Indexing scheme relating to checking stores for correct operation, subsequent repair or testing stores during standby or offline operation

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CPC
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Industries

Patents Grantslast 30 patents

Information Patent Grant
Anti-fuse devices and anti-fuse units
- Patent number 11,985,818
- Issue date May 14, 2024
- Changxin Memory Technologies, Inc.
- ChihCheng Liu
- G11 - INFORMATION STORAGE
Information Patent Grant
Controller to detect malfunctioning address of memory device
- Patent number 11,783,910
- Issue date Oct 10, 2023
- RAMBUS INC.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus performing repair operation
- Patent number 11,626,186
- Issue date Apr 11, 2023
- SK hynix Inc.
- Dong Beom Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory test circuit and device wafer
- Patent number 11,557,360
- Issue date Jan 17, 2023
- NANYA TECHNOLOGY CORPORATION
- Yan-De Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Modifying memory bank operating parameters
- Patent number 11,557,367
- Issue date Jan 17, 2023
- Micron Technology, Inc.
- Christopher G. Wieduwilt
- G11 - INFORMATION STORAGE
Information Patent Grant
Controller to detect malfunctioning address of memory device
- Patent number 11,501,848
- Issue date Nov 15, 2022
- RAMBUS INC.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Grant
Modifiable repair solutions for a memory array
- Patent number 11,430,539
- Issue date Aug 30, 2022
- Micron Technology, Inc.
- Troy A. Manning
- G11 - INFORMATION STORAGE
Information Patent Grant
Utilization of control fuses for functional operations in system-on...
- Patent number 11,222,707
- Issue date Jan 11, 2022
- NXP USA, INC.
- Rohit Kumar Sinha
- G11 - INFORMATION STORAGE
Information Patent Grant
E-fuse circuit
- Patent number 11,127,477
- Issue date Sep 21, 2021
- ELITE SEMICONDUCTOR MICROELECTRONICS TECHNOLOGY INC.
- Tse-Hua Yao
- G11 - INFORMATION STORAGE
Information Patent Grant
Controller to detect malfunctioning address of memory device
- Patent number 11,037,652
- Issue date Jun 15, 2021
- Rambus, Inc.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Grant
Modifying memory bank operating parameters
- Patent number 11,011,250
- Issue date May 18, 2021
- Micron Technology, Inc.
- Christopher G. Wieduwilt
- G11 - INFORMATION STORAGE
Information Patent Grant
Run-time memory device failure detection enhancement
- Patent number 10,984,882
- Issue date Apr 20, 2021
- Western Digital Technologies, Inc.
- Sanghoon Chu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Controller to detect malfunctioning address of memory device
- Patent number 10,867,691
- Issue date Dec 15, 2020
- RAMBUS INC.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Grant
Data backup method for performing post package repair (repair on sy...
- Patent number 10,628,265
- Issue date Apr 21, 2020
- Samsung Electronics Co., Ltd.
- Dae-Jeong Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Modifying memory bank operating parameters
- Patent number 10,600,496
- Issue date Mar 24, 2020
- Micron Technology, Inc.
- Christopher G. Wieduwilt
- G11 - INFORMATION STORAGE
Information Patent Grant
DRAM device with embedded flash memory for redundancy and fabricati...
- Patent number 10,529,423
- Issue date Jan 7, 2020
- United Microelectronics Corp.
- Yukihiro Nagai
- G11 - INFORMATION STORAGE
Information Patent Grant
Repair fuse latches using static random access memory array
- Patent number 10,522,235
- Issue date Dec 31, 2019
- Micron Technology, Inc.
- Simon J. Lovett
- G11 - INFORMATION STORAGE
Information Patent Grant
DRAM row sparing
- Patent number 10,468,118
- Issue date Nov 5, 2019
- Hewlett Packard Enterprise Development LP
- Andrew C. Walton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Run-time flash die failure detection enhancement
- Patent number 10,453,548
- Issue date Oct 22, 2019
- Western Digital Technologies, Inc.
- Sanghoon Chu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for providing redundancy in memory
- Patent number 10,446,258
- Issue date Oct 15, 2019
- Micron Technology, Inc.
- Violante Moschiano
- G11 - INFORMATION STORAGE
Information Patent Grant
Controller to detect malfunctioning address of memory device
- Patent number 10,446,256
- Issue date Oct 15, 2019
- Rambus Inc.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Grant
DRAM device with embedded flash memory for redundancy and fabricati...
- Patent number 10,373,683
- Issue date Aug 6, 2019
- United Microelectronics Corp.
- Yukihiro Nagai
- G11 - INFORMATION STORAGE
Information Patent Grant
Controller to detect malfunctioning address of memory device
- Patent number 10,008,291
- Issue date Jun 26, 2018
- Rambus Inc.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods for providing redundancy in a memory array comprising mappi...
- Patent number 9,779,839
- Issue date Oct 3, 2017
- Micron Technology, Inc.
- Violante Moschiano
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device including dummy memory cells and memory...
- Patent number 9,691,490
- Issue date Jun 27, 2017
- SK hynix Inc.
- Eun Seok Choi
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory devices, testing systems and methods
- Patent number 9,672,939
- Issue date Jun 6, 2017
- Micron Technology, Inc.
- Michael A. Shore
- G11 - INFORMATION STORAGE
Information Patent Grant
Controller to detect malfunctioning address of memory device
- Patent number 9,659,671
- Issue date May 23, 2017
- Rambus Inc.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Grant
Flexible I/O partition of multi-die memory solution
- Patent number 9,640,282
- Issue date May 2, 2017
- Invensas Corporation
- Yong Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Decoding method, memory storage device and memory controlling circu...
- Patent number 9,467,175
- Issue date Oct 11, 2016
- Phison Electronics Corp.
- Chih-Hsuan Chiang
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device with initialization operation and boot-up oper...
- Patent number 9,437,329
