Investigating thin films

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CPC
G01N21/8422

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/8422Investigating thin films

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Optical sample characterization
- Patent number 12,152,994
- Issue date Nov 26, 2024
- LUMUS LTD.
- Eitan Ronen
- G01 - MEASURING TESTING
Information Patent Grant
Angle independent optical surface inspector
- Patent number 12,130,243
- Issue date Oct 29, 2024
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Measure of the degree of crystallinty of a polymer coating on a met...
- Patent number 12,130,231
- Issue date Oct 29, 2024
- Arcelormittal
- Nathalie Labbe
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for generating model for spectroscopic ellipsometry const...
- Patent number 12,105,028
- Issue date Oct 1, 2024
- AUROS TECHNOLOGY, INC.
- Sang Jun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Assessing a flow of a sprayed coating
- Patent number 12,072,222
- Issue date Aug 27, 2024
- BASF Coatings GmbH
- Yevgen Zhmayev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sensing and control of additive manufacturing processes
- Patent number 12,070,817
- Issue date Aug 27, 2024
- Massachusetts Institute of Technology
- Ryan Wade Penny
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Gravure coater test apparatus and gravure coater
- Patent number 12,042,814
- Issue date Jul 23, 2024
- LG Chem, Ltd.
- Sungjong Seo
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Method of detecting coating wear
- Patent number 12,038,268
- Issue date Jul 16, 2024
- Hamilton Sundstrand Corporation
- Kevin R. Bordage
- G01 - MEASURING TESTING
Information Patent Grant
Methods for imaging transparent two-dimensional sheets by fluoresce...
- Patent number 12,031,914
- Issue date Jul 9, 2024
- Northwestern University
- Jiaxing Huang
- G01 - MEASURING TESTING
Information Patent Grant
Method for optical monitoring and/or determination of properties of...
- Patent number 12,025,562
- Issue date Jul 2, 2024
- Fraunhofer-Gesellschaft zur Forderung der Angewandten Forschung E.V.
- Peter Hartmann
- G01 - MEASURING TESTING
Information Patent Grant
Region prober optical inspector
- Patent number 11,988,615
- Issue date May 21, 2024
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for quantitative phenotype analysis
- Patent number 11,982,627
- Issue date May 14, 2024
- Monsanto Technology LLC
- Alberto B. Iandolino
- G01 - MEASURING TESTING
Information Patent Grant
Measurement light source and measuring arrangement for detecting a...
- Patent number 11,953,426
- Issue date Apr 9, 2024
- CARL ZEISS SPECTROSCOPY GMBH
- Joerg Margraf
- G01 - MEASURING TESTING
Information Patent Grant
Process for rapidly measuring coefficient of moisture expansion (CM...
- Patent number 11,940,266
- Issue date Mar 26, 2024
- The Aerospace Corporation
- Geena L. Ferrelli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Non-destructive glass priming verification method for installed glass
- Patent number 11,933,733
- Issue date Mar 19, 2024
- FCA US LLC
- Gloria J Sheppard
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Non-destructive method for measuring thickness of three-layered rei...
- Patent number 11,913,773
- Issue date Feb 27, 2024
- LG Chem, Ltd.
- Sung-Hyun Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for composite sheet weight determinations
- Patent number 11,879,765
- Issue date Jan 23, 2024
- Honeywell International Inc.
- Tobias Nebel
- G01 - MEASURING TESTING
Information Patent Grant
Paint and other materials including a taggant
- Patent number 11,851,579
- Issue date Dec 26, 2023
- Henry Guy Stevens
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for metrology with layer-specific illumination...
- Patent number 11,852,590
- Issue date Dec 26, 2023
- KLA Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for detecting slurry spread volume using terahertz wave,...
- Patent number 11,846,584
- Issue date Dec 19, 2023
- Hyundai Motor Company
- Ha Seung Seong
- G01 - MEASURING TESTING
Information Patent Grant
Multi-shield plate and control system
- Patent number 11,823,919
- Issue date Nov 21, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ping-Tse Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Coating determination
