incident electron beam and measuring cathode luminescence (U.V.)

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CPC
G01N2223/08

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/08incident electron beam and measuring cathode luminescence (U.V.)

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Patents Grantslast 30 patents

Information Patent Grant
Method of calculating thickness of graphene layer and method of mea...
- Patent number 12,359,911
- Issue date Jul 15, 2025
- Samsung Electronics Co., Ltd.
- Eunkyu Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lithium detection techniques using neutrons and/or alpha particles
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- Issue date Jun 17, 2025
- Schlumberger Technology Corporation
- Shikha Prasad
- E21 - EARTH DRILLING MINING
Information Patent Grant
Electron spectroscopy based techniques for determining various chem...
- Patent number 12,326,410
- Issue date Jun 10, 2025
- COZAI LTD
- Hagai Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Characterizing and measuring in small boxes using XPS with multiple...
- Patent number 12,281,893
- Issue date Apr 22, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Heath Pois
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Carbon-based optical sensor element for measuring greenhouse gas co...
- Patent number 12,235,230
- Issue date Feb 25, 2025
- NATIONAL INSTITUTE OF METEOROLOGICAL SCIENCES
- Young Suk Oh
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Spectrometer
- Patent number 12,235,228
- Issue date Feb 25, 2025
- EasyXAFS, LLC
- William Holden
- G01 - MEASURING TESTING
Information Patent Grant
Patterned x-ray emitting target
- Patent number 11,996,259
- Issue date May 28, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Characterizing and measuring in small boxes using XPS with multiple...
- Patent number 11,988,502
- Issue date May 21, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath Pois
- G01 - MEASURING TESTING
Information Patent Grant
Method for improving an EBSD/TKD map
- Patent number 11,940,396
- Issue date Mar 26, 2024
- Bruker Nano GmbH
- Daniel Radu Goran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of calculating thickness of graphene layer and method of mea...
- Patent number 11,906,291
- Issue date Feb 20, 2024
- Samsung Electronics Co., Ltd.
- Eunkyu Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dislocation type and density discrimination in semiconductor materi...
- Patent number 11,782,001
- Issue date Oct 10, 2023
- ATTOLIGHT AG
- Marc Fouchier
- G01 - MEASURING TESTING
Information Patent Grant
X-ray reflectometry apparatus and method thereof for measuring thre...
- Patent number 11,579,099
- Issue date Feb 14, 2023
- Industrial Technology Research Institute
- Chun-Ting Liu
- G01 - MEASURING TESTING
Information Patent Grant
System and method using x-rays for depth-resolving metrology and an...
- Patent number 11,549,895
- Issue date Jan 10, 2023
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
Method of examining a sample using a charged particle microscope
- Patent number 11,519,871
- Issue date Dec 6, 2022
- FEI Company
- Jan Klusácek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray analyzer
- Patent number 11,467,103
- Issue date Oct 11, 2022
- APPLIED SCIENCE LABORATORY CO., LTD.
- Hiroyoshi Soejima
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Charged particle beam irradiation apparatus and control method
- Patent number 11,424,100
- Issue date Aug 23, 2022
- Hitachi High-Tech Science Corporation
- Takuma Aso
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for characterizing a sample combining an X-ray characterizat...
- Patent number 10,481,109
- Issue date Nov 19, 2019
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Agnieszka Priebe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for measuring energy of electrons
- Patent number 10,386,314
- Issue date Aug 20, 2019
- National University Corporation Nagoya University
- Toru Ujihara
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional imaging in charged-particle microscopy
