CPC
G01N21/31
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Patent Grant
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Thomas Lauwers
G01 - MEASURING TESTING
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Patent Grant
Deere & Company
Peter Schade
A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
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Patent Grant
Analytik Jena GmbH+Co. KG
Roland Lehmann
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Grant
Koninklijke Philips N.V.
Marinus Bastiaan Van Leeuwen
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
California Institute of Technology
Ryan M. Briggs
E21 - EARTH DRILLING MINING
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Patent Grant
Philip Morris Products S.A.
Felix Fernando
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
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Patent Grant
Samsung Display Co., Ltd.
Jeong Moon Lee
G01 - MEASURING TESTING
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Patent Grant
DISH Wireless L.L.C.
William Allen Gollihar
G01 - MEASURING TESTING
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Patent Grant
Drager Safety AG & Co. KGaA
Håkon Sagberg
G01 - MEASURING TESTING
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Patent Grant
Leuko Labs, Inc
Carlos Castro Gonzalez
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Yokogawa Electric Corporation
Anatoliy A. Kosterev
G01 - MEASURING TESTING
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Patent Grant
Shimadzu Corporation
Tatsuya Ikehara
G01 - MEASURING TESTING
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Patent Grant
Nippon Telegraph and Telephone Corporation
Yuichi Okabe
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Seoul National University R&DB Foundation
Heui Jae Pahk
G01 - MEASURING TESTING
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Patent Grant
CZ Biohub SF, LLC.
Shalin Mehta
G01 - MEASURING TESTING
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Patent Grant
Donaldson Company, Inc.
Chad M. Goltzman
F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
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Patent Grant
LG ENERGY SOLUTION, LTD.
Kyoung Ho Kim
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
LASER INSTITUTE, SHANDONG ACADEMY OF SCIENCES
Tongyu Liu
G01 - MEASURING TESTING
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Patent Grant
NCS TESTING TECHNOLOGY CO., LTD
Yunhai Jia
G01 - MEASURING TESTING
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Patent Grant
Yard Stick PBC
Kevin Andrew Meissner
G01 - MEASURING TESTING
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Patent Grant
Korea Research Institute of Standards and Science
Tae Geol Lee
G01 - MEASURING TESTING
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Patent Grant
CHRYSALABS INC.
Gabriel Mangeat
G01 - MEASURING TESTING
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Patent Grant
Sony Group Corporation
Morio Ogura
G01 - MEASURING TESTING
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Patent Grant
NATIONAL TAIWAN UNIVERSITY
Chi-Kuang Sun
G01 - MEASURING TESTING
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Patent Grant
Innogized Technologies, Inc.
Oliver Smith
G01 - MEASURING TESTING
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Patent Grant
Aclima Inc.
Todd Langland
G01 - MEASURING TESTING
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Patent Grant
Guangdong Ocean University
Junyi Li
G01 - MEASURING TESTING
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Patent Grant
BOTTLEVIN, INC.
Leslie Young Harvill
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
SETECH CO., LTD.
Hirokazu Sekine
G01 - MEASURING TESTING
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Patent Grant
NEC Corporation
Leiming Su
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Mantis Photonics AB
Diego GUÉNOT
G01 - MEASURING TESTING
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Patent Application
Massachusetts Institute of Technology
Paul P. Woskov
E21 - EARTH DRILLING MINING
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Patent Application
P & P OPTICA INC.
Romuald PAWLUCZYK
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
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Patent Application
SCUOLA SUPERIORE DI STUDI UNIVERSITARI E DI PERFEZIONAMENTO SANT'ANNA
Giorgio PITRUZZELLO
G01 - MEASURING TESTING
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Patent Application
HEALTHY PHOTON (NINGBO) TECHNOLOGY CO., LTD.
Yin WANG
G01 - MEASURING TESTING
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Patent Application
BEEHOLD D.O.O. NIS
Petar PEJIC
G01 - MEASURING TESTING
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Patent Application
SCHLUMBERGER TECHNOLOGY CORPORATION
Sebastien Catheline
G01 - MEASURING TESTING
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Patent Application
Samsung Electronics Co., Ltd.
Seungwoo LEE
G01 - MEASURING TESTING
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Patent Application
AERODYNE RESEARCH, INC.
Joseph R. Roscioli
G01 - MEASURING TESTING
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Patent Application
Deere & Company
MAHESH SOMAROWTHU
G01 - MEASURING TESTING
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Patent Application
Hemera
Rachid Mouflih
G01 - MEASURING TESTING
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Patent Application
Zhancheng XU
G01 - MEASURING TESTING
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Patent Application
TIANMA JAPAN, LTD.
Nobuya SEKO
G01 - MEASURING TESTING
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Patent Application
Zhancheng XU
G01 - MEASURING TESTING
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Patent Application
Kai M. Skog
G01 - MEASURING TESTING
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Patent Application
The Trustees of Princeton University
Michael Soskind
G01 - MEASURING TESTING
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Patent Application
Samsung Electronics Co., Ltd.
Jinwoo Lee
G01 - MEASURING TESTING
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Patent Application
Christopher B. Milligan
G01 - MEASURING TESTING
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Patent Application
B. BRAUN AVITUM AG
Ernst Bressau
G01 - MEASURING TESTING
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Patent Application
Massachusetts Institute of Technology
Boris Khaykovich
G01 - MEASURING TESTING
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Patent Application
Japan Display Inc.
Kaoru ITO
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
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Patent Application
Pattern Bioscience, Inc.
Ross Johnson
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Application
Abu Dhabi National Oil Company
Thierry LUCIDARME
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Application
Hyperspectral Corp.
David M. Palacios
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
UCARETRON INC.
JEE HWAN JANG
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
SafeNet International LLC
Joseph Y. Fang
G01 - MEASURING TESTING
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Patent Application
Horiba, Ltd.
Kohei TACHIBANA
G01 - MEASURING TESTING
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Patent Application
Japan Display Inc.
Kaoru ITO
G01 - MEASURING TESTING
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Patent Application
ABBOTT POINT OF CARE INC.
Michael L. Low
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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Patent Application
Universitair Zeikenhuis Antwerpen
Matthias CUYKX
G01 - MEASURING TESTING
