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G01N2201/06133
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2201/00
Features of devices classified in G01N21/00
Current Industry
G01N2201/06133
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Patents Grants
last 30 patents
Information
Patent Grant
Plant imaging and spectral scanning system and method
Patent number
9,878,842
Issue date
Jan 30, 2018
Dow AgroSciences LLC
Kirsti A. Golgotiu
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information
Patent Grant
Backlight apparatus with remote light source
Patent number
8,308,330
Issue date
Nov 13, 2012
Günther Nath
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for inspection of multi-junction solar cells
Patent number
7,705,978
Issue date
Apr 27, 2010
Northrop Grumman Corporation
Mau-Song Chou
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for inspection of semiconductor devices
Patent number
7,326,929
Issue date
Feb 5, 2008
Northrop Grumman Corporation
Mau-Song Chou
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for measuring opaque medium coverage of a translucent sheet
Patent number
4,832,495
Issue date
May 23, 1989
Adolph Coors Company
Daniel D. Briggs
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
APPARATUS AND METHOD FOR OPTICAL EXAMINATION OF DOCUMENTS
Publication number
20090294693
Publication date
Dec 3, 2009
LUMATECH GMBH
Günther Nath
G01 - MEASURING TESTING
Information
Patent Application
Methods and apparatus for inspection of multi-junction solar cells
Publication number
20070181180
Publication date
Aug 9, 2007
Mau-Song Chou
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for inspection of semiconductor devices
Publication number
20070181809
Publication date
Aug 9, 2007
Mau-Song Chou
G01 - MEASURING TESTING