interference of radiation

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CPC
G01N2223/064

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/064interference of radiation

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Patents Grantslast 30 patents

Information Patent Grant
Bifocal electron microscope
- Patent number 12,216,068
- Issue date Feb 4, 2025
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron diffraction holography
- Patent number 11,906,450
- Issue date Feb 20, 2024
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron diffraction holography
- Patent number 11,460,419
- Issue date Oct 4, 2022
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray phase contrast detector
- Patent number 11,389,124
- Issue date Jul 19, 2022
- General Electric Company
- Uwe Wiedmann
- G01 - MEASURING TESTING
Information Patent Grant
Radiation capturing system
- Patent number 11,221,303
- Issue date Jan 11, 2022
- Konica Minolta, Inc.
- Chiho Makifuchi
- G01 - MEASURING TESTING
Information Patent Grant
Metal X-ray grid, X-ray imaging device, and production method for m...
- Patent number 11,101,051
- Issue date Aug 24, 2021
- Hamamatsu Photonics K.K.
- Masahiro Kotani
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray phase contrast imaging with fourier transform determination o...
- Patent number 10,801,971
- Issue date Oct 13, 2020
- SHIMADZU CORPORATION
- Naoki Morimoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Radiation phase change detection method and radiation imaging appar...
- Patent number 10,371,649
- Issue date Aug 6, 2019
- Canon Kabushiki Kaisha
- Nobuhiro Yasui
- G01 - MEASURING TESTING
Information Patent Grant
Metal grating for X-rays, production method for metal grating for X...
- Patent number 10,153,061
- Issue date Dec 11, 2018
- Konica Minolta, Inc.
- Mitsuru Yokoyama
- G02 - OPTICS
Information Patent Grant
Differential phase-contrast imaging
- Patent number 10,028,716
- Issue date Jul 24, 2018
- Koniklijke Philips N.V.
- Ewald Rössl
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray radiography system for differential phase contrast imaging of...
- Patent number 9,453,803
- Issue date Sep 27, 2016
- Siemens Aktiengesellschaft
- Marcus Radicke
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray imaging apparatus
- Patent number 8,995,613
- Issue date Mar 31, 2015
- Canon Kabushiki Kaisha
- Chidane Ouchi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray interferometer for phase contrast imaging
- Patent number 8,041,004
- Issue date Oct 18, 2011
- Paul Scherrer Institut
- Christian David
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
2999931
- Patent number 2,999,931
- Issue date Sep 12, 1961
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
BIFOCAL ELECTRON MICROSCOPE
- Publication number 20250155387
- Publication date May 15, 2025
- FEI Company
- Alexander Henstra
- G01 - MEASURING TESTING
Information Patent Application
BIFOCAL ELECTRON MICROSCOPE
- Publication number 20240272100
- Publication date Aug 15, 2024
- FEI Company
- Alexander Henstra
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON DIFFRACTION HOLOGRAPHY
- Publication number 20230003672
- Publication date Jan 5, 2023
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON DIFFRACTION HOLOGRAPHY
- Publication number 20210302333
- Publication date Sep 30, 2021
- FEI Company
- Alexander Henstra
- G01 - MEASURING TESTING
Information Patent Application
METAL X-RAY GRID, X-RAY IMAGING DEVICE, AND PRODUCTION METHOD FOR M...
- Publication number 20200284736
- Publication date Sep 10, 2020
- Hamamatsu Photonics K.K.
- Masahiro KOTANI
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
RADIATION PHASE CHANGE DETECTION METHOD AND RADIATION IMAGING APPAR...
- Publication number 20170315066
- Publication date Nov 2, 2017
- Canon Kabushiki Kaisha
- Nobuhiro Yasui
- G01 - MEASURING TESTING
Information Patent Application
RADIATION CAPTURING SYSTEM
- Publication number 20170284948
- Publication date Oct 5, 2017
- Konica Minolta, Inc.
- Chiho MAKIFUCHI
- G01 - MEASURING TESTING
Information Patent Application
Metal Grating For X-Rays, Production Method For Metal Grating For X...
- Publication number 20160240276
- Publication date Aug 18, 2016
- KONICA MINOLTA, INC.
- Mitsuru YOKOYAMA
- G01 - MEASURING TESTING
Information Patent Application
Methods and Systems for Material Characterization
- Publication number 20140149052
- Publication date May 29, 2014
- ITM POWER (RESEARCH) LIMITED
- Dirk Van Dyck
- G01 - MEASURING TESTING
Information Patent Application
DIFFERENTIAL PHASE-CONTRAST IMAGING
- Publication number 20130208864
- Publication date Aug 15, 2013
- Koninklijke Philips Electronics N.V.
- Ewald Rössl
- G01 - MEASURING TESTING
Information Patent Application
IMAGING APPARATUS
- Publication number 20130163717
- Publication date Jun 27, 2013
- Canon Kabushiki Kaisha
- Kentaro Nagai
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IMAGING APPARATUS
- Publication number 20120263274
- Publication date Oct 18, 2012
- Canon Kabushiki Kaisha
- Chidane Ouchi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
X-Ray Interferometer for Phase Contrast Imaging
- Publication number 20090316857
- Publication date Dec 24, 2009
- PAUL SCHERRER INSTITUT
- Christian David
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

interference of radiation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Bifocal electron microscope

Electron diffraction holography

Electron diffraction holography

X-ray phase contrast detector

Radiation capturing system

Metal X-ray grid, X-ray imaging device, and production method for m...

X-ray phase contrast imaging with fourier transform determination o...

Radiation phase change detection method and radiation imaging appar...

Metal grating for X-rays, production method for metal grating for X...

Differential phase-contrast imaging

X-ray radiography system for differential phase contrast imaging of...

X-ray imaging apparatus

X-ray interferometer for phase contrast imaging

2999931

Patents Applicationslast 30 patents

BIFOCAL ELECTRON MICROSCOPE

BIFOCAL ELECTRON MICROSCOPE

ELECTRON DIFFRACTION HOLOGRAPHY

ELECTRON DIFFRACTION HOLOGRAPHY

METAL X-RAY GRID, X-RAY IMAGING DEVICE, AND PRODUCTION METHOD FOR M...

RADIATION PHASE CHANGE DETECTION METHOD AND RADIATION IMAGING APPAR...

RADIATION CAPTURING SYSTEM

Metal Grating For X-Rays, Production Method For Metal Grating For X...

Methods and Systems for Material Characterization

DIFFERENTIAL PHASE-CONTRAST IMAGING

IMAGING APPARATUS

X-RAY IMAGING APPARATUS

X-Ray Interferometer for Phase Contrast Imaging