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Sensing device
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Patent number 10,570,008
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Issue date Feb 25, 2020
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Silicon Integrated Systems Corp.
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Ssu-Che Yang
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B81 - MICRO-STRUCTURAL TECHNOLOGY
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Analog waveform digitizer
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Patent number 4,297,680
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Issue date Oct 27, 1981
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John Fluke Mfg. Co., Inc.
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Henriecus Koeman
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G01 - MEASURING TESTING
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Video display
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Patent number 4,145,706
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Issue date Mar 20, 1979
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Robert Bosch GmbH
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Heinz Hess
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G01 - MEASURING TESTING
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Control devices
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Patent number 4,107,585
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Issue date Aug 15, 1978
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Marconi Instruments Ltd.
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Damer Evelyn O'Neill Waddington
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G01 - MEASURING TESTING
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Signal measuring apparatus
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Patent number 4,074,190
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Issue date Feb 14, 1978
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National Research Development Corporation
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Walter Bunting
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G01 - MEASURING TESTING
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-
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Reaction detection system
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Patent number 3,989,383
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Issue date Nov 2, 1976
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Bio-Technology Instruments Corporation
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Gerald Lee Paulson
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G01 - MEASURING TESTING
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-
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Cathode ray tube meters
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Patent number 3,965,419
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Issue date Jun 22, 1976
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McIntosh Laboratory Inc.
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Micheal O. Paiva
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G01 - MEASURING TESTING
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3852890
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Patent number 3,852,890
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Issue date Dec 10, 1974
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G01 - MEASURING TESTING
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3833808
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Patent number 3,833,808
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Issue date Sep 3, 1974
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G01 - MEASURING TESTING
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3806948
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Patent number 3,806,948
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Issue date Apr 23, 1974
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G01 - MEASURING TESTING
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3754280
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Patent number 3,754,280
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Issue date Aug 21, 1973
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G01 - MEASURING TESTING
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3740760
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Patent number 3,740,760
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Issue date Jun 19, 1973
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G01 - MEASURING TESTING
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3737913
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Patent number 3,737,913
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Issue date Jun 5, 1973
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G01 - MEASURING TESTING