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Parent Industries

GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

Current Industry

G11C29/021in voltage or current generators

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Storage device with eye open monitoring (EOM) circuit and method to...
- Patent number 12,198,781
- Issue date Jan 14, 2025
- Samsung Electronics Co., Ltd.
- Hyunjoon Yoo
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device performing sensing operation and method of operating...
- Patent number 12,190,973
- Issue date Jan 7, 2025
- SK Hynix Inc.
- Se Chun Park
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic random access memory built-in self-test power fail mitigation
- Patent number 12,190,979
- Issue date Jan 7, 2025
- Intel Corporation
- Bill Nale
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data storage apparatus comprising cell section operable as dosimete...
- Patent number 12,183,410
- Issue date Dec 31, 2024
- ams International AG
- Tommaso Vincenzi
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for detecting margins of data signal and stora...
- Patent number 12,159,034
- Issue date Dec 3, 2024
- Huawei Technologies Co., Ltd.
- Yongyao Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory device and operation method thereof
- Patent number 12,154,616
- Issue date Nov 26, 2024
- Samsung Electronics Co., Ltd.
- Yoon-Joo Eom
- G11 - INFORMATION STORAGE
Information Patent Grant
Analog signals monitoring for functional safety
- Patent number 12,131,792
- Issue date Oct 29, 2024
- Infineon Technologies LLC
- Yoram Betser
- G11 - INFORMATION STORAGE
Information Patent Grant
Calibration of threshold voltage shift values
- Patent number 12,087,379
- Issue date Sep 10, 2024
- International Business Machines Corporation
- Radu Ioan Stoica
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of error correction code (ECC) decoding and memory system pe...
- Patent number 12,080,366
- Issue date Sep 3, 2024
- Samsung Electronics Co., Ltd.
- Kangseok Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Glitch detection redundancy
- Patent number 12,068,050
- Issue date Aug 20, 2024
- Micron Technology, Inc.
- Angelo Alberto Rovelli
- G11 - INFORMATION STORAGE
Information Patent Grant
Program and operating methods of nonvolatile memory device
- Patent number 12,020,761
- Issue date Jun 25, 2024
- Samsung Electronics Co., Ltd.
- Boh-Chang Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Techniques for determining an interface connection status
- Patent number 12,014,787
- Issue date Jun 18, 2024
- Micron Technology, Inc.
- Melissa I. Uribe
- G11 - INFORMATION STORAGE
Information Patent Grant
Program and operating methods of nonvolatile memory device
- Patent number 12,009,046
- Issue date Jun 11, 2024
- Samsung Electronics Co., Ltd.
- Boh-Chang Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory device with dynamic processing level calibration
- Patent number 12,001,286
- Issue date Jun 4, 2024
- Micron Technology, Inc.
- Larry J. Koudele
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection and isolation of faulty holdup capacitors using hardware...
- Patent number 11,977,750
- Issue date May 7, 2024
- Western Digital Technologies, Inc.
- Nagi Reddy Chodem
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Read voltage level correction method, memory storage device, and me...
- Patent number 11,972,139
- Issue date Apr 30, 2024
- Phison Electronics Corp.
- Shih-Jia Zeng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory device with dynamic program-verify voltage calibration
- Patent number 11,934,666
- Issue date Mar 19, 2024
- Micron Technology, Inc.
- Larry J. Koudele
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data storage device and method for power on reset and read error ha...
- Patent number 11,915,772
- Issue date Feb 27, 2024
- Western Digital Technologies, Inc.
- Vishal Sharma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory device and method for operating the same
- Patent number 11,915,750
- Issue date Feb 27, 2024
- Micron Technology, Inc.
- Marco Sforzin
- G11 - INFORMATION STORAGE
Information Patent Grant
Voltage detection for managed memory systems
- Patent number 11,915,771
- Issue date Feb 27, 2024
- Micron Technology, Inc.
- Yoav Weinberg
