in sense amplifiers

Industry

CPC
G11C29/026

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Parent Industries

GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

Current Industry

G11C29/026in sense amplifiers

Industries

Patents Grantslast 30 patents

Information Patent Grant
Method for obtaining circuit noise parameters and electronic device
- Patent number 12,087,385
- Issue date Sep 10, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Kang Zhao
- G11 - INFORMATION STORAGE
Information Patent Grant
Multi-level cell data encoding
- Patent number 12,057,182
- Issue date Aug 6, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Win-San Khwa
- G11 - INFORMATION STORAGE
Information Patent Grant
Concurrent compensation in a memory system
- Patent number 11,942,171
- Issue date Mar 26, 2024
- Micron Technology, Inc.
- Harish V. Gadamsetty
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for determining mismatch of sense amplifier, s...
- Patent number 11,928,355
- Issue date Mar 12, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Jian Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory with error checking and correcting unit
- Patent number 11,894,089
- Issue date Feb 6, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Weibing Shang
- G11 - INFORMATION STORAGE
Information Patent Grant
Storage device
- Patent number 11,869,610
- Issue date Jan 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Jia Wang
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device and method of operating the memory device
- Patent number 11,462,285
- Issue date Oct 4, 2022
- SK hynix Inc.
- Sungmook Lim
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory and operation method of memory
- Patent number 11,462,286
- Issue date Oct 4, 2022
- SK Hynix Inc.
- Munseon Jang
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device with improved sensing structure
- Patent number 11,367,497
- Issue date Jun 21, 2022
- Micron Technology, Inc.
- Alberto Troia
- G11 - INFORMATION STORAGE
Information Patent Grant
Determining bias configuration for write operations in memory to im...
- Patent number 10,923,170
- Issue date Feb 16, 2021
- EVERSPIN TECHNOLOGIES, INC.
- Jason Janesky
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor devices
- Patent number 10,748,590
- Issue date Aug 18, 2020
- SK hynix Inc.
- Kibong Koo
- G11 - INFORMATION STORAGE
Information Patent Grant
Current behavior of elements
- Patent number 10,734,074
- Issue date Aug 4, 2020
- Hewlett Packard Enterprise Development LP
- Brent Buchanan
- G11 - INFORMATION STORAGE
Information Patent Grant
Self testing circuit for power optimization
- Patent number 10,725,104
- Issue date Jul 28, 2020
- SanDisk Technologies LLC
- Amandeep Kaur
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory device with control and test circuit, and method for test re...
- Patent number 10,566,034
- Issue date Feb 18, 2020
- Winbond Electronics Corp.
- Yuji Nakaoka
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuit block, variable resistance memory device including the...
- Patent number 10,553,644
- Issue date Feb 4, 2020
- SK hynix Inc.
- Seok Joon Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device for initializing memory cells
- Patent number 10,553,267
- Issue date Feb 4, 2020
- SK hynix Inc.
- Kibong Koo
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods for calibrating sense amplifiers in a semic...
- Patent number 10,529,389
- Issue date Jan 7, 2020
- Micron Technology, Inc.
- Stefan Frederik Schippers
- G11 - INFORMATION STORAGE
Information Patent Grant
Differential circuit and operational amplifier
- Patent number 10,396,729
- Issue date Aug 27, 2019
- Fuji Electric Co., Ltd.
- Motomitsu Iwamoto
- G05 - CONTROLLING REGULATING
Information Patent Grant
Circuit and method for monitoring correlated electron switches
- Patent number 10,354,727
- Issue date Jul 16, 2019
- ARM Ltd.
- Bal S. Sandhu
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory with bit line short circuit detection and masking of groups...
- Patent number 10,269,444
- Issue date Apr 23, 2019
- SanDisk Technologies LLC
- Anurag Nigam
- G11 - INFORMATION STORAGE
Information Patent Grant
Process variation compensation with correlated electron switch devices
- Patent number 10,267,831
- Issue date Apr 23, 2019
- ARM Ltd.
- Vikas Chandra
- G11 - INFORMATION STORAGE
Information Patent Grant
Determining bias configuration for write operations in memory to im...
- Patent number 10,262,713
- Issue date Apr 16, 2019
- EVERSPIN TECHNOLOGIES, INC.
- Jason Janesky
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device
- Patent number 10,141,070
- Issue date Nov 27, 2018
- SK hynix Inc.
- Jong Seok Han
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory system of optimal read reference voltage and operating metho...
- Patent number 10,120,585
- Issue date Nov 6, 2018
- SK Hynix Inc.
- Chenrong Xiong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory and reference circuit calibration method thereof
- Patent number 10,008,246
- Issue date Jun 26, 2018
- Semiconductor Manufacturing International (Shanghai) Corporation
- Yao Zhou
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit and method for monitoring correlated electron switches
- Patent number 9,979,385
- Issue date May 22, 2018
- ARM Ltd.
- Bal S. Sandhu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Timed sense amplifier circuits and methods in a semiconductor memory
- Patent number 9,959,912
- Issue date May 1, 2018
- QUALCOMM Incorporated
- Chulmin Jung
- G11 - INFORMATION STORAGE
Information Patent Grant
Leakage current detection device and nonvolatile memory device havi...
- Patent number 9,903,901
- Issue date Feb 27, 2018
- Samsung Electronics Co., Ltd.
- Byung-Gil Jeon
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device and correction method
- Patent number 9,904,593
- Issue date Feb 27, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chia-Fu Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic window to improve NAND endurance
- Patent number 9,857,992
