irradiation range monitor

Industry

CPC
G01N2223/323

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/323irradiation range monitor

Industries

Patents Grantslast 30 patents

Information Patent Grant
X-ray imaging device
- Patent number 11,921,057
- Issue date Mar 5, 2024
- National University Corporation Shizuoka University
- Toru Aoki
- G01 - MEASURING TESTING
Information Patent Grant
Diffraction analysis device and method for full-field x-ray fluores...
- Patent number 11,774,380
- Issue date Oct 3, 2023
- Sichuan University
- Yuanjun Xu
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction measurement method and apparatus
- Patent number 10,591,425
- Issue date Mar 17, 2020
- Honda Motor Co., Ltd.
- Kenji Sato
- G01 - MEASURING TESTING
Information Patent Grant
Virtual barricade for radiation inspection of predefined paths
- Patent number 10,436,725
- Issue date Oct 8, 2019
- Georgetown Rail Equipment Company
- Jeb Everett Belcher
- G01 - MEASURING TESTING
Information Patent Grant
X-ray beam alignment device and method
- Patent number 10,325,691
- Issue date Jun 18, 2019
- Consolidated Nuclear Security, LLC
- Nathaniel Frederick Henry
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
System and method for correlating object information with X-ray images
- Patent number 10,182,776
- Issue date Jan 22, 2019
- Siemens Healthcare GmbH
- Karl Barth
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Handling misalignment in differential phase contrast imaging
- Patent number 9,903,827
- Issue date Feb 27, 2018
- Koninklijke Philips N.V.
- Gereon Vogtmeier
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray fluorescence analyzer and measurement position adjusting meth...
- Patent number 9,791,392
- Issue date Oct 17, 2017
- Hitachi High-Tech Science Corporation
- Isao Yagi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analyzer
- Patent number 9,658,175
- Issue date May 23, 2017
- Hitachi High-Tech Science Corporation
- Ryusuke Hirose
- G01 - MEASURING TESTING
Information Patent Grant
X-ray irradiation apparatus provided with irradiation range monitor
- Patent number 4,969,177
- Issue date Nov 6, 1990
- Horiba, Ltd.
- Kunio Otsuki
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for charged particle spectroscopy
- Patent number 4,255,656
- Issue date Mar 10, 1981
- Kratos Limited
- Andrew Barrie
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR USING RADIATION IMAGING DATA TO ANALYZE CO...
- Publication number 20240369500
- Publication date Nov 7, 2024
- Robert Koch
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR AUTOMATICALLY SETTING UP COMPUTED TOMOGRAPHY SCAN PARAME...
- Publication number 20240077434
- Publication date Mar 7, 2024
- Lumafield, Inc.
- Adam P. Damiano
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IMAGING DEVICE
- Publication number 20220196575
- Publication date Jun 23, 2022
- NATIONALUNIVERSITYCORPORATIONSHIZUOKAUNIVERSITY
- Toru AOKI
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
RADIATION GENERATING APPARATUS AND RADIATION IMAGING SYSTEM
- Publication number 20140254754
- Publication date Sep 11, 2014
- Canon Kabushiki Kaisha
- Yoichi Ikarashi
- G01 - MEASURING TESTING

irradiation range monitor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

X-ray imaging device

Diffraction analysis device and method for full-field x-ray fluores...

X-ray diffraction measurement method and apparatus

Virtual barricade for radiation inspection of predefined paths

X-ray beam alignment device and method

System and method for correlating object information with X-ray images

Handling misalignment in differential phase contrast imaging

X-ray fluorescence analyzer and measurement position adjusting meth...

X-ray analyzer

X-ray irradiation apparatus provided with irradiation range monitor

Apparatus for charged particle spectroscopy

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR USING RADIATION IMAGING DATA TO ANALYZE CO...

METHOD FOR AUTOMATICALLY SETTING UP COMPUTED TOMOGRAPHY SCAN PARAME...

X-RAY IMAGING DEVICE

RADIATION GENERATING APPARATUS AND RADIATION IMAGING SYSTEM