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GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor memory device detecting defect, and operating method...
- Patent number 12,100,463
- Issue date Sep 24, 2024
- Samsung Electronics Co., Ltd.
- Bongkil Jung
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and methods for detecting and configuring lanes in a circui...
- Patent number 12,087,381
- Issue date Sep 10, 2024
- Altera Corporation
- Marian Cretu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory, chip, and method for storing repair information of memory
- Patent number 12,087,380
- Issue date Sep 10, 2024
- Huawei Technologies Co., Ltd.
- Bingwu Ji
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for obtaining circuit noise parameters and electronic device
- Patent number 12,087,385
- Issue date Sep 10, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Kang Zhao
- G11 - INFORMATION STORAGE
Information Patent Grant
Nonvolatile memory including on-die-termination circuit and storage...
- Patent number 12,073,898
- Issue date Aug 27, 2024
- Samsung Electronics Co., Ltd.
- Eun-Ji Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
On-die termination of address and command signals
- Patent number 12,002,540
- Issue date Jun 4, 2024
- RAMBUS INC.
- Ian Shaeffer
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods for zone-based soft post-package repair
- Patent number 11,984,185
- Issue date May 14, 2024
- Micron Technology, Inc.
- Alan J. Wilson
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory array test structure and method of forming the same
- Patent number 11,935,624
- Issue date Mar 19, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Meng-Han Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods for calibrating adjustable impedances of a...
- Patent number 11,916,527
- Issue date Feb 27, 2024
- Dean Gans
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory testing techniques
- Patent number 11,862,271
- Issue date Jan 2, 2024
- ARM Limited
- Andy Wangkun Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Leakage detection circuit, nonvolatile memory device including leak...
- Patent number 11,791,007
- Issue date Oct 17, 2023
- SK hynix Inc.
- Byoung Sung You
- G11 - INFORMATION STORAGE
Information Patent Grant
Nonvolatile memory including on-die-termination circuit and storage...
- Patent number 11,742,040
- Issue date Aug 29, 2023
- Samsung Electronics Co., Ltd.
- Eun-Ji Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses for characterizing system channels and associated metho...
- Patent number 11,728,001
- Issue date Aug 15, 2023
- Micron Technology, Inc.
- Markus H. Geiger
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device
- Patent number 11,726,895
- Issue date Aug 15, 2023
- Kioxia Corporation
- Masashi Niimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Word line control method, word line control circuit device and semi...
- Patent number 11,693,584
- Issue date Jul 4, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Liang Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
On-die termination of address and command signals
- Patent number 11,688,441
- Issue date Jun 27, 2023
- RAMBUS INC.
- Ian Shaeffer
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory array test structure and method of forming the same
- Patent number 11,657,863
- Issue date May 23, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Meng-Han Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus for performing a repair operation
- Patent number 11,621,047
- Issue date Apr 4, 2023
- SK hynix Inc.
- Jeong Jun Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus of integrating memory stacks
- Patent number 11,604,754
- Issue date Mar 14, 2023
- Advanced Micro Devices, Inc.
- Dmitri Yudanov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing through-silicon-vias
- Patent number 11,600,349
- Issue date Mar 7, 2023
- RAMBUS INC.
- Thomas Vogelsang
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory system and method
- Patent number 11,581,052
- Issue date Feb 14, 2023
- Kioxia Corporation
