Investigating crystals

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G01N2021/8477

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

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G01N2021/8477Investigating crystals

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Patents Grantslast 30 patents

Information Patent Grant
Passivation of nonlinear optical crystals
- Patent number 12,152,316
- Issue date Nov 26, 2024
- KLA Corporation
- Yung-Ho Alex Chuang
- C30 - CRYSTAL GROWTH
Information Patent Grant
Nitride crystal substrate and method for manufacturing the same
- Patent number 12,104,279
- Issue date Oct 1, 2024
- Sumitomo Chemical Company, Limited
- Fumimasa Horikiri
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
Laser method and apparatus for analysing crystals
- Patent number 12,019,020
- Issue date Jun 25, 2024
- Oxford University Innovation Limited
- Jason Smith
- G01 - MEASURING TESTING
Information Patent Grant
Polarimeter with multiple independent tunable channels and method f...
- Patent number 11,867,891
- Issue date Jan 9, 2024
- ADVANCED OPTICAL TECHNOLOGIES, INC.
- Brian G. Hoover
- G02 - OPTICS
Information Patent Grant
Method for estimating twin defect density
- Patent number 11,733,177
- Issue date Aug 22, 2023
- The Industry & Academic Cooperation in Chungnam National University (IAC)
- Soon-ku Hong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liquid crystal sensor
- Patent number 11,500,247
- Issue date Nov 15, 2022
- Platypus Technologies, LLC
- Ross D. Bemowski
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Panel retardance measurement
- Patent number 11,486,826
- Issue date Nov 1, 2022
- Magic Leap, Inc.
- Erik Heath Arend
- G01 - MEASURING TESTING
Information Patent Grant
Experiment system and method for accurate controlling of macromolec...
- Patent number 11,452,948
- Issue date Sep 27, 2022
- Dalian University of Technology
- Xiaobin Jiang
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Nitride crystal substrate and method for manufacturing the same
- Patent number 11,377,756
- Issue date Jul 5, 2022
- SCIOCS COMPANY LIMITED
- Fumimasa Horikiri
- C30 - CRYSTAL GROWTH
Information Patent Grant
Evaluation method and manufacturing method of SiC epitaxial wafer
- Patent number 11,315,839
- Issue date Apr 26, 2022
- Showa Denko K.K.
- Yoshitaka Nishihara
- C30 - CRYSTAL GROWTH
Information Patent Grant
Passivation of nonlinear optical crystals
- Patent number 11,227,770
- Issue date Jan 18, 2022
- KLA Corporation
- Yung-Ho Alex Chuang
- C30 - CRYSTAL GROWTH
Information Patent Grant
Passivation of nonlinear optical crystals
- Patent number 11,180,866
- Issue date Nov 23, 2021
- KLA Corporation
- Yung-Ho Alex Chuang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for analysing a component
- Patent number 11,125,679
- Issue date Sep 21, 2021
- Rolls-Royce PLC
- James R. Fortune
- F01 - MACHINES OR ENGINES IN GENERAL ENGINE PLANTS IN GENERAL STEAM ENGINES
Information Patent Grant
Automatic protein crystallization trial analysis system
- Patent number 11,010,591
- Issue date May 18, 2021
- Merck Sharp & Dohme Corp.
- Soheil Ghafurian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Purifying diamond powder
- Patent number 10,899,625
- Issue date Jan 26, 2021
- Halliburton Energy Services, Inc.
- Qi Liang
- G01 - MEASURING TESTING
Information Patent Grant
Crystal orientation detecting apparatus and crystal orientation det...
- Patent number 10,809,201
- Issue date Oct 20, 2020
- Disco Corporation
- Noboru Takeda
- G01 - MEASURING TESTING
Information Patent Grant
Device for evaluating crystallinity and method of evaluating crysta...
- Patent number 10,801,970
- Issue date Oct 13, 2020
- Samsung Display Co., Ltd.
- Jin Seo
- G01 - MEASURING TESTING
Information Patent Grant
Method of identifying defect regions in wafer
- Patent number 10,634,622
- Issue date Apr 28, 2020
- SK SILTRON CO., LTD.
- Jae Hyeong Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and methods for probing a material as a function of depth...
- Patent number 10,371,668
- Issue date Aug 6, 2019
- Vanderbilt University
- Joy Garnett
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting back surface of epitaxial wafer and method...
- Patent number 10,338,005
- Issue date Jul 2, 2019
- Sumco Corporation