- Patent number 10,128,080
- Issue date Nov 13, 2018
- FEI Company
- Faysal Boughorbel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analyser arrangement for particle spectrometer
- Patent number 9,978,579
- Issue date May 22, 2018
- SCIENTA OMICRON AB
- Björn Wannberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Deterioration analyzing method
- Patent number 9,851,342
- Issue date Dec 26, 2017
- Sumitomo Rubber Industries, Ltd.
- Fusae Kaneko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for measuring unoccupied states of solid
- Patent number 9,664,564
- Issue date May 30, 2017
- Kyoto University
- Hiroyuki Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite charged particle beam apparatus
- Patent number 9,024,280
- Issue date May 5, 2015
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope, an interface and a method for observi...
- Patent number 8,334,510
- Issue date Dec 18, 2012
- B-Nano Ltd.
- Dov Shachal
- G01 - MEASURING TESTING
Information Patent Grant
In-situ differential spectroscopy
- Patent number 8,283,631
- Issue date Oct 9, 2012
- KLA-Tencor Corporation
- Mehdi Vaez-Iravani
- G01 - MEASURING TESTING
Information Patent Grant
Photoelectron spectroscopy apparatus and method of use
- Patent number 7,399,963
- Issue date Jul 15, 2008
- ReVera Incorporated
- Bruno W. Schueler
- G01 - MEASURING TESTING
Information Patent Grant
Electrical measurements in samples
- Patent number 7,148,478
- Issue date Dec 12, 2006
- Yeda Research and Development Company Ltd.
- Hagai Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer and method of spectroscopy
- Patent number 6,104,029
- Issue date Aug 15, 2000
- VG Systems Ltd.
- Peter Coxon
- G01 - MEASURING TESTING
Information Patent Grant
Electron spectroscopy apparatus
- Patent number 5,569,916
- Issue date Oct 29, 1996
- Agency of Industrial Science & Technology, Ministry of International Trade &...
- Toshihisa Tomie
- G01 - MEASURING TESTING
Information Patent Grant
Electron spectroscopy analyzer and a method of correcting a shift o...
- Patent number 5,352,894
- Issue date Oct 4, 1994
- Sharp Kabushiki Kaisha
- Fumitoshi Yasuo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PARTICLE-INDUCED X-RAY EMISSION USING LIGHT AND HEAVY PARTICLE BEAMS
- Publication number 20250189469
- Publication date Jun 12, 2025
- FEI Company
- Sean M. Kellogg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPROVED SURFACE ANALYSIS PROCESS AND DEVICE
- Publication number 20250180497
- Publication date Jun 5, 2025
- PHOTOELECTRON INTELLECTUAL PROPERTY HOLDINGS LLC
- Peter Cumpson
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER
- Publication number 20250164421
- Publication date May 22, 2025
- EasyXAFS, LLC
- William Holden
- G01 - MEASURING TESTING
Information Patent Application
CERAMIC SUBSTRATE, CERAMIC CIRCUIT BOARD, SEMICONDUCTOR DEVICE, MET...
- Publication number 20250113439
- Publication date Apr 3, 2025
- Kabushiki Kaisha Toshiba
- Yukihisa MATSUMOTO
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
LITHIUM DETECTION TECHNIQUES USING NEUTRONS AND/OR ALPHA PARTICLES
- Publication number 20250044476
- Publication date Feb 6, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Shikha Prasad
- G01 - MEASURING TESTING
Information Patent Application
PATTERNED X-RAY EMITTING TARGET
- Publication number 20250006451
- Publication date Jan 2, 2025
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...
- Publication number 20240401940
- Publication date Dec 5, 2024
- NOVA MEASURING INSTRUMENTS INC.
- Heath POIS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR SPECTROSCOPIC ANALYSIS
- Publication number 20240369505
- Publication date Nov 7, 2024
- FEI Company
- Garrett Budnik
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CALCULATING THICKNESS OF GRAPHENE LAYER AND METHOD OF MEA...
- Publication number 20240151522
- Publication date May 9, 2024
- Samsung Electronics Co., Ltd.
- Eunkyu LEE
- G01 - MEASURING TESTING
Information Patent Application