- Akiyoshi Hashimoto
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory test circuit and device wafer
- Patent number 11,557,360
- Issue date Jan 17, 2023
- NANYA TECHNOLOGY CORPORATION
- Yan-De Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Communication channel calibration for drift conditions
- Patent number 11,552,748
- Issue date Jan 10, 2023
- RAMBUS INC.
- Frederick A. Ware
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Noise injection for power noise susceptibility test for memory systems
- Patent number 11,538,543
- Issue date Dec 27, 2022
- SK Hynix Inc.
- Xiaofang Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit and associated chip
- Patent number 11,508,452
- Issue date Nov 22, 2022
- Realtek Semiconductor Corporation
- Sheng-Lin Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods for calibrating adjustable impedances of a...
- Patent number 11,482,989
- Issue date Oct 25, 2022
- Micron Technology, Inc.
- Dean Gans
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor chips including through electrodes and methods of tes...
- Patent number 11,476,169
- Issue date Oct 18, 2022
- SK hynix Inc.
- Sun Myung Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
On-die termination of address and command signals
- Patent number 11,468,928
- Issue date Oct 11, 2022
- RAMBUS INC.
- Ian Shaeffer
- G11 - INFORMATION STORAGE
Information Patent Grant
Nonvolatile memory device, memory system including the same and met...
- Patent number RE49206
- Issue date Sep 6, 2022
- Samsung Electronics Co., Ltd.
- Dae-Woon Kang
Information Patent Grant
Runtime identification of bad memory cells based on difference betw...
- Patent number 11,404,135
- Issue date Aug 2, 2022
- Amazon Technologies, Inc.
- Jonathan Parker
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE PROVIDING A TEST MODE RELATED TO DETECTING A D...
- Publication number 20240404614
- Publication date Dec 5, 2024
- SK HYNIX INC.
- Byeong Cheol LEE
- G11 - INFORMATION STORAGE
Information Patent Application
NONVOLATILE MEMORY INCLUDING ON-DIE-TERMINATION CIRCUIT AND STORAGE...
- Publication number 20240371457
- Publication date Nov 7, 2024
- Samsung Electronics Co., Ltd.
- Eun-Ji Kim
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR CALIBRATING ADJUSTABLE IMPEDANCES OF A...
- Publication number 20240223160
- Publication date Jul 4, 2024
- Lodestar Licensing Group LLC
- Dean Gans
- G11 - INFORMATION STORAGE
Information Patent Application
REPAIR TECHNIQUES FOR COUPLED MEMORY DIES
- Publication number 20240194287
- Publication date Jun 13, 2024
- Micron Technology, Inc.
- James Brian Johnson
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY ARRAY TEST STRUCTURE AND METHOD OF FORMING THE SAME
- Publication number 20240194234
- Publication date Jun 13, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Meng-Han Lin
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR CALIBRATING ADJUSTABLE IMPEDANCES OF A...
- Publication number 20240154605
- Publication date May 9, 2024
- Lodestar Licensing Group LLC
- Dean Gans
- G11 - INFORMATION STORAGE
Information Patent Application
Memory Testing Techniques
- Publication number 20240136006
- Publication date Apr 25, 2024
- ARM Limited
- Andy Wangkun Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
On-Die Termination of Address and Command Signals
- Publication number 20240105242
- Publication date Mar 28, 2024
- Rambus Inc.
- Ian Shaeffer
- G11 - INFORMATION STORAGE
Information Patent Application
NONVOLATILE MEMORY INCLUDING ON-DIE-TERMINATION CIRCUIT AND STORAGE...
- Publication number 20240021259
- Publication date Jan 18, 2024
- Samsung Electronics Co., Ltd.
- Eun-Ji Kim
- G11 - INFORMATION STORAGE
Information Patent Application
Memory Array Test Structure and Method of Forming the Same
- Publication number 20230253022
- Publication date Aug 10, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Meng-Han Lin
- G11 - INFORMATION STORAGE
Information Patent Application
COMMUNICATION CHANNEL CALIBRATION FOR DRIFT CONDITIONS
- Publication number 20230224101
- Publication date Jul 13, 2023
- Rambus Inc.
