Intermediate conversion to time interval type

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  • H03M2201/23
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Patents Grantslast 30 patents

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    Sensing an external stimulus using a group of continuous-time Nyqui...

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    • Issue date Mar 31, 2020
    • Invensense, Inc.
    • Vadim Tsinker
    • H03 - BASIC ELECTRONIC CIRCUITRY
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    Two-step single-slope comparator with high linearity and CMOS image...

    • Patent number 10,411,724
    • Issue date Sep 10, 2019
    • SK Hynix Inc.
    • Hyeon-June Kim
    • H03 - BASIC ELECTRONIC CIRCUITRY
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    Self-oscillating multi-ramp converter and method for converting a c...

    • Patent number 10,326,464
    • Issue date Jun 18, 2019
    • Infineon Technologies Austria AG
    • Christopher Rogi
    • H03 - BASIC ELECTRONIC CIRCUITRY
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    Ad converter, signal processing method, solid-state imaging device,...

    • Patent number 9,894,299
    • Issue date Feb 13, 2018
    • Sony Corporation
    • Kyoichi Kanagawa
    • H03 - BASIC ELECTRONIC CIRCUITRY
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    Calibration for a single ramp multi slope analog-to-digital converter

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    • Issue date May 10, 2016
    • Senseeker Engineering Inc.
    • Nishant Dhawan
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Calibration in multiple slope column parallel analog-to-digital con...

    • Patent number 8,994,832
    • Issue date Mar 31, 2015
    • OmniVision Technologies, Inc.
    • Zheng Yang
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Grant

    Calibration in multiple slope column parallel analog-to-digital con...

    • Patent number 8,730,081
    • Issue date May 20, 2014
    • OmniVision Technologies, Inc.
    • Zheng Yang
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Grant

    Transmitter for forming non-linear pulse code modulated samples of...

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    • Issue date Mar 1, 1977
    • U.S. Philips Corporation
    • Kornelis Jan Wouda
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
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    3896431

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    • H03 - BASIC ELECTRONIC CIRCUITRY
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    • H03 - BASIC ELECTRONIC CIRCUITRY
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    3889254

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    • G01 - MEASURING TESTING
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    3872726

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    • G01 - MEASURING TESTING
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    3843872

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    • G06 - COMPUTING CALCULATING COUNTING
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    3842413

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    • H03 - BASIC ELECTRONIC CIRCUITRY
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    3840807

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    • H03 - BASIC ELECTRONIC CIRCUITRY
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    3838413

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    • G06 - COMPUTING CALCULATING COUNTING
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    3829785

    • Patent number 3,829,785
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    • G01 - MEASURING TESTING
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    3790886

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    • Issue date Feb 5, 1974
    • G01 - MEASURING TESTING
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    3787835

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    • G06 - COMPUTING CALCULATING COUNTING
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    3768022

    • Patent number 3,768,022
    • Issue date Oct 23, 1973
    • H03 - BASIC ELECTRONIC CIRCUITRY
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    3766543

    • Patent number 3,766,543
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    • G05 - CONTROLLING REGULATING
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    3766544

    • Patent number 3,766,544
    • Issue date Oct 16, 1973
    • G01 - MEASURING TESTING
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    3750142

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    • H03 - BASIC ELECTRONIC CIRCUITRY
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    3743429

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    • G01 - MEASURING TESTING
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    3737897

    • Patent number 3,737,897
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    • H03 - BASIC ELECTRONIC CIRCUITRY
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    3737893

    • Patent number 3,737,893
    • Issue date Jun 5, 1973
    • H03 - BASIC ELECTRONIC CIRCUITRY
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    3729733

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    • G06 - COMPUTING CALCULATING COUNTING
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    • H03 - BASIC ELECTRONIC CIRCUITRY
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    3725903

    • Patent number 3,725,903
    • Issue date Apr 3, 1973
    • H03 - BASIC ELECTRONIC CIRCUITRY
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    3719807

    • Patent number 3,719,807
    • Issue date Mar 6, 1973
    • H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents