983
- Issue date Jan 30, 2024
- Shanghai Huali Integrated Circuit Corporation
- Rui Pan
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
VOLTAGE REGULATOR CIRCUIT
- Publication number 20240136351
- Publication date Apr 25, 2024
- STMicroelectronics (Rousset) SAS
- Loic BOURGUINE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THREE-TERMINAL BIDIRECTIONAL ENHANCEMENT MODE GaN SWITCH
- Publication number 20240136408
- Publication date Apr 25, 2024
- Efficient Power Conversion Corporation
- Jianjun Cao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20240136352
- Publication date Apr 25, 2024
- RENESAS ELECTRONICS CORPORATION
- Natsumi IKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Devices and Methods for Improving Voltage Handling and/or Bi-Direct...
- Publication number 20240128968
- Publication date Apr 18, 2024
- pSemi Corporation
- Tero Tapio Ranta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SHALLOW TRENCH ISOLATION (STI) PROCESSING WITH LOCAL OXIDATION OF S...
- Publication number 20240112947
- Publication date Apr 4, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Scott Kelly Montgomery
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THIN FILM RESISTOR MISMATCH IMPROVEMENT USING A SELF-ALIGNED DOUBLE...
- Publication number 20240113156
- Publication date Apr 4, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Scott William JESSEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC DEVICE AND TEMPERATURE DETECTION DEVICE THEREOF
- Publication number 20240113512
- Publication date Apr 4, 2024
- LEAP Semiconductor Corp.
- Wei-Fan Chen
- G01 - MEASURING TESTING
Information Patent Application
CAPACITOR STRUCTURE EMBEDDED WITHIN SOURCE OR DRAIN REGION
- Publication number 20240113101
- Publication date Apr 4, 2024
- Intel Corporation
- Sourav Dutta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT PROTECTION DEVICE AND METHOD
- Publication number 20240113099
- Publication date Apr 4, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Lin HSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BURIED TRENCH CAPACITOR
- Publication number 20240113102
- Publication date Apr 4, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Umamaheswari Aghoram
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIELD EFFECT TRANSISTOR WITH INTEGRATED SERIES CAPACITANCE
- Publication number 20240105712
- Publication date Mar 28, 2024
- Wolfspeed, Inc.
- Jeremy Fisher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POWER SEMICONDUCTOR DEVICE, MEASUREMENT SYSTEM AND METHOD FOR DETER...
- Publication number 20240105837
- Publication date Mar 28, 2024
- INFINEON TECHNOLOGIES AG
- Ingo Dirnstorfer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20240105834
- Publication date Mar 28, 2024
- Rohm Co., Ltd.
- Hajime OKUDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIODES IN NANOSHEET TECHNOLOGY
- Publication number 20240096949
- Publication date Mar 21, 2024
- International Business Machines Corporation
- Ruilong Xie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20240096878
- Publication date Mar 21, 2024
- INNOSCIENCE (SUZHOU) TECHNOLOGY CO., LTD.
- Danfeng MAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20240096877
- Publication date Mar 21, 2024
- KIOXIA Corporation
- Yuya OMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20240096876
- Publication date Mar 21, 2024
- Kabushiki Kaisha Toshiba
- Takahiro NAKAGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20240088886
- Publication date Mar 14, 2024
- Rohm Co., Ltd.
- Makoto SADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20240088138
- Publication date Mar 14, 2024
- Infineon Technologies Austria AG
- Hyeongnam Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND CIRCUIT TO ISOLATE BODY CAPACITANCE IN SEMICONDUCTOR DEV...
- Publication number 20240088842
- Publication date Mar 14, 2024
- Taiwan Semiconductor Manufacturing Co., LTD
- Garming LIANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POLYSILICON RESISTOR STRUCTURES
- Publication number 20240088139
- Publication date Mar 14, 2024
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY , LTD.
- Meng-Han LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED RESISTOR
- Publication number 20240088201
- Publication date Mar 14, 2024
- MICROCHIP TECHNOLOGY INCORPORATED
- Yaojian Leng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMBER, TRANSISTOR DEVICES, POWER DEVICES, AND METHOD FOR MANUFACTU...
- Publication number 20240079233
- Publication date Mar 7, 2024
- Huawei Technologies Co., Ltd
- Gilberto Curatola
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integration of Nanosheets with Bottom Dielectric Isolation and Idea...
- Publication number 20240072041
- Publication date Feb 29, 2024
- International Business Machines Corporation
- Andrew Gaul
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSISTOR CIRCUITS INCLUDING FRINGELESS TRANSISTORS AND METHOD OF...
- Publication number 20240072042
- Publication date Feb 29, 2024
- SANDISK TECHNOLOGIES LLC
- Hokuto KODATE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND ELECTRONIC DEVICE
- Publication number 20240063216
- Publication date Feb 22, 2024
- INFINEON TECHNOLOGIES AG
- Digvijay Raghunathan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NANOSHEET DEVICES AND METHODS OF FABRICATING THE SAME
- Publication number 20240055424
- Publication date Feb 15, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Chung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POWER IC
- Publication number 20240048052
- Publication date Feb 8, 2024
- Rohm Co., Ltd.
- Satoru NATE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING A SEMICONDUCTOR DE...
- Publication number 20240047379
- Publication date Feb 8, 2024
- Infineon Technologies Austria AG
- Norbert Labrenz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SENSE AMPLIFIER FOR COUPLING EFFECT REDUCTION
- Publication number 20240038281
- Publication date Feb 1, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ku-Feng Lin
- G11 - INFORMATION STORAGE