SURFACE CHARACTERIZATION OF MATERIALS USING CATHODOLUMINESCENCE
- Publication number 20240125718
- Publication date Apr 18, 2024
- Silanna UV Technologies Pte Ltd
- Petar Atanackovic
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON SPECTROSCOPY BASED TECHNIQUES FOR DETERMINING VARIOUS CHEM...
- Publication number 20230288355
- Publication date Sep 14, 2023
- COZAI LTD
- Hagai COHEN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR SPECTROSCOPIC ANALYSIS
- Publication number 20230243767
- Publication date Aug 3, 2023
- FEI Company
- Garrett Budnik
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MODELING A ROCK SAMPLE
- Publication number 20230229827
- Publication date Jul 20, 2023
- Saudi Arabian Oil Company
- Abrar Alabbad
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CARBON-BASED OPTICAL SENSOR ELEMENT FOR MEASURING GREENHOUSE GAS CO...
- Publication number 20230168213
- Publication date Jun 1, 2023
- National Institute of Meteorological Sciences
- Young Suk OH
- G01 - MEASURING TESTING
Information Patent Application
SCREENING/ANALYSIS OF FLUOROCARBONS USING X-RAY PHOTOELECTRON SPECT...
- Publication number 20220373486
- Publication date Nov 24, 2022
- The Penn State Research Foundation
- Sara A. LINCOLN
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20220349848
- Publication date Nov 3, 2022
- KEYENCE CORPORATION
- Hayato OHBA
- G01 - MEASURING TESTING
Information Patent Application
DISLOCATION TYPE AND DENSITY DISCRIMINATION IN SEMICONDUCTOR MATERI...
- Publication number 20220178854
- Publication date Jun 9, 2022
- ATTOLIGHT AG
- Marc Fouchier
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD USING X-RAYS FOR DEPTH-RESOLVING METROLOGY AND AN...
- Publication number 20220082515
- Publication date Mar 17, 2022
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM IRRADIATION APPARATUS AND CONTROL METHOD
- Publication number 20210090855
- Publication date Mar 25, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Takuma ASO
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE
- Publication number 20200355633
- Publication date Nov 12, 2020
- FEI Company
- Jan Klusácek
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING ENERGY OF ELECTRONS
- Publication number 20190079033
- Publication date Mar 14, 2019
- NATIONAL UNIVERSITY CORPORATION NAGOYA UNIVERSITY
- Toru UJIHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYSER ARRANGEMENT FOR PARTICLE SPECTROMETER
- Publication number 20180269054
- Publication date Sep 20, 2018
- SCIENTA OMICRON AB
- Björn WANNBERG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION GROUP IRRADIATION DEVICE, SECONDARY ION MASS SPECTROMETER, AND...
- Publication number 20140374585
- Publication date Dec 25, 2014
- Yohei Murayama
- G01 - MEASURING TESTING
Information Patent Application
ANALYSER ARRANGEMENT FOR PARTICLE SPECTROMETER
- Publication number 20140361161
- Publication date Dec 11, 2014
- VG SCIENTA AB
- Björn Wannberg
- G01 - MEASURING TESTING
Information Patent Application
DETERIORATION ANALYZING METHOD
- Publication number 20140349407
- Publication date Nov 27, 2014
- Fusae Kaneko
- G01 - MEASURING TESTING
Information Patent Application
COMPOSITE CHARGED PARTICLE BEAM APPARATUS
- Publication number 20130075606
- Publication date Mar 28, 2013
- Atsushi UEMOTO
- G01 - MEASURING TESTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE, AN INTERFACE AND A METHOD FOR OBSERVI...
- Publication number 20110168889
- Publication date Jul 14, 2011
- Dov Shachal
- G01 - MEASURING TESTING
Information Patent Application
In-Situ Differential Spectroscopy
- Publication number 20090278044
- Publication date Nov 12, 2009
- KLA-Tencor Corporation
- Mehdi Vaez-Iravani
- G01 - MEASURING TESTING
Information Patent Application
Photoelectron spectroscopy apparatus and method of use
- Publication number 20070069125
- Publication date Mar 29, 2007
- Bruno W. Schueler
- G01 - MEASURING TESTING
Information Patent Application
Electrical measurements in samples
- Publication number 20060103395
- Publication date May 18, 2006
- Hagai Cohen
- G01 - MEASURING TESTING