- G11 - INFORMATION STORAGE
Information Patent Grant
Page group read voltage threshold calibration
- Patent number 11,875,831
- Issue date Jan 16, 2024
- International Business Machines Corporation
- Roman Alexander Pletka
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for testing memory, medium and device
- Patent number 11,869,609
- Issue date Jan 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Xikun Chu
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory system including a semiconductor memory having a memory cell...
- Patent number 11,869,596
- Issue date Jan 9, 2024
- Kioxia Corporation
- Suguru Nishikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory device and operation method thereof
- Patent number 11,862,234
- Issue date Jan 2, 2024
- Samsung Electronics Co., Ltd.
- Yoon-Joo Eom
- G11 - INFORMATION STORAGE
Information Patent Grant
Chip detection method and chip detection apparatus
- Patent number 11,862,266
- Issue date Jan 2, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Jianbo Zhou
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory system and method of operating the same
- Patent number 11,836,366
- Issue date Dec 5, 2023
- SK Hynix Inc.
- Ju Ung Bae
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data integrity checks based on voltage distribution metrics
- Patent number 11,810,631
- Issue date Nov 7, 2023
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G11 - INFORMATION STORAGE
Information Patent Grant
Program and operating methods of nonvolatile memory device
- Patent number 11,804,279
- Issue date Oct 31, 2023
- Samsung Electronics Co., Ltd.
- Boh-Chang Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Periodic calibrations during memory device self refresh
- Patent number 11,790,976
- Issue date Oct 17, 2023
- Intel Corporation
- Christopher E. Cox
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Selective reading of memory with improved accuracy
- Patent number 11,789,796
- Issue date Oct 17, 2023
- OVONYX MEMORY TECHNOLOGY, LLC
- Wayne Kinney
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MEMORY DEVICE AND OPERATION METHOD THEREOF
- Publication number 20250022504
- Publication date Jan 16, 2025
- Samsung Electronics Co., Ltd.
- YOON-JOO EOM
- G11 - INFORMATION STORAGE
Information Patent Application
GLITCH DETECTION REDUNDANCY
- Publication number 20240412805
- Publication date Dec 12, 2024
- Micron Technology, Inc.
- Angelo Alberto Rovelli
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD OF ERROR CORRECTION CODE (ECC) DECODING AND MEMORY SYSTEM PE...
- Publication number 20240395352
- Publication date Nov 28, 2024
- Samsung Electronics Co., Ltd.
- Kangseok Lee
- G11 - INFORMATION STORAGE
Information Patent Application
FAILSAFE MEMORY CARD ARCHITECTURE USING VOLTAGE DRIVER OUTPUT ENABL...
- Publication number 20240347120
- Publication date Oct 17, 2024
- SANDISK TECHNOLOGIES LLC
- SHIV HARIT MATHUR
- G11 - INFORMATION STORAGE
Information Patent Application
START-UP CIRCUIT FOR BANDGAP REFERENCES IN A NAND FLASH
- Publication number 20240331787
- Publication date Oct 3, 2024
- Samsung Electronics Co., Ltd.
- Shubham Raj SINGH
- G11 - INFORMATION STORAGE
Information Patent Application
STORAGE DEVICE FOR SUPPORTING DYNAMIC ALLOCATION OF MEMORY AND METH...
- Publication number 20240331790
- Publication date Oct 3, 2024
- SK HYNIX INC.
- Tae Ho LIM
- G11 - INFORMATION STORAGE
Information Patent Application
Capacitor Health Check For Data Storage Devices
- Publication number 20240321373
- Publication date Sep 26, 2024
- Western Digital Technologies, Inc.
- Narasimhan Trichy
- G11 - INFORMATION STORAGE
Information Patent Application
TECHNIQUES FOR DETERMINING AN INTERFACE CONNECTION STATUS
- Publication number 20240296897
- Publication date Sep 5, 2024
- Micron Technology, Inc.
- Melissa I. Uribe
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE WITH DYNAMIC PROCESSING LEVEL CALIBRATION
- Publication number 20240289226
- Publication date Aug 29, 2024
- Micron Technology, Inc.
- Larry J. Koudele
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VOLTAGE DETECTION FOR MANAGED MEMORY SYSTEMS
- Publication number 20240274211
- Publication date Aug 15, 2024
- Micron Technology, Inc.
- Yoav Weinberg
- G11 - INFORMATION STORAGE
Information Patent Application
