incident electron beam and measuring excited X-rays

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CPC
G01N2223/079

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/079incident electron beam and measuring excited X-rays

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method for measuring distribution of pores in electrode for seconda...
- Patent number 12,196,651
- Issue date Jan 14, 2025
- LG ENERGY SOLUTION, LTD.
- Jung Hoon Han
- G01 - MEASURING TESTING
Information Patent Grant
Imaging systems and methods of operating the same
- Patent number 12,196,693
- Issue date Jan 14, 2025
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 12,135,299
- Issue date Nov 5, 2024
- Shimadzu Corporation
- Takuro Izumi
- G01 - MEASURING TESTING
Information Patent Grant
Method for improving an EBSD/TKD map
- Patent number 11,940,396
- Issue date Mar 26, 2024
- Bruker Nano GmbH
- Daniel Radu Goran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Verification plates with automated evaluation of melt performance
- Patent number 11,733,187
- Issue date Aug 22, 2023
- Arcam AB
- David Svensson
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Sample analysis apparatus and method
- Patent number 11,674,913
- Issue date Jun 13, 2023
- Jeol Ltd.
- Takaomi Yokoyama
- G01 - MEASURING TESTING
Information Patent Grant
Sample analysis apparatus and method
- Patent number 11,668,662
- Issue date Jun 6, 2023
- Jeol Ltd.
- Yasuaki Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Analyzer
- Patent number 11,609,191
- Issue date Mar 21, 2023
- Jeol Ltd.
- Kazunori Tsukamoto
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining a material composition
- Patent number 11,579,100
- Issue date Feb 14, 2023
- Bruker Nano GmbH
- Ralf Terborg
- G01 - MEASURING TESTING
Information Patent Grant
Analytical method and apparatus
- Patent number 11,536,675
- Issue date Dec 27, 2022
- Jeol Ltd.
- Takanori Murano
- G01 - MEASURING TESTING
Information Patent Grant
SNR for x-ray detectors in SEM systems by using polarization filter
- Patent number 11,525,791
- Issue date Dec 13, 2022
- Applied Materials Israel Ltd.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray imaging in cross-section using un-cut lamella with background...
- Patent number 11,501,951
- Issue date Nov 15, 2022
- Applied Materials Israel Ltd.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray analysis apparatus and x-ray generation unit
- Patent number 11,467,107
- Issue date Oct 11, 2022
- Horiba, Ltd.
- Tomoki Aoyama
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analyzer
- Patent number 11,467,106
- Issue date Oct 11, 2022
- Jeol Ltd.
- Kazunori Tsukamoto
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis device and peak search method
- Patent number 11,435,303
- Issue date Sep 6, 2022
- Shimadzu Corporation
- Hiroshi Sakamae
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis system and X-ray analysis method
- Patent number 11,428,653
- Issue date Aug 30, 2022
- Jeol Ltd.
- Hideyuki Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Analysis device and spectrum generation method
- Patent number 11,353,414
- Issue date Jun 7, 2022
- Jeol Ltd.
- Takanori Murano
- G01 - MEASURING TESTING
Information Patent Grant
Nanofabricated structures for sub-beam resolution and spectral enha...
- Patent number 11,340,179
- Issue date May 24, 2022
- BAE Systems Information and Electronic System Integration INC
- Eugene M. Lavely
- G01 - MEASURING TESTING
Information Patent Grant
Device and method applicable for measuring ultrathin thickness of f...
- Patent number 11,287,253
- Issue date Mar 29, 2022
- Industrial Technology Research Institute
- Chun-Ting Liu
- G01 - MEASURING TESTING
Information Patent Grant
Particle measuring device and particle measuring method
- Patent number 11,143,606
- Issue date Oct 12, 2021
- HITACHI HIGH-TECH CORPORATION
- Tomihiro Hashizume
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope and method for determining crystal ori...
- Patent number 10,935,505
- Issue date Mar 2, 2021
- Jeol Ltd.
- Takeshi Otsuka
- G01 - MEASURING TESTING
Information Patent Grant
Cross sectional depth composition generation utilizing scanning ele...
- Patent number 10,830,715
- Issue date Nov 10, 2020
- International Business Machines Corporation
- Eric J. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Cross sectional depth composition generation utilizing scanning ele...
- Patent number 10,763,075
- Issue date Sep 1, 2020
- International Business Machines Corporation
- Eric J. Campbell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analysis with preliminary survey
- Patent number 10,527,563
- Issue date Jan 7, 2020
- Oxford Instruments Nanotechnology Tools Limited
- Christian Lang
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope
- Patent number 10,269,536
- Issue date Apr 23, 2019
- Hitachi High-Technologies Corporation
- Satoshi Takada
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional imaging in charged-particle microscopy
- Patent number 10,128,080
- Issue date Nov 13, 2018
- FEI Company
- Faysal Boughorbel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methodology for three-dimensional morphological and quantitative de...
- Patent number 9,920,435
- Issue date Mar 20, 2018
- Instituto Mexicano del Petroleo
- Florentino Leyte Guerrero
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Cross sectional depth composition generation utilizing scanning ele...
- Patent number 9,702,835
- Issue date Jul 11, 2017
- International Business Machines Corporation
- Eric J. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Electron excited X-ray fluorescence device
- Patent number 9,671,355
- Issue date Jun 6, 2017
- Tribogenics, Inc.
- Carlos Camara
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining the performance of a photolithographic mask
- Patent number 9,431,212
- Issue date Aug 30, 2016
- Carl Zeiss SMS GmbH
- Markus Waiblinger
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY ANALYZER
- Publication number 20240402101