- Patent number 11,808,712
- Issue date Nov 7, 2023
- TAU ACT GMBH
- Veglia Filippo
- G01 - MEASURING TESTING
Information Patent Grant
Bandgap measurements of patterned film stacks using spectroscopic m...
- Patent number 11,796,390
- Issue date Oct 24, 2023
- KLA Corporation
- Tianhan Wang
- G01 - MEASURING TESTING
Information Patent Grant
Measuring deflection to determine a characteristic of a cantilever
- Patent number 11,754,505
- Issue date Sep 12, 2023
- UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE ARMY
- Rebekah C Wilson
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting defects in thin film layers
- Patent number 11,740,185
- Issue date Aug 29, 2023
- MEMSSTAR LIMITED
- Anthony O'Hara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for estimating twin defect density
- Patent number 11,733,177
- Issue date Aug 22, 2023
- The Industry & Academic Cooperation in Chungnam National University (IAC)
- Soon-ku Hong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making a metamaterial device
- Patent number 11,726,233
- Issue date Aug 15, 2023
- Purdue Research Foundation
- Urcan Guler
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Inspection system, inspection method, program, and storage medium
- Patent number 11,727,554
- Issue date Aug 15, 2023
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Takanobu Ojima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method to determine properties of a coating on a transparent film,...
- Patent number 11,703,319
- Issue date Jul 18, 2023
- TDK ELECTRONICS AG
- Ramón García Rojo
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement device for inspection of discontinuities in aer...
- Patent number 11,680,910
- Issue date Jun 20, 2023
- Spirit Aerosystems, Inc.
- Mark Davis Haynes
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...
- Publication number 20240418633
- Publication date Dec 19, 2024
- KLA Corporation
- Shova Subedi
- G01 - MEASURING TESTING
Information Patent Application
INFRARED DETECTION CAMERA
- Publication number 20240402090
- Publication date Dec 5, 2024
- Laser & Plasma Technologies, LLC
- Mool C. GUPTA
- G01 - MEASURING TESTING
Information Patent Application
COLORMETRIC METHODS TO PREDICT COATING AND BOND PERFORMANCE PROPERTIES
- Publication number 20240402091
- Publication date Dec 5, 2024
- The Boeing Company
- Eileen Olga KUTSCHA
- G01 - MEASURING TESTING
Information Patent Application
COATING EVALUATION DEVICE AND COATING EVALUATION METHOD
- Publication number 20240369494
- Publication date Nov 7, 2024
- NISSAN MOTOR CO., LTD.
- Shota YAMAZAKI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING ORGANOPHOSPHORUS PESTICIDE BY MICROFLUIDIC CHI...
- Publication number 20240353342
- Publication date Oct 24, 2024
- JIANGSU UNIVERSITY
- Xuetao HU
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SYSTEMS AND METHODS OF LOCATING COOLING FEATURES IN A GAS TURBINE C...
- Publication number 20240353343
- Publication date Oct 24, 2024
- GENERAL ELECTRIC COMPANY
- Thomas J. BATZINGER
- F01 - MACHINES OR ENGINES IN GENERAL ENGINE PLANTS IN GENERAL STEAM ENGINES
Information Patent Application
FILM THICKNESS MEASUREMENT DEVICE, FILM THICKNESS MEASUREMENT METHO...
- Publication number 20240353344
- Publication date Oct 24, 2024
- EBARA CORPORATION
- Masaki KINOSHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPLIT PRISM SILICON-BASED LIQUID IMMERSION MICROCHANNEL MEASURING D...
- Publication number 20240337591
- Publication date Oct 10, 2024
- Korea Research Institute of Standards and Science
- Dong Hyung KIM
- G01 - MEASURING TESTING
Information Patent Application
REFERENCE SAMPLE FOR COATING DEFECTS AND METHOD FOR PRODUCING SAME
- Publication number 20240319103
- Publication date Sep 26, 2024
- Konica Minolta, Inc.
- RYUICHI YOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
ELECTRODE PLATE INSPECTION METHOD, METHOD FOR FABRICATING POWER STO...
- Publication number 20240302275
- Publication date Sep 12, 2024
- Prime Planet Energy & Solutions, Inc.
- Tomomichi YAMAZAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COATING EVALUATION DEVICE AND COATING EVALUATION METHOD
- Publication number 20240288375