NON-VOLATILE MEMORY WITH SMART CONTROL OF OVERDRIVE VOLTAGE
- Publication number 20240233847
- Publication date Jul 11, 2024
- SANDISK TECHNOLOGIES LLC
- Yi Song
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE AND METHOD FOR OPERATING THE SAME
- Publication number 20240194258
- Publication date Jun 13, 2024
- Micron Technology, Inc.
- Marco Sforzin
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE PERFORMING DATA READ OPERATION AND CONTROLLER...
- Publication number 20240170080
- Publication date May 23, 2024
- SK HYNIX INC.
- Hyung Jin CHOI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Data Storage Device and Method for Power on Reset and Read Error Ha...
- Publication number 20240079072
- Publication date Mar 7, 2024
- Western Digital Technologies, Inc.
- Vishal Sharma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STORAGE CONTROLLER GENERATING READ VOLTAGES FOR SOFT DECISION DECOD...
- Publication number 20240079073
- Publication date Mar 7, 2024
- Samsung Electronics Co., Ltd.
- YongSung Kil
- G11 - INFORMATION STORAGE
Information Patent Application
CALIBRATION OF THRESHOLD VOLTAGE SHIFT VALUES
- Publication number 20240071542
- Publication date Feb 29, 2024
- International Business Machines Corporation
- Radu Ioan Stoica
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE AND OPERATION METHOD THEREOF
- Publication number 20240071475
- Publication date Feb 29, 2024
- Samsung Electronics Co., Ltd.
- YOON-JOO EOM
- G11 - INFORMATION STORAGE
Information Patent Application
DATA INTEGRITY CHECKS BASED ON VOLTAGE DISTRIBUTION METRICS
- Publication number 20240021258
- Publication date Jan 18, 2024
- Micron Technology, Inc.
- Vamsi Pavan Rayaprolu
- G11 - INFORMATION STORAGE
Information Patent Application
AGING MONITORING CIRCUIT OF SEMICONDUCTOR MEMORY DEVICE
- Publication number 20240021257
- Publication date Jan 18, 2024
- FIDELIX CO., LTD.
- Jae Jin LEE
- G11 - INFORMATION STORAGE
Information Patent Application
DYNAMIC RANDOM ACCESS MEMORY BUILT-IN SELF-TEST POWER FAIL MITIGATION
- Publication number 20240021263
- Publication date Jan 18, 2024
- Intel Corporation
- Bill NALE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GLITCH DETECTION REDUNDANCY
- Publication number 20230395181
- Publication date Dec 7, 2023
- Micron Technology, Inc.
- Angelo Alberto Rovelli
- G11 - INFORMATION STORAGE
Information Patent Application
DATA STORAGE APPARATUS COMPRISING CELL SECTION OPERABLE AS DOSIMETE...
- Publication number 20230386592
- Publication date Nov 30, 2023
- ams International AG
- Tommaso VINCENZI
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND APPARATUS FOR TESTING MEMORY, MEDIUM AND DEVICE
- Publication number 20230326539
- Publication date Oct 12, 2023
- Changxin Memory Technologies, Inc.
- Xikun CHU
- G11 - INFORMATION STORAGE
Information Patent Application
TECHNIQUES FOR DETERMINING AN INTERFACE CONNECTION STATUS
- Publication number 20230317191
- Publication date Oct 5, 2023
- Micron Technology, Inc.
- Melissa I. Uribe
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SYSTEM AND METHOD
- Publication number 20230298685
- Publication date Sep 21, 2023
- KIOXIA CORPORATION
- Motoki SHIMIZU
- G11 - INFORMATION STORAGE
Information Patent Application
Analog Signals Monitoring for Functional Safety
- Publication number 20230268023
- Publication date Aug 24, 2023
- Infineon Technologies LLC
- Yoram Betser
- G11 - INFORMATION STORAGE
Information Patent Application
PROGRAM AND OPERATING METHODS OF NONVOLATILE MEMORY DEVICE
- Publication number 20230245710
- Publication date Aug 3, 2023
- Samsung Electronics Co., Ltd.
- Boh-Chang KIM
- G11 - INFORMATION STORAGE
Information Patent Application
PAGE GROUP READ VOLTAGE THRESHOLD CALIBRATION
- Publication number 20230207023
- Publication date Jun 29, 2023
- International Business Machines Corporation
- ROMAN ALEXANDER PLETKA
- G11 - INFORMATION STORAGE
Information Patent Application
VOLTAGE DETECTION FOR MANAGED MEMORY SYSTEMS
- Publication number 20230207032
- Publication date Jun 29, 2023
- Micron Technology, Inc.
- Yoav Weinberg
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SYSTEM INCLUDING A SEMICONDUCTOR MEMORY HAVING A MEMORY CELL...
- Publication number 20230207016
- Publication date Jun 29, 2023
- Kioxia Corporation
- Suguru NISHIKAWA
- G06 - COMPUTING CALCULATING COUNTING