- Tatsuya Osada
- G01 - MEASURING TESTING
Information Patent Grant
Passivation of nonlinear optical crystals
- Patent number 10,283,366
- Issue date May 7, 2019
- KLA-Tencor Corporation
- Yung-Ho Chuang
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method for classifying a defect in a component intended to have a m...
- Patent number 10,215,710
- Issue date Feb 26, 2019
- Rolls-Royce PLC
- Michael J. Wingfield
- G01 - MEASURING TESTING
Information Patent Grant
Measurement method for liquid crystal azimuthal angle of liquid cry...
- Patent number 10,146,073
- Issue date Dec 4, 2018
- Shenzhen China Star Optoelectronics Technology Co., Ltd.
- Bo Hai
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Monitoring method and apparatus for control of excimer laser annealing
- Patent number 10,121,687
- Issue date Nov 6, 2018
- Coherent Lasersystems GmbH & Co. KG
- Paul Van Der Wilt
- G02 - OPTICS
Information Patent Grant
Monitoring method and apparatus for excimer-laser annealing process
- Patent number 9,976,969
- Issue date May 22, 2018
- Coherent Lasersystems GmbH & Co. KG
- Paul Van Der Wilt
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for detecting crystal orientation of silicon w...
- Patent number 9,965,846
- Issue date May 8, 2018
- Trina Solar Co., Ltd
- Shaoyong Fu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Integrated reciprocal space mapping for simultaneous lattice parame...
- Patent number 9,864,075
- Issue date Jan 9, 2018
- Jonathan Giencke
- G01 - MEASURING TESTING
Information Patent Grant
Air pocket detection methods and systems
- Patent number 9,665,931
- Issue date May 30, 2017
- Sunedison Semiconductor Limited (UEN201334164H)
- John F. Valley
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Passivation of nonlinear optical crystals
- Patent number 9,459,215
- Issue date Oct 4, 2016
- KLA-Tencor Corporation
- Yung-Ho Chuang
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring method and apparatus for control of excimer laser annealing
- Patent number 9,335,276
- Issue date May 10, 2016
- Coherent Lasersystems GmbH & Co. KG
- Paul Van Der Wilt
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM FOR DETERMINING EVAPORATION ENDPOINT BY IMAGE RECOGNITION IN...
- Publication number 20240282128
- Publication date Aug 22, 2024
- DONGJIANG ENVIRONMENTAL COMPANY LIMITED
- Zhibin LIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POLARIMETER WITH MULTIPLE INDEPENDENT TUNABLE CHANNELS AND METHOD F...
- Publication number 20240142758
- Publication date May 2, 2024
- ADVANCED OPTICAL TECHNOLOGIES, INC.
- Brian G. Hoover
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETERMINING CRYSTALLINITY AND METHOD OF MANUFACTURING A D...
- Publication number 20230064942
- Publication date Mar 2, 2023
- SAMSUNG DISPLAY CO., LTD.
- Eon Pil SHIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING CRYSTALLOGRAPHIC ORIENTATION O...
- Publication number 20220373460
- Publication date Nov 24, 2022
- Nanyang Technological University
- Bernard Daniel GASKEY
- G01 - MEASURING TESTING
Information Patent Application
NITRIDE CRYSTAL SUBSTRATE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20220154367
- Publication date May 19, 2022
- SCIOCS COMPANY LIMITED
- Fumimasa HORIKIRI
- C30 - CRYSTAL GROWTH
Information Patent Application
PANEL RETARDANCE MEASUREMENT
- Publication number 20220146421
- Publication date May 12, 2022
- Magic Leap, Inc.
- Erik Heath Arend
- G01 - MEASURING TESTING
Information Patent Application
Laser Method and Apparatus for Analysing Crystals
- Publication number 20210341387
- Publication date Nov 4, 2021
- Oxford University Innovation Limited
- Jason Smith
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CREATING AND DETECTING AN OPTICALLY PERMEABLE IMAGE INSI...
- Publication number 20210316401
- Publication date Oct 14, 2021
- JOINT STOCK COMPANY <<ALROSA>> (PUBLIC JOINT STOCK COMPANY) (PJSC ALROSA)
- Andrey Alekseevich IONIN
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD FOR ESTIMATING TWIN DEFECT DENSITY
- Publication number 20210270753
- Publication date Sep 2, 2021
- THE INDUSTRY & ACADEMIC COOPERATION IN CHUNGNAM NATIONAL UNIVERSITY (IAC)
- Soon-ku HONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Crystal purity detecting apparatus
- Publication number 20200088635
- Publication date Mar 19, 2020
- Jianhua Yao
- G01 - MEASURING TESTING
Information Patent Application
CRYSTAL ORIENTATION DETECTING APPARATUS AND CRYSTAL ORIENTATION DET...
- Publication number 20190391083
- Publication date Dec 26, 2019
- Disco Corporation
- Noboru TAKEDA
- G02 - OPTICS
Information Patent Application
DEVICE FOR EVALUATING CRYSTALLINITY AND METHOD OF EVALUATING CRYSTA...
- Publication number 20190120773
- Publication date Apr 25, 2019
- SAMSUNG DISPLAY CO., LTD.
- Jin SEO
- G01 - MEASURING TESTING
Information Patent Application
In-Situ Passivation for Nonlinear Optical Crystals
- Publication number 20190056637
- Publication date Feb 21, 2019
- KLA-Tencor Corporation
- Mandar Paranjape
- C30 - CRYSTAL GROWTH
Information Patent Application
SUBSTRATE TESTING CARRIER AND SUBSTRATE TESTING DEVICE
- Publication number 20180275072
- Publication date Sep 27, 2018
- BOE TECHNOLOGY GROUP CO., LTD.
- Shufeng Wang
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING LIQUID CRYSTAL DISPLAY DEVICE AND INSPECTIO...
- Publication number 20160320178
- Publication date Nov 3, 2016
- SAMSUNG DISPLAY CO., LTD.
- Yong-Woon LIM
- G02 - OPTICS
Information Patent Application
MONITORING METHOD AND APPARATUS FOR CONTROL OF EXCIMER LASER ANNEALING
- Publication number 20160233116
- Publication date Aug 11, 2016
- COHERENT LASERSYSTEMS GMBH & CO. KG
- Paul VAN DER WILT
- G02 - OPTICS
Information Patent Application
ROTATING SCATTERING PLANE BASED NONLINEAR OPTICAL SPECTROMETER TO S...
- Publication number 20150355098
- Publication date Dec 10, 2015
- California Institute of Technology
- David Hsieh
- G02 - OPTICS
Information Patent Application
MONITORING METHOD AND APPARATUS FOR CONTROL OF EXCIMER LASER ANNEALING
- Publication number 20150247808
- Publication date Sep 3, 2015
- COHERENT LASERSYSTEMS GMBH & CO. KG
- Paul VAN DER WILT
- G02 - OPTICS
Information Patent Application
Liquid crystal devices with mixed anion metal salts
- Publication number 20140356970
- Publication date Dec 4, 2014
- Nicholas Lawrence Abbott
- G01 - MEASURING TESTING
Information Patent Application
Method For Characterizing Fission Semi-Tracks in Solids
- Publication number 20140328510
- Publication date Nov 6, 2014
- Apatite to Zircon, Inc.
- Raymond Allen Donelick
- G01 - MEASURING TESTING
Information Patent Application
Passivation of Nonlinear Optical Crystals
- Publication number 20140305367
- Publication date Oct 16, 2014
- KLA-Tencor Corporation
- Yung-Ho Alex Chuang
- C30 - CRYSTAL GROWTH
Information Patent Application
Imaging System
- Publication number 20140253906
- Publication date Sep 11, 2014
- Gemvision Corporation, LLC
- Jeffrey L. High
- G02 - OPTICS
Information Patent Application
EXAMINATION OF A SILICON SUBSTRATE FOR A SOLAR CELL
- Publication number 20140038316
- Publication date Feb 6, 2014
- Alexander FULLE
- G01 - MEASURING TESTING
Information Patent Application
MONITORING METHOD AND APPARATUS FOR EXCIMER LASER ANNEALING PROCESS
- Publication number 20130341310
- Publication date Dec 26, 2013
- Paul VAN DER WILT
- C30 - CRYSTAL GROWTH
Information Patent Application
Imaging System
- Publication number 20130329212
- Publication date Dec 12, 2013
- Gemvision Corporation, LLC
- Jeffrey L. High
- G02 - OPTICS
Information Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20130242294
- Publication date Sep 19, 2013
- Hitachi High-Technologies Corporation
- Atsushi Taniguchi
- G01 - MEASURING TESTING
Information Patent Application
Air Pocket Detection Methods and Systems
- Publication number 20130176454
- Publication date Jul 11, 2013
- MEMC Electronic Materials, Inc.
- John F. Valley
- G01 - MEASURING TESTING
Information Patent Application
Symmetry Based Air Pocket Detection Methods and Systems
- Publication number 20130179094
- Publication date Jul 11, 2013
- MEMC Electronic Materials, Inc.
- John F. Valley
- G01 - MEASURING TESTING
Information Patent Application
HYDROGEN PASSIVATION OF NONLINEAR OPTICAL CRYSTALS
- Publication number 20130088706
- Publication date Apr 11, 2013
- KLA-Tencor Corporation
- Yung-Ho Chuang
- C30 - CRYSTAL GROWTH
Information Patent Application
NON-DESTRUCTIVE DETERMINATION OF MATERIAL CHARACTERISTICS
- Publication number 20120321126
- Publication date Dec 20, 2012
- Premium Aerotec GmbH
- Tanja FRESE
- G01 - MEASURING TESTING