- Publication date Aug 29, 2024
- NISSAN MOTOR CO., LTD.
- Takahiro KAITO
- G01 - MEASURING TESTING
Information Patent Application
PLATING DEFECTS ESTIMATING METHOD AND SEMICONDUCTOR DEVICE MANUFACT...
- Publication number 20240282643
- Publication date Aug 22, 2024
- HITACHI POWER SEEMICONDUCTOR DEVICE, LTD.
- Reo Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods for Analyzing an Electrode Layer of a Battery Cell Using a...
- Publication number 20240230546
- Publication date Jul 11, 2024
- SIEMENS AKTIENGESELLSCHAFT
- Sascha Schulte
- G01 - MEASURING TESTING
Information Patent Application
COATING EVALUATION DEVICE AND COATING EVALUATION METHOD
- Publication number 20240230547
- Publication date Jul 11, 2024
- NISSAN MOTOR CO., LTD.
- Shota YAMAZAKI
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE INSPECTION DEVICE AND SUBSTRATE INSPECTION METHOD USING T...
- Publication number 20240201100
- Publication date Jun 20, 2024
- SAMSUNG DISPLAY CO., LTD.
- SUNG HUNE YOO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING LACQUERED SURFACES WITH EFFECT...
- Publication number 20240183788
- Publication date Jun 6, 2024
- BYK-Gardner GmbH
- Uwe Sperling
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR DETERMINING THE MICROSTRUCTURE FOR...
- Publication number 20240159681
- Publication date May 16, 2024
- GENERAL ELECTRIC COMPANY
- Aditya Kulkarni
- G01 - MEASURING TESTING
Information Patent Application
Methods for Analyzing an Electrode Layer of a Battery Cell Using a...
- Publication number 20240133819
- Publication date Apr 25, 2024
- SIEMENS AKTIENGESELLSCHAFT
- Sascha Schulte
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING ORIENTATION OF SILVER NANOWIRE, POLYVINYL ALCO...
- Publication number 20240060888
- Publication date Feb 22, 2024
- Resonac Corporation
- Yasunao MIYAMURA
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
SYSTEMS AND TECHNIQUES FOR OPTICAL MEASUREMENT OF THIN FILMS
- Publication number 20240055282
- Publication date Feb 15, 2024
- LAM RESEARCH CORPORATION
- Liu Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPARKLE CONTRAST CORRECTING METHOD, COMPARING METHOD, COMPARING APP...
- Publication number 20240027357
- Publication date Jan 25, 2024
- DAI NIPPON PRINTING CO., LTD.
- Makio KURASHIGE
- G01 - MEASURING TESTING
Information Patent Application
MATRIX-BASED CHARACTERIZATION AND MEASUREMENTS FOR SEMICONDUCTOR TH...
- Publication number 20240003819
- Publication date Jan 4, 2024
- The Board of Trustees of the Leland Stanford Junior University
- Thaibao Phan
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR DETERMINING UV COVERAGE ON IRRADIATION TARGET...
- Publication number 20230417670
- Publication date Dec 28, 2023
- L'Oreal
- Alexandre Nicolas
- G01 - MEASURING TESTING
Information Patent Application
EPI SELF-HEATING SENSOR TUBE AS IN-SITU GROWTH RATE SENSOR
- Publication number 20230375460
- Publication date Nov 23, 2023
- Applied Materials, Inc.
- Zhepeng CONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR EVALUATING ADHESION RELIABILITY AND HEAT RADIATION PERFO...
- Publication number 20230366829
- Publication date Nov 16, 2023
- Denka Company Limited
- Yusuke WAKUDA
- G01 - MEASURING TESTING
Information Patent Application
CONTACTLESS DETERMINATION OF COATING FEATURES
- Publication number 20230304938
- Publication date Sep 28, 2023
- DAS-NANO TECH S.L.
- Israel ARNEDO GIL
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT DEVICE FOR INSPECTION OF DISCONTINUITIES IN AER...
- Publication number 20230280280
- Publication date Sep 7, 2023
- SPIRIT AEROSYSTEMS, INC
- Mark Davis Haynes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COLOR MEASUREMENT
- Publication number 20230251137
- Publication date Aug 10, 2023
- AXALTA COATING SYSTEMS IP CO., LLC
- Neil Richard Murphy
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETECTING COATING WEAR
- Publication number 20230204343
- Publication date Jun 29, 2023
- HAMILTON SUNDSTRAND CORPORATION
- Kevin R. Bordage
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ESTIMATING A QUALITY FUNCTION OF A MONO- OR MULTI-LAYERE...
- Publication number 20230194435
- Publication date Jun 22, 2023
- SAINT-GOBAIN GLASS FRANCE
- Yaël BRONSTEIN
- G06 - COMPUTING CALCULATING COUNTING

