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G01N2201/117

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2201/00Features of devices classified in G01N21/00

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G01N2201/117Indexed, memorised or programmed scan

Industries

Patents Grantslast 30 patents

Information Patent Grant
Spectrophotometer, spectroscopic measurement method, and program
- Patent number 11,927,527
- Issue date Mar 12, 2024
- Hitachi High-Tech Science Corporation
- Kai Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Mapping-measurement apparatus
- Patent number 7,224,460
- Issue date May 29, 2007
- Jasco Corporation
- Noriaki Soga
- G01 - MEASURING TESTING
Information Patent Grant
Laser imaging system
- Patent number 5,037,207
- Issue date Aug 6, 1991
- Ohio State University Research Foundation
- L. David Tomei
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
SPECTROPHOTOMETER, SPECTROSCOPIC MEASUREMENT METHOD, AND PROGRAM
- Publication number 20220412879
- Publication date Dec 29, 2022
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Kai MARUYAMA
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPY APPARATUS AND METHODS
- Publication number 20190226995
- Publication date Jul 25, 2019
- RENISHAW PLC
- Thomas Anthony MASON
- G01 - MEASURING TESTING
Information Patent Application
Mapping-measurement apparatus
- Publication number 20050088656
- Publication date Apr 28, 2005
- JASCO CORPORATION
- Noriaki Soga
- G01 - MEASURING TESTING
Information Patent Application
Machine vision inspection system and method having improved operati...
- Publication number 20040223053
- Publication date Nov 11, 2004
- Mitutoyo Corporation
- Paul G. Gladnick
- G06 - COMPUTING CALCULATING COUNTING