in combination with diodes, or resistors, or capacitors

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Current detection circuit and garbage can

Electrostatic discharge protection circuit and semiconductor circuit

High electron mobility transistor and method for fabricating the same

Semiconductor device

Silicide-sandwiched source/drain region and method of fabricating same

Super CMOS devices on a microelectronics system

Manufacturable thin film gallium and nitrogen containing devices

Resistor with doped regions and semiconductor devices having the same

Semiconductor device

Power semiconductor device with an auxiliary gate structure

Integrated circuit comprising a three-dimensional capacitor

Fin field effect transistor (FinFet) device structure and method fo...

Semiconductor device

Manufacturable thin film gallium and nitrogen containing devices

Semiconductor die and method of manufacturing the same

Semiconductor device

Semiconductor device structures and methods of manufacturing the same

Field-effect transistor (FET) based synchronous rectifier for emula...

Capacitor networks for harmonic control in power devices

MOSFET device of silicon carbide having an integrated diode and man...

High reliability polysilicon components

Type III-V semiconductor substrate with monolithically integrated c...

Semiconductor device and method for operating semiconductor device

Semiconductor device and semiconductor module

Semiconductor super-junction power device

MOS transistor isolated from the substrate of an integrated circuit...

Method for manufacturing semiconductor device

Semiconductor device structure with resistive element

Semiconductor device having a main transistor, a sense transistor,...

Capacitor integrated in FinFET device and method for fabricating th...

Patents Applicationslast 30 patents

VOLTAGE REGULATOR CIRCUIT

THREE-TERMINAL BIDIRECTIONAL ENHANCEMENT MODE GaN SWITCH

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

Devices and Methods for Improving Voltage Handling and/or Bi-Direct...

SHALLOW TRENCH ISOLATION (STI) PROCESSING WITH LOCAL OXIDATION OF S...

THIN FILM RESISTOR MISMATCH IMPROVEMENT USING A SELF-ALIGNED DOUBLE...

ELECTRONIC DEVICE AND TEMPERATURE DETECTION DEVICE THEREOF

CAPACITOR STRUCTURE EMBEDDED WITHIN SOURCE OR DRAIN REGION

INTEGRATED CIRCUIT PROTECTION DEVICE AND METHOD

BURIED TRENCH CAPACITOR

FIELD EFFECT TRANSISTOR WITH INTEGRATED SERIES CAPACITANCE

POWER SEMICONDUCTOR DEVICE, MEASUREMENT SYSTEM AND METHOD FOR DETER...

SEMICONDUCTOR DEVICE

DIODES IN NANOSHEET TECHNOLOGY

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE

METHOD AND CIRCUIT TO ISOLATE BODY CAPACITANCE IN SEMICONDUCTOR DEV...

POLYSILICON RESISTOR STRUCTURES

INTEGRATED RESISTOR

MEMBER, TRANSISTOR DEVICES, POWER DEVICES, AND METHOD FOR MANUFACTU...

Integration of Nanosheets with Bottom Dielectric Isolation and Idea...

TRANSISTOR CIRCUITS INCLUDING FRINGELESS TRANSISTORS AND METHOD OF...

SEMICONDUCTOR DEVICE AND ELECTRONIC DEVICE

NANOSHEET DEVICES AND METHODS OF FABRICATING THE SAME

POWER IC

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING A SEMICONDUCTOR DE...

SENSE AMPLIFIER FOR COUPLING EFFECT REDUCTION