- Publication date Dec 5, 2024
- Shimadzu Corporation
- Tetsuya YONEDA
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE CLASSIFICATION OF SPECIMENS BASED ON ENERGY SIGNATU...
- Publication number 20240255449
- Publication date Aug 1, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Doron Girmonsky
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM, CORRECTOR FOR ABERRATION CORRECTION O...
- Publication number 20240170249
- Publication date May 23, 2024
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Pieter Kruit
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALIBRATING PARAMETER ERROR OF ELECTRON PROBE MICROANALY...
- Publication number 20240151666
- Publication date May 9, 2024
- Shanghai Institute of Measurement and Testing Technology
- Lihua LEI
- G01 - MEASURING TESTING
Information Patent Application
Analyzing Method and Analyzer
- Publication number 20240142395
- Publication date May 2, 2024
- JEOL Ltd.
- Koki Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Electron Microscope and Map Display Method for Absorption...
- Publication number 20240085357
- Publication date Mar 14, 2024
- JEOL Ltd.
- Hideyuki Takahashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ENERGY DISPERSIVE X-RAY SPECTROSCOPY SENSING UNIT BACKGROUND
- Publication number 20240060912
- Publication date Feb 22, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Martin Chauvin
- G01 - MEASURING TESTING
Information Patent Application
COMPUTER-ASSISTED METHOD FOR DETERMINING AN ELEMENT FRACTION OF A D...
- Publication number 20230296540
- Publication date Sep 21, 2023
- GATAN INC.
- Johannes ÖSTERREICHER
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON SPECTROSCOPY BASED TECHNIQUES FOR DETERMINING VARIOUS CHEM...
- Publication number 20230288355
- Publication date Sep 14, 2023
- COZAI LTD
- Hagai COHEN
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL ANALYSIS WITH MULTIPLE DETECTORS
- Publication number 20230258587
- Publication date Aug 17, 2023
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- Simon BURGESS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PREPARATION METHOD OF CRYSTAL STRUCTURE ANALYSIS SAMPLE FOR STRUCTU...
- Publication number 20230053333
- Publication date Feb 23, 2023
- KIRIN HOLDINGS KABUSHIKI KAISHA
- Yoshimasa TANIGUCHI
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE
- Publication number 20230035039
- Publication date Feb 2, 2023
- KEYENCE CORPORATION
- Kenichiro HIROSE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SNR FOR X-RAY DETECTORS IN SEM SYSTEMS BY USING POLARIZATION FILTER
- Publication number 20220397540
- Publication date Dec 15, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY IMAGING IN CROSS-SECTION USING UN-CUT LAMELLA WITH BACKGROUND...
- Publication number 20220367146
- Publication date Nov 17, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING SYSTEMS AND METHODS OF OPERATING THE SAME
- Publication number 20220334072
- Publication date Oct 20, 2022
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan CAO
- G01 - MEASURING TESTING
Information Patent Application
Spectrum Analysis Apparatus and Database Creation Method
- Publication number 20220307996
- Publication date Sep 29, 2022
- JEOL Ltd.
- Shogo Koshiya
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Spectrum Analysis Apparatus and Method
- Publication number 20220299457
- Publication date Sep 22, 2022
- JEOL Ltd.
- Takanori Murano
- G01 - MEASURING TESTING
Information Patent Application
VERIFICATION PLATES WITH AUTOMATED EVALUATION OF MELT PERFORMANCE
- Publication number 20220260509
- Publication date Aug 18, 2022
- Arcam AB
- David Svensson
- B22 - CASTING POWDER METALLURGY
Information Patent Application
METHOD FOR IMPROVING AN EBSD/TKD MAP
- Publication number 20220221412
- Publication date Jul 14, 2022
- BRUKER NANO GMBH
- Daniel Radu GORAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Sample Analysis Apparatus and Method
- Publication number 20220026377
- Publication date Jan 27, 2022
- JEOL Ltd.
- Yasuaki Yamamoto
- G01 - MEASURING TESTING
Information Patent Application
Sample Analysis Apparatus and Method
- Publication number 20220026378
- Publication date Jan 27, 2022
- JEOL Ltd.
- Takaomi Yokoyama
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS APPARATUS AND X-RAY GENERATION UNIT
- Publication number 20210389262
- Publication date Dec 16, 2021
- HORIBA, LTD.
- Tomoki AOYAMA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS DEVICE AND PEAK SEARCH METHOD
- Publication number 20210356413
- Publication date Nov 18, 2021
- Shimadzu Corporation
- Hiroshi SAKAMAE
- G01 - MEASURING TESTING
Information Patent Application
Analytical Method and Apparatus
- Publication number 20210302339
- Publication date Sep 30, 2021
- JEOL Ltd.
- Takanori Murano
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING A MATERIAL COMPOSITION
- Publication number 20210148842
- Publication date May 20, 2021
- BRUKER NANO GMBH
- Ralf TERBORG
- G01 - MEASURING TESTING
Information Patent Application
Sample Component Determination Method, Sample Component Determinati...
- Publication number 20210131983
- Publication date May 6, 2021
- Shimadzu Corporation
- Akira Ogoshi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NANOFABRICATED STRUCTURES FOR SUB-BEAM RESOLUTION AND SPECTRAL ENHA...
- Publication number 20210116400
- Publication date Apr 22, 2021
- BAE SYSTEMS INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION INC
- Eugene M. Lavely
- G01 - MEASURING TESTING
Information Patent Application
Analyzer
- Publication number 20210025838
- Publication date Jan 28, 2021
- JEOL Ltd.
- Kazunori Tsukamoto
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Analysis System and X-Ray Analysis Method
- Publication number 20200393393
- Publication date Dec 17, 2020
- JEOL Ltd.
- Hideyuki Takahashi
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Analyzer
- Publication number 20200378909
- Publication date Dec 3, 2020
- JEOL Ltd.
- Kazunori Tsukamoto
- G01 - MEASURING TESTING