incident electron beam and measuring cathode luminescence (U.V.)

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method of calculating thickness of graphene layer and method of mea...

Lithium detection techniques using neutrons and/or alpha particles

Electron spectroscopy based techniques for determining various chem...

Characterizing and measuring in small boxes using XPS with multiple...

Carbon-based optical sensor element for measuring greenhouse gas co...

Spectrometer

Patterned x-ray emitting target

Characterizing and measuring in small boxes using XPS with multiple...

Method for improving an EBSD/TKD map

Method of calculating thickness of graphene layer and method of mea...

Dislocation type and density discrimination in semiconductor materi...

X-ray reflectometry apparatus and method thereof for measuring thre...

System and method using x-rays for depth-resolving metrology and an...

Method of examining a sample using a charged particle microscope

X-ray analyzer

Charged particle beam irradiation apparatus and control method

Method for characterizing a sample combining an X-ray characterizat...

Apparatus and method for measuring energy of electrons

Three-dimensional imaging in charged-particle microscopy

Analyser arrangement for particle spectrometer

Deterioration analyzing method

Method and device for measuring unoccupied states of solid

Composite charged particle beam apparatus

Scanning electron microscope, an interface and a method for observi...

In-situ differential spectroscopy

Photoelectron spectroscopy apparatus and method of use

Electrical measurements in samples

Spectrometer and method of spectroscopy

Electron spectroscopy apparatus

Electron spectroscopy analyzer and a method of correcting a shift o...

Patents Applicationslast 30 patents

PARTICLE-INDUCED X-RAY EMISSION USING LIGHT AND HEAVY PARTICLE BEAMS

IMPROVED SURFACE ANALYSIS PROCESS AND DEVICE

SPECTROMETER

CERAMIC SUBSTRATE, CERAMIC CIRCUIT BOARD, SEMICONDUCTOR DEVICE, MET...

LITHIUM DETECTION TECHNIQUES USING NEUTRONS AND/OR ALPHA PARTICLES

PATTERNED X-RAY EMITTING TARGET

CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE...

METHOD AND SYSTEM FOR SPECTROSCOPIC ANALYSIS

METHOD OF CALCULATING THICKNESS OF GRAPHENE LAYER AND METHOD OF MEA...

SURFACE CHARACTERIZATION OF MATERIALS USING CATHODOLUMINESCENCE

ELECTRON SPECTROSCOPY BASED TECHNIQUES FOR DETERMINING VARIOUS CHEM...

METHOD AND SYSTEM FOR SPECTROSCOPIC ANALYSIS

SYSTEM AND METHOD FOR MODELING A ROCK SAMPLE

CARBON-BASED OPTICAL SENSOR ELEMENT FOR MEASURING GREENHOUSE GAS CO...

SCREENING/ANALYSIS OF FLUOROCARBONS USING X-RAY PHOTOELECTRON SPECT...

ANALYSIS DEVICE AND ANALYSIS METHOD

DISLOCATION TYPE AND DENSITY DISCRIMINATION IN SEMICONDUCTOR MATERI...

SYSTEM AND METHOD USING X-RAYS FOR DEPTH-RESOLVING METROLOGY AND AN...

CHARGED PARTICLE BEAM IRRADIATION APPARATUS AND CONTROL METHOD

METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE

APPARATUS AND METHOD FOR MEASURING ENERGY OF ELECTRONS

ANALYSER ARRANGEMENT FOR PARTICLE SPECTROMETER

ION GROUP IRRADIATION DEVICE, SECONDARY ION MASS SPECTROMETER, AND...

ANALYSER ARRANGEMENT FOR PARTICLE SPECTROMETER

DETERIORATION ANALYZING METHOD

COMPOSITE CHARGED PARTICLE BEAM APPARATUS

SCANNING ELECTRON MICROSCOPE, AN INTERFACE AND A METHOD FOR OBSERVI...

In-Situ Differential Spectroscopy

Photoelectron spectroscopy apparatus and method of use

Electrical measurements in samples