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G01N2021/4126
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PHYSICS
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Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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G01N2021/4126
Index of thin films
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Patents Grants
last 30 patents
Information
Patent Grant
Systems and methods for conducting contact-free thickness and refra...
Patent number
11,454,794
Issue date
Sep 27, 2022
The United States of America, as represented by the Secretary, Department of...
Do-Hyun Kim
G01 - MEASURING TESTING
Information
Patent Grant
Method for determining the thickness and refractive index of a laye...
Patent number
11,371,831
Issue date
Jun 28, 2022
Carl Zeiss Microscopy GmbH
Nils Langholz
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for evaluation of an interaction between an analy...
Patent number
11,255,851
Issue date
Feb 22, 2022
Cytiva Sweden AB
Olof Karlsson
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and methods for measuring mode spectra for ion-exchanged...
Patent number
11,079,280
Issue date
Aug 3, 2021
Corning Incorporated
Rostislav Vatchev Roussev
G01 - MEASURING TESTING
Information
Patent Grant
Growth rate detection apparatus, vapor deposition apparatus, and va...
Patent number
11,022,428
Issue date
Jun 1, 2021
NUFLARE TECHNOLOGY, INC.
Yasushi Iyechika
G01 - MEASURING TESTING
Information
Patent Grant
Prism coupling methods of characterizing stress in glass-based ion-...
Patent number
10,859,451
Issue date
Dec 8, 2020
Corning Incorporated
Vitor Marino Schneider
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods to improve optical spectrum fidelity in integra...
Patent number
10,774,418
Issue date
Sep 15, 2020
Halliburton Energy Services, Inc.
Aditya B. Nayak
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Systems and methods for conducting contact-free thickness and refra...
Patent number
10,712,545
Issue date
Jul 14, 2020
The United States of America as represented by the Secretary, Department of H...
Do-Hyun Kim
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Growth-rate measuring apparatus and growth-rate detection method
Patent number
10,488,334
Issue date
Nov 26, 2019
NUFLARE TECHNOLOGY, INC.
Yasushi Iyechika
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Apparatus and methods for measuring mode spectra for ion-exchanged...
Patent number
9,983,064
Issue date
May 29, 2018
Corning Incorporated
Rostislav Vatchev Roussev
G02 - OPTICS
Information
Patent Grant
Prism-coupling systems and methods for characterizing ion-exchanged...
Patent number
9,534,981
Issue date
Jan 3, 2017
Corning Incorporated
Rostislav Vatchev Roussev
C03 - GLASS MINERAL OR SLAG WOOL
Information
Patent Grant
Prism-coupling systems and methods for characterizing large depth-o...
Patent number
9,261,429
Issue date
Feb 16, 2016
Corning Incorporated
Shenping Li
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for determining a property of a surface
Patent number
9,103,651
Issue date
Aug 11, 2015
Mitutoyo Corporation
Han Haitjema
G01 - MEASURING TESTING
Information
Patent Grant
Diffraction grating coupler, system and method
Patent number
8,335,414
Issue date
Dec 18, 2012
Consejo Superior de Investigaciones Cientificas
Kirill Zinoviev
G01 - MEASURING TESTING
Information
Patent Grant
Optical monitor for rugate filter deposition
Patent number
8,200,448
Issue date
Jun 12, 2012
William H. Southwell
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for three-dimensionally determining the refractiv...
Patent number
7,612,879
Issue date
Nov 3, 2009
Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
Joachim Stumpe
G01 - MEASURING TESTING
Information
Patent Grant
Method of characterizing transparent thin-films using differential...
Patent number
7,545,510
Issue date
Jun 9, 2009
Academia Sinica
Chau-Hwang Lee
G01 - MEASURING TESTING
Information
Patent Grant
Interferometric system for the simultaneous measurement of the inde...
Patent number
7,046,373
Issue date
May 16, 2006
Consiglio Nazionale Delle Ricerche
Giuseppe Coppola
G01 - MEASURING TESTING
Information
Patent Grant
Monitoring of concentration of nitrogen in nitrided gate oxides, an...
Patent number
6,721,046
Issue date
Apr 13, 2004
Advanced Micro Devices, Inc.
Arvind Halliyal
G01 - MEASURING TESTING
Information
Patent Grant
Method to observe film thickness and/or refractive index by color d...
Patent number
5,610,392
Issue date
Mar 11, 1997
Research Development Corporation of Japan
Kuniaki Nagayama
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring refractive index and thickness of film and app...
Patent number
5,420,680
Issue date
May 30, 1995
Ricoh Company, Ltd.
Tami Isobe
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring optical constants of a thin film...
Patent number
5,125,740
Issue date
Jun 30, 1992
Hitachi, Ltd.
Hidemi Sato
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring an unknown parameter of a thin film and appara...
Patent number
5,107,105
Issue date
Apr 21, 1992
Ricoh Company, Ltd.
