Investigating thin films

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CPC
G01N21/8422

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/8422Investigating thin films

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Roll map for electrode coating process and roll map creation method...
- Patent number 12,366,948
- Issue date Jul 22, 2025
- LG ENERGY SOLUTIONS LTD.
- Jun Hyo Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for determining UV coverage on irradiation target...
- Patent number 12,366,530
- Issue date Jul 22, 2025
- L'Oreal
- Alexandre Nicolas
- G01 - MEASURING TESTING
Information Patent Grant
Transmission apparatus, measurement system, and camera system
- Patent number 12,360,038
- Issue date Jul 15, 2025
- Canon Kabushiki Kaisha
- Takeaki Itsuji
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device and method for dynamic characteristics of pressure...
- Patent number 12,352,647
- Issue date Jul 8, 2025
- Northwestern Polytechnical University
- Limin Gao
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring thickness and optical properties of multi-laye...
- Patent number 12,345,518
- Issue date Jul 1, 2025
- Huaqiao University
- Changcai Cui
- G01 - MEASURING TESTING
Information Patent Grant
Roll map for electrode coating process and roll map creation method...
- Patent number 12,346,530
- Issue date Jul 1, 2025
- LG ENERGY SOLUTION, LTD.
- Jun Hyo Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Color measurement
- Patent number 12,339,169
- Issue date Jun 24, 2025
- Axalta Coating Systems IP Co., LLC
- Neil Richard Murphy
- G01 - MEASURING TESTING
Information Patent Grant
System and method for detecting contamination of thin-films
- Patent number 12,320,755
- Issue date Jun 3, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chung-Liang Cheng
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for selecting polyester film, method for producing multilaye...
- Patent number 12,306,096
- Issue date May 20, 2025
- TOPPAN INC.
- Haruna Kadoya
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods of locating cooling features in a gas turbine c...
- Patent number 12,306,108
- Issue date May 20, 2025
- General Electric Company
- Thomas J. Batzinger
- G01 - MEASURING TESTING
Information Patent Grant
Making and inspecting a web of vitreous lithium sulfide separator s...
- Patent number 12,294,051
- Issue date May 6, 2025
- PolyPlus Battery Company
- Steven J. Visco
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining the composition of a multi-layer system show...
- Patent number 12,292,378
- Issue date May 6, 2025
- HUBERGROUP DEUTSCHLAND GmbH
- Sylvia Klausnitzer
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Method for estimating a quality function of a mono- or multi-layere...
- Patent number 12,287,295
- Issue date Apr 29, 2025
- Saint-Gobain Glass France
- Yaël Bronstein
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Infrared detection camera
- Patent number 12,281,989
- Issue date Apr 22, 2025
- LASER & PLASMA TECHNOLOGIES, LLC
- Mool C. Gupta
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting organophosphorus pesticide by microfluidic chi...
- Patent number 12,281,990
- Issue date Apr 22, 2025
- JIANGSU UNIVERSITY
- Xuetao Hu
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
EPI self-heating sensor tube as in-situ growth rate sensor
- Patent number 12,270,752
- Issue date Apr 8, 2025
- Applied Materials, Inc.
- Zhepeng Cong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cylindrical shell detection method and cylindrical shell detection...
- Patent number 12,265,037
- Issue date Apr 1, 2025
- Advanced ACEBIOTEK CO., LTD.
- Jyh-Chern Chen
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for real-time quality control of a film in a sp...
- Patent number 12,255,110
- Issue date Mar 18, 2025
- Samsung Electronics Co., Ltd.
- Gaurav Kumar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for measuring element concentration of material
- Patent number 12,222,281
- Issue date Feb 11, 2025
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Ying-Chih Wang
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection device and inspecting method using the same
- Patent number 12,222,294
- Issue date Feb 11, 2025
- Samsung Display Co., Ltd.
- Jeong Moon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Qualitative or quantitative characterization of a coating surface
- Patent number 12,203,868
- Issue date Jan 21, 2025
- Evonik Operations GmbH
- Philipp Isken
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Device and method for monitoring the drying/curing process of coatings
- Patent number 12,196,685
- Issue date Jan 14, 2025
- BASF Coatings GmbH
- Harry Libutzki
- G01 - MEASURING TESTING
Information Patent Grant
Adhesion interface observation method
- Patent number 12,188,872
- Issue date Jan 7, 2025
- SUBARU CORPORATION
- Yugo Tomita
- G01 - MEASURING TESTING
Information Patent Grant
Optical sample characterization
- Patent number 12,152,994
- Issue date Nov 26, 2024
- LUMUS LTD.
- Eitan Ronen
- G01 - MEASURING TESTING
Information Patent Grant
Angle independent optical surface inspector
- Patent number 12,130,243
- Issue date Oct 29, 2024
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Measure of the degree of crystallinty of a polymer coating on a met...
- Patent number 12,130,231
- Issue date Oct 29, 2024
- Arcelormittal
- Nathalie Labbe
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for generating model for spectroscopic ellipsometry const...
- Patent number 12,105,028
- Issue date Oct 1, 2024
- AUROS TECHNOLOGY, INC.
- Sang Jun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Assessing a flow of a sprayed coating
- Patent number 12,072,222
- Issue date Aug 27, 2024
- BASF Coatings GmbH
- Yevgen Zhmayev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sensing and control of additive manufacturing processes
- Patent number 12,070,817
- Issue date Aug 27, 2024
- Massachusetts Institute of Technology
- Ryan Wade Penny
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Gravure coater test apparatus and gravure coater
- Patent number 12,042,814
- Issue date Jul 23, 2024
- LG Chem, Ltd.
- Sungjong Seo
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...