Investigating thin films

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Optical sample characterization

Angle independent optical surface inspector

Measure of the degree of crystallinty of a polymer coating on a met...

Apparatus for generating model for spectroscopic ellipsometry const...

Assessing a flow of a sprayed coating

Sensing and control of additive manufacturing processes

Gravure coater test apparatus and gravure coater

Method of detecting coating wear

Methods for imaging transparent two-dimensional sheets by fluoresce...

Method for optical monitoring and/or determination of properties of...

Region prober optical inspector

Systems and methods for quantitative phenotype analysis

Measurement light source and measuring arrangement for detecting a...

Process for rapidly measuring coefficient of moisture expansion (CM...

Non-destructive glass priming verification method for installed glass

Non-destructive method for measuring thickness of three-layered rei...

Apparatus for composite sheet weight determinations

Paint and other materials including a taggant

Systems and methods for metrology with layer-specific illumination...

Apparatus for detecting slurry spread volume using terahertz wave,...

Multi-shield plate and control system

Coating determination

Bandgap measurements of patterned film stacks using spectroscopic m...

Measuring deflection to determine a characteristic of a cantilever

Method for detecting defects in thin film layers

Method for estimating twin defect density

Method of making a metamaterial device

Inspection system, inspection method, program, and storage medium

Method to determine properties of a coating on a transparent film,...

Optical measurement device for inspection of discontinuities in aer...

Patents Applicationslast 30 patents

COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...

INFRARED DETECTION CAMERA

COLORMETRIC METHODS TO PREDICT COATING AND BOND PERFORMANCE PROPERTIES

COATING EVALUATION DEVICE AND COATING EVALUATION METHOD

METHOD FOR DETECTING ORGANOPHOSPHORUS PESTICIDE BY MICROFLUIDIC CHI...

SYSTEMS AND METHODS OF LOCATING COOLING FEATURES IN A GAS TURBINE C...

FILM THICKNESS MEASUREMENT DEVICE, FILM THICKNESS MEASUREMENT METHO...

SPLIT PRISM SILICON-BASED LIQUID IMMERSION MICROCHANNEL MEASURING D...

REFERENCE SAMPLE FOR COATING DEFECTS AND METHOD FOR PRODUCING SAME

ELECTRODE PLATE INSPECTION METHOD, METHOD FOR FABRICATING POWER STO...

COATING EVALUATION DEVICE AND COATING EVALUATION METHOD

PLATING DEFECTS ESTIMATING METHOD AND SEMICONDUCTOR DEVICE MANUFACT...

Methods for Analyzing an Electrode Layer of a Battery Cell Using a...

COATING EVALUATION DEVICE AND COATING EVALUATION METHOD

SUBSTRATE INSPECTION DEVICE AND SUBSTRATE INSPECTION METHOD USING T...

METHOD AND APPARATUS FOR INSPECTING LACQUERED SURFACES WITH EFFECT...

INSPECTION SYSTEM AND METHOD FOR DETERMINING THE MICROSTRUCTURE FOR...

Methods for Analyzing an Electrode Layer of a Battery Cell Using a...

METHOD FOR MEASURING ORIENTATION OF SILVER NANOWIRE, POLYVINYL ALCO...

SYSTEMS AND TECHNIQUES FOR OPTICAL MEASUREMENT OF THIN FILMS

SPARKLE CONTRAST CORRECTING METHOD, COMPARING METHOD, COMPARING APP...

MATRIX-BASED CHARACTERIZATION AND MEASUREMENTS FOR SEMICONDUCTOR TH...

METHOD AND DEVICE FOR DETERMINING UV COVERAGE ON IRRADIATION TARGET...

EPI SELF-HEATING SENSOR TUBE AS IN-SITU GROWTH RATE SENSOR

METHOD FOR EVALUATING ADHESION RELIABILITY AND HEAT RADIATION PERFO...

CONTACTLESS DETERMINATION OF COATING FEATURES

OPTICAL MEASUREMENT DEVICE FOR INSPECTION OF DISCONTINUITIES IN AER...

COLOR MEASUREMENT

METHOD OF DETECTING COATING WEAR

METHOD FOR ESTIMATING A QUALITY FUNCTION OF A MONO- OR MULTI-LAYERE...