Investigating crystals

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Passivation of nonlinear optical crystals

Nitride crystal substrate and method for manufacturing the same

Laser method and apparatus for analysing crystals

Polarimeter with multiple independent tunable channels and method f...

Method for estimating twin defect density

Liquid crystal sensor

Panel retardance measurement

Experiment system and method for accurate controlling of macromolec...

Nitride crystal substrate and method for manufacturing the same

Evaluation method and manufacturing method of SiC epitaxial wafer

Passivation of nonlinear optical crystals

Passivation of nonlinear optical crystals

Method and apparatus for analysing a component

Automatic protein crystallization trial analysis system

Purifying diamond powder

Crystal orientation detecting apparatus and crystal orientation det...

Device for evaluating crystallinity and method of evaluating crysta...

Method of identifying defect regions in wafer

Apparatus and methods for probing a material as a function of depth...

Apparatus for inspecting back surface of epitaxial wafer and method...

Passivation of nonlinear optical crystals

Method for classifying a defect in a component intended to have a m...

Measurement method for liquid crystal azimuthal angle of liquid cry...

Monitoring method and apparatus for control of excimer laser annealing

Monitoring method and apparatus for excimer-laser annealing process

Method and apparatus for detecting crystal orientation of silicon w...

Integrated reciprocal space mapping for simultaneous lattice parame...

Air pocket detection methods and systems

Passivation of nonlinear optical crystals

Monitoring method and apparatus for control of excimer laser annealing

Patents Applicationslast 30 patents

SYSTEM FOR DETERMINING EVAPORATION ENDPOINT BY IMAGE RECOGNITION IN...

POLARIMETER WITH MULTIPLE INDEPENDENT TUNABLE CHANNELS AND METHOD F...

METHOD OF DETERMINING CRYSTALLINITY AND METHOD OF MANUFACTURING A D...

METHOD AND APPARATUS FOR DETERMINING CRYSTALLOGRAPHIC ORIENTATION O...

NITRIDE CRYSTAL SUBSTRATE AND METHOD FOR MANUFACTURING THE SAME

PANEL RETARDANCE MEASUREMENT

Laser Method and Apparatus for Analysing Crystals

METHOD FOR CREATING AND DETECTING AN OPTICALLY PERMEABLE IMAGE INSI...

METHOD FOR ESTIMATING TWIN DEFECT DENSITY

Crystal purity detecting apparatus

CRYSTAL ORIENTATION DETECTING APPARATUS AND CRYSTAL ORIENTATION DET...

DEVICE FOR EVALUATING CRYSTALLINITY AND METHOD OF EVALUATING CRYSTA...

In-Situ Passivation for Nonlinear Optical Crystals

SUBSTRATE TESTING CARRIER AND SUBSTRATE TESTING DEVICE

METHOD OF MANUFACTURING LIQUID CRYSTAL DISPLAY DEVICE AND INSPECTIO...

MONITORING METHOD AND APPARATUS FOR CONTROL OF EXCIMER LASER ANNEALING

ROTATING SCATTERING PLANE BASED NONLINEAR OPTICAL SPECTROMETER TO S...

MONITORING METHOD AND APPARATUS FOR CONTROL OF EXCIMER LASER ANNEALING

Liquid crystal devices with mixed anion metal salts

Method For Characterizing Fission Semi-Tracks in Solids

Passivation of Nonlinear Optical Crystals

Imaging System

EXAMINATION OF A SILICON SUBSTRATE FOR A SOLAR CELL

MONITORING METHOD AND APPARATUS FOR EXCIMER LASER ANNEALING PROCESS

Imaging System

DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

Air Pocket Detection Methods and Systems

Symmetry Based Air Pocket Detection Methods and Systems

HYDROGEN PASSIVATION OF NONLINEAR OPTICAL CRYSTALS

NON-DESTRUCTIVE DETERMINATION OF MATERIAL CHARACTERISTICS