Tami Isobe
G01 - MEASURING TESTING
Information
Patent Grant
Refractive index monitor for deposition of gradient-index films
Patent number
5,100,233
Issue date
Mar 31, 1992
Rockwell International Corporation
William H. Southwell
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring refractive index of thin film layer
Patent number
5,096,298
Issue date
Mar 17, 1992
Ricoh Company, Ltd.
Tami Isobe
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring refractive index of thin film layer
Patent number
5,073,026
Issue date
Dec 17, 1991
Ricoh Company, Ltd.
Tami Isobe
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring refractive index and thickness o...
Patent number
5,034,617
Issue date
Jul 23, 1991
Ricoh Company, Ltd.
Tami Isobe
G01 - MEASURING TESTING
Information
Patent Grant
Method for determining incident angle in measurement of refractive...
Patent number
4,983,823
Issue date
Jan 8, 1991
Ricoh Company Ltd.
Tami Isobe
G01 - MEASURING TESTING
Information
Patent Grant
Optical measurement of thin films
Patent number
4,953,974
Issue date
Sep 4, 1990
McDonnell Douglas Corporation
William J. Fritz
G01 - MEASURING TESTING
Information
Patent Grant
Method for film thickness and refractive index determination
Patent number
4,909,631
Issue date
Mar 20, 1990
Raul Y. Tan
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND DEVICE FOR ANALYSING A SAMPLE USING A RESONANT SUPPORT,...
Publication number
20220317031
Publication date
Oct 6, 2022
Centre National de la Recherche Scientifique
Mathieu DUPOY
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR EVALUATION OF AN INTERACTION BETWEEN AN ANALY...
Publication number
20220137039
Publication date
May 5, 2022
CYTIVA SWEDEN AB
Olof Karlsson
G01 - MEASURING TESTING
Information
Patent Application
GROWTH RATE DETECTION APPARATUS, VAPOR DEPOSITION APPARATUS, AND VA...
Publication number
20200292299
Publication date
Sep 17, 2020
NuFlare Technology, Inc.
Yasushi IYECHIKA
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHODS FOR MEASURING MODE SPECTRA FOR ION-EXCHANGED...
Publication number
20180252586
Publication date
Sep 6, 2018
Corning Incorporated
Rostislav Vatchev Roussev
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED COMPUTATIONAL ELEMENTS INCORPORATING A STRESS RELIEF LAYER
Publication number
20180171781
Publication date
Jun 21, 2018
Halliburton Energy Services, Inc.
James M. Price
E21 - EARTH DRILLING MINING
Information
Patent Application
SYSTEMS AND METHODS TO IMPROVE OPTICAL SPECTRUM FIDELITY IN INTEGRA...
Publication number
20160289821
Publication date
Oct 6, 2016
Halliburton Energy Services, Inc.
Aditya B. NAYAK
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
Reusable Long Period Microfiber Grating for detection of DNA Hybrid...
Publication number
20150353996
Publication date
Dec 10, 2015
NANO AND ADVANCED MATERIALS INSTITUTE LIMITED
Yeuk Lai HOO
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
METHOD AND APPARATUS FOR DETERMINING A PROPERTY OF A SURFACE
Publication number
20130335747
Publication date
Dec 19, 2013
Han HAITJEMA
G01 - MEASURING TESTING
Information
Patent Application
DIFFRACTION GRATING COUPLER, SYSTEM AND METHOD
Publication number
20110102777
Publication date
May 5, 2011
Kirill Zinoviev
G02 - OPTICS
Information
Patent Application
Optical monitor for rugate filter deposition
Publication number
20090216474
Publication date
Aug 27, 2009
William H. Southwell
G02 - OPTICS
Information
Patent Application
Method for characterizing transparent thin-films using differential...
Publication number
20080266548
Publication date
Oct 30, 2008
Academia Sinica
Chau-Hwang Lee
G01 - MEASURING TESTING
Information
Patent Application
Tiled periodic metal film sensors
Publication number
20070176728
Publication date
Aug 2, 2007
Tirumala R. Ranganath
G01 - MEASURING TESTING
Information
Patent Application
Method and device for three-dimensionally determining the refractiv...
Publication number
20070097356
Publication date
May 3, 2007
Fraunhofer-Gesellschaft zur Förderung der angewand ten Forschung e.V.
Joachim Stumpe
G01 - MEASURING TESTING
Information
Patent Application
Interferometric system for the simultaneous measurement of the inde...
Publication number
20050036154
Publication date
Feb 17, 2005
CONSIGLI NAZIONALE DELLE RICERCHE
Giuseppe Coppola
G01 - MEASURING TESTING
Information
Patent Application
Method for automatic determination of optical parameters of a layer...
Publication number
20040027580
Publication date
Feb 12, 2004
Hans-Artur Bosser
G01 - MEASURING TESTING