- Issue date Jan 2, 2018
- Intel Corporation
- Kiran Pangal
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
MULTI-LEVEL CELL DATA ENCODING
- Publication number 20240363184
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Win-San KHWA
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICES PROVIDING TEST MODE RELATED TO RELIABILITY
- Publication number 20240282350
- Publication date Aug 22, 2024
- SK HYNIX INC.
- Yun Suk HONG
- G11 - INFORMATION STORAGE
Information Patent Application
LATCH TYPE SENSE AMPLIFIER FOR TESTING
- Publication number 20240242772
- Publication date Jul 18, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hua-Hsin Yu
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY WITH ERROR CHECKING AND CORRECTING UNIT
- Publication number 20240145022
- Publication date May 2, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Weibing SHANG
- G11 - INFORMATION STORAGE
Information Patent Application
AGING MONITORING CIRCUIT OF SEMICONDUCTOR MEMORY DEVICE
- Publication number 20240021257
- Publication date Jan 18, 2024
- FIDELIX CO., LTD.
- Jae Jin LEE
- G11 - INFORMATION STORAGE
Information Patent Application
CONCURRENT COMPENSATION IN A MEMORY SYSTEM
- Publication number 20230207033
- Publication date Jun 29, 2023
- Micron Technology, Inc.
- Harish V. Gadamsetty
- G11 - INFORMATION STORAGE
Information Patent Application
MULTI-LEVEL CELL DATA ENCODING
- Publication number 20230037044
- Publication date Feb 2, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Win-San KHWA
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR OBTAINING CIRCUIT NOISE PARAMETERS AND ELECTRONIC DEVICE
- Publication number 20230013029
- Publication date Jan 19, 2023
- Changxin Memory Technologies, Inc.
- Kang ZHAO
- G11 - INFORMATION STORAGE
Information Patent Application
STORAGE DEVICE
- Publication number 20220383971
- Publication date Dec 1, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Jia WANG
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY APPARATUS AND MEMORY TESTING METHOD THEREOF
- Publication number 20220215893
- Publication date Jul 7, 2022
- WINBOND ELECTRONICS CORP.
- Chih-Tung Tang
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY
- Publication number 20220093201
- Publication date Mar 24, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Weibing SHANG
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE AND METHOD OF OPERATING THE MEMORY DEVICE
- Publication number 20220084612
- Publication date Mar 17, 2022
- SK HYNIX INC.
- Sungmook LIM
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY AND OPERATION METHOD OF MEMORY
- Publication number 20210398600
- Publication date Dec 23, 2021
- SK HYNIX INC.
- Munseon JANG
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE WITH IMPROVED SENSING STRUCTURE
- Publication number 20210287757
- Publication date Sep 16, 2021
- Micron Technology, Inc.
- Alberto Troia
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICES
- Publication number 20200058337
- Publication date Feb 20, 2020
- SK HYNIX INC.
- Kibong KOO
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE WITH CONTROL AND TEST CIRCUIT, AND METHOD FOR TEST RE...
- Publication number 20200035272
- Publication date Jan 30, 2020
- WINBOND ELECTRONICS CORP.
- Yuji Nakaoka
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR CALIBRATING SENSE AMPLIFIERS IN A SEMIC...
- Publication number 20190244642
- Publication date Aug 8, 2019
- Micron Technology, Inc.
- Stefan Frederik Schippers
- G11 - INFORMATION STORAGE
Information Patent Application
DETERMINING BIAS CONFIGURATION FOR WRITE OPERATIONS IN MEMORY TO IM...
- Publication number 20190214070
- Publication date Jul 11, 2019
- EVERSPIN TECHNOLOGIES, INC.
- Jason JANESKY
- G11 - INFORMATION STORAGE
Information Patent Application
SELF TESTING CIRCUIT FOR POWER OPTIMIZATION
- Publication number 20190195948
- Publication date Jun 27, 2019
- SanDisk Technologies LLC
- Amandeep Kaur
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICES
- Publication number 20190043546
- Publication date Feb 7, 2019
- SK HYNIX INC.
- Kibong KOO
- G11 - INFORMATION STORAGE
Information Patent Application
CURRENT BEHAVIOR OF ELEMENTS
- Publication number 20180342293
- Publication date Nov 29, 2018
- HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
- Brent Buchanan
- G11 - INFORMATION STORAGE
Information Patent Application
DYNAMIC WINDOW TO IMPROVE NAND ENDURANCE
- Publication number 20180196612
- Publication date Jul 12, 2018
- Intel Corporation
- Kiran Pangal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Memory System of Optimal Read Reference Voltage and Operating Metho...
- Publication number 20180046373
- Publication date Feb 15, 2018
- SK HYNIX MEMORY SOLUTIONS INC.
- Chenrong XIONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20180040383
- Publication date Feb 8, 2018
- SK HYNIX INC.
- Jong Seok HAN
- G11 - INFORMATION STORAGE
Information Patent Application
Read Retry For Non-Volatile Memories
- Publication number 20160093396
- Publication date Mar 31, 2016
- SEAGATE TECHNOLOGY LLC
- AbdelHakim S Alhussien
- G11 - INFORMATION STORAGE
Information Patent Application
VARIABLE READ DELAY SYSTEM
- Publication number 20150318057
- Publication date Nov 5, 2015
- QUALCOMM Incorporated
- Jung Pill KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONFIGURING STORAGE CELLS
- Publication number 20140369118
- Publication date Dec 18, 2014
- John Strasser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
READ BIAS MANAGEMENT TO REDUCE READ ERRORS FOR PHASE CHANGE MEMORY
- Publication number 20140325314
- Publication date Oct 30, 2014
- Micron Technology, Inc.
- Ferdinando Bedeschi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR OPTIMIZING LOG LIKELIHOOD RATIO (LLR) USED FO...
- Publication number 20140281771
- Publication date Sep 18, 2014
- Samsung Electronics Co., Ltd.
- SANG-YONG YOON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR SENSE AMPLIFYING
- Publication number 20140185400
- Publication date Jul 3, 2014
- Taiwan Semiconductor Manufacturing Co., LTD
- Caleb Yu-Sheng CHO
- G11 - INFORMATION STORAGE