- Issue date Sep 6, 2016
- SK Hynix Inc.
- Ga-Ram Park
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE
- Publication number 20240071559
- Publication date Feb 29, 2024
- Rambus Inc.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Application
ANTI-FUSE DEVICES AND ANTI-FUSE UNITS
- Publication number 20220320122
- Publication date Oct 6, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- ChihCheng Liu
- G11 - INFORMATION STORAGE
Information Patent Application
CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE
- Publication number 20220238177
- Publication date Jul 28, 2022
- Rambus Inc.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Application
CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE
- Publication number 20210407619
- Publication date Dec 30, 2021
- Rambus Inc.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Application
MODIFYING MEMORY BANK OPERATING PARAMETERS
- Publication number 20210335443
- Publication date Oct 28, 2021
- Micron Technology, Inc.
- Christopher G. Wieduwilt
- G11 - INFORMATION STORAGE
Information Patent Application
CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE
- Publication number 20200273534
- Publication date Aug 27, 2020
- RAMBUS INC.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Application
MODIFYING MEMORY BANK OPERATING PARAMETERS
- Publication number 20200265912
- Publication date Aug 20, 2020
- Micron Technology, Inc.
- Christopher G. Wieduwilt
- G11 - INFORMATION STORAGE
Information Patent Application
CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE
- Publication number 20200111540
- Publication date Apr 9, 2020
- RAMBUS INC.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Application
Run-Time Memory Device Failure Detection Enhancement
- Publication number 20200027520
- Publication date Jan 23, 2020
- Western Digital Technologies, Inc.
- Sanghoon CHU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REPAIR FUSE LATCHES USING STATIC RANDOM ACCESS MEMORY ARRAY
- Publication number 20190066819
- Publication date Feb 28, 2019
- Simon J. Lovett
- G11 - INFORMATION STORAGE
Information Patent Application
CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE
- Publication number 20190027231
- Publication date Jan 24, 2019
- RAMBUS INC.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Application
RUN-TIME FLASH DIE FAILURE DETECTION ENHANCEMENT
- Publication number 20180336960
- Publication date Nov 22, 2018
- Western Digital Technologies, Inc.
- Sanghoon CHU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND APPARATUS FOR PROVIDING REDUNDANCY IN MEMORY
- Publication number 20180047460
- Publication date Feb 15, 2018
- Micron Technology, Inc.
- Violante Moschiano
- G11 - INFORMATION STORAGE
Information Patent Application
CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE
- Publication number 20170323690
- Publication date Nov 9, 2017
- RAMBUS INC.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Application
DECODING METHOD, MEMORY STORAGE DEVICE AND MEMORY CONTROLLING CIRCU...
- Publication number 20150161002
- Publication date Jun 11, 2015
- PHISON ELECTRONICS CORP.
- Chih-Hsuan Chiang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Field-Repair System and Method
- Publication number 20140359401
- Publication date Dec 4, 2014
- HANGZHOU HAICUN INFORMATION TECHNOLOGY CO. LTD.
- Guobiao ZHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR PACKAGE INCLUDING STACKED CHIPS AND METHOD OF FABRICA...
- Publication number 20140347943
- Publication date Nov 27, 2014
- Samsung Electronics Co., Ltd.
- Taek-Sung KIM
- G11 - INFORMATION STORAGE
Information Patent Application
E-FUSE ARRAY CIRCUIT
- Publication number 20140313842
- Publication date Oct 23, 2014
- SK hynix Inc.
- Sungju SON
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE AND OPERATING METHOD OF MEMORY DEVICE AND MEMORY SYSTEM
- Publication number 20140301150
- Publication date Oct 9, 2014
- SK HYNIX INC.
- Hyun-Su YOON
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR STORAGE DEVICE, CONTROLLER, AND MEMORY SYSTEM
- Publication number 20140289569
- Publication date Sep 25, 2014
- KABUSHIKI KAISHA TOSHIBA
- Jota TACHIKAWA
- G11 - INFORMATION STORAGE
Information Patent Application
PROGRAMMABLE MEMORY REPAIR SCHEME
- Publication number 20140247678
- Publication date Sep 4, 2014
- RAMBUS INC.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND DEVICE FOR STORING AND READING RELIABLE INFORMATION IN A...
- Publication number 20140241059
- Publication date Aug 28, 2014
- Elpida Memory, Inc.
- Giulio Martinozzi
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20140108725
- Publication date Apr 17, 2014
- SK HYNIX INC.
- Wan Seob LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
E-FUSE ARRAY CIRCUIT
- Publication number 20140071780
- Publication date Mar 13, 2014
- Sungju SON
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE AND DATA PROCESSING SYSTEM INCLUDING THE SAME
- Publication number 20140036606
- Publication date Feb 6, 2014
- Elpida Memory, Inc.
- Hiroto KINOSHITA
- G11 - INFORMATION STORAGE
Information Patent Application
CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE
- Publication number 20130283110
- Publication date Oct 24, 2013
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DIAGNOSTIC APPARATUS AND MEMORY DIAGNOSTIC METHOD AND PROGRAM
- Publication number 20130238947
- Publication date Sep 12, 2013
- Mitsubishi Electric Corporation
- Ryoya Ichioka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICES, TESTING SYSTEMS AND METHODS
- Publication number 20130232386
- Publication date Sep 5, 2013
- Micron Technology, Inc.
- Michael A. Shore
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND DEFECTIVE CELL RELIEVING METHOD
- Publication number 20130077420
- Publication date Mar 28, 2013
- Kabushiki Kaisha Toshiba
- Takayuki Iwai
- G11 - INFORMATION STORAGE
Information Patent Application
Field-Repair System and Method
- Publication number 20130061100
- Publication date Mar 7, 2013
- CHENGDU HAICUN IP TECHNOLOGY LLC
- Guobiao ZHANG
- G06 - COMPUTING CALCULATING COUNTING