- Frederick A. Ware
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR CALIBRATING ADJUSTABLE IMPEDANCES OF A...
- Publication number 20230137651
- Publication date May 4, 2023
- Micron Technology, Inc.
- Dean Gans
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE DETECTING DEFECT, AND OPERATING METHOD...
- Publication number 20230121078
- Publication date Apr 20, 2023
- Samsung Electronics Co., Ltd.
- Bongkil JUNG
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR SYSTEM AND WIRING DEFECT DETECTING METHOD
- Publication number 20230073181
- Publication date Mar 9, 2023
- KIOXIA Corporation
- Kouichirou INOUE
- G11 - INFORMATION STORAGE
Information Patent Application
LEAKAGE DETECTION CIRCUIT, NONVOLATILE MEMORY DEVICE INCLUDING LEAK...
- Publication number 20230060971
- Publication date Mar 2, 2023
- SK HYNIX INC.
- Byoung Sung YOU
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR OBTAINING CIRCUIT NOISE PARAMETERS AND ELECTRONIC DEVICE
- Publication number 20230013029
- Publication date Jan 19, 2023
- Changxin Memory Technologies, Inc.
- Kang ZHAO
- G11 - INFORMATION STORAGE
Information Patent Application
On-Die Termination of Address and Command Signals
- Publication number 20230016728
- Publication date Jan 19, 2023
- Rambus Inc.
- Ian Shaeffer
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY, CHIP, AND METHOD FOR STORING REPAIR INFORMATION OF MEMORY
- Publication number 20220406393
- Publication date Dec 22, 2022
- Huawei Technologies Co., Ltd
- Bingwu JI
- G11 - INFORMATION STORAGE
Information Patent Application
Memory Array Test Structure and Method of Forming the Same
- Publication number 20220406350
- Publication date Dec 22, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Meng-Han Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUSES AND METHODS FOR ZONE-BASED SOFT POST-PACKAGE REPAIR
- Publication number 20220328125
- Publication date Oct 13, 2022
- Micron Technology, Inc.
- Alan J. Wilson
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUS FOR PERFORMING A REPAIR OPERATION
- Publication number 20220301648
- Publication date Sep 22, 2022
- SK HYNIX INC.
- Jeong Jun LEE
- G11 - INFORMATION STORAGE
Information Patent Application
ERROR DETECTION PIN ENCODING SCHEME TO AVOID MAXIMUM TRANSITIONS AN...
- Publication number 20220262447
- Publication date Aug 18, 2022
- NVIDIA Corp.
- Sunil Sudhakaran
- G11 - INFORMATION STORAGE
Information Patent Application
NONVOLATILE MEMORY INCLUDING ON-DIE-TERMINATION CIRCUIT AND STORAGE...
- Publication number 20220215892
- Publication date Jul 7, 2022
- SAMSUNG ELECTRONICS CO., LTD.
- Eun-Ji Kim
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES FOR CHARACTERIZING SYSTEM CHANNELS AND ASSOCIATED METHO...
- Publication number 20220157396
- Publication date May 19, 2022
- Micron Technology, Inc.
- Markus H. Geiger
- G11 - INFORMATION STORAGE
Information Patent Application
CIRCUIT AND ASSOCIATED CHIP
- Publication number 20220130481
- Publication date Apr 28, 2022
- REALTEK SEMICONDUCTOR CORPORATION
- SHENG-LIN LIN
- G01 - MEASURING TESTING
Information Patent Application
COMMUNICATION CHANNEL CALIBRATION FOR DRIFT CONDITIONS
- Publication number 20220052802
- Publication date Feb 17, 2022
- Rambus Inc.
- Frederick A. Ware
- G11 - INFORMATION STORAGE
Information Patent Application
TEST CIRCUIT, MEMORY DEVICE, STORAGE DEVICE, AND METHOD OF OPERATIN...
- Publication number 20220051741
- Publication date Feb 17, 2022
- SK HYNIX INC.
- Sung Won CHOI
- G11 - INFORMATION STORAGE
Information Patent Application
NOISE INJECTION FOR POWER NOISE SUSCEPTIBILITY TEST FOR MEMORY SYSTEMS
- Publication number 20210304833
- Publication date Sep 30, 2021
- SK HYNIX INC.
- Xiaofang CHEN
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SYSTEM AND METHOD
- Publication number 20210295937
- Publication date Sep 23, 2021
- KIOXIA Corporation
- Akiyoshi HASHIMOTO
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR CHIPS INCLUDING THROUGH ELECTRODES AND METHODS OF TES...
- Publication number 20210287951
- Publication date Sep 16, 2021
- SK HYNIX INC.
- Sun Myung CHOI
- G11 - INFORMATION STORAGE

in signal lines

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Semiconductor memory device detecting defect, and operating method...

Systems and methods for detecting and configuring lanes in a circui...

Memory, chip, and method for storing repair information of memory

Method for obtaining circuit noise parameters and electronic device

Nonvolatile memory including on-die-termination circuit and storage...

On-die termination of address and command signals

Apparatuses and methods for zone-based soft post-package repair

Memory array test structure and method of forming the same

Apparatuses and methods for calibrating adjustable impedances of a...

Memory testing techniques

Leakage detection circuit, nonvolatile memory device including leak...

Nonvolatile memory including on-die-termination circuit and storage...

Apparatuses for characterizing system channels and associated metho...

Semiconductor device

Word line control method, word line control circuit device and semi...

On-die termination of address and command signals

Memory array test structure and method of forming the same

Apparatus for performing a repair operation

Method and apparatus of integrating memory stacks

Testing through-silicon-vias

Memory system and method

Memory test circuit and device wafer

Communication channel calibration for drift conditions

Noise injection for power noise susceptibility test for memory systems

Circuit and associated chip

Apparatuses and methods for calibrating adjustable impedances of a...

Semiconductor chips including through electrodes and methods of tes...

On-die termination of address and command signals

Nonvolatile memory device, memory system including the same and met...

Runtime identification of bad memory cells based on difference betw...

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE PROVIDING A TEST MODE RELATED TO DETECTING A D...

NONVOLATILE MEMORY INCLUDING ON-DIE-TERMINATION CIRCUIT AND STORAGE...

APPARATUSES AND METHODS FOR CALIBRATING ADJUSTABLE IMPEDANCES OF A...

REPAIR TECHNIQUES FOR COUPLED MEMORY DIES

MEMORY ARRAY TEST STRUCTURE AND METHOD OF FORMING THE SAME

APPARATUSES AND METHODS FOR CALIBRATING ADJUSTABLE IMPEDANCES OF A...

Memory Testing Techniques

On-Die Termination of Address and Command Signals

NONVOLATILE MEMORY INCLUDING ON-DIE-TERMINATION CIRCUIT AND STORAGE...

Memory Array Test Structure and Method of Forming the Same

COMMUNICATION CHANNEL CALIBRATION FOR DRIFT CONDITIONS

APPARATUSES AND METHODS FOR CALIBRATING ADJUSTABLE IMPEDANCES OF A...

SEMICONDUCTOR MEMORY DEVICE DETECTING DEFECT, AND OPERATING METHOD...

SEMICONDUCTOR SYSTEM AND WIRING DEFECT DETECTING METHOD

LEAKAGE DETECTION CIRCUIT, NONVOLATILE MEMORY DEVICE INCLUDING LEAK...

METHOD FOR OBTAINING CIRCUIT NOISE PARAMETERS AND ELECTRONIC DEVICE

On-Die Termination of Address and Command Signals

MEMORY, CHIP, AND METHOD FOR STORING REPAIR INFORMATION OF MEMORY

Memory Array Test Structure and Method of Forming the Same

APPARATUSES AND METHODS FOR ZONE-BASED SOFT POST-PACKAGE REPAIR

APPARATUS FOR PERFORMING A REPAIR OPERATION

ERROR DETECTION PIN ENCODING SCHEME TO AVOID MAXIMUM TRANSITIONS AN...

NONVOLATILE MEMORY INCLUDING ON-DIE-TERMINATION CIRCUIT AND STORAGE...

APPARATUSES FOR CHARACTERIZING SYSTEM CHANNELS AND ASSOCIATED METHO...

CIRCUIT AND ASSOCIATED CHIP

COMMUNICATION CHANNEL CALIBRATION FOR DRIFT CONDITIONS

TEST CIRCUIT, MEMORY DEVICE, STORAGE DEVICE, AND METHOD OF OPERATIN...

NOISE INJECTION FOR POWER NOISE SUSCEPTIBILITY TEST FOR MEMORY SYSTEMS

MEMORY SYSTEM AND METHOD

SEMICONDUCTOR CHIPS INCLUDING THROUGH ELECTRODES AND METHODS OF TES...