in sense amplifiers

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for obtaining circuit noise parameters and electronic device

Multi-level cell data encoding

Concurrent compensation in a memory system

Method and apparatus for determining mismatch of sense amplifier, s...

Memory with error checking and correcting unit

Storage device

Memory device and method of operating the memory device

Memory and operation method of memory

Memory device with improved sensing structure

Determining bias configuration for write operations in memory to im...

Semiconductor devices

Current behavior of elements

Self testing circuit for power optimization

Memory device with control and test circuit, and method for test re...

Test circuit block, variable resistance memory device including the...

Semiconductor device for initializing memory cells

Apparatuses and methods for calibrating sense amplifiers in a semic...

Differential circuit and operational amplifier

Circuit and method for monitoring correlated electron switches

Memory with bit line short circuit detection and masking of groups...

Process variation compensation with correlated electron switch devices

Determining bias configuration for write operations in memory to im...

Semiconductor device

Memory system of optimal read reference voltage and operating metho...

Memory and reference circuit calibration method thereof

Circuit and method for monitoring correlated electron switches

Timed sense amplifier circuits and methods in a semiconductor memory

Leakage current detection device and nonvolatile memory device havi...

Memory device and correction method

Dynamic window to improve NAND endurance

Patents Applicationslast 30 patents

MULTI-LEVEL CELL DATA ENCODING

SEMICONDUCTOR DEVICES PROVIDING TEST MODE RELATED TO RELIABILITY

LATCH TYPE SENSE AMPLIFIER FOR TESTING

MEMORY WITH ERROR CHECKING AND CORRECTING UNIT

AGING MONITORING CIRCUIT OF SEMICONDUCTOR MEMORY DEVICE

CONCURRENT COMPENSATION IN A MEMORY SYSTEM

MULTI-LEVEL CELL DATA ENCODING

METHOD FOR OBTAINING CIRCUIT NOISE PARAMETERS AND ELECTRONIC DEVICE

STORAGE DEVICE

MEMORY APPARATUS AND MEMORY TESTING METHOD THEREOF

MEMORY

MEMORY DEVICE AND METHOD OF OPERATING THE MEMORY DEVICE

MEMORY AND OPERATION METHOD OF MEMORY

MEMORY DEVICE WITH IMPROVED SENSING STRUCTURE

SEMICONDUCTOR DEVICES

MEMORY DEVICE WITH CONTROL AND TEST CIRCUIT, AND METHOD FOR TEST RE...

APPARATUSES AND METHODS FOR CALIBRATING SENSE AMPLIFIERS IN A SEMIC...

DETERMINING BIAS CONFIGURATION FOR WRITE OPERATIONS IN MEMORY TO IM...

SELF TESTING CIRCUIT FOR POWER OPTIMIZATION

SEMICONDUCTOR DEVICES

CURRENT BEHAVIOR OF ELEMENTS

DYNAMIC WINDOW TO IMPROVE NAND ENDURANCE

Memory System of Optimal Read Reference Voltage and Operating Metho...

SEMICONDUCTOR DEVICE

Read Retry For Non-Volatile Memories

VARIABLE READ DELAY SYSTEM

CONFIGURING STORAGE CELLS

READ BIAS MANAGEMENT TO REDUCE READ ERRORS FOR PHASE CHANGE MEMORY

METHOD AND DEVICE FOR OPTIMIZING LOG LIKELIHOOD RATIO (LLR) USED FO...

APPARATUS AND METHOD FOR SENSE AMPLIFYING