Indexing scheme relating to checking stores for correct operation, subsequent repair or testing stores during standby or offline operation

Industry

Parent Industries

Current Industry

Sub Industries

Patents Grantslast 30 patents

Anti-fuse devices and anti-fuse units

Controller to detect malfunctioning address of memory device

Apparatus performing repair operation

Memory test circuit and device wafer

Modifying memory bank operating parameters

Controller to detect malfunctioning address of memory device

Modifiable repair solutions for a memory array

Utilization of control fuses for functional operations in system-on...

E-fuse circuit

Controller to detect malfunctioning address of memory device

Modifying memory bank operating parameters

Run-time memory device failure detection enhancement

Controller to detect malfunctioning address of memory device

Data backup method for performing post package repair (repair on sy...

Modifying memory bank operating parameters

DRAM device with embedded flash memory for redundancy and fabricati...

Repair fuse latches using static random access memory array

DRAM row sparing

Run-time flash die failure detection enhancement

Methods and apparatus for providing redundancy in memory

Controller to detect malfunctioning address of memory device

DRAM device with embedded flash memory for redundancy and fabricati...

Controller to detect malfunctioning address of memory device

Methods for providing redundancy in a memory array comprising mappi...

Semiconductor memory device including dummy memory cells and memory...

Memory devices, testing systems and methods

Controller to detect malfunctioning address of memory device

Flexible I/O partition of multi-die memory solution

Decoding method, memory storage device and memory controlling circu...

Semiconductor device with initialization operation and boot-up oper...

Patents Applicationslast 30 patents

CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE

ANTI-FUSE DEVICES AND ANTI-FUSE UNITS

CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE

CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE

MODIFYING MEMORY BANK OPERATING PARAMETERS

CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE

MODIFYING MEMORY BANK OPERATING PARAMETERS

CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE

Run-Time Memory Device Failure Detection Enhancement

REPAIR FUSE LATCHES USING STATIC RANDOM ACCESS MEMORY ARRAY

CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE

RUN-TIME FLASH DIE FAILURE DETECTION ENHANCEMENT

METHODS AND APPARATUS FOR PROVIDING REDUNDANCY IN MEMORY

CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE

DECODING METHOD, MEMORY STORAGE DEVICE AND MEMORY CONTROLLING CIRCU...

Field-Repair System and Method

SEMICONDUCTOR PACKAGE INCLUDING STACKED CHIPS AND METHOD OF FABRICA...

E-FUSE ARRAY CIRCUIT

MEMORY DEVICE AND OPERATING METHOD OF MEMORY DEVICE AND MEMORY SYSTEM

SEMICONDUCTOR STORAGE DEVICE, CONTROLLER, AND MEMORY SYSTEM

PROGRAMMABLE MEMORY REPAIR SCHEME

METHOD AND DEVICE FOR STORING AND READING RELIABLE INFORMATION IN A...

SEMICONDUCTOR MEMORY DEVICE

E-FUSE ARRAY CIRCUIT

SEMICONDUCTOR DEVICE AND DATA PROCESSING SYSTEM INCLUDING THE SAME

CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE

MEMORY DIAGNOSTIC APPARATUS AND MEMORY DIAGNOSTIC METHOD AND PROGRAM

MEMORY DEVICES, TESTING SYSTEMS AND METHODS

SEMICONDUCTOR MEMORY DEVICE AND DEFECTIVE CELL RELIEVING METHOD

Field-Repair System and Method