Patents Applicationslast 30 patents

Information Patent Application
SUBSTRATE EVALUATION METHOD AND SUBSTRATE PROCESSING APPARATUS
- Publication number 20250224329
- Publication date Jul 10, 2025
- TOKYO ELECTRON LIMITED
- Yuji OTSUKI
- G01 - MEASURING TESTING
Information Patent Application
METHOD, SYSTEM AND SENSOR FOR ANALYSING A SAMPLE, AND PROCESS FOR M...
- Publication number 20250224331
- Publication date Jul 10, 2025
- TERAVIEW LIMITED
- Ian Alasdair Pentland
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION SYSTEM AND DEFECT INSPECTION METHOD
- Publication number 20250198941
- Publication date Jun 19, 2025
- Samsung Electronics Co., Ltd.
- Min Ho RIM
- G01 - MEASURING TESTING
Information Patent Application
WIRE ROD, ENAMELED WIRE, AND METHOD FOR MANUFACTURING ENAMELED WIRE
- Publication number 20250180491
- Publication date Jun 5, 2025
- Proterial, Ltd.
- Hajime NISHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FILM THICKNESS MEASUREMENT DEVICE
- Publication number 20250137773
- Publication date May 1, 2025
- Industrial Technology Research Institute
- Shih-Hsiang LAI
- G01 - MEASURING TESTING
Information Patent Application
Optical Sample Characterization
- Publication number 20250085229
- Publication date Mar 13, 2025
- LUMUS LTD.
- Eitan RONEN
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20250076209
- Publication date Mar 6, 2025
- Mitsubishi Heavy Industries, Ltd.
- Yuki YANO
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATION LIGHT SOURCE AND SUBSTRATE INSPECTION APPARATUS INCLUD...
- Publication number 20250067680
- Publication date Feb 27, 2025
- ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Dong Hoon SONG
- G01 - MEASURING TESTING
Information Patent Application
CONTACTLESS DETERMINING A PHYSICAL FEATURE OF A TARGET ITEM
- Publication number 20250035428
- Publication date Jan 30, 2025
- DAS-NANO TECH S.L.
- Mikel SUBIZA GARCÍA
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT METHOD AND SUBSTRATE PROCESSING APPARATUS
- Publication number 20250003874
- Publication date Jan 2, 2025
- TOKYO ELECTRON LIMITED
- Yuji OTSUKI
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...
- Publication number 20240418633
- Publication date Dec 19, 2024
- KLA Corporation
- Shova Subedi
- G01 - MEASURING TESTING
Information Patent Application
INFRARED DETECTION CAMERA
- Publication number 20240402090
- Publication date Dec 5, 2024
- Laser & Plasma Technologies, LLC
- Mool C. GUPTA
- G01 - MEASURING TESTING
Information Patent Application
COLORMETRIC METHODS TO PREDICT COATING AND BOND PERFORMANCE PROPERTIES
- Publication number 20240402091
- Publication date Dec 5, 2024
- The Boeing Company
- Eileen Olga KUTSCHA
- G01 - MEASURING TESTING
Information Patent Application
COATING EVALUATION DEVICE AND COATING EVALUATION METHOD
- Publication number 20240369494
- Publication date Nov 7, 2024
- NISSAN MOTOR CO., LTD.
- Shota YAMAZAKI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING ORGANOPHOSPHORUS PESTICIDE BY MICROFLUIDIC CHI...
- Publication number 20240353342
- Publication date Oct 24, 2024
- JIANGSU UNIVERSITY
- Xuetao HU
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SYSTEMS AND METHODS OF LOCATING COOLING FEATURES IN A GAS TURBINE C...
- Publication number 20240353343
- Publication date Oct 24, 2024
- GENERAL ELECTRIC COMPANY
- Thomas J. BATZINGER
- F01 - MACHINES OR ENGINES IN GENERAL ENGINE PLANTS IN GENERAL STEAM ENGINES
Information Patent Application
FILM THICKNESS MEASUREMENT DEVICE, FILM THICKNESS MEASUREMENT METHO...
- Publication number 20240353344
- Publication date Oct 24, 2024
- EBARA CORPORATION
- Masaki KINOSHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPLIT PRISM SILICON-BASED LIQUID IMMERSION MICROCHANNEL MEASURING D...
- Publication number 20240337591
- Publication date Oct 10, 2024
- Korea Research Institute of Standards and Science
- Dong Hyung KIM
- G01 - MEASURING TESTING
Information Patent Application
REFERENCE SAMPLE FOR COATING DEFECTS AND METHOD FOR PRODUCING SAME
- Publication number 20240319103
- Publication date Sep 26, 2024
- Konica Minolta, Inc.
- RYUICHI YOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
ELECTRODE PLATE INSPECTION METHOD, METHOD FOR FABRICATING POWER STO...
- Publication number 20240302275
- Publication date Sep 12, 2024
- Prime Planet Energy & Solutions, Inc.
- Tomomichi YAMAZAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COATING EVALUATION DEVICE AND COATING EVALUATION METHOD
- Publication number 20240288375
- Publication date Aug 29, 2024
- NISSAN MOTOR CO., LTD.
- Takahiro KAITO
- G01 - MEASURING TESTING
Information Patent Application
PLATING DEFECTS ESTIMATING METHOD AND SEMICONDUCTOR DEVICE MANUFACT...
- Publication number 20240282643
- Publication date Aug 22, 2024
- HITACHI POWER SEEMICONDUCTOR DEVICE, LTD.
- Reo Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods for Analyzing an Electrode Layer of a Battery Cell Using a...
- Publication number 20240230546
- Publication date Jul 11, 2024
- SIEMENS AKTIENGESELLSCHAFT
- Sascha Schulte
- G01 - MEASURING TESTING
Information Patent Application
COATING EVALUATION DEVICE AND COATING EVALUATION METHOD
- Publication number 20240230547
- Publication date Jul 11, 2024
- NISSAN MOTOR CO., LTD.
- Shota YAMAZAKI
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE INSPECTION DEVICE AND SUBSTRATE INSPECTION METHOD USING T...
- Publication number 20240201100
- Publication date Jun 20, 2024
- SAMSUNG DISPLAY CO., LTD.
- SUNG HUNE YOO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING LACQUERED SURFACES WITH EFFECT...
- Publication number 20240183788
- Publication date Jun 6, 2024
- BYK-Gardner GmbH
- Uwe Sperling
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR DETERMINING THE MICROSTRUCTURE FOR...
- Publication number 20240159681
- Publication date May 16, 2024
- GENERAL ELECTRIC COMPANY
- Aditya Kulkarni
- G01 - MEASURING TESTING
Information Patent Application
Methods for Analyzing an Electrode Layer of a Battery Cell Using a...
- Publication number 20240133819
- Publication date Apr 25, 2024
- SIEMENS AKTIENGESELLSCHAFT
- Sascha Schulte
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING ORIENTATION OF SILVER NANOWIRE, POLYVINYL ALCO...
- Publication number 20240060888
- Publication date Feb 22, 2024
- Resonac Corporation
- Yasunao MIYAMURA
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
SYSTEMS AND TECHNIQUES FOR OPTICAL MEASUREMENT OF THIN FILMS
- Publication number 20240055282
- Publication date Feb 15, 2024
- LAM RESEARCH CORPORATION
- Liu Yang
- H01 - BASIC ELECTRIC ELEMENTS

Investigating thin films

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Roll map for electrode coating process and roll map creation method...

Method and device for determining UV coverage on irradiation target...

Transmission apparatus, measurement system, and camera system

Measuring device and method for dynamic characteristics of pressure...

Method for measuring thickness and optical properties of multi-laye...

Roll map for electrode coating process and roll map creation method...

Color measurement

System and method for detecting contamination of thin-films

Method for selecting polyester film, method for producing multilaye...

Systems and methods of locating cooling features in a gas turbine c...

Making and inspecting a web of vitreous lithium sulfide separator s...

Method for determining the composition of a multi-layer system show...

Method for estimating a quality function of a mono- or multi-layere...

Infrared detection camera

Method for detecting organophosphorus pesticide by microfluidic chi...

EPI self-heating sensor tube as in-situ growth rate sensor

Cylindrical shell detection method and cylindrical shell detection...

Methods and systems for real-time quality control of a film in a sp...

Method for measuring element concentration of material

Optical inspection device and inspecting method using the same

Qualitative or quantitative characterization of a coating surface

Device and method for monitoring the drying/curing process of coatings

Adhesion interface observation method

Optical sample characterization

Angle independent optical surface inspector

Measure of the degree of crystallinty of a polymer coating on a met...

Apparatus for generating model for spectroscopic ellipsometry const...

Assessing a flow of a sprayed coating

Sensing and control of additive manufacturing processes

Gravure coater test apparatus and gravure coater

Patents Applicationslast 30 patents

SUBSTRATE EVALUATION METHOD AND SUBSTRATE PROCESSING APPARATUS

METHOD, SYSTEM AND SENSOR FOR ANALYSING A SAMPLE, AND PROCESS FOR M...

DEFECT INSPECTION SYSTEM AND DEFECT INSPECTION METHOD

WIRE ROD, ENAMELED WIRE, AND METHOD FOR MANUFACTURING ENAMELED WIRE

FILM THICKNESS MEASUREMENT DEVICE

Optical Sample Characterization

INSPECTION DEVICE AND INSPECTION METHOD

ILLUMINATION LIGHT SOURCE AND SUBSTRATE INSPECTION APPARATUS INCLUD...

CONTACTLESS DETERMINING A PHYSICAL FEATURE OF A TARGET ITEM

MEASUREMENT METHOD AND SUBSTRATE PROCESSING APPARATUS

COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...

INFRARED DETECTION CAMERA

COLORMETRIC METHODS TO PREDICT COATING AND BOND PERFORMANCE PROPERTIES

COATING EVALUATION DEVICE AND COATING EVALUATION METHOD

METHOD FOR DETECTING ORGANOPHOSPHORUS PESTICIDE BY MICROFLUIDIC CHI...

SYSTEMS AND METHODS OF LOCATING COOLING FEATURES IN A GAS TURBINE C...

FILM THICKNESS MEASUREMENT DEVICE, FILM THICKNESS MEASUREMENT METHO...

SPLIT PRISM SILICON-BASED LIQUID IMMERSION MICROCHANNEL MEASURING D...

REFERENCE SAMPLE FOR COATING DEFECTS AND METHOD FOR PRODUCING SAME

ELECTRODE PLATE INSPECTION METHOD, METHOD FOR FABRICATING POWER STO...

COATING EVALUATION DEVICE AND COATING EVALUATION METHOD

PLATING DEFECTS ESTIMATING METHOD AND SEMICONDUCTOR DEVICE MANUFACT...

Methods for Analyzing an Electrode Layer of a Battery Cell Using a...

COATING EVALUATION DEVICE AND COATING EVALUATION METHOD

SUBSTRATE INSPECTION DEVICE AND SUBSTRATE INSPECTION METHOD USING T...

METHOD AND APPARATUS FOR INSPECTING LACQUERED SURFACES WITH EFFECT...

INSPECTION SYSTEM AND METHOD FOR DETERMINING THE MICROSTRUCTURE FOR...

Methods for Analyzing an Electrode Layer of a Battery Cell Using a...

METHOD FOR MEASURING ORIENTATION OF SILVER NANOWIRE, POLYVINYL ALCO...

SYSTEMS AND TECHNIQUES FOR OPTICAL MEASUREMENT OF THIN FILMS