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G01R13/0209
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R13/00
Arrangements for displaying electric variables or waveforms
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G01R13/0209
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Patents Grants
last 30 patents
Information
Patent Grant
Digital oscilloscope having fractional calculus operation and displ...
Patent number
11,994,536
Issue date
May 28, 2024
University of Electronic Science and Technology of China
Bo Xu
G01 - MEASURING TESTING
Information
Patent Grant
Control valve
Patent number
11,313,890
Issue date
Apr 26, 2022
SAMSOON AG
Christian Mellinger
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Grant
Method for performing a bus autoset function and measurement device
Patent number
10,991,341
Issue date
Apr 27, 2021
Rohde & Schwarz GmbH & Co. KG
Philip Diegmann
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Oscilloscope persistence for digital bus signals
Patent number
10,983,146
Issue date
Apr 20, 2021
Tektronix, Inc.
Kevin C. Spisak
G01 - MEASURING TESTING
Information
Patent Grant
Sensor hub and method for operating the same
Patent number
10,816,521
Issue date
Oct 27, 2020
LG Electronics Inc.
Sungyong Sohn
G01 - MEASURING TESTING
Information
Patent Grant
Voltage measurement and wireless communication system
Patent number
10,613,119
Issue date
Apr 7, 2020
Hubbell Incorporated
Michael David Carson
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Direct current digital voltage display and polarity circuit tester
Patent number
9,970,965
Issue date
May 15, 2018
Lisle Corporation
Michael L. Whitehead
G01 - MEASURING TESTING
Information
Patent Grant
Analysis method for signal time margin
Patent number
9,188,608
Issue date
Nov 17, 2015
INVENTEC (PUDONG) TECHNOLOGY CORPORATION
Yen-Hao Chen
G01 - MEASURING TESTING
Information
Patent Grant
Simultaneous physical and protocol layer analysis
Patent number
7,965,764
Issue date
Jun 21, 2011
LeCroy Corporation
Roland Gamper
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Simultaneous physical and protocol layer analysis
Patent number
7,756,199
Issue date
Jul 13, 2010
LeCroy Corporation
Roland Gamper
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of compressing values of a monitored electrical power signal
Patent number
7,415,370
Issue date
Aug 19, 2008
ELSPEC Ltd.
Pol Nisenblat
G01 - MEASURING TESTING
Information
Patent Grant
Simultaneous physical and protocol layer analysis
Patent number
7,403,560
Issue date
Jul 22, 2008
LeCroy Corporation
Roland Gamper
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Diagnostic method for analyzing power consumption of electrical equ...
Patent number
7,216,058
Issue date
May 8, 2007
CIMX Corporation
Takahide Nakajima
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for monitoring power quality in an electric po...
Patent number
7,050,913
Issue date
May 23, 2006
Eaton Corporation
Roger W. Cox
G01 - MEASURING TESTING
Information
Patent Grant
Ancillary data distribution display
Patent number
6,025,848
Issue date
Feb 15, 2000
Tektronix, Inc.
Mark Hanley
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Electrical Testing Device with Probe Having Portions with Different...
Publication number
20240288471
Publication date
Aug 29, 2024
Snap-on Incorporated
Nicholas A. Gabbey
G01 - MEASURING TESTING
Information
Patent Application
DIGITAL OSCILLOSCOPE HAVING FRACTIONAL CALCULUS OPERATION AND DISPL...
Publication number
20220373577
Publication date
Nov 24, 2022
University of Electronic Science and Technology of China
Bo XU
G01 - MEASURING TESTING
Information
Patent Application
CONTROL VALVE
Publication number
20190086456
Publication date
Mar 21, 2019
SAMSON AG
Christian MELLINGER
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Application
SENSOR HUB AND METHOD FOR OPERATING THE SAME
Publication number
20180188218
Publication date
Jul 5, 2018
LG Electronics, Inc.
Sungyong Sohn
G01 - MEASURING TESTING
Information
Patent Application
ANALYSIS METHOD FOR SIGNAL TIME MARGIN
Publication number
20140117973
Publication date
May 1, 2014
Inventec Corporation
Yen-Hao Chen
G01 - MEASURING TESTING
Information
Patent Application
SIMULTANEOUS PHYSICAL AND PROTOCOL LAYER ANALYSIS
Publication number
20100141657
Publication date
Jun 10, 2010
Roland Gamper
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SIMULTANEOUS PHYSICAL AND PROTOCOL LAYER ANALYSIS
Publication number
20080255784
Publication date
Oct 16, 2008
Roland Gamper
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Diagnostic method for analyzing power consumption of electrical equ...
Publication number
20060229847
Publication date
Oct 12, 2006
Takahide Nakajima
G01 - MEASURING TESTING
Information
Patent Application
Power quality monitoring
Publication number
20060212238
Publication date
Sep 21, 2006
Pol Nisenblat
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for monitoring power quality in an electric po...
Publication number
20050187725
Publication date
Aug 25, 2005
Roger W. Cox
G01 - MEASURING TESTING
Information
Patent Application
Simultaneous physical and protocol layer analysis
Publication number
20050175079
Publication date
Aug 11, 2005
Roland Gamper
G06 - COMPUTING CALCULATING COUNTING