incident electron beam and measuring excited X-rays

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for measuring distribution of pores in electrode for seconda...

Imaging systems and methods of operating the same

X-ray fluorescence analyzer

Method for improving an EBSD/TKD map

Verification plates with automated evaluation of melt performance

Sample analysis apparatus and method

Sample analysis apparatus and method

Analyzer

Method for determining a material composition

Analytical method and apparatus

SNR for x-ray detectors in SEM systems by using polarization filter

X-ray imaging in cross-section using un-cut lamella with background...

X-ray analysis apparatus and x-ray generation unit

X-ray analyzer

X-ray analysis device and peak search method

X-ray analysis system and X-ray analysis method

Analysis device and spectrum generation method

Nanofabricated structures for sub-beam resolution and spectral enha...

Device and method applicable for measuring ultrathin thickness of f...

Particle measuring device and particle measuring method

Scanning electron microscope and method for determining crystal ori...

Cross sectional depth composition generation utilizing scanning ele...

Cross sectional depth composition generation utilizing scanning ele...

Analysis with preliminary survey

Electron microscope

Three-dimensional imaging in charged-particle microscopy

Methodology for three-dimensional morphological and quantitative de...

Cross sectional depth composition generation utilizing scanning ele...

Electron excited X-ray fluorescence device

Method for determining the performance of a photolithographic mask

Patents Applicationslast 30 patents

X-RAY ANALYZER

NON-DESTRUCTIVE CLASSIFICATION OF SPECIMENS BASED ON ENERGY SIGNATU...

CHARGED PARTICLE BEAM SYSTEM, CORRECTOR FOR ABERRATION CORRECTION O...

METHOD FOR CALIBRATING PARAMETER ERROR OF ELECTRON PROBE MICROANALY...

Analyzing Method and Analyzer

Scanning Electron Microscope and Map Display Method for Absorption...

ENERGY DISPERSIVE X-RAY SPECTROSCOPY SENSING UNIT BACKGROUND

COMPUTER-ASSISTED METHOD FOR DETERMINING AN ELEMENT FRACTION OF A D...

ELECTRON SPECTROSCOPY BASED TECHNIQUES FOR DETERMINING VARIOUS CHEM...

MATERIAL ANALYSIS WITH MULTIPLE DETECTORS

PREPARATION METHOD OF CRYSTAL STRUCTURE ANALYSIS SAMPLE FOR STRUCTU...

ANALYSIS DEVICE

SNR FOR X-RAY DETECTORS IN SEM SYSTEMS BY USING POLARIZATION FILTER

X-RAY IMAGING IN CROSS-SECTION USING UN-CUT LAMELLA WITH BACKGROUND...

IMAGING SYSTEMS AND METHODS OF OPERATING THE SAME

Spectrum Analysis Apparatus and Database Creation Method

X-Ray Spectrum Analysis Apparatus and Method

VERIFICATION PLATES WITH AUTOMATED EVALUATION OF MELT PERFORMANCE

METHOD FOR IMPROVING AN EBSD/TKD MAP

Sample Analysis Apparatus and Method

Sample Analysis Apparatus and Method

X-RAY ANALYSIS APPARATUS AND X-RAY GENERATION UNIT

X-RAY ANALYSIS DEVICE AND PEAK SEARCH METHOD

Analytical Method and Apparatus

METHOD FOR DETERMINING A MATERIAL COMPOSITION

Sample Component Determination Method, Sample Component Determinati...

NANOFABRICATED STRUCTURES FOR SUB-BEAM RESOLUTION AND SPECTRAL ENHA...

Analyzer

X-Ray Analysis System and X-Ray Analysis Method

X-Ray Analyzer