in voltage or current generators

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Storage device with eye open monitoring (EOM) circuit and method to...

Memory device performing sensing operation and method of operating...

Dynamic random access memory built-in self-test power fail mitigation

Data storage apparatus comprising cell section operable as dosimete...

Method and apparatus for detecting margins of data signal and stora...

Memory device and operation method thereof

Analog signals monitoring for functional safety

Calibration of threshold voltage shift values

Method of error correction code (ECC) decoding and memory system pe...

Glitch detection redundancy

Program and operating methods of nonvolatile memory device

Techniques for determining an interface connection status

Program and operating methods of nonvolatile memory device

Memory device with dynamic processing level calibration

Detection and isolation of faulty holdup capacitors using hardware...

Read voltage level correction method, memory storage device, and me...

Memory device with dynamic program-verify voltage calibration

Data storage device and method for power on reset and read error ha...

Memory device and method for operating the same

Voltage detection for managed memory systems

Page group read voltage threshold calibration

Method and apparatus for testing memory, medium and device

Memory system including a semiconductor memory having a memory cell...

Memory device and operation method thereof

Chip detection method and chip detection apparatus

Memory system and method of operating the same

Data integrity checks based on voltage distribution metrics

Program and operating methods of nonvolatile memory device

Periodic calibrations during memory device self refresh

Selective reading of memory with improved accuracy

Patents Applicationslast 30 patents

MEMORY DEVICE AND OPERATION METHOD THEREOF

GLITCH DETECTION REDUNDANCY

METHOD OF ERROR CORRECTION CODE (ECC) DECODING AND MEMORY SYSTEM PE...

FAILSAFE MEMORY CARD ARCHITECTURE USING VOLTAGE DRIVER OUTPUT ENABL...

START-UP CIRCUIT FOR BANDGAP REFERENCES IN A NAND FLASH

STORAGE DEVICE FOR SUPPORTING DYNAMIC ALLOCATION OF MEMORY AND METH...

Capacitor Health Check For Data Storage Devices

TECHNIQUES FOR DETERMINING AN INTERFACE CONNECTION STATUS

MEMORY DEVICE WITH DYNAMIC PROCESSING LEVEL CALIBRATION

VOLTAGE DETECTION FOR MANAGED MEMORY SYSTEMS

NON-VOLATILE MEMORY WITH SMART CONTROL OF OVERDRIVE VOLTAGE

MEMORY DEVICE AND METHOD FOR OPERATING THE SAME

SEMICONDUCTOR DEVICE PERFORMING DATA READ OPERATION AND CONTROLLER...

Data Storage Device and Method for Power on Reset and Read Error Ha...

STORAGE CONTROLLER GENERATING READ VOLTAGES FOR SOFT DECISION DECOD...

CALIBRATION OF THRESHOLD VOLTAGE SHIFT VALUES

MEMORY DEVICE AND OPERATION METHOD THEREOF

DATA INTEGRITY CHECKS BASED ON VOLTAGE DISTRIBUTION METRICS

AGING MONITORING CIRCUIT OF SEMICONDUCTOR MEMORY DEVICE

DYNAMIC RANDOM ACCESS MEMORY BUILT-IN SELF-TEST POWER FAIL MITIGATION

GLITCH DETECTION REDUNDANCY

DATA STORAGE APPARATUS COMPRISING CELL SECTION OPERABLE AS DOSIMETE...

METHOD AND APPARATUS FOR TESTING MEMORY, MEDIUM AND DEVICE

TECHNIQUES FOR DETERMINING AN INTERFACE CONNECTION STATUS

MEMORY SYSTEM AND METHOD

Analog Signals Monitoring for Functional Safety

PROGRAM AND OPERATING METHODS OF NONVOLATILE MEMORY DEVICE

PAGE GROUP READ VOLTAGE THRESHOLD CALIBRATION

VOLTAGE DETECTION FOR MANAGED MEMORY SYSTEMS

MEMORY SYSTEM INCLUDING A SEMICONDUCTOR MEMORY HAVING